JP1626668S - - Google Patents
Info
- Publication number
- JP1626668S JP1626668S JPD2018-2097F JP2018002097F JP1626668S JP 1626668 S JP1626668 S JP 1626668S JP 2018002097 F JP2018002097 F JP 2018002097F JP 1626668 S JP1626668 S JP 1626668S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2018-2097F JP1626668S (ja) | 2018-02-02 | 2018-02-02 | |
US29/658,650 USD873683S1 (en) | 2018-02-02 | 2018-08-01 | Electric contact |
TW107304473D01F TWD197823S (zh) | 2018-02-02 | 2018-08-02 | 電性接觸子之部分 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2018-2097F JP1626668S (ja) | 2018-02-02 | 2018-02-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP1626668S true JP1626668S (ja) | 2019-03-18 |
Family
ID=65718439
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JPD2018-2097F Active JP1626668S (ja) | 2018-02-02 | 2018-02-02 |
Country Status (3)
Country | Link |
---|---|
US (1) | USD873683S1 (ja) |
JP (1) | JP1626668S (ja) |
TW (1) | TWD197823S (ja) |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4634968A (en) * | 1982-12-20 | 1987-01-06 | The Narda Microwave Corporation | Wide range radiation monitor |
US4740746A (en) * | 1984-11-13 | 1988-04-26 | Tektronix, Inc. | Controlled impedance microcircuit probe |
US4716365A (en) * | 1985-10-11 | 1987-12-29 | Lisle Corporation | Circuit tester |
USD311346S (en) * | 1987-09-25 | 1990-10-16 | Q.A. Technology Company | Electronic test probe |
US5172051A (en) * | 1991-04-24 | 1992-12-15 | Hewlett-Packard Company | Wide bandwidth passive probe |
USD397052S (en) * | 1997-04-08 | 1998-08-18 | Societe Chauvin Arnoux | Test lead |
US7208971B2 (en) * | 2002-10-15 | 2007-04-24 | General Electric Company | Manual probe carriage system and method of using the same |
US9046568B2 (en) * | 2009-03-27 | 2015-06-02 | Essai, Inc. | Universal spring contact pin and IC test socket therefor |
CN102004173B (zh) * | 2009-09-01 | 2014-02-19 | 鸿富锦精密工业(深圳)有限公司 | 探针 |
TWI421504B (zh) * | 2010-07-02 | 2014-01-01 | Isc Co Ltd | 測試用的測試探針以及其製造方法 |
US8912803B2 (en) * | 2011-09-19 | 2014-12-16 | Honeywell International, Inc. | Electrostatic shielding technique on high voltage diodes |
US9829506B2 (en) * | 2012-04-13 | 2017-11-28 | Xcerra Corporation | Test probe assembly and related methods |
JP6011103B2 (ja) * | 2012-07-23 | 2016-10-19 | 山一電機株式会社 | コンタクトプローブ及びそれを備えた半導体素子用ソケット |
USD686098S1 (en) * | 2012-11-14 | 2013-07-16 | Agar Corporation Ltd. | Antenna detection probe for a storage tank |
JP6269337B2 (ja) * | 2014-06-16 | 2018-01-31 | オムロン株式会社 | プローブピン、および、これを用いた電子デバイス |
JP1529607S (ja) * | 2014-12-15 | 2015-07-27 | ||
JP1529608S (ja) * | 2014-12-15 | 2015-07-27 | ||
JP1529605S (ja) * | 2014-12-15 | 2015-07-27 | ||
JP1529612S (ja) * | 2014-12-19 | 2015-07-27 | ||
US10241133B2 (en) * | 2014-12-31 | 2019-03-26 | Tektronix, Inc. | Probe tip and probe assembly |
US9810715B2 (en) * | 2014-12-31 | 2017-11-07 | Tektronix, Inc. | High impedance compliant probe tip |
-
2018
- 2018-02-02 JP JPD2018-2097F patent/JP1626668S/ja active Active
- 2018-08-01 US US29/658,650 patent/USD873683S1/en active Active
- 2018-08-02 TW TW107304473D01F patent/TWD197823S/zh unknown
Also Published As
Publication number | Publication date |
---|---|
USD873683S1 (en) | 2020-01-28 |
TWD197823S (zh) | 2019-06-01 |