USD769754S1 - Probe pin - Google Patents
Probe pin Download PDFInfo
- Publication number
- USD769754S1 USD769754S1 US29/557,788 US201629557788F USD769754S US D769754 S1 USD769754 S1 US D769754S1 US 201629557788 F US201629557788 F US 201629557788F US D769754 S USD769754 S US D769754S
- Authority
- US
- United States
- Prior art keywords
- probe pin
- view
- probe
- pin
- design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Description
The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design. The dot-dash broken lines in the figures show boundaries of the claimed design.
Claims (1)
- The ornamental design for a probe pin, as shown and described.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2015-20448F JP1554473S (en) | 2015-09-15 | 2015-09-15 | |
JP2015-020448 | 2015-09-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD769754S1 true USD769754S1 (en) | 2016-10-25 |
Family
ID=56414213
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/557,788 Active USD769754S1 (en) | 2015-09-15 | 2016-03-11 | Probe pin |
Country Status (3)
Country | Link |
---|---|
US (1) | USD769754S1 (en) |
JP (1) | JP1554473S (en) |
TW (1) | TWD180086S (en) |
Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD507197S1 (en) * | 2004-11-22 | 2005-07-12 | Fu-Cheng Sun | Measure tape |
USD662895S1 (en) * | 2010-01-27 | 2012-07-03 | Kabushiki Kaisha Nihon Micronics | Electric contact |
USD665744S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
USD665745S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
US8366496B2 (en) * | 2010-03-18 | 2013-02-05 | Hon Hai Precision Ind. Co., Ltd. | Composite contact assembly having lower contact with contact engaging points offset from each other |
US8460010B2 (en) * | 2009-09-28 | 2013-06-11 | Kabushiki Kaisha Nihon Micronics | Contact and electrical connecting apparatus |
US8669774B2 (en) * | 2010-04-09 | 2014-03-11 | Yamaichi Electronics Co., Ltd. | Probe pin and an IC socket with the same |
US8808038B2 (en) * | 2009-11-11 | 2014-08-19 | Hicon Co., Ltd. | Spring contact and a socket embedded with spring contacts |
US9130290B2 (en) * | 2011-10-14 | 2015-09-08 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9207260B2 (en) * | 2011-11-07 | 2015-12-08 | Kabushiki Kaisha Nihon Micronics | Probe block, probe card and probe apparatus both having the probe block |
USD749968S1 (en) * | 2014-01-24 | 2016-02-23 | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | Electrical test lead |
USD750987S1 (en) * | 2014-01-24 | 2016-03-08 | Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. | Interactive test probe for battery tester |
US9322846B2 (en) * | 2011-10-14 | 2016-04-26 | Omron Corporation | Contactor |
-
2015
- 2015-09-15 JP JPD2015-20448F patent/JP1554473S/ja active Active
-
2016
- 2016-03-11 US US29/557,788 patent/USD769754S1/en active Active
- 2016-03-14 TW TW105301314F patent/TWD180086S/en unknown
Patent Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD507197S1 (en) * | 2004-11-22 | 2005-07-12 | Fu-Cheng Sun | Measure tape |
US8460010B2 (en) * | 2009-09-28 | 2013-06-11 | Kabushiki Kaisha Nihon Micronics | Contact and electrical connecting apparatus |
US8808038B2 (en) * | 2009-11-11 | 2014-08-19 | Hicon Co., Ltd. | Spring contact and a socket embedded with spring contacts |
USD662895S1 (en) * | 2010-01-27 | 2012-07-03 | Kabushiki Kaisha Nihon Micronics | Electric contact |
US8366496B2 (en) * | 2010-03-18 | 2013-02-05 | Hon Hai Precision Ind. Co., Ltd. | Composite contact assembly having lower contact with contact engaging points offset from each other |
US8669774B2 (en) * | 2010-04-09 | 2014-03-11 | Yamaichi Electronics Co., Ltd. | Probe pin and an IC socket with the same |
USD665745S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
USD665744S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
US9130290B2 (en) * | 2011-10-14 | 2015-09-08 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9322846B2 (en) * | 2011-10-14 | 2016-04-26 | Omron Corporation | Contactor |
US9207260B2 (en) * | 2011-11-07 | 2015-12-08 | Kabushiki Kaisha Nihon Micronics | Probe block, probe card and probe apparatus both having the probe block |
USD749968S1 (en) * | 2014-01-24 | 2016-02-23 | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | Electrical test lead |
USD750987S1 (en) * | 2014-01-24 | 2016-03-08 | Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. | Interactive test probe for battery tester |
Non-Patent Citations (1)
Title |
---|
U.S. Appl. No. 29/557,790, filed Mar. 11, 2016; Teranishi et al. |
Also Published As
Publication number | Publication date |
---|---|
JP1554473S (en) | 2016-07-25 |
TWD180086S (en) | 2016-12-11 |
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