USD873685S1 - Electric contact - Google Patents
Electric contact Download PDFInfo
- Publication number
- USD873685S1 USD873685S1 US29/658,652 US201829658652F USD873685S US D873685 S1 USD873685 S1 US D873685S1 US 201829658652 F US201829658652 F US 201829658652F US D873685 S USD873685 S US D873685S
- Authority
- US
- United States
- Prior art keywords
- electric contact
- view
- design
- indicated
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Description
The broken lines shown in the figures are only for the purpose of illustrating the unclaimed portions of the article, and form no part of the claimed design. Chain or line-dot broken lines indicate boundary lines between the claimed portions and the unclaimed portions, and are for illustration only and form no part of the claimed design.
Claims (1)
- The ornamental design for an electric contact, as shown and described.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2018-2099F JP1623279S (en) | 2018-02-02 | 2018-02-02 | |
JP2018-002099 | 2018-02-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD873685S1 true USD873685S1 (en) | 2020-01-28 |
Family
ID=65037440
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/658,652 Active USD873685S1 (en) | 2018-02-02 | 2018-08-01 | Electric contact |
Country Status (3)
Country | Link |
---|---|
US (1) | USD873685S1 (en) |
JP (1) | JP1623279S (en) |
TW (1) | TWD195361S (en) |
Citations (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4634968A (en) * | 1982-12-20 | 1987-01-06 | The Narda Microwave Corporation | Wide range radiation monitor |
US4716365A (en) * | 1985-10-11 | 1987-12-29 | Lisle Corporation | Circuit tester |
US4740746A (en) * | 1984-11-13 | 1988-04-26 | Tektronix, Inc. | Controlled impedance microcircuit probe |
USD311346S (en) * | 1987-09-25 | 1990-10-16 | Q.A. Technology Company | Electronic test probe |
US5172051A (en) * | 1991-04-24 | 1992-12-15 | Hewlett-Packard Company | Wide bandwidth passive probe |
USD397052S (en) * | 1997-04-08 | 1998-08-18 | Societe Chauvin Arnoux | Test lead |
US7208971B2 (en) * | 2002-10-15 | 2007-04-24 | General Electric Company | Manual probe carriage system and method of using the same |
US20110050261A1 (en) * | 2009-09-01 | 2011-03-03 | Hon Hai Precision Industry Co., Ltd. | Test probe |
US20130069669A1 (en) * | 2011-09-19 | 2013-03-21 | Vasu MOGAVEERA | Electrostatic shielding technique on high voltage diodes |
USD686098S1 (en) * | 2012-11-14 | 2013-07-16 | Agar Corporation Ltd. | Antenna detection probe for a storage tank |
US20150070040A1 (en) * | 2012-04-13 | 2015-03-12 | Xcerra Corporation | Test probe assembly and related methods |
US9046568B2 (en) * | 2009-03-27 | 2015-06-02 | Essai, Inc. | Universal spring contact pin and IC test socket therefor |
US20150369859A1 (en) * | 2012-07-23 | 2015-12-24 | Yamaichi Electronics Co., Ltd. | Contact probe and semiconductor element socket provided with same |
USD769748S1 (en) * | 2014-12-15 | 2016-10-25 | Omron Corporation | Probe pin |
USD769749S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
USD776552S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD776551S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
US9547023B2 (en) * | 2010-07-02 | 2017-01-17 | Isc Co., Ltd. | Test probe for test and fabrication method thereof |
US20170138985A1 (en) * | 2014-06-16 | 2017-05-18 | Omron Corporation | Probe pin and electronic device using the same |
US9810715B2 (en) * | 2014-12-31 | 2017-11-07 | Tektronix, Inc. | High impedance compliant probe tip |
US10241133B2 (en) * | 2014-12-31 | 2019-03-26 | Tektronix, Inc. | Probe tip and probe assembly |
-
2018
- 2018-02-02 JP JPD2018-2099F patent/JP1623279S/ja active Active
- 2018-08-01 US US29/658,652 patent/USD873685S1/en active Active
- 2018-08-02 TW TW107304474D01F patent/TWD195361S/en unknown
Patent Citations (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4634968A (en) * | 1982-12-20 | 1987-01-06 | The Narda Microwave Corporation | Wide range radiation monitor |
US4740746A (en) * | 1984-11-13 | 1988-04-26 | Tektronix, Inc. | Controlled impedance microcircuit probe |
US4716365A (en) * | 1985-10-11 | 1987-12-29 | Lisle Corporation | Circuit tester |
USD311346S (en) * | 1987-09-25 | 1990-10-16 | Q.A. Technology Company | Electronic test probe |
US5172051A (en) * | 1991-04-24 | 1992-12-15 | Hewlett-Packard Company | Wide bandwidth passive probe |
USD397052S (en) * | 1997-04-08 | 1998-08-18 | Societe Chauvin Arnoux | Test lead |
US7208971B2 (en) * | 2002-10-15 | 2007-04-24 | General Electric Company | Manual probe carriage system and method of using the same |
US9046568B2 (en) * | 2009-03-27 | 2015-06-02 | Essai, Inc. | Universal spring contact pin and IC test socket therefor |
US20110050261A1 (en) * | 2009-09-01 | 2011-03-03 | Hon Hai Precision Industry Co., Ltd. | Test probe |
US8283939B2 (en) * | 2009-09-01 | 2012-10-09 | Hon Hai Precision Industry Co., Ltd. | Test probe |
US9547023B2 (en) * | 2010-07-02 | 2017-01-17 | Isc Co., Ltd. | Test probe for test and fabrication method thereof |
US20130069669A1 (en) * | 2011-09-19 | 2013-03-21 | Vasu MOGAVEERA | Electrostatic shielding technique on high voltage diodes |
US20150070040A1 (en) * | 2012-04-13 | 2015-03-12 | Xcerra Corporation | Test probe assembly and related methods |
US20150369859A1 (en) * | 2012-07-23 | 2015-12-24 | Yamaichi Electronics Co., Ltd. | Contact probe and semiconductor element socket provided with same |
USD686098S1 (en) * | 2012-11-14 | 2013-07-16 | Agar Corporation Ltd. | Antenna detection probe for a storage tank |
US20170138985A1 (en) * | 2014-06-16 | 2017-05-18 | Omron Corporation | Probe pin and electronic device using the same |
USD776552S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD776551S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD769748S1 (en) * | 2014-12-15 | 2016-10-25 | Omron Corporation | Probe pin |
USD769749S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
US9810715B2 (en) * | 2014-12-31 | 2017-11-07 | Tektronix, Inc. | High impedance compliant probe tip |
US10241133B2 (en) * | 2014-12-31 | 2019-03-26 | Tektronix, Inc. | Probe tip and probe assembly |
Also Published As
Publication number | Publication date |
---|---|
JP1623279S (en) | 2019-01-28 |
TWD195361S (en) | 2019-01-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |