USD311346S - Electronic test probe - Google Patents
Electronic test probe Download PDFInfo
- Publication number
- USD311346S USD311346S US07/101,169 US10116987F USD311346S US D311346 S USD311346 S US D311346S US 10116987 F US10116987 F US 10116987F US D311346 S USD311346 S US D311346S
- Authority
- US
- United States
- Prior art keywords
- test probe
- electronic test
- electronic
- probe
- ornamental design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a front perspective view of a electronic test probe showing my new design;
FIG. 2 is a rear elevational view, taken along line 2--2 of FIG. 1; and
FIG. 3 is a front end elevational view thereof, taken along line 3--3 of FIG. 3.
Claims (1)
- The ornamental design for electronic test probe, as shown and described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/101,169 USD311346S (en) | 1987-09-25 | 1987-09-25 | Electronic test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/101,169 USD311346S (en) | 1987-09-25 | 1987-09-25 | Electronic test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD311346S true USD311346S (en) | 1990-10-16 |
Family
ID=64237466
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US07/101,169 Expired - Lifetime USD311346S (en) | 1987-09-25 | 1987-09-25 | Electronic test probe |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD311346S (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD873159S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873160S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873161S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873684S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873686S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873683S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873685S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD874958S1 (en) * | 2018-02-02 | 2020-02-11 | Kabushiki Kaisha Nihon Micronics | Electric contact |
-
1987
- 1987-09-25 US US07/101,169 patent/USD311346S/en not_active Expired - Lifetime
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD873159S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873160S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873161S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873684S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873686S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873683S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873685S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD874958S1 (en) * | 2018-02-02 | 2020-02-11 | Kabushiki Kaisha Nihon Micronics | Electric contact |
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