TWD190540S - Part of probe pin - Google Patents
Part of probe pinInfo
- Publication number
- TWD190540S TWD190540S TW106304545F TW106304545F TWD190540S TW D190540 S TWD190540 S TW D190540S TW 106304545 F TW106304545 F TW 106304545F TW 106304545 F TW106304545 F TW 106304545F TW D190540 S TWD190540 S TW D190540S
- Authority
- TW
- Taiwan
- Prior art keywords
- design
- case
- electrical contact
- article
- parts
- Prior art date
Links
- 239000000523 sample Substances 0.000 title abstract description 3
- 239000004065 semiconductor Substances 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 1
Abstract
【物品用途】;本物品係一種對於被檢查體的電極電接觸之探針(電接觸件)，使用於半導體元件、積體電路等電子零件之試驗裝置。;【設計說明】;本案之設計要點在於物品的形狀。;A-B部分放大圖係將前視圖的A-B部分放大顯示之圖式。;圖式所揭露之實線係本案欲主張設計之部分；圖式所揭露之虛線係本案不主張設計之部分；圖式中一點鏈線係本案欲主張之部分與不主張設計之部分的分界線，該一點鏈線本身為本案不主張設計之部分。[Use of article] This article is a probe (electrical contact) that makes electrical contact with the electrode of the object to be inspected. It is used as a testing device for electronic components such as semiconductor components and integrated circuits. ;[Design Description];The design key point of this case lies in the shape of the object. ;The enlarged view of part A-B is an enlarged view of part A-B of the front view. ; The solid lines shown in the drawing are the parts of the case where the design is intended to be claimed; the dotted lines shown in the drawing are the parts of the case where the design is not claimed; Boundary line, the point chain line itself is a part of the design that is not advocated in this case.
Description
本物品係一種對於被檢查體的電極電接觸之探針(電接觸件)，使用於半導體元件、積體電路等電子零件之試驗裝置。 This article is a test device for an electronic component such as a semiconductor element or an integrated circuit, which is a probe (electrical contact) for electrical contact with an electrode of a test object.
本案之設計要點在於物品的形狀。 The design point of this case is the shape of the item.
A-B部分放大圖係將前視圖的A-B部分放大顯示之圖式。 The A-B partial enlargement diagram enlarges the A-B part of the front view.
圖式所揭露之實線係本案欲主張設計之部分；圖式所揭露之虛線係本案不主張設計之部分；圖式中一點鏈線係本案欲主張之部分與不主張設計之部分的分界線，該一點鏈線本身為本案不主張設計之部分。 The solid line disclosed in the figure is the part of the design that is intended to be claimed in the present case; the dotted line disclosed in the drawing does not claim the part of the design; the point chain in the figure is the boundary between the part of the case and the part of the design that does not claim the design. The point chain itself is not part of the design of the case.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2017-2475F JP1592871S (en) | 2017-02-10 | 2017-02-10 | |
| JP2017-002475 | 2017-02-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWD190540S true TWD190540S (en) | 2018-05-21 |
Family
ID=60570635
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW106304545F TWD190540S (en) | 2017-02-10 | 2017-08-09 | Part of probe pin |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD867183S1 (en) |
| JP (1) | JP1592871S (en) |
| TW (1) | TWD190540S (en) |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD397052S (en) * | 1997-04-08 | 1998-08-18 | Societe Chauvin Arnoux | Test lead |
| CN102004173B (en) * | 2009-09-01 | 2014-02-19 | 鸿富锦精密工业（深圳）有限公司 | Probe |
| US8912803B2 (en) * | 2011-09-19 | 2014-12-16 | Honeywell International, Inc. | Electrostatic shielding technique on high voltage diodes |
| US9829506B2 (en) * | 2012-04-13 | 2017-11-28 | Xcerra Corporation | Test probe assembly and related methods |
| JP6011103B2 (en) * | 2012-07-23 | 2016-10-19 | 山一電機株式会社 | Contact probe and socket for semiconductor device provided with the same |
| USD686098S1 (en) * | 2012-11-14 | 2013-07-16 | Agar Corporation Ltd. | Antenna detection probe for a storage tank |
| JP6269337B2 (en) * | 2014-06-16 | 2018-01-31 | オムロン株式会社 | Probe pin and electronic device using the same |
| JP6484137B2 (en) | 2014-11-26 | 2019-03-13 | 株式会社日本マイクロニクス | Probe and contact inspection device |
| JP1529608S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP1529605S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP1529607S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP1529612S (en) * | 2014-12-19 | 2015-07-27 |
-
2017
- 2017-02-10 JP JPD2017-2475F patent/JP1592871S/ja active Active
- 2017-07-28 US US29/612,176 patent/USD867183S1/en active Active
- 2017-08-09 TW TW106304545F patent/TWD190540S/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JP1592871S (en) | 2017-12-11 |
| USD867183S1 (en) | 2019-11-19 |
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