WO2008111199A1 - 半導体装置及びその製造方法 - Google Patents
半導体装置及びその製造方法 Download PDFInfo
- Publication number
- WO2008111199A1 WO2008111199A1 PCT/JP2007/055130 JP2007055130W WO2008111199A1 WO 2008111199 A1 WO2008111199 A1 WO 2008111199A1 JP 2007055130 W JP2007055130 W JP 2007055130W WO 2008111199 A1 WO2008111199 A1 WO 2008111199A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- film
- over
- semiconductor device
- electrode film
- upper electrode
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 4
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 239000003990 capacitor Substances 0.000 abstract 2
- 230000001681 protective effect Effects 0.000 abstract 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 abstract 1
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 238000005530 etching Methods 0.000 abstract 1
- 239000010419 fine particle Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/55—Capacitors with a dielectric comprising a perovskite structure material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/60—Electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/60—Electrodes
- H01L28/65—Electrodes comprising a noble metal or a noble metal oxide, e.g. platinum (Pt), ruthenium (Ru), ruthenium dioxide (RuO2), iridium (Ir), iridium dioxide (IrO2)
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B53/00—Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B53/00—Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors
- H10B53/30—Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the memory core region
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Memories (AREA)
Abstract
【課題】エッチング時に発生する導電性微粒子による強誘電体キャパシタの短絡を防止でき、特性が良好であるとともに高集積化が可能な半導体装置及びその製造方法を提供する。 【解決手段】半導体基板110に形成されたトランジスタを覆う絶縁膜の上に、下部電極膜131、強誘電体膜132及び上部電極膜133を形成し、更にその上にキャップ層としてPt膜134を形成する。そして、Pt膜134の上に所定のパターンのハードマスク(TiN膜135及びSiO2膜136)を形成し、Pt膜134及び上部電極膜133をエッチングする。その後、全面に絶縁性保護膜138を形成し、上部電極膜133の側面を絶縁性保護膜138で覆う。次いで、強誘電体膜132及び下部電極膜131をエッチングして、強誘電体キャパシタを形成する。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009503839A JP5212358B2 (ja) | 2007-03-14 | 2007-03-14 | 半導体装置の製造方法 |
PCT/JP2007/055130 WO2008111199A1 (ja) | 2007-03-14 | 2007-03-14 | 半導体装置及びその製造方法 |
US12/541,639 US20090302362A1 (en) | 2007-03-14 | 2009-08-14 | Semiconductor device and method of manufacturing the same |
US13/769,287 US8956881B2 (en) | 2007-03-14 | 2013-02-16 | Method of manufacturing a FeRAM device |
US14/590,117 US20150111310A1 (en) | 2007-03-14 | 2015-01-06 | Semiconductor device and method of manufacturing the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/055130 WO2008111199A1 (ja) | 2007-03-14 | 2007-03-14 | 半導体装置及びその製造方法 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/541,639 Continuation US20090302362A1 (en) | 2007-03-14 | 2009-08-14 | Semiconductor device and method of manufacturing the same |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008111199A1 true WO2008111199A1 (ja) | 2008-09-18 |
Family
ID=39759150
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/055130 WO2008111199A1 (ja) | 2007-03-14 | 2007-03-14 | 半導体装置及びその製造方法 |
Country Status (3)
Country | Link |
---|---|
US (3) | US20090302362A1 (ja) |
JP (1) | JP5212358B2 (ja) |
WO (1) | WO2008111199A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011148830A1 (ja) * | 2010-05-28 | 2011-12-01 | 三菱重工業株式会社 | 半導体素子の窒化珪素膜、窒化珪素膜の製造方法及び装置 |
JP2020126866A (ja) * | 2019-02-01 | 2020-08-20 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法及び半導体装置 |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101617399B (zh) * | 2007-02-27 | 2011-05-18 | 富士通半导体股份有限公司 | 半导体存储器件及其制造、测试方法、封装树脂形成方法 |
CN102696107A (zh) * | 2009-12-18 | 2012-09-26 | 松下电器产业株式会社 | 电阻变化型元件及其制造方法 |
JP2012151292A (ja) * | 2011-01-19 | 2012-08-09 | Fujitsu Semiconductor Ltd | 半導体装置及びその製造方法 |
JP5862290B2 (ja) * | 2011-12-28 | 2016-02-16 | 富士通セミコンダクター株式会社 | 半導体装置とその製造方法 |
US9111944B2 (en) * | 2013-09-09 | 2015-08-18 | Cypress Semiconductor Corporation | Method of fabricating a ferroelectric capacitor |
US9484196B2 (en) | 2014-02-25 | 2016-11-01 | Micron Technology, Inc. | Semiconductor structures including liners comprising alucone and related methods |
US9806129B2 (en) | 2014-02-25 | 2017-10-31 | Micron Technology, Inc. | Cross-point memory and methods for fabrication of same |
US11223014B2 (en) | 2014-02-25 | 2022-01-11 | Micron Technology, Inc. | Semiconductor structures including liners comprising alucone and related methods |
