USD867183S1 - Probe pin - Google Patents
Probe pin Download PDFInfo
- Publication number
- USD867183S1 USD867183S1 US29/612,176 US201729612176F USD867183S US D867183 S1 USD867183 S1 US D867183S1 US 201729612176 F US201729612176 F US 201729612176F US D867183 S USD867183 S US D867183S
- Authority
- US
- United States
- Prior art keywords
- probe pin
- view
- probe
- pin
- design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Description
The broken lines shown in the figures represent portions of the probe pin that form no part of the claimed design. The line-dot broken lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.
Claims (1)
- The ornamental design for a probe pin, as shown and described.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017-002475 | 2017-02-10 | ||
JPD2017-2475F JP1592871S (en) | 2017-02-10 | 2017-02-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD867183S1 true USD867183S1 (en) | 2019-11-19 |
Family
ID=60570635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/612,176 Active USD867183S1 (en) | 2017-02-10 | 2017-07-28 | Probe pin |
Country Status (3)
Country | Link |
---|---|
US (1) | USD867183S1 (en) |
JP (1) | JP1592871S (en) |
TW (1) | TWD190540S (en) |
Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD397052S (en) * | 1997-04-08 | 1998-08-18 | Societe Chauvin Arnoux | Test lead |
US20110050261A1 (en) * | 2009-09-01 | 2011-03-03 | Hon Hai Precision Industry Co., Ltd. | Test probe |
US20130069669A1 (en) * | 2011-09-19 | 2013-03-21 | Vasu MOGAVEERA | Electrostatic shielding technique on high voltage diodes |
USD686098S1 (en) * | 2012-11-14 | 2013-07-16 | Agar Corporation Ltd. | Antenna detection probe for a storage tank |
US20150070040A1 (en) * | 2012-04-13 | 2015-03-12 | Xcerra Corporation | Test probe assembly and related methods |
US20150369859A1 (en) * | 2012-07-23 | 2015-12-24 | Yamaichi Electronics Co., Ltd. | Contact probe and semiconductor element socket provided with same |
KR20160063284A (en) | 2014-11-26 | 2016-06-03 | 가부시키가이샤 니혼 마이크로닉스 | Probe and contact inspection device |
USD769748S1 (en) * | 2014-12-15 | 2016-10-25 | Omron Corporation | Probe pin |
USD769749S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
USD776551S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD776552S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
US20170138985A1 (en) * | 2014-06-16 | 2017-05-18 | Omron Corporation | Probe pin and electronic device using the same |
-
2017
- 2017-02-10 JP JPD2017-2475F patent/JP1592871S/ja active Active
- 2017-07-28 US US29/612,176 patent/USD867183S1/en active Active
- 2017-08-09 TW TW106304545F patent/TWD190540S/en unknown
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD397052S (en) * | 1997-04-08 | 1998-08-18 | Societe Chauvin Arnoux | Test lead |
US20110050261A1 (en) * | 2009-09-01 | 2011-03-03 | Hon Hai Precision Industry Co., Ltd. | Test probe |
US20130069669A1 (en) * | 2011-09-19 | 2013-03-21 | Vasu MOGAVEERA | Electrostatic shielding technique on high voltage diodes |
US20150070040A1 (en) * | 2012-04-13 | 2015-03-12 | Xcerra Corporation | Test probe assembly and related methods |
US20150369859A1 (en) * | 2012-07-23 | 2015-12-24 | Yamaichi Electronics Co., Ltd. | Contact probe and semiconductor element socket provided with same |
USD686098S1 (en) * | 2012-11-14 | 2013-07-16 | Agar Corporation Ltd. | Antenna detection probe for a storage tank |
US20170138985A1 (en) * | 2014-06-16 | 2017-05-18 | Omron Corporation | Probe pin and electronic device using the same |
KR20160063284A (en) | 2014-11-26 | 2016-06-03 | 가부시키가이샤 니혼 마이크로닉스 | Probe and contact inspection device |
USD769748S1 (en) * | 2014-12-15 | 2016-10-25 | Omron Corporation | Probe pin |
USD776551S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD776552S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD769749S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
Also Published As
Publication number | Publication date |
---|---|
TWD190540S (en) | 2018-05-21 |
JP1592871S (en) | 2017-12-11 |
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