TWD195361S - Part of electric contact - Google Patents
Part of electric contactInfo
- Publication number
- TWD195361S TWD195361S TW107304474D01F TW107304474D01F TWD195361S TW D195361 S TWD195361 S TW D195361S TW 107304474D01 F TW107304474D01 F TW 107304474D01F TW 107304474D01 F TW107304474D01 F TW 107304474D01F TW D195361 S TWD195361 S TW D195361S
- Authority
- TW
- Taiwan
- Prior art keywords
- design
- view
- line
- sectional
- enlarged view
- Prior art date
Links
- 239000000523 sample Substances 0.000 abstract description 2
- 239000004065 semiconductor Substances 0.000 abstract description 2
- 238000001514 detection method Methods 0.000 description 1
Abstract
【物品用途】;本設計物品為一種電性接觸子，係作為與被檢測物之電極電性接觸的探針而使用在例如半導體元件或積體電路等電子零件的檢測裝置中。;【設計說明】;本設計係關於第107304474號專利申請案之衍生設計。;本設計物品之設計要點在於物品的形狀。;圖式所揭露之虛線為本案不主張設計之部分；圖式所揭露之一點鏈線為本案所欲主張設計之部分與不主張設計之部分的邊界線，該一點鏈線實際上不可見，為本案不主張設計之部分。;A-A部分放大圖為前視圖中之A-A部分的放大圖。;B-B線剖面圖為A-A部分放大圖中之B-B線處的剖面圖。;C-C線剖面圖為A-A部分放大圖中之C-C線處的剖面圖。[Use of article] This designed article is an electrical contact, which is used as a probe in electrical contact with the electrode of the object to be detected, in a testing device for electronic parts such as semiconductor components or integrated circuits. ;[Design Description];This design is a derivative design of patent application No. 107304474. ;The design key point of this design object lies in the shape of the object. ;The dotted line shown in the drawing is the part of the case that is not claimed for design; the dotted line shown in the drawing is the boundary line between the part that is intended to be designed and the part that is not claimed for design. This point chain line is actually invisible. This is a part of the design that is not claimed in this case. ;The enlarged view of part A-A is an enlarged view of part A-A in the front view. ;The cross-sectional view of line B-B is the cross-sectional view of line B-B in the enlarged view of part A-A. ;The C-C line sectional view is the C-C line sectional view in the enlarged view of part A-A.
Description
本設計物品為一種電性接觸子，係作為與被檢測物之電極電性接觸的探針而使用在例如半導體元件或積體電路等電子零件的檢測裝置中。 The design article is an electrical contact and is used as a probe for electrically contacting an electrode of a test object, for example, in a detection device for an electronic component such as a semiconductor element or an integrated circuit.
本設計係關於第107304474號專利申請案之衍生設計。 This design is related to the derivative design of the patent application No. 107304474.
本設計物品之設計要點在於物品的形狀。 The design point of this design item lies in the shape of the item.
圖式所揭露之虛線為本案不主張設計之部分；圖式所揭露之一點鏈線為本案所欲主張設計之部分與不主張設計之部分的邊界線，該一點鏈線實際上不可見，為本案不主張設計之部分。 The dotted line disclosed in the figure is not part of the design of the case; one of the dotted lines disclosed in the figure is the boundary line between the part of the design that is intended to be claimed and the part that does not claim the design. The point of the chain is actually not visible. This case does not claim part of the design.
A-A部分放大圖為前視圖中之A-A部分的放大圖。 A-A partial enlarged view is an enlarged view of the A-A portion in the front view.
B-B線剖面圖為A-A部分放大圖中之B-B線處的剖面圖。 The cross-sectional view taken along line B-B is a cross-sectional view taken along the line B-B in the enlarged view of the A-A section.
C-C線剖面圖為A-A部分放大圖中之C-C線處的剖面圖。 The cross-sectional view of the C-C line is a cross-sectional view at the C-C line in the enlarged view of the A-A portion.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2018-2099F JP1623279S (en) | 2018-02-02 | 2018-02-02 | |
| JP2018-002099 | 2018-02-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWD195361S true TWD195361S (en) | 2019-01-11 |
Family
ID=65037440
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW107304474D01F TWD195361S (en) | 2018-02-02 | 2018-08-02 | Part of electric contact |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD873685S1 (en) |
| JP (1) | JP1623279S (en) |
| TW (1) | TWD195361S (en) |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4634968A (en) * | 1982-12-20 | 1987-01-06 | The Narda Microwave Corporation | Wide range radiation monitor |
| US4740746A (en) * | 1984-11-13 | 1988-04-26 | Tektronix, Inc. | Controlled impedance microcircuit probe |
| US4716365A (en) * | 1985-10-11 | 1987-12-29 | Lisle Corporation | Circuit tester |
| USD311346S (en) * | 1987-09-25 | 1990-10-16 | Q.A. Technology Company | Electronic test probe |
| US5172051A (en) * | 1991-04-24 | 1992-12-15 | Hewlett-Packard Company | Wide bandwidth passive probe |
| USD397052S (en) * | 1997-04-08 | 1998-08-18 | Societe Chauvin Arnoux | Test lead |
| US7208971B2 (en) * | 2002-10-15 | 2007-04-24 | General Electric Company | Manual probe carriage system and method of using the same |
| US9046568B2 (en) * | 2009-03-27 | 2015-06-02 | Essai, Inc. | Universal spring contact pin and IC test socket therefor |
| CN102004173B (en) * | 2009-09-01 | 2014-02-19 | 鸿富锦精密工业（深圳）有限公司 | Probe |
| TWI421504B (en) * | 2010-07-02 | 2014-01-01 | Isc Co Ltd | Test probe for test and fabrication method thereof |
| US8912803B2 (en) * | 2011-09-19 | 2014-12-16 | Honeywell International, Inc. | Electrostatic shielding technique on high voltage diodes |
| US9829506B2 (en) * | 2012-04-13 | 2017-11-28 | Xcerra Corporation | Test probe assembly and related methods |
| JP6011103B2 (en) * | 2012-07-23 | 2016-10-19 | 山一電機株式会社 | Contact probe and socket for semiconductor device provided with the same |
| USD686098S1 (en) * | 2012-11-14 | 2013-07-16 | Agar Corporation Ltd. | Antenna detection probe for a storage tank |
| JP6269337B2 (en) * | 2014-06-16 | 2018-01-31 | オムロン株式会社 | Probe pin and electronic device using the same |
| JP1529607S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP1529608S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP1529605S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP1529612S (en) * | 2014-12-19 | 2015-07-27 | ||
| US10241133B2 (en) * | 2014-12-31 | 2019-03-26 | Tektronix, Inc. | Probe tip and probe assembly |
| US9810715B2 (en) * | 2014-12-31 | 2017-11-07 | Tektronix, Inc. | High impedance compliant probe tip |
-
2018
- 2018-02-02 JP JPD2018-2099F patent/JP1623279S/ja active Active
- 2018-08-01 US US29/658,652 patent/USD873685S1/en active Active
- 2018-08-02 TW TW107304474D01F patent/TWD195361S/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| USD873685S1 (en) | 2020-01-28 |
| JP1623279S (en) | 2019-01-28 |
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