USD775984S1 - Probe pin - Google Patents
Probe pin Download PDFInfo
- Publication number
- USD775984S1 USD775984S1 US29/536,599 US201529536599F USD775984S US D775984 S1 USD775984 S1 US D775984S1 US 201529536599 F US201529536599 F US 201529536599F US D775984 S USD775984 S US D775984S
- Authority
- US
- United States
- Prior art keywords
- probe pin
- view
- pin
- figures show
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Description
The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design.
The dot-dash broken lines in the figures show boundaries of the claimed design.
The shade lines in the figures show contour and not surface ornamentation.
Claims (1)
- The ornamental design for a probe pin, as shown and described.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015-004749 | 2015-03-04 | ||
JPD2015-4749F JP1542606S (en) | 2015-03-04 | 2015-03-04 | |
JP2015-004750 | 2015-03-04 | ||
JPD2015-4750F JP1543002S (en) | 2015-03-04 | 2015-03-04 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD775984S1 true USD775984S1 (en) | 2017-01-10 |
Family
ID=57688397
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/536,599 Active USD775984S1 (en) | 2015-03-04 | 2015-08-18 | Probe pin |
Country Status (1)
Country | Link |
---|---|
US (1) | USD775984S1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3555497A (en) * | 1967-09-02 | 1971-01-12 | Kawai Musical Instr Mfg Co | Electrical contact member |
USD507197S1 (en) * | 2004-11-22 | 2005-07-12 | Fu-Cheng Sun | Measure tape |
USD662895S1 (en) * | 2010-01-27 | 2012-07-03 | Kabushiki Kaisha Nihon Micronics | Electric contact |
USD665745S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
USD665744S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
US8366496B2 (en) * | 2010-03-18 | 2013-02-05 | Hon Hai Precision Ind. Co., Ltd. | Composite contact assembly having lower contact with contact engaging points offset from each other |
US8460010B2 (en) * | 2009-09-28 | 2013-06-11 | Kabushiki Kaisha Nihon Micronics | Contact and electrical connecting apparatus |
US8669774B2 (en) * | 2010-04-09 | 2014-03-11 | Yamaichi Electronics Co., Ltd. | Probe pin and an IC socket with the same |
US8808038B2 (en) * | 2009-11-11 | 2014-08-19 | Hicon Co., Ltd. | Spring contact and a socket embedded with spring contacts |
US9130290B2 (en) * | 2011-10-14 | 2015-09-08 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9207260B2 (en) * | 2011-11-07 | 2015-12-08 | Kabushiki Kaisha Nihon Micronics | Probe block, probe card and probe apparatus both having the probe block |
USD749968S1 (en) * | 2014-01-24 | 2016-02-23 | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | Electrical test lead |
USD750987S1 (en) * | 2014-01-24 | 2016-03-08 | Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. | Interactive test probe for battery tester |
US9322846B2 (en) * | 2011-10-14 | 2016-04-26 | Omron Corporation | Contactor |
-
2015
- 2015-08-18 US US29/536,599 patent/USD775984S1/en active Active
Patent Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3555497A (en) * | 1967-09-02 | 1971-01-12 | Kawai Musical Instr Mfg Co | Electrical contact member |
USD507197S1 (en) * | 2004-11-22 | 2005-07-12 | Fu-Cheng Sun | Measure tape |
US8460010B2 (en) * | 2009-09-28 | 2013-06-11 | Kabushiki Kaisha Nihon Micronics | Contact and electrical connecting apparatus |
US8808038B2 (en) * | 2009-11-11 | 2014-08-19 | Hicon Co., Ltd. | Spring contact and a socket embedded with spring contacts |
USD662895S1 (en) * | 2010-01-27 | 2012-07-03 | Kabushiki Kaisha Nihon Micronics | Electric contact |
US8366496B2 (en) * | 2010-03-18 | 2013-02-05 | Hon Hai Precision Ind. Co., Ltd. | Composite contact assembly having lower contact with contact engaging points offset from each other |
US8669774B2 (en) * | 2010-04-09 | 2014-03-11 | Yamaichi Electronics Co., Ltd. | Probe pin and an IC socket with the same |
USD665745S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
USD665744S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
US9130290B2 (en) * | 2011-10-14 | 2015-09-08 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9322846B2 (en) * | 2011-10-14 | 2016-04-26 | Omron Corporation | Contactor |
US9207260B2 (en) * | 2011-11-07 | 2015-12-08 | Kabushiki Kaisha Nihon Micronics | Probe block, probe card and probe apparatus both having the probe block |
USD749968S1 (en) * | 2014-01-24 | 2016-02-23 | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | Electrical test lead |
USD750987S1 (en) * | 2014-01-24 | 2016-03-08 | Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. | Interactive test probe for battery tester |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
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