TWD197821S - Part of electric contact - Google Patents

Part of electric contact

Info

Publication number
TWD197821S
TWD197821S TW107304472D01F TW107304472D01F TWD197821S TW D197821 S TWD197821 S TW D197821S TW 107304472D01 F TW107304472D01 F TW 107304472D01F TW 107304472D01 F TW107304472D01 F TW 107304472D01F TW D197821 S TWD197821 S TW D197821S
Authority
TW
Taiwan
Prior art keywords
design
electrical contact
article
enlarged view
designed
Prior art date
Application number
TW107304472D01F
Other languages
Chinese (zh)
Inventor
Mika Nasu
Tsuyoshi Muramoto
Original Assignee
日商日本麥克隆尼股份有限&#x5
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日本麥克隆尼股份有限&#x5, Nihon Micronics Kk filed Critical 日商日本麥克隆尼股份有限&#x5
Publication of TWD197821S publication Critical patent/TWD197821S/en

Links

Abstract

【物品用途】;本設計物品為一種電性接觸子，係作為與被檢測物之電極電性接觸的探針而使用在例如半導體元件或積體電路等電子零件的檢測裝置中。;【設計說明】;本設計係關於第107304472號專利申請案之衍生設計。;本設計物品之設計要點在於物品的形狀。;圖式所揭露之虛線為本案不主張設計之部分；圖式所揭露之一點鏈線為本案所欲主張設計之部分與不主張設計之部分的邊界線，該一點鏈線實際上不可見，為本案不主張設計之部分。;A-A部分放大圖為前視圖中之A-A部分的放大圖。[Use of article] This designed article is an electrical contact, which is used as a probe in electrical contact with the electrode of the object to be detected, in a testing device for electronic parts such as semiconductor components or integrated circuits. ;[Design Description];This design is a derivative design of patent application No. 107304472. ;The design key point of this design object lies in the shape of the object. ;The dotted line shown in the drawing is the part of the case that is not claimed for design; the dotted line shown in the drawing is the boundary line between the part that is intended to be designed and the part that is not claimed for design. This point chain line is actually invisible. This is the part of the design that is not claimed in this case. ;The enlarged view of part A-A is an enlarged view of part A-A in the front view.

TW107304472D01F 2018-02-02 2018-08-02 Part of electric contact TWD197821S (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2018-2094F JP1626667S (en) 2018-02-02 2018-02-02

Publications (1)

Publication Number Publication Date
TWD197821S true TWD197821S (en) 2019-06-01

Family

ID=65718861

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107304472D01F TWD197821S (en) 2018-02-02 2018-08-02 Part of electric contact

Country Status (3)

Country Link
US (1) USD873160S1 (en)
JP (1) JP1626667S (en)
TW (1) TWD197821S (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1682139S (en) * 2020-10-06 2021-08-30

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
CN102004173B (en) * 2009-09-01 2014-02-19 鸿富锦精密工业（深圳）有限公司 Probe
TWI421504B (en) * 2010-07-02 2014-01-01 Isc Co Ltd Test probe for test and fabrication method thereof
US8912803B2 (en) * 2011-09-19 2014-12-16 Honeywell International, Inc. Electrostatic shielding technique on high voltage diodes
WO2013154738A1 (en) * 2012-04-13 2013-10-17 Delaware Capital Formation, Inc. Test probe assembly and related methods
JP6011103B2 (en) * 2012-07-23 2016-10-19 山一電機株式会社 Contact probe and socket for semiconductor device provided with the same
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
JP6269337B2 (en) * 2014-06-16 2018-01-31 オムロン株式会社 Probe pin and electronic device using the same
JP1529605S (en) * 2014-12-15 2015-07-27
JP1529607S (en) * 2014-12-15 2015-07-27
JP1529608S (en) * 2014-12-15 2015-07-27
JP1529612S (en) * 2014-12-19 2015-07-27
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly

Also Published As

Publication number Publication date
JP1626667S (en) 2019-03-18
USD873160S1 (en) 2020-01-21

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