USD894025S1 - Electric characteristic measuring probe - Google Patents
Electric characteristic measuring probe Download PDFInfo
- Publication number
- USD894025S1 USD894025S1 US29/670,517 US201829670517F USD894025S US D894025 S1 USD894025 S1 US D894025S1 US 201829670517 F US201829670517 F US 201829670517F US D894025 S USD894025 S US D894025S
- Authority
- US
- United States
- Prior art keywords
- measuring probe
- characteristic measuring
- electric characteristic
- view
- elevational view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000000523 sample Substances 0.000 title claims description 3
Images
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2018-10760F JP1624757S (ja) | 2018-05-16 | 2018-05-16 | |
JP2018-010760 | 2018-05-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD894025S1 true USD894025S1 (en) | 2020-08-25 |
Family
ID=65359084
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/670,517 Active USD894025S1 (en) | 2018-05-16 | 2018-11-16 | Electric characteristic measuring probe |
Country Status (3)
Country | Link |
---|---|
US (1) | USD894025S1 (ja) |
JP (1) | JP1624757S (ja) |
TW (1) | TWD198372S (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
USD1030689S1 (en) * | 2022-04-29 | 2024-06-11 | Point Engineering Co., Ltd. | Semiconductor probe pin |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP1716912S (ja) | 2021-11-15 | 2022-06-08 | 電気的特性測定用プローブ |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD507198S1 (en) * | 2003-06-11 | 2005-07-12 | K&S Interconnect, Inc. | Straight protruding probe beam contour surfaces |
US7671610B2 (en) * | 2007-10-19 | 2010-03-02 | Microprobe, Inc. | Vertical guided probe array providing sideways scrub motion |
USD769749S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
USD769748S1 (en) * | 2014-12-15 | 2016-10-25 | Omron Corporation | Probe pin |
USD776551S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD776552S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
US10132833B2 (en) * | 2013-07-09 | 2018-11-20 | Formfactor, Inc. | Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates |
-
2018
- 2018-05-16 JP JPD2018-10760F patent/JP1624757S/ja active Active
- 2018-11-16 US US29/670,517 patent/USD894025S1/en active Active
- 2018-11-16 TW TW107306751F patent/TWD198372S/zh unknown
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD507198S1 (en) * | 2003-06-11 | 2005-07-12 | K&S Interconnect, Inc. | Straight protruding probe beam contour surfaces |
USD510043S1 (en) * | 2003-06-11 | 2005-09-27 | K&S Interconnect, Inc. | Continuously profiled probe beam |
US7671610B2 (en) * | 2007-10-19 | 2010-03-02 | Microprobe, Inc. | Vertical guided probe array providing sideways scrub motion |
US10132833B2 (en) * | 2013-07-09 | 2018-11-20 | Formfactor, Inc. | Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates |
USD769748S1 (en) * | 2014-12-15 | 2016-10-25 | Omron Corporation | Probe pin |
USD776551S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD776552S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD769749S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
USD1030689S1 (en) * | 2022-04-29 | 2024-06-11 | Point Engineering Co., Ltd. | Semiconductor probe pin |
Also Published As
Publication number | Publication date |
---|---|
TWD198372S (zh) | 2019-07-01 |
JP1624757S (ja) | 2019-02-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |