JP1646397S - - Google Patents
Info
- Publication number
- JP1646397S JP1646397S JP2019011016F JP2019011016F JP1646397S JP 1646397 S JP1646397 S JP 1646397S JP 2019011016 F JP2019011016 F JP 2019011016F JP 2019011016 F JP2019011016 F JP 2019011016F JP 1646397 S JP1646397 S JP 1646397S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019011016F JP1646397S (en) | 2019-05-21 | 2019-05-21 | |
| US29/713,906 USD931228S1 (en) | 2019-05-21 | 2019-11-19 | Electrical contact |
| TW108307106F TWD209939S (en) | 2019-05-21 | 2019-11-20 | Electric contacts |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019011016F JP1646397S (en) | 2019-05-21 | 2019-05-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP1646397S true JP1646397S (en) | 2019-11-25 |
Family
ID=68610810
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019011016F Active JP1646397S (en) | 2019-05-21 | 2019-05-21 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD931228S1 (en) |
| JP (1) | JP1646397S (en) |
| TW (1) | TWD209939S (en) |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU2003261854A1 (en) * | 2003-05-13 | 2004-12-03 | Kabushiki Kaisha Nihon Micronics | Probe for testing electric conduction |
| US7679389B2 (en) * | 2005-03-07 | 2010-03-16 | Kabushiki Kaisha Nihon Micronics | Probe for electrical test and electrical connecting apparatus using it |
| JP5113392B2 (en) * | 2007-01-22 | 2013-01-09 | 株式会社日本マイクロニクス | Probe and electrical connection device using the same |
| JP5123533B2 (en) * | 2007-02-01 | 2013-01-23 | 株式会社日本マイクロニクス | Probe for energization test and manufacturing method thereof |
| JP2008203036A (en) * | 2007-02-19 | 2008-09-04 | Micronics Japan Co Ltd | Electrical connection device |
| JP5046909B2 (en) * | 2007-12-21 | 2012-10-10 | 株式会社日本マイクロニクス | Contact for electrical test, electrical connection device using the contact, and method for manufacturing contact |
| JP2009270880A (en) * | 2008-05-02 | 2009-11-19 | Micronics Japan Co Ltd | Contact for electrical test of electronic device, manufacturing method thereof, and probe assembly |
| US8089294B2 (en) * | 2008-08-05 | 2012-01-03 | WinMENS Technologies Co., Ltd. | MEMS probe fabrication on a reusable substrate for probe card application |
| JP5631131B2 (en) * | 2010-09-17 | 2014-11-26 | 株式会社日本マイクロニクス | Probe for probe test and probe assembly |
| USD665361S1 (en) * | 2011-02-15 | 2012-08-14 | Omron Corporation | Electric connector terminal |
| USD702646S1 (en) * | 2012-08-29 | 2014-04-15 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| JP2021028603A (en) * | 2019-08-09 | 2021-02-25 | 株式会社日本マイクロニクス | Electric contact and electrical connection device |
| JP7353859B2 (en) * | 2019-08-09 | 2023-10-02 | 株式会社日本マイクロニクス | Electrical contacts and electrical connection devices |
-
2019
- 2019-05-21 JP JP2019011016F patent/JP1646397S/ja active Active
- 2019-11-19 US US29/713,906 patent/USD931228S1/en active Active
- 2019-11-20 TW TW108307106F patent/TWD209939S/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| TWD209939S (en) | 2021-02-21 |
| USD931228S1 (en) | 2021-09-21 |