WO2005084948A1 - 耐熱性樹脂積層フィルム並びにこれを含む金属層付き積層フィルム及び半導体装置 - Google Patents
耐熱性樹脂積層フィルム並びにこれを含む金属層付き積層フィルム及び半導体装置 Download PDFInfo
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- WO2005084948A1 WO2005084948A1 PCT/JP2005/003380 JP2005003380W WO2005084948A1 WO 2005084948 A1 WO2005084948 A1 WO 2005084948A1 JP 2005003380 W JP2005003380 W JP 2005003380W WO 2005084948 A1 WO2005084948 A1 WO 2005084948A1
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- resistant resin
- resin layer
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- film
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B15/08—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/20—Layered products comprising a layer of metal comprising aluminium or copper
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/28—Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42
- B32B27/281—Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42 comprising polyimides
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0313—Organic insulating material
- H05K1/0353—Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
- H05K1/036—Multilayers with layers of different types
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2250/00—Layers arrangement
- B32B2250/02—2 layers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/20—Properties of the layers or laminate having particular electrical or magnetic properties, e.g. piezoelectric
- B32B2307/206—Insulating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/30—Properties of the layers or laminate having particular thermal properties
- B32B2307/306—Resistant to heat
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/30—Properties of the layers or laminate having particular thermal properties
- B32B2307/308—Heat stability
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/70—Other properties
- B32B2307/732—Dimensional properties
- B32B2307/734—Dimensional stability
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
- B32B2457/08—PCBs, i.e. printed circuit boards
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
- B32B2457/14—Semiconductor wafers
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0393—Flexible materials
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0137—Materials
- H05K2201/0154—Polyimide
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0355—Metal foils
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/06—Thermal details
- H05K2201/068—Thermal details wherein the coefficient of thermal expansion is important
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31511—Of epoxy ether
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31678—Of metal
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31721—Of polyimide
Definitions
- Heat-resistant resin laminated film laminated film with metal layer including the same, and semiconductor device
- the present invention relates to a heat-resistant resin laminated film, a laminated film with a metal layer including the same, and a semiconductor device. More specifically, the present invention is widely used in the electronics industry.
- V which relates to a method of manufacturing a laminated film with a metal layer for a flexible printed wiring board (FPC), and which includes a method of mounting a semiconductor integrated circuit (IC) such as a tape automated bonding (TAB), a chip-on-film (COF).
- IC semiconductor integrated circuit
- TAB tape automated bonding
- COF chip-on-film
- the present invention relates to a laminated film with a metal layer used in the above method, a semiconductor device using the same, and a method for producing a laminated film with a metal layer.
- TAB has been used as a mounting method for semiconductor integrated circuits.
- a flexible heat-resistant insulating film such as a polyimide film or epoxy resin is used.
- “Three-layer laminate” products in which copper foil is bonded via an adhesive layer have been used.
- the inner lead for mounting the IC has a flying lead structure, so the reduction in strength due to the narrower lead and the ability to reduce the copper foil thickness of about 40 ⁇ m pitch are considered to be the technical limit of miniaturization.
- the COF method in which inner leads are formed on a heat-resistant insulating film and mounted by flip chip (FC) technology is becoming widespread.
- the IC is directly bonded to the copper wiring of the flying lead structure, but in COF, since the IC is bonded to the copper wiring on the heat-resistant insulating film, the heat at the time of bonding is also applied to the heat-resistant insulating film. Will be involved.
- the adhesive of the “three-layer laminate” product used for TAB and general FPC is epoxy -Based resin, phenol-based resin, acrylonitrile-based resin, butadiene-based resin, etc., whose heat resistance is inferior to polyimide used for heat-resistant insulating film, so that the excellent properties of polyimide film cannot be fully utilized .
- IC bonding using the COF method often employs a method in which the tinned wiring and the gold bumps of the IC are bonded together (gang bonding with gold-tin eutectic). The heat and pressure exerted directly on the adhesive layer.
- a "two-layer type” that does not use an adhesive is widely used, and the "two-layer type” is vacuum-deposited on a heat-resistant insulating film such as a polyimide film.
- a heat-resistant insulating film such as a polyimide film.
- a “strike” item is a “strike” item.
- the "two-layer type plating" product a metal layer such as copper is directly formed on the heat-resistant insulating film as the base material, so that the type of the base material and the thickness of the metal layer can be freely changed. There is a problem that adhesion to the metal layer is low. In addition, there is a problem that productivity is not readily increased as soon as a pinhole is formed, so that the cost is high.
- the “two-layer cast” product has high adhesiveness to the metal layer, but is formed by applying a heat-resistant resin layer to the copper foil. There are quality problems such as wrinkling and waving of the copper foil due to shrinkage. Especially when the thickness of the copper foil is 12 m or less, operability is further deteriorated and productivity is reduced.
- the “three-layer laminate” product is manufactured by laminating a commercially available copper foil and a film base material such as polyimide via an adhesive layer, which is advantageous in cost.
- metal foils such as copper foil have been heated and pressed onto an aromatic polyimide multilayer film in which a polyimide resin having a rigid structure is used as the core and a thermoplastic polyimide resin is laminated on the core.
- a laminated FPC substrate called a “pseudo two-layer product” has been proposed (for example, see Patent Document 2).
- FPC substrates have high adhesion to metal foil, but all are used only for copper-clad products.
- One-sided copper-clad products have a problem in that the substrate is greatly warped when the copper layer is etched, that is, when the wiring pattern is formed. Also, even in the case of a double-sided copper-clad product, warpage occurs if there is a difference in the thickness of the thermoplastic polyimide resin layer formed on both sides of the polyimide resin layer in the core portion.
- FPC substrates have also been proposed in which a metal layer is laminated on one surface of a polyimide film via a thermoplastic polyimide resin layer, and a heat-resistant polyimide layer is provided on the opposite polyimide film surface.
- a metal layer is laminated on one surface of a polyimide film via a thermoplastic polyimide resin layer, and a heat-resistant polyimide layer is provided on the opposite polyimide film surface.
- Patent Document 1 JP-A-9 99518 (pages 2-7)
- Patent Document 2 JP-A-2002-114848 (pages 6-8)
- Patent Document 3 JP-A-9-148695 (pages 2-7)
- Patent Document 4 JP-A-2000-96010 (pages 3-7)
- an object of the present invention is to provide a heat-resistant resin laminated film obtained by laminating a heat-resistant resin layer on a heat-resistant resin film such as a polyimide film.
- a laminated film with a metal layer obtained by laminating a heat-resistant insulating film and a metal foil via a heat-resistant resin layer the copper layer is etched, that is, the wiring pattern is formed. Accordingly, an object of the present invention is to provide a laminated film with a metal layer without warpage, and a highly reliable semiconductor device using the same.
- the present invention relates to a heat-resistant resin laminated film in which a heat-resistant resin layer is laminated on at least one side of a heat-resistant insulating film, wherein the coefficient of linear expansion of the heat-resistant resin layer is kA (ppm / ° C )But , K 10 ⁇ kA ⁇ k + 20 (k: coefficient of linear expansion of heat-resistant insulating film) is a heat-resistant resin laminated film.
- kA ppm / ° C
- K 10 ⁇