TWD177828S - Probe pin for ic socket - Google Patents

Probe pin for ic socket

Info

Publication number
TWD177828S
TWD177828S TW104303168F TW104303168F TWD177828S TW D177828 S TWD177828 S TW D177828S TW 104303168 F TW104303168 F TW 104303168F TW 104303168 F TW104303168 F TW 104303168F TW D177828 S TWD177828 S TW D177828S
Authority
TW
Taiwan
Prior art keywords
integrated circuit
socket
probe pin
case
article
Prior art date
Application number
TW104303168F
Other languages
Chinese (zh)
Inventor
Hirotada Teranishi
Takahiro Sakai
Original Assignee
歐姆龍股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 歐姆龍股份有限公司 filed Critical 歐姆龍股份有限公司
Publication of TWD177828S publication Critical patent/TWD177828S/en

Links

Abstract

【物品用途】;本案設計之物品係積體電路插座用探針引腳，連接於積體電路之通電檢查所使用之積體電路插座。;【設計說明】;本案設計係新穎獨特之樣式，藉由獨特地設計積體電路插座用探針引腳，可顯現出先前技藝所未有之視覺效果。[Use of article] The article designed in this case is a probe pin for an integrated circuit socket, which is connected to the integrated circuit socket used for power inspection of the integrated circuit. ;[Design Description];The design of this case is a novel and unique style. By uniquely designing the probe pins for integrated circuit sockets, it can show visual effects that have never been seen before.

TW104303168F 2014-12-15 2015-06-11 Probe pin for ic socket TWD177828S (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-27894F JP1529608S (en) 2014-12-15 2014-12-15

Publications (1)

Publication Number Publication Date
TWD177828S true TWD177828S (en) 2016-08-21

Family

ID=53764635

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104303168F TWD177828S (en) 2014-12-15 2015-06-11 Probe pin for ic socket

Country Status (3)

Country Link
US (1) USD776552S1 (en)
JP (1) JP1529608S (en)
TW (1) TWD177828S (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6269337B2 (en) * 2014-06-16 2018-01-31 オムロン株式会社 Probe pin and electronic device using the same
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
JP1592871S (en) * 2017-02-10 2017-12-11
USD847757S1 (en) * 2017-08-30 2019-05-07 Kabushiki Kaisha Nihon Micronics Probe pin
JP1622968S (en) * 2018-02-02 2019-01-28
JP1622969S (en) * 2018-02-02 2019-01-28
JP1626667S (en) * 2018-02-02 2019-03-18
JP1626668S (en) * 2018-02-02 2019-03-18
JP1623280S (en) * 2018-02-02 2019-01-28
USD873161S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
JP1623279S (en) * 2018-02-02 2019-01-28
JP1622970S (en) * 2018-02-02 2019-01-28
JP1624757S (en) * 2018-05-16 2019-02-18
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
TWD226028S (en) * 2022-04-29 2023-06-21 南韓商普因特工程有限公司 Semiconductor probe pin
TWD227961S (en) * 2022-04-29 2023-10-11 南韓商普因特工程有限公司 Semiconductor probe pin
JP1742821S (en) * 2022-12-08 2023-04-25 electrical contact
USD1090440S1 (en) * 2023-01-12 2025-08-26 Johnstech International Corporation Spring probe contact assembly
JP1762925S (en) * 2023-03-09 2024-02-05 Length measuring device
JP1762926S (en) * 2023-03-09 2024-02-05 Length measuring device
JP1762947S (en) * 2023-03-09 2024-02-05 Length measuring device
JP1762946S (en) * 2023-03-09 2024-02-05 Length measuring device
USD1106975S1 (en) * 2023-05-23 2025-12-23 Kabushiki Kaisha Nihon Micronics Electric contact

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2011036800A1 (en) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス Contactor and electrical connection device
KR101058146B1 (en) * 2009-11-11 2011-08-24 하이콘 주식회사 Spring contacts and sockets with spring contacts
TWD138876S1 (en) * 2010-01-27 2011-02-01 日本麥克隆尼股份有限公司 Electric contact
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (en) * 2010-04-09 2012-08-15 山一電機株式会社 Probe pin and IC socket having the same
JP5352525B2 (en) 2010-04-28 2013-11-27 日本航空電子工業株式会社 Probe pin contact, probe pin, and connection jig for electronic devices
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5708430B2 (en) * 2011-10-14 2015-04-30 オムロン株式会社 Contact
JP5699899B2 (en) * 2011-10-14 2015-04-15 オムロン株式会社 Contact
TWD157152S (en) 2012-05-08 2013-11-11 日本麥克隆尼股份有限公司 Electric contact
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Also Published As

Publication number Publication date
JP1529608S (en) 2015-07-27
USD776552S1 (en) 2017-01-17

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