TWD233293S - Electric contact - Google Patents
Electric contact Download PDFInfo
- Publication number
- TWD233293S TWD233293S TW112304606F TW112304606F TWD233293S TW D233293 S TWD233293 S TW D233293S TW 112304606 F TW112304606 F TW 112304606F TW 112304606 F TW112304606 F TW 112304606F TW D233293 S TWD233293 S TW D233293S
- Authority
- TW
- Taiwan
- Prior art keywords
- design
- article
- case
- chain line
- semiconductor components
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 abstract description 6
- 238000012360 testing method Methods 0.000 abstract description 4
- 238000007689 inspection Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 2
Abstract
【物品用途】;本物品係用以對半導體晶片等半導體元件的電特性進行試驗檢查的電性接觸件，且係組裝於半導體元件的試驗檢查裝置而使用者。;【設計說明】;本物品的設計要點在於物品的形狀。;圖式所揭露之虛線部分為本案不主張設計之部分。圖式所揭露之一點鏈線僅為本案欲主張設計之部分與不主張設計之部分之分界線，該一點鏈線本身為本案不主張設計之部分。[Purpose of the article]; This article is an electrical contact for testing and inspecting the electrical characteristics of semiconductor components such as semiconductor chips, and is used when assembled in a test and inspection device for semiconductor components. ;[Design description]; The design point of this article lies in the shape of the article. ; The dotted line part disclosed in the figure is the part that this case does not claim to design. The dotted chain line disclosed in the figure is only the boundary between the part that this case intends to claim to design and the part that does not claim to design. The dotted chain line itself is the part that this case does not claim to design.
Description
本物品係用以對半導體晶片等半導體元件的電特性進行試驗檢查的電性接觸件，且係組裝於半導體元件的試驗檢查裝置而使用者。This article is an electrical contact for testing the electrical characteristics of semiconductor components such as semiconductor chips, and is used when assembled in a test and inspection device for semiconductor components.
本物品的設計要點在於物品的形狀。The key point of this item's design lies in its shape.
圖式所揭露之虛線部分為本案不主張設計之部分。圖式所揭露之一點鏈線僅為本案欲主張設計之部分與不主張設計之部分之分界線，該一點鏈線本身為本案不主張設計之部分。The dotted line part of the diagram is the part that the present invention does not claim to design. The dotted chain line of the diagram is only the boundary between the part that the present invention intends to claim to design and the part that the present invention does not claim to design. The dotted chain line itself is the part that the present invention does not claim to design.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023-004350 | 2023-03-06 | ||
| JP2023004350F JP1755925S (en) | 2023-03-06 | 2023-03-06 | electrical contacts |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWD233293S true TWD233293S (en) | 2024-09-01 |
Family
ID=88418410
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW112304606F TWD233293S (en) | 2023-03-06 | 2023-09-06 | Electric contact |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD1087034S1 (en) |
| JP (1) | JP1755925S (en) |
| TW (1) | TWD233293S (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP1755925S (en) * | 2023-03-06 | 2023-10-23 | electrical contacts |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWD207332S (en) | 2019-09-27 | 2020-09-21 | 湧德電子股份有限公司 | Terminal |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4917017B2 (en) * | 2005-03-07 | 2012-04-18 | 株式会社日本マイクロニクス | Probe for energization test and electrical connection device using the same |
| US20090009197A1 (en) * | 2007-07-02 | 2009-01-08 | Kabushiki Kaisha Nihon Micronics | Probe for electrical test |
| USD590350S1 (en) * | 2008-04-21 | 2009-04-14 | Hon Hai Precision Ind. Co., Ltd. | Electrical contact |
| USD615494S1 (en) * | 2009-11-17 | 2010-05-11 | Cheng Uei Precision Industry Co., Ltd. | Battery connector contact |
| JP1646397S (en) * | 2019-05-21 | 2019-11-25 | ||
| JP7353859B2 (en) * | 2019-08-09 | 2023-10-02 | 株式会社日本マイクロニクス | Electrical contacts and electrical connection devices |
| JP1755925S (en) * | 2023-03-06 | 2023-10-23 | electrical contacts |
-
2023
- 2023-03-06 JP JP2023004350F patent/JP1755925S/en active Active
- 2023-09-05 US US29/911,553 patent/USD1087034S1/en active Active
- 2023-09-06 TW TW112304606F patent/TWD233293S/en unknown
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWD207332S (en) | 2019-09-27 | 2020-09-21 | 湧德電子股份有限公司 | Terminal |
Also Published As
| Publication number | Publication date |
|---|---|
| JP1755925S (en) | 2023-10-23 |
| USD1087034S1 (en) | 2025-08-05 |
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