USD873683S1 - Electric contact - Google Patents

Electric contact Download PDF

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Publication number
USD873683S1
USD873683S1 US29/658,650 US201829658650F USD873683S US D873683 S1 USD873683 S1 US D873683S1 US 201829658650 F US201829658650 F US 201829658650F US D873683 S USD873683 S US D873683S
Authority
US
United States
Prior art keywords
electric contact
view
design
indicated
elevation view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/658,650
Inventor
Mika NASU
Tsuyoshi Muramoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Assigned to KABUSHIKI KAISHA NIHON MICRONICS reassignment KABUSHIKI KAISHA NIHON MICRONICS ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MURAMOTO, TSUYOSHI, NASU, MIKA
Application granted granted Critical
Publication of USD873683S1 publication Critical patent/USD873683S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a perspective view of a portion of an electric contact, showing the claimed design;
FIG. 2 is a front elevation view of the electric contact;
FIG. 3 is a rear elevation view of the electric contact;
FIG. 4 is a left side elevation view of the electric contact;
FIG. 5 is a right side elevation view of the electric contact;
FIG. 6 is a top plan view of the electric contact;
FIG. 7 is a bottom plan view of the electric contact;
FIG. 8 is an enlarged view of the section of the electric contact as indicated in FIG. 2;
FIG. 9 is an enlarged left side view of the section of the electric contact as indicated in FIG. 2; and,
FIG. 10 is an enlarged right side view of the section of the electric contact as indicated in FIG. 2.
The broken lines shown in the figures are only for the purpose of illustrating the unclaimed portions of the article, and form no part of the claimed design. Chain or line-dot broken lines indicate boundary lines between the claimed portions and the unclaimed portions, and are for illustration only and form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an electric contact, as shown and described.
US29/658,650 2018-02-02 2018-08-01 Electric contact Active USD873683S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2018-2097F JP1626668S (en) 2018-02-02 2018-02-02
JP2018-002097 2018-02-02

Publications (1)

Publication Number Publication Date
USD873683S1 true USD873683S1 (en) 2020-01-28

Family

ID=65718439

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/658,650 Active USD873683S1 (en) 2018-02-02 2018-08-01 Electric contact

Country Status (3)

Country Link
US (1) USD873683S1 (en)
JP (1) JP1626668S (en)
TW (1) TWD197823S (en)

Citations (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
US20110050261A1 (en) * 2009-09-01 2011-03-03 Hon Hai Precision Industry Co., Ltd. Test probe
US20130069669A1 (en) * 2011-09-19 2013-03-21 Vasu MOGAVEERA Electrostatic shielding technique on high voltage diodes
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
US20150070040A1 (en) * 2012-04-13 2015-03-12 Xcerra Corporation Test probe assembly and related methods
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
US20150369859A1 (en) * 2012-07-23 2015-12-24 Yamaichi Electronics Co., Ltd. Contact probe and semiconductor element socket provided with same
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
US9547023B2 (en) * 2010-07-02 2017-01-17 Isc Co., Ltd. Test probe for test and fabrication method thereof
US20170138985A1 (en) * 2014-06-16 2017-05-18 Omron Corporation Probe pin and electronic device using the same
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly

Patent Citations (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
US20110050261A1 (en) * 2009-09-01 2011-03-03 Hon Hai Precision Industry Co., Ltd. Test probe
US8283939B2 (en) * 2009-09-01 2012-10-09 Hon Hai Precision Industry Co., Ltd. Test probe
US9547023B2 (en) * 2010-07-02 2017-01-17 Isc Co., Ltd. Test probe for test and fabrication method thereof
US20130069669A1 (en) * 2011-09-19 2013-03-21 Vasu MOGAVEERA Electrostatic shielding technique on high voltage diodes
US20150070040A1 (en) * 2012-04-13 2015-03-12 Xcerra Corporation Test probe assembly and related methods
US20150369859A1 (en) * 2012-07-23 2015-12-24 Yamaichi Electronics Co., Ltd. Contact probe and semiconductor element socket provided with same
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
US20170138985A1 (en) * 2014-06-16 2017-05-18 Omron Corporation Probe pin and electronic device using the same
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly

Also Published As

Publication number Publication date
TWD197823S (en) 2019-06-01
JP1626668S (en) 2019-03-18

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