TWD227961S - Semiconductor probe pin - Google Patents
Semiconductor probe pin Download PDFInfo
- Publication number
- TWD227961S TWD227961S TW111305315F TW111305315F TWD227961S TW D227961 S TWD227961 S TW D227961S TW 111305315 F TW111305315 F TW 111305315F TW 111305315 F TW111305315 F TW 111305315F TW D227961 S TWD227961 S TW D227961S
- Authority
- TW
- Taiwan
- Prior art keywords
- probe pin
- semiconductor probe
- semiconductor
- item
- design
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract description 7
- 239000000523 sample Substances 0.000 title 1
- 230000002950 deficient Effects 0.000 abstract description 2
- 239000000463 material Substances 0.000 abstract description 2
- 239000002184 metal Substances 0.000 abstract description 2
- 235000012431 wafers Nutrition 0.000 abstract description 2
- 238000001514 detection method Methods 0.000 abstract 1
- 238000007689 inspection Methods 0.000 description 1
Abstract
【物品用途】;本設計物品是一種半導體檢測針，用於通過接觸半導體晶片或半導體器件等物體來檢查物體是否有缺陷。本設計物品的材質為金屬。;【設計說明】;無。[Use of item]; This design item is a semiconductor detection needle, which is used to check whether the object is defective by contacting objects such as semiconductor wafers or semiconductor devices. The material of this design item is metal. ;[Design Description];None.
Description
本設計物品是一種半導體檢測針，用於通過接觸半導體晶片或半導體器件等物體來檢查物體是否有缺陷。本設計物品的材質為金屬。This design item is a semiconductor inspection needle, which is used to check whether the object is defective by contacting objects such as semiconductor wafers or semiconductor devices. The material of this design item is metal.
無。without.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR20220017283 | 2022-04-29 | ||
| KR30-2022-0017283 | 2022-04-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWD227961S true TWD227961S (en) | 2023-10-11 |
Family
ID=88875276
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111305315F TWD227961S (en) | 2022-04-29 | 2022-10-27 | Semiconductor probe pin |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWD227961S (en) |
-
2022
- 2022-10-27 TW TW111305315F patent/TWD227961S/en unknown
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