JP1624757S - - Google Patents
Info
- Publication number
- JP1624757S JP1624757S JPD2018-10760F JP2018010760F JP1624757S JP 1624757 S JP1624757 S JP 1624757S JP 2018010760 F JP2018010760 F JP 2018010760F JP 1624757 S JP1624757 S JP 1624757S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2018-10760F JP1624757S (ja) | 2018-05-16 | 2018-05-16 | |
| TW107306751F TWD198372S (zh) | 2018-05-16 | 2018-11-16 | 電氣特性測定用探針之部分 |
| US29/670,517 USD894025S1 (en) | 2018-05-16 | 2018-11-16 | Electric characteristic measuring probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2018-10760F JP1624757S (ja) | 2018-05-16 | 2018-05-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP1624757S true JP1624757S (ja) | 2019-02-18 |
Family
ID=65359084
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JPD2018-10760F Active JP1624757S (ja) | 2018-05-16 | 2018-05-16 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD894025S1 (ja) |
| JP (1) | JP1624757S (ja) |
| TW (1) | TWD198372S (ja) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
| JP1716912S (ja) | 2021-11-15 | 2022-06-08 | 電気的特性測定用プローブ | |
| TWD226028S (zh) * | 2022-04-29 | 2023-06-21 | 南韓商普因特工程有限公司 | 半導體檢測針 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD510043S1 (en) * | 2003-06-11 | 2005-09-27 | K&S Interconnect, Inc. | Continuously profiled probe beam |
| US7671610B2 (en) * | 2007-10-19 | 2010-03-02 | Microprobe, Inc. | Vertical guided probe array providing sideways scrub motion |
| KR102081478B1 (ko) * | 2013-07-09 | 2020-02-25 | 폼팩터, 인크. | 전기적 도전성 가이드 플레이트들 사이의, 신호 통과 경로들 및 이차 경로들을 갖는 다경로 전기적 프로브 및 프로브 어셈블리들 |
| JP1529607S (ja) * | 2014-12-15 | 2015-07-27 | ||
| JP1529605S (ja) * | 2014-12-15 | 2015-07-27 | ||
| JP1529608S (ja) * | 2014-12-15 | 2015-07-27 | ||
| JP1529612S (ja) * | 2014-12-19 | 2015-07-27 |
-
2018
- 2018-05-16 JP JPD2018-10760F patent/JP1624757S/ja active Active
- 2018-11-16 US US29/670,517 patent/USD894025S1/en active Active
- 2018-11-16 TW TW107306751F patent/TWD198372S/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| TWD198372S (zh) | 2019-07-01 |
| USD894025S1 (en) | 2020-08-25 |