TWD217960S - Probe - Google Patents
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- Publication number
- TWD217960S TWD217960S TW109306823F TW109306823F TWD217960S TW D217960 S TWD217960 S TW D217960S TW 109306823 F TW109306823 F TW 109306823F TW 109306823 F TW109306823 F TW 109306823F TW D217960 S TWD217960 S TW D217960S
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- view
- design
- enlarged
- perspective
- Prior art date
Links
- 239000000523 sample Substances 0.000 title 1
- 239000004065 semiconductor Substances 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Images
Description
本設計用於點測諸如晶圓之類的待測物，使用於半導體元件、積體電路等電子裝置的測試裝置。 This design is used to spot test objects such as wafers, and is used as a test device for electronic devices such as semiconductor components and integrated circuits.
本設計具有如圖式所示的特殊設計。 This design has a special design as shown in the drawing.
圖式中所揭露的虛線為本案不主張設計的部分。圖式中所揭露的一點鏈線為邊界線，做為區隔本案主張設計的部分與不主張設計的部分，該邊界線本身亦為本案不主張設計的部分。 The dotted lines disclosed in the drawings are the parts that are not claimed in this case. The one-point chain line disclosed in the drawing is the boundary line, which is used to distinguish the part that advocates design and the part that does not advocate design in this case. The boundary line itself is also the part that does not advocate design in this case.
A-A部分放大立體圖1為立體圖中A-A部分的放大立體圖；A-A部分放大前、後視圖分別為立體圖中A-A部分的放大前、後視圖；A-A部分放大俯、仰視圖分別為立體圖中A-A部分的放大俯、仰視圖；A-A部分放大立體圖2為立體圖中A-A部分另一視角的放大立體圖。 Part A-A enlarged perspective Figure 1 is an enlarged perspective view of part A-A in the three-dimensional view; the enlarged front and rear views of part A-A are respectively the enlarged front and rear views of part A-A in the three-dimensional view; the enlarged top and bottom views of part A-A are respectively the enlarged top view of part A-A in the three-dimensional view , Bottom view; A-A part enlarged perspective Figure 2 is an enlarged perspective view of the A-A part of the perspective view from another perspective.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109306823F TWD217960S (en) | 2020-12-03 | 2020-12-03 | Probe |
| US29/786,073 USD983681S1 (en) | 2020-12-03 | 2021-05-28 | Probe for testing device under test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109306823F TWD217960S (en) | 2020-12-03 | 2020-12-03 | Probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWD217960S true TWD217960S (en) | 2022-04-01 |
Family
ID=89543946
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW109306823F TWD217960S (en) | 2020-12-03 | 2020-12-03 | Probe |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWD217960S (en) |
-
2020
- 2020-12-03 TW TW109306823F patent/TWD217960S/en unknown
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