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本物品は、半導体チップ等の半導体デバイスの電気特性を試験検査するための電気接触子であり、半導体デバイスの試験検査装置に組み込まれて使用される物品である。This article is an electrical contact for testing and inspecting the electrical characteristics of a semiconductor device such as a semiconductor chip, and is an article that is used by being incorporated into a test and inspection apparatus for semiconductor devices.