TWD177826S - Probe pin for ic socket - Google Patents

Probe pin for ic socket

Info

Publication number
TWD177826S
TWD177826S TW104303166F TW104303166F TWD177826S TW D177826 S TWD177826 S TW D177826S TW 104303166 F TW104303166 F TW 104303166F TW 104303166 F TW104303166 F TW 104303166F TW D177826 S TWD177826 S TW D177826S
Authority
TW
Taiwan
Prior art keywords
integrated circuit
socket
probe pin
case
article
Prior art date
Application number
TW104303166F
Other languages
Chinese (zh)
Inventor
Hirotada Teranishi
Takahiro Sakai
Original Assignee
歐姆龍股份有限公司
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 歐姆龍股份有限公司, Omron Tateisi Electronics Co filed Critical 歐姆龍股份有限公司
Publication of TWD177826S publication Critical patent/TWD177826S/en

Links

Abstract

【物品用途】;本案設計之物品係積體電路插座用探針引腳，連接於積體電路之通電檢查所使用之積體電路插座。;【設計說明】;本案設計係新穎獨特之樣式，藉由獨特地設計積體電路插座用探針引腳，可顯現出先前技藝所未有之視覺效果。[Use of the article] The article designed in this case is a probe pin for an integrated circuit socket, which is connected to the integrated circuit socket used for power inspection of the integrated circuit. ;[Design Description];The design of this case is a novel and unique style. By uniquely designing the probe pins for integrated circuit sockets, it can show visual effects unprecedented in previous techniques.

TW104303166F 2014-12-15 2015-06-11 Probe pin for ic socket TWD177826S (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-27892F JP1529607S (en) 2014-12-15 2014-12-15

Publications (1)

Publication Number Publication Date
TWD177826S true TWD177826S (en) 2016-08-21

Family

ID=53764634

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104303166F TWD177826S (en) 2014-12-15 2015-06-11 Probe pin for ic socket

Country Status (3)

Country Link
US (1) USD769748S1 (en)
JP (1) JP1529607S (en)
TW (1) TWD177826S (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1592871S (en) * 2017-02-10 2017-12-11
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
JP1622968S (en) * 2018-02-02 2019-01-28
JP1622969S (en) * 2018-02-02 2019-01-28
JP1623279S (en) * 2018-02-02 2019-01-28
JP1623280S (en) * 2018-02-02 2019-01-28
JP1622970S (en) * 2018-02-02 2019-01-28
USD873161S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
JP1626667S (en) * 2018-02-02 2019-03-18
JP1626668S (en) * 2018-02-02 2019-03-18
JP1624757S (en) * 2018-05-16 2019-02-18
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1015282S1 (en) * 2022-02-01 2024-02-20 Johnstech International Corporation Spring pin tip

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2011036800A1 (en) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス Contactor and electrical connection device
KR101058146B1 (en) * 2009-11-11 2011-08-24 하이콘 주식회사 Spring contacts and sockets with spring contacts
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (en) * 2010-04-09 2012-08-15 山一電機株式会社 Probe pin and IC socket having the same
JP5352525B2 (en) 2010-04-28 2013-11-27 日本航空電子工業株式会社 Probe pin contact, probe pin, and connection jig for electronic devices
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5699899B2 (en) * 2011-10-14 2015-04-15 オムロン株式会社 Contact
JP5708430B2 (en) * 2011-10-14 2015-04-30 オムロン株式会社 Contact
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead

Also Published As

Publication number Publication date
USD769748S1 (en) 2016-10-25
JP1529607S (en) 2015-07-27

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