TWD175500S - A part of probe pin for continuity test - Google Patents

A part of probe pin for continuity test

Info

Publication number
TWD175500S
TWD175500S TW104304715F TW104304715F TWD175500S TW D175500 S TWD175500 S TW D175500S TW 104304715 F TW104304715 F TW 104304715F TW 104304715 F TW104304715 F TW 104304715F TW D175500 S TWD175500 S TW D175500S
Authority
TW
Taiwan
Prior art keywords
case
design
probe pin
continuity test
chain line
Prior art date
Application number
TW104304715F
Other languages
Chinese (zh)
Inventor
Hirotada Teranishi
Takahiro Sakai
Original Assignee
歐姆龍股份有限公司
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 歐姆龍股份有限公司, Omron Tateisi Electronics Co filed Critical 歐姆龍股份有限公司
Publication of TWD175500S publication Critical patent/TWD175500S/en

Links

Abstract

【物品用途】;本案設計之物品係導通檢查用探針接腳。;【設計說明】;圖式所揭露之虛線部分,為本案不主張設計之部分。圖式中一點鏈線所圍繞者,係界定本案所欲主張之範圍,該一點鏈線本身為本案不主張設計之部分。;本案設計係新穎獨特之樣式,藉由獨特地設計導通檢查用探針接腳,可顯現出先前技藝所未有之視覺效果。[Use of item]; The item designed in this case is a probe pin for continuity check. ;[Design Description];The dotted line portion disclosed in the drawing is the part of this case that does not require design. The one-point chain line in the diagram is surrounded by the scope of the claim in this case. The one-point chain line itself is the part of the design that is not claimed in this case. ;The design of this case is a novel and unique style. By uniquely designing the probe pins for continuity check, it can show a visual effect that has never been seen before.

TW104304715F 2015-03-04 2015-08-27 A part of probe pin for continuity test TWD175500S (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015004751 2015-03-04

Publications (1)

Publication Number Publication Date
TWD175500S true TWD175500S (en) 2016-05-11

Family

ID=89161699

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104304715F TWD175500S (en) 2015-03-04 2015-08-27 A part of probe pin for continuity test

Country Status (1)

Country Link
TW (1) TWD175500S (en)

Similar Documents

Publication Publication Date Title
MX2021013467A (en) Anti-pdl1 antibodies, activatable anti-pdl1 antibodies, and methods of use thereof.
TWD183605S (en) Portion of a keyboard
TWD173715S (en) Probe pin for ic socket
TWD177828S (en) Probe pin for ic socket
TWD173713S (en) Probe pin for ic socket
TWD177826S (en) Probe pin for ic socket
TWD181044S (en) Portion of a container
TWD183789S (en) Tape measure
MX2017003615A (en) Measurement probe comprising a sensitive element.
TWD180087S (en) Probe pin for continuity test
TWD173714S (en) A part of probe pin for ic socket
TWD177827S (en) A part of probe pin for ic socket
TWD177829S (en) A part of probe pin for ic socket
TWD179291S (en) Part of the coordinate input device
TWD180086S (en) A part of probe pin for continuity test
TWD182148S (en) Probe pin for continuity test
TWD182147S (en) Probe pin for continuity test
TWD175553S (en) A part of probe pin for ic socket
TWD184714S (en) Controller for electronic device
TWD175500S (en) A part of probe pin for continuity test
TWD175503S (en) A part of probe pin for continuity test
TWD175502S (en) A part of probe pin for continuity test
TWD175501S (en) A part of probe pin for continuity test
TWD199832S (en) Probe pin for continuity test
TWD174714S (en) Articulating contact pin