USD764331S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD764331S1
USD764331S1 US29/528,958 US201529528958F USD764331S US D764331 S1 USD764331 S1 US D764331S1 US 201529528958 F US201529528958 F US 201529528958F US D764331 S USD764331 S US D764331S
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US
United States
Prior art keywords
probe pin
view
probe
pin
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/528,958
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English (en)
Inventor
Hirotada Teranishi
Takahiro Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SAKAI, TAKAHIRO, TERANISHI, HIROTADA
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION CORRECTION OF TYPOGRAPHICAL ERROR IN ASSIGNEE'S ADDRESS PREVIOUSLY RECORDED ON REEL 036767 FRAME 0550 Assignors: SAKAI, TAKAHIRO, TERANISHI, HIROTADA
Application granted granted Critical
Publication of USD764331S1 publication Critical patent/USD764331S1/en
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US29/528,958 2014-12-04 2015-06-02 Probe pin Active USD764331S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2014-27121F JP1529603S (zh) 2014-12-04 2014-12-04
JP2014-027121 2014-12-04

Publications (1)

Publication Number Publication Date
USD764331S1 true USD764331S1 (en) 2016-08-23

Family

ID=53764630

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/528,958 Active USD764331S1 (en) 2014-12-04 2015-06-02 Probe pin

Country Status (3)

Country Link
US (1) USD764331S1 (zh)
JP (1) JP1529603S (zh)
TW (1) TWD173048S (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2007097559A1 (en) 2006-02-20 2007-08-30 Saehanmicrotech Co., Ltd Probe pin assembly and method for manufacturing the same
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
US8366496B2 (en) * 2010-03-18 2013-02-05 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
US8460010B2 (en) * 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2007097559A1 (en) 2006-02-20 2007-08-30 Saehanmicrotech Co., Ltd Probe pin assembly and method for manufacturing the same
US8460010B2 (en) * 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
US8366496B2 (en) * 2010-03-18 2013-02-05 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Korean Office Action issued in KR Appl. No. 30-2015-0027089.
U.S. Appl. No. 29/528,956, filed Jun. 2, 2015; Teranishi et al.
U.S. Appl. No. 29/528,960, filed Jun. 2, 2015; Teranishi et al.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin

Also Published As

Publication number Publication date
TWD173048S (zh) 2016-01-11
JP1529603S (zh) 2015-07-27

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