TWD222981S - Part of electric contact - Google Patents
Part of electric contact Download PDFInfo
- Publication number
- TWD222981S TWD222981S TW111302017F TW111302017F TWD222981S TW D222981 S TWD222981 S TW D222981S TW 111302017 F TW111302017 F TW 111302017F TW 111302017 F TW111302017 F TW 111302017F TW D222981 S TWD222981 S TW D222981S
- Authority
- TW
- Taiwan
- Prior art keywords
- electrical contact
- article
- inspected
- names
- showing
- Prior art date
Links
- 239000000523 sample Substances 0.000 abstract description 4
- 239000004065 semiconductor Substances 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 abstract 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical group C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
Images
Abstract
【物品用途】;本物品為一種對於被檢查體的電極進行電性接觸的電性接觸子(又稱“探針”，probe pin)，且係使用於半導體元件或積體電路等電子零件的測試裝置中。本物品係具有：與被檢查體接觸的接觸子部分；以及安裝於電性接觸子保持具的台座部分。如顯示使用狀態及各部名稱的參考圖1及顯示使用狀態及各部名稱的參考圖2所示，可將複數個本物品安裝至電性接觸子保持具來使用。;【設計說明】;本物品之設計要點在於物品的形狀。;圖式所揭露之虛線部分為本案不主張設計之部分。[Use of article]; This article is an electrical contact (also known as a "probe", probe pin) that makes electrical contact with the electrode of the object to be inspected, and is used for electronic parts such as semiconductor components or integrated circuits. in the test device. This product system has: a contact part that is in contact with the object to be inspected; and a base part that is attached to the electrical contact holder. As shown in Reference Figure 1 showing the usage status and the names of each part, and Reference Figure 2 showing the usage status and the names of each part, multiple pieces of this article can be attached to the electrical contact holder for use. ;[Design Description];The design key point of this item lies in the shape of the item. ;The dotted line parts revealed in the diagram are parts of the case that are not designed to be designed.
Description
本物品為一種對於被檢查體的電極進行電性接觸的電性接觸子(又稱“探針”，probe pin)，且係使用於半導體元件或積體電路等電子零件的測試裝置中。本物品係具有：與被檢查體接觸的接觸子部分；以及安裝於電性接觸子保持具的台座部分。如顯示使用狀態及各部名稱的參考圖1及顯示使用狀態及各部名稱的參考圖2所示，可將複數個本物品安裝至電性接觸子保持具來使用。 This article is an electrical contact (also known as "probe", probe pin) that makes electrical contact with the electrodes of the object to be inspected, and is used in testing devices for electronic components such as semiconductor elements or integrated circuits. This product system has: a contact sub-section which is in contact with the object to be inspected; and a pedestal part installed on the electrical contact sub-holder. As shown in reference FIG. 1 showing the state of use and the names of each part, and FIG. 2 showing the state of use and the names of each part, a plurality of this article can be attached to the electrical contact holder for use.
本物品之設計要點在於物品的形狀。 The key point of the design of this item is the shape of the item.
圖式所揭露之虛線部分為本案不主張設計之部分。 The dotted line part disclosed in the drawing is the part not claimed in the design of this case.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021-023374 | 2021-10-27 | ||
| JP2021023374F JP1715945S (en) | 2021-10-27 | 2021-10-27 | Electrical contact |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWD222981S true TWD222981S (en) | 2023-01-01 |
Family
ID=81680513
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111302017F TWD222981S (en) | 2021-10-27 | 2022-04-26 | Part of electric contact |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD1043581S1 (en) |
| JP (1) | JP1715945S (en) |
| TW (1) | TWD222981S (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD1043581S1 (en) * | 2021-10-27 | 2024-09-24 | Kabushiki Kaisha Nihon Micronics | Electric contact |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5543439Y2 (en) * | 1971-09-14 | 1980-10-13 | ||
| US6888362B2 (en) * | 2000-11-09 | 2005-05-03 | Formfactor, Inc. | Test head assembly for electronic components with plurality of contoured microelectronic spring contacts |
| USD553086S1 (en) * | 2006-09-26 | 2007-10-16 | Cheng Uei Precision Industry Co., Ltd. | Contact of board to board connector |
| USD568247S1 (en) * | 2007-09-21 | 2008-05-06 | Cheng Uei Precision Industry Co., Ltd. | Terminal of connector |
| JP5069542B2 (en) * | 2007-12-03 | 2012-11-07 | 株式会社日本マイクロニクス | Probe card |
| USD598864S1 (en) * | 2008-01-24 | 2009-08-25 | Cheng Uei Precision Industry Co., Ltd. | I/O connector |
| USD634273S1 (en) * | 2010-08-30 | 2011-03-15 | Mattel, Inc. | Electrical terminal |
| USD657312S1 (en) * | 2011-02-25 | 2012-04-10 | Armorworks Enterprises, Llc | Energy attenuating link |
| USD710302S1 (en) * | 2012-11-28 | 2014-08-05 | American Ceramic Technology | Reactor vessel radiation shielding |
| USD741798S1 (en) * | 2014-12-29 | 2015-10-27 | Armando Dominguez | Generator standby electric power mechanical interlock |
| USD798235S1 (en) * | 2016-09-29 | 2017-09-26 | Armando Dominguez | Universal circuit breaker interlock |
| USD852755S1 (en) * | 2018-04-04 | 2019-07-02 | Cheng Uei Precision Industry Co., Ltd. | Connector contact |
| USD920913S1 (en) * | 2019-04-02 | 2021-06-01 | Libest Inc. | Electrode assembly |
| JP1646397S (en) * | 2019-05-21 | 2019-11-25 | ||
| JP2022185454A (en) * | 2021-06-02 | 2022-12-14 | 株式会社日本マイクロニクス | probe unit |
| JP1715945S (en) * | 2021-10-27 | 2022-05-26 | Electrical contact |
-
2021
- 2021-10-27 JP JP2021023374F patent/JP1715945S/en active Active
-
2022
- 2022-04-26 TW TW111302017F patent/TWD222981S/en unknown
- 2022-04-26 US US29/836,312 patent/USD1043581S1/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD1043581S1 (en) * | 2021-10-27 | 2024-09-24 | Kabushiki Kaisha Nihon Micronics | Electric contact |
Also Published As
| Publication number | Publication date |
|---|---|
| USD1043581S1 (en) | 2024-09-24 |
| JP1715945S (en) | 2022-05-26 |
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