TWD229529S - Part of electric contact - Google Patents
Part of electric contact Download PDFInfo
- Publication number
- TWD229529S TWD229529S TW112302619F TW112302619F TWD229529S TW D229529 S TWD229529 S TW D229529S TW 112302619 F TW112302619 F TW 112302619F TW 112302619 F TW112302619 F TW 112302619F TW D229529 S TWD229529 S TW D229529S
- Authority
- TW
- Taiwan
- Prior art keywords
- design
- article
- intended
- electrical contact
- chain line
- Prior art date
Links
- 239000000523 sample Substances 0.000 abstract description 2
- 239000004065 semiconductor Substances 0.000 abstract description 2
Abstract
【物品用途】;本物品為一種電性接觸件(探針)，係對於被檢查體的電極進行電性接觸，並且使用在半導體元件、積體電路等電子零件的試驗裝置中。;【設計說明】;本物品之設計要點在於物品的形狀。;圖式所揭露之虛線部分係顯示物品中不主張設計之部分。圖式所揭露之一點鏈線係顯示欲主張設計之部分與不主張設計之部分的邊界線，該一點鏈線本身為本案不主張設計之部分。[Use of article] This article is an electrical contact (probe) that makes electrical contact with the electrode of the object to be inspected and is used in testing equipment for electronic components such as semiconductor components and integrated circuits. ;[Design Description];The design key point of this item lies in the shape of the item. ;The dotted lines shown in the drawings show parts of the article that are not intended to be designed. The dotted chain line disclosed in the drawing shows the boundary line between the part where design is intended to be claimed and the part where design is not claimed. The dotted chain line itself is the part where design is not claimed in this case.
Description
本物品為一種電性接觸件(探針)，係對於被檢查體的電極進行電性接觸，並且使用在半導體元件、積體電路等電子零件的試驗裝置中。This article is an electrical contact (probe) that makes electrical contact with the electrode of the object to be inspected and is used in testing equipment for electronic components such as semiconductor elements and integrated circuits.
本物品之設計要點在於物品的形狀。The design key point of this item lies in the shape of the item.
圖式所揭露之虛線部分係顯示物品中不主張設計之部分。圖式所揭露之一點鏈線係顯示欲主張設計之部分與不主張設計之部分的邊界線，該一點鏈線本身為本案不主張設計之部分。The dotted lines shown in the drawings show parts of the article that are not intended to be designed. The dotted chain line disclosed in the drawing shows the boundary line between the part where design is intended to be claimed and the part where design is not claimed. The dotted chain line itself is the part where design is not claimed in this case.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022026424F JP1742821S (en) | 2022-12-08 | 2022-12-08 | electrical contact |
| JP2022-026424 | 2022-12-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWD229529S true TWD229529S (en) | 2024-01-11 |
Family
ID=86055050
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW112302619F TWD229529S (en) | 2022-12-08 | 2023-05-25 | Part of electric contact |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD1106976S1 (en) |
| JP (1) | JP1742821S (en) |
| TW (1) | TWD229529S (en) |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2319610A (en) * | 1941-09-12 | 1943-05-18 | Gen Electric | Electric contact member |
| DE202007000243U1 (en) * | 2007-01-08 | 2007-05-10 | Great Performance Industries Co., Ltd. | Telescopic stylus for e.g. cell phone, has positioning device with positioning opening, pressure spring and two pins, where spring and pins are accommodated in opening and pins are provided at both ends of spring and project from opening |
| USD595235S1 (en) * | 2008-09-02 | 2009-06-30 | Iriso Electronics Co., Ltd. | Electrical contact |
| TWD173861S (en) * | 2014-12-02 | 2016-02-21 | 日本麥克隆尼股份有限公司 | Electric contact |
| JP1529606S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP1529608S (en) * | 2014-12-15 | 2015-07-27 | ||
| JP6610322B2 (en) * | 2016-02-15 | 2019-11-27 | オムロン株式会社 | Probe pin and inspection apparatus using the same |
| JP6221031B1 (en) * | 2016-12-16 | 2017-11-01 | 日本電産リード株式会社 | Contact probe and electrical connection jig |
| JP1623279S (en) * | 2018-02-02 | 2019-01-28 | ||
| JP1624757S (en) * | 2018-05-16 | 2019-02-18 | ||
| TWD227961S (en) * | 2022-04-29 | 2023-10-11 | 南韓商普因特工程有限公司 | Semiconductor probe pin |
-
2022
- 2022-12-08 JP JP2022026424F patent/JP1742821S/en active Active
-
2023
- 2023-05-23 US US29/876,516 patent/USD1106976S1/en active Active
- 2023-05-25 TW TW112302619F patent/TWD229529S/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JP1742821S (en) | 2023-04-25 |
| USD1106976S1 (en) | 2025-12-23 |
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