USD894025S1 - Electric characteristic measuring probe - Google Patents

Electric characteristic measuring probe Download PDF

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Publication number
USD894025S1
USD894025S1 US29/670,517 US201829670517F USD894025S US D894025 S1 USD894025 S1 US D894025S1 US 201829670517 F US201829670517 F US 201829670517F US D894025 S USD894025 S US D894025S
Authority
US
United States
Prior art keywords
measuring probe
characteristic measuring
electric characteristic
view
elevational view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/670,517
Other languages
English (en)
Inventor
Michio Kaida
Huei Che Yu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Advance Technology Corp
SV Probe Technology Taiwan Co Ltd
Original Assignee
Nidec Read Corp
SV Probe Technology Taiwan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Read Corp, SV Probe Technology Taiwan Co Ltd filed Critical Nidec Read Corp
Assigned to SV PROBE TECHNOLOGY TAIWAN CO., LTD., NIDEC-READ CORPORATION reassignment SV PROBE TECHNOLOGY TAIWAN CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: YU, HUEI CHE, KAIDA, MICHIO
Application granted granted Critical
Publication of USD894025S1 publication Critical patent/USD894025S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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US29/670,517 2018-05-16 2018-11-16 Electric characteristic measuring probe Active USD894025S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2018-10760F JP1624757S (ja) 2018-05-16 2018-05-16
JP2018-010760 2018-05-16

Publications (1)

Publication Number Publication Date
USD894025S1 true USD894025S1 (en) 2020-08-25

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Family Applications (1)

Application Number Title Priority Date Filing Date
US29/670,517 Active USD894025S1 (en) 2018-05-16 2018-11-16 Electric characteristic measuring probe

Country Status (3)

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US (1) USD894025S1 (ja)
JP (1) JP1624757S (ja)
TW (1) TWD198372S (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1716912S (ja) 2021-11-15 2022-06-08 電気的特性測定用プローブ

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507198S1 (en) * 2003-06-11 2005-07-12 K&S Interconnect, Inc. Straight protruding probe beam contour surfaces
US7671610B2 (en) * 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
US10132833B2 (en) * 2013-07-09 2018-11-20 Formfactor, Inc. Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507198S1 (en) * 2003-06-11 2005-07-12 K&S Interconnect, Inc. Straight protruding probe beam contour surfaces
USD510043S1 (en) * 2003-06-11 2005-09-27 K&S Interconnect, Inc. Continuously profiled probe beam
US7671610B2 (en) * 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion
US10132833B2 (en) * 2013-07-09 2018-11-20 Formfactor, Inc. Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin

Also Published As

Publication number Publication date
TWD198372S (zh) 2019-07-01
JP1624757S (ja) 2019-02-18

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