US9577010B2 (en) | 2014-02-25 | 2017-02-21 | Micron Technology, Inc. | Cross-point memory and methods for fabrication of same |
US10003022B2 (en) * | 2014-03-04 | 2018-06-19 | Taiwan Semiconductor Manufacturing Co., Ltd. | RRAM cell structure with conductive etch-stop layer |
US10249819B2 (en) | 2014-04-03 | 2019-04-02 | Micron Technology, Inc. | Methods of forming semiconductor structures including multi-portion liners |
US9768378B2 (en) | 2014-08-25 | 2017-09-19 | Micron Technology, Inc. | Cross-point memory and methods for fabrication of same |
US9748311B2 (en) | 2014-11-07 | 2017-08-29 | Micron Technology, Inc. | Cross-point memory and methods for fabrication of same |
TW201807832A (zh) * | 2016-08-24 | 2018-03-01 | 聯華電子股份有限公司 | 半導體元件及其製作方法 |
US10283700B2 (en) | 2017-06-20 | 2019-05-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor memory structure with magnetic tunnel junction (MTJ) cell |
US10276634B2 (en) * | 2017-06-20 | 2019-04-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor memory structure with magnetic tunnel junction (MTJ) cell |
JP7027916B2 (ja) | 2018-01-31 | 2022-03-02 | 富士通セミコンダクターメモリソリューション株式会社 | 半導体装置及びその製造方法 |
KR20190122421A (ko) * | 2018-04-20 | 2019-10-30 | 삼성전자주식회사 | 반도체 소자 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997035341A1 (fr) * | 1996-03-15 | 1997-09-25 | Hitachi, Ltd. | Dispositif de stockage a semi-conducteur et sa production |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002043540A (ja) * | 1999-05-14 | 2002-02-08 | Toshiba Corp | 半導体装置 |
US6611014B1 (en) * | 1999-05-14 | 2003-08-26 | Kabushiki Kaisha Toshiba | Semiconductor device having ferroelectric capacitor and hydrogen barrier film and manufacturing method thereof |
JP2001036024A (ja) * | 1999-07-16 | 2001-02-09 | Nec Corp | 容量及びその製造方法 |
US6635498B2 (en) * | 2001-12-20 | 2003-10-21 | Texas Instruments Incorporated | Method of patterning a FeRAM capacitor with a sidewall during bottom electrode etch |
US20030143853A1 (en) * | 2002-01-31 | 2003-07-31 | Celii Francis G. | FeRAM capacitor stack etch |
JP2003338608A (ja) * | 2002-05-20 | 2003-11-28 | Oki Electric Ind Co Ltd | 強誘電体キャパシタ及びその製造方法 |
US6943039B2 (en) * | 2003-02-11 | 2005-09-13 | Applied Materials Inc. | Method of etching ferroelectric layers |
US7001821B2 (en) * | 2003-11-10 | 2006-02-21 | Texas Instruments Incorporated | Method of forming and using a hardmask for forming ferroelectric capacitors in a semiconductor device |
JP2005183842A (ja) * | 2003-12-22 | 2005-07-07 | Fujitsu Ltd | 半導体装置の製造方法 |
JP2007266429A (ja) * | 2006-03-29 | 2007-10-11 | Fujitsu Ltd | 半導体装置及びその製造方法 |
JP4690234B2 (ja) * | 2006-03-31 | 2011-06-01 | 富士通セミコンダクター株式会社 | 半導体装置及びその製造方法 |
JP4946214B2 (ja) * | 2006-06-30 | 2012-06-06 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法 |
JP4827653B2 (ja) * | 2006-08-10 | 2011-11-30 | 富士通セミコンダクター株式会社 | 半導体装置とその製造方法 |
JP4983172B2 (ja) * | 2006-09-12 | 2012-07-25 | 富士通セミコンダクター株式会社 | 半導体装置及びその製造方法 |
-
2007
- 2007-03-14 WO PCT/JP2007/055130 patent/WO2008111199A1/ja active Application Filing
- 2007-03-14 JP JP2009503839A patent/JP5212358B2/ja not_active Expired - Fee Related
-
2009
- 2009-08-14 US US12/541,639 patent/US20090302362A1/en not_active Abandoned
-
2013
- 2013-02-16 US US13/769,287 patent/US8956881B2/en not_active Expired - Fee Related
-
2015
- 2015-01-06 US US14/590,117 patent/US20150111310A1/en not_active Abandoned
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997035341A1 (fr) * | 1996-03-15 | 1997-09-25 | Hitachi, Ltd. | Dispositif de stockage a semi-conducteur et sa production |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011148830A1 (ja) * | 2010-05-28 | 2011-12-01 | 三菱重工業株式会社 | 半導体素子の窒化珪素膜、窒化珪素膜の製造方法及び装置 |
JP2011249626A (ja) * | 2010-05-28 | 2011-12-08 | Mitsubishi Heavy Ind Ltd | 半導体素子の窒化珪素膜、窒化珪素膜の製造方法及び装置 |
JP2020126866A (ja) * | 2019-02-01 | 2020-08-20 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法及び半導体装置 |
JP7360004B2 (ja) | 2019-02-01 | 2023-10-12 | 富士通セミコンダクターメモリソリューション株式会社 | 半導体装置の製造方法及び半導体装置 |
Also Published As
Publication number | Publication date |
---|---|
US20090302362A1 (en) | 2009-12-10 |
US20150111310A1 (en) | 2015-04-23 |
US20130161790A1 (en) | 2013-06-27 |
US8956881B2 (en) | 2015-02-17 |
JPWO2008111199A1 (ja) | 2010-06-24 |
JP5212358B2 (ja) | 2013-06-19 |
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