TWD222981S - 電性接觸子之部分 - Google Patents

電性接觸子之部分 Download PDF

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Publication number
TWD222981S
TWD222981S TW111302017F TW111302017F TWD222981S TW D222981 S TWD222981 S TW D222981S TW 111302017 F TW111302017 F TW 111302017F TW 111302017 F TW111302017 F TW 111302017F TW D222981 S TWD222981 S TW D222981S
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TW
Taiwan
Prior art keywords
electrical contact
article
inspected
names
showing
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TW111302017F
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English (en)
Inventor
成田聡
原子翔
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日商日本麥克隆尼股份有限公司
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Publication of TWD222981S publication Critical patent/TWD222981S/zh

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Abstract

【物品用途】;本物品為一種對於被檢查體的電極進行電性接觸的電性接觸子(又稱“探針”,probe pin),且係使用於半導體元件或積體電路等電子零件的測試裝置中。本物品係具有:與被檢查體接觸的接觸子部分;以及安裝於電性接觸子保持具的台座部分。如顯示使用狀態及各部名稱的參考圖1及顯示使用狀態及各部名稱的參考圖2所示,可將複數個本物品安裝至電性接觸子保持具來使用。;【設計說明】;本物品之設計要點在於物品的形狀。;圖式所揭露之虛線部分為本案不主張設計之部分。

Description

電性接觸子之部分
本物品為一種對於被檢查體的電極進行電性接觸的電性接觸子(又稱“探針”,probe pin),且係使用於半導體元件或積體電路等電子零件的測試裝置中。本物品係具有:與被檢查體接觸的接觸子部分;以及安裝於電性接觸子保持具的台座部分。如顯示使用狀態及各部名稱的參考圖1及顯示使用狀態及各部名稱的參考圖2所示,可將複數個本物品安裝至電性接觸子保持具來使用。
本物品之設計要點在於物品的形狀。
圖式所揭露之虛線部分為本案不主張設計之部分。
TW111302017F 2021-10-27 2022-04-26 電性接觸子之部分 TWD222981S (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021023374F JP1715945S (ja) 2021-10-27 2021-10-27 電気接触子
JP2021-023374 2021-10-27

Publications (1)

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TWD222981S true TWD222981S (zh) 2023-01-01

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TW111302017F TWD222981S (zh) 2021-10-27 2022-04-26 電性接觸子之部分

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US (1) USD1043581S1 (zh)
JP (1) JP1715945S (zh)
TW (1) TWD222981S (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1043581S1 (en) * 2021-10-27 2024-09-24 Kabushiki Kaisha Nihon Micronics Electric contact

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5543439Y2 (zh) * 1971-09-14 1980-10-13
US6888362B2 (en) * 2000-11-09 2005-05-03 Formfactor, Inc. Test head assembly for electronic components with plurality of contoured microelectronic spring contacts
USD553086S1 (en) * 2006-09-26 2007-10-16 Cheng Uei Precision Industry Co., Ltd. Contact of board to board connector
USD568247S1 (en) * 2007-09-21 2008-05-06 Cheng Uei Precision Industry Co., Ltd. Terminal of connector
JP5069542B2 (ja) * 2007-12-03 2012-11-07 株式会社日本マイクロニクス プローブカード
USD598864S1 (en) * 2008-01-24 2009-08-25 Cheng Uei Precision Industry Co., Ltd. I/O connector
USD634273S1 (en) * 2010-08-30 2011-03-15 Mattel, Inc. Electrical terminal
USD657312S1 (en) * 2011-02-25 2012-04-10 Armorworks Enterprises, Llc Energy attenuating link
USD710302S1 (en) * 2012-11-28 2014-08-05 American Ceramic Technology Reactor vessel radiation shielding
USD741798S1 (en) * 2014-12-29 2015-10-27 Armando Dominguez Generator standby electric power mechanical interlock
USD798235S1 (en) * 2016-09-29 2017-09-26 Armando Dominguez Universal circuit breaker interlock
USD852755S1 (en) * 2018-04-04 2019-07-02 Cheng Uei Precision Industry Co., Ltd. Connector contact
USD920913S1 (en) * 2019-04-02 2021-06-01 Libest Inc. Electrode assembly
JP1646397S (zh) * 2019-05-21 2019-11-25
JP2022185454A (ja) * 2021-06-02 2022-12-14 株式会社日本マイクロニクス プローブユニット
JP1715945S (ja) * 2021-10-27 2022-05-26 電気接触子

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1043581S1 (en) * 2021-10-27 2024-09-24 Kabushiki Kaisha Nihon Micronics Electric contact

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JP1715945S (ja) 2022-05-26
USD1043581S1 (en) 2024-09-24

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