JP1529603S - - Google Patents

Info

Publication number
JP1529603S
JP1529603S JPD2014-27121F JP2014027121F JP1529603S JP 1529603 S JP1529603 S JP 1529603S JP 2014027121 F JP2014027121 F JP 2014027121F JP 1529603 S JP1529603 S JP 1529603S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2014-27121F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2014-27121F priority Critical patent/JP1529603S/ja
Priority to US29/528,958 priority patent/USD764331S1/en
Priority to TW104302992F priority patent/TWD173048S/zh
Application granted granted Critical
Publication of JP1529603S publication Critical patent/JP1529603S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2014-27121F 2014-12-04 2014-12-04 Active JP1529603S (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JPD2014-27121F JP1529603S (zh) 2014-12-04 2014-12-04
US29/528,958 USD764331S1 (en) 2014-12-04 2015-06-02 Probe pin
TW104302992F TWD173048S (zh) 2014-12-04 2015-06-03 積體電路插座用探針引腳

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-27121F JP1529603S (zh) 2014-12-04 2014-12-04

Publications (1)

Publication Number Publication Date
JP1529603S true JP1529603S (zh) 2015-07-27

Family

ID=53764630

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2014-27121F Active JP1529603S (zh) 2014-12-04 2014-12-04

Country Status (3)

Country Link
US (1) USD764331S1 (zh)
JP (1) JP1529603S (zh)
TW (1) TWD173048S (zh)

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
KR100701498B1 (ko) 2006-02-20 2007-03-29 주식회사 새한마이크로텍 반도체 검사용 프로브핀 조립체 및 그 제조방법
WO2011036800A1 (ja) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス 接触子及び電気的接続装置
KR101058146B1 (ko) * 2009-11-11 2011-08-24 하이콘 주식회사 스프링 콘택트 및 스프링 콘택트 내장 소켓
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるｉｃソケット
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5708430B2 (ja) * 2011-10-14 2015-04-30 オムロン株式会社 接触子
JP5699899B2 (ja) * 2011-10-14 2015-04-15 オムロン株式会社 接触子
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Also Published As

Publication number Publication date
USD764331S1 (en) 2016-08-23
TWD173048S (zh) 2016-01-11

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