TWD197823S - Part of electric contact - Google Patents
Part of electric contactInfo
- Publication number
- TWD197823S TWD197823S TW107304473D01F TW107304473D01F TWD197823S TW D197823 S TWD197823 S TW D197823S TW 107304473D01 F TW107304473D01 F TW 107304473D01F TW 107304473D01 F TW107304473D01 F TW 107304473D01F TW D197823 S TWD197823 S TW D197823S
- Authority
- TW
- Taiwan
- Prior art keywords
- design
- electrical contact
- article
- enlarged view
- designed
- Prior art date
Links
Abstract
【物品用途】;本設計物品為一種電性接觸子，係作為與被檢測物之電極電性接觸的探針而使用在例如半導體元件或積體電路等電子零件的檢測裝置中。;【設計說明】;本設計係關於第107304473號專利申請案之衍生設計。;本設計物品之設計要點在於物品的形狀。;圖式所揭露之虛線為本案不主張設計之部分；圖式所揭露之一點鏈線為本案所欲主張設計之部分與不主張設計之部分的邊界線，該一點鏈線實際上不可見，為本案不主張設計之部分。;A-A部分放大圖為前視圖中之A-A部分的放大圖。[Use of article] This designed article is an electrical contact, which is used as a probe in electrical contact with the electrode of the object to be detected, in a testing device for electronic parts such as semiconductor components or integrated circuits. ;[Design Description];This design is a derivative design of patent application No. 107304473. ;The design key point of this design object lies in the shape of the object. ;The dotted line shown in the drawing is the part of the case that is not claimed for design; the dotted line shown in the drawing is the boundary line between the part that is intended to be designed and the part that is not claimed for design. This point chain line is actually invisible. This is the part of the design that is not claimed in this case. ;The enlarged view of part A-A is an enlarged view of part A-A in the front view.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2018-2097F JP1626668S (en) | 2018-02-02 | 2018-02-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWD197823S true TWD197823S (en) | 2019-06-01 |
Family
ID=65718439
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW107304473D01F TWD197823S (en) | 2018-02-02 | 2018-08-02 | Part of electric contact |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD873683S1 (en) |
| JP (1) | JP1626668S (en) |
| TW (1) | TWD197823S (en) |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4634968A (en) * | 1982-12-20 | 1987-01-06 | The Narda Microwave Corporation | Wide range radiation monitor |
| US4740746A (en) * | 1984-11-13 | 1988-04-26 | Tektronix, Inc. | Controlled impedance microcircuit probe |
| US4716365A (en) * | 1985-10-11 | 1987-12-29 | Lisle Corporation | Circuit tester |
| USD311346S (en) * | 1987-09-25 | 1990-10-16 | Q.A. Technology Company | Electronic test probe |
| US5172051A (en) * | 1991-04-24 | 1992-12-15 | Hewlett-Packard Company | Wide bandwidth passive probe |
| USD397052S (en) * | 1997-04-08 | 1998-08-18 | Societe Chauvin Arnoux | Test lead |
| US7208971B2 (en) * | 2002-10-15 | 2007-04-24 | General Electric Company | Manual probe carriage system and method of using the same |
| US9046568B2 (en) * | 2009-03-27 | 2015-06-02 | Essai, Inc. | Universal spring contact pin and IC test socket therefor |
| CN102004173B (en) * | 2009-09-01 | 2014-02-19 | 鸿富锦精密工业（深圳）有限公司 | Probe |
| TWI421504B (en) * | 2010-07-02 | 2014-01-01 | Isc Co Ltd | Test probe for test and fabrication method thereof |
| US8912803B2 (en) * | 2011-09-19 | 2014-12-16 | Honeywell International, Inc. | Electrostatic shielding technique on high voltage diodes |
| TWD150990S (en) | 2012-03-27 | 2012-12-21 | 欣興電子股份有限公司 | Pin for pin grid array |
| SG11201406561XA (en) * | 2012-04-13 | 2014-11-27 | Capital Formation Inc | Test probe assembly and related methods |
| JP6011103B2 (en) * | 2012-07-23 | 2016-10-19 | 山一電機株式会社 | Contact probe and socket for semiconductor device provided with the same |
| USD686098S1 (en) * | 2012-11-14 | 2013-07-16 | Agar Corporation Ltd. | Antenna detection probe for a storage tank |
| JP6269337B2 (en) * | 2014-06-16 | 2018-01-31 | オムロン株式会社 | Probe pin and electronic device using the same |
| JP1529607S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP1529605S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP1529608S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP1529612S (en) * | 2014-12-19 | 2015-07-27 | ||
| US10241133B2 (en) * | 2014-12-31 | 2019-03-26 | Tektronix, Inc. | Probe tip and probe assembly |
| US9810715B2 (en) * | 2014-12-31 | 2017-11-07 | Tektronix, Inc. | High impedance compliant probe tip |
-
2018
- 2018-02-02 JP JPD2018-2097F patent/JP1626668S/ja active Active
- 2018-08-01 US US29/658,650 patent/USD873683S1/en active Active
- 2018-08-02 TW TW107304473D01F patent/TWD197823S/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| USD873683S1 (en) | 2020-01-28 |
| JP1626668S (en) | 2019-03-18 |
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