USD769747S1 - Probe pin - Google Patents
Probe pin Download PDFInfo
- Publication number
- USD769747S1 USD769747S1 US29/530,261 US201529530261F USD769747S US D769747 S1 USD769747 S1 US D769747S1 US 201529530261 F US201529530261 F US 201529530261F US D769747 S USD769747 S US D769747S
- Authority
- US
- United States
- Prior art keywords
- probe pin
- view
- probe
- pin
- design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Description
The broken lines depict the environmental subject matter only and form no part of the claimed design. The dot-dash line represents the boundary of the claimed design.
Claims (1)
- The ornamental design for a probe pin, as shown and described.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014-027891 | 2014-02-17 | ||
JPD2014-27891F JP1529606S (en) | 2014-12-15 | 2014-12-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD769747S1 true USD769747S1 (en) | 2016-10-25 |
Family
ID=53764633
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/530,261 Active USD769747S1 (en) | 2014-12-15 | 2015-06-15 | Probe pin |
Country Status (3)
Country | Link |
---|---|
US (1) | USD769747S1 (en) |
JP (1) | JP1529606S (en) |
TW (1) | TWD173714S (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
USD1030689S1 (en) * | 2022-04-29 | 2024-06-11 | Point Engineering Co., Ltd. | Semiconductor probe pin |
Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD507197S1 (en) * | 2004-11-22 | 2005-07-12 | Fu-Cheng Sun | Measure tape |
JP2011232181A (en) | 2010-04-28 | 2011-11-17 | Japan Aviation Electronics Industry Ltd | Contact for probe pin, probe pin and connecting jig for electronic device |
USD662895S1 (en) * | 2010-01-27 | 2012-07-03 | Kabushiki Kaisha Nihon Micronics | Electric contact |
USD665744S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
USD665745S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
US8366496B2 (en) * | 2010-03-18 | 2013-02-05 | Hon Hai Precision Ind. Co., Ltd. | Composite contact assembly having lower contact with contact engaging points offset from each other |
US8460010B2 (en) * | 2009-09-28 | 2013-06-11 | Kabushiki Kaisha Nihon Micronics | Contact and electrical connecting apparatus |
US8669774B2 (en) * | 2010-04-09 | 2014-03-11 | Yamaichi Electronics Co., Ltd. | Probe pin and an IC socket with the same |
US8808038B2 (en) * | 2009-11-11 | 2014-08-19 | Hicon Co., Ltd. | Spring contact and a socket embedded with spring contacts |
US9130290B2 (en) * | 2011-10-14 | 2015-09-08 | Omron Corporation | Bellows body contactor having a fixed touch piece |
USD749968S1 (en) * | 2014-01-24 | 2016-02-23 | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | Electrical test lead |
USD750987S1 (en) * | 2014-01-24 | 2016-03-08 | Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. | Interactive test probe for battery tester |
US9322846B2 (en) * | 2011-10-14 | 2016-04-26 | Omron Corporation | Contactor |
-
2014
- 2014-12-15 JP JPD2014-27891F patent/JP1529606S/ja active Active
-
2015
- 2015-06-11 TW TW104303165F patent/TWD173714S/en unknown
- 2015-06-15 US US29/530,261 patent/USD769747S1/en active Active
Patent Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD507197S1 (en) * | 2004-11-22 | 2005-07-12 | Fu-Cheng Sun | Measure tape |
US8460010B2 (en) * | 2009-09-28 | 2013-06-11 | Kabushiki Kaisha Nihon Micronics | Contact and electrical connecting apparatus |
US8808038B2 (en) * | 2009-11-11 | 2014-08-19 | Hicon Co., Ltd. | Spring contact and a socket embedded with spring contacts |
USD662895S1 (en) * | 2010-01-27 | 2012-07-03 | Kabushiki Kaisha Nihon Micronics | Electric contact |
US8366496B2 (en) * | 2010-03-18 | 2013-02-05 | Hon Hai Precision Ind. Co., Ltd. | Composite contact assembly having lower contact with contact engaging points offset from each other |
US8669774B2 (en) * | 2010-04-09 | 2014-03-11 | Yamaichi Electronics Co., Ltd. | Probe pin and an IC socket with the same |
JP2011232181A (en) | 2010-04-28 | 2011-11-17 | Japan Aviation Electronics Industry Ltd | Contact for probe pin, probe pin and connecting jig for electronic device |
USD665744S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
USD665745S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
US9130290B2 (en) * | 2011-10-14 | 2015-09-08 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9322846B2 (en) * | 2011-10-14 | 2016-04-26 | Omron Corporation | Contactor |
USD749968S1 (en) * | 2014-01-24 | 2016-02-23 | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | Electrical test lead |
USD750987S1 (en) * | 2014-01-24 | 2016-03-08 | Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. | Interactive test probe for battery tester |
Non-Patent Citations (11)
Title |
---|
Taiwanese Office Action issued in TW Appl. No. 104303166 on Oct. 27, 2015. |
Taiwanese Office Action issued in TW Appl. No. 104303167 on Oct. 27, 2015. |
Taiwanese Office Action issued in TW Appl. No. 104303168 on Oct. 27, 2015. |
Taiwanese Office Action issued in TW Appl. No. 104303169 on Oct. 27, 2015. |
U.S. Appl. No. 29/530,260, filed Jun. 15, 2015. |
U.S. Appl. No. 29/530,263, filed Jun. 15, 2015. |
U.S. Appl. No. 29/530,264, filed Jun. 15, 2015. |
U.S. Appl. No. 29/530,265, filed Jun. 15, 2015. |
U.S. Appl. No. 29/530,266, filed Jun. 15, 2015. |
U.S. Appl. No. 29/530,394, filed Jun. 16, 2015. |
U.S. Appl. No. 29/530,396, filed Jun. 16, 2015. |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
USD1030689S1 (en) * | 2022-04-29 | 2024-06-11 | Point Engineering Co., Ltd. | Semiconductor probe pin |
Also Published As
Publication number | Publication date |
---|---|
TWD173714S (en) | 2016-02-11 |
JP1529606S (en) | 2015-07-27 |
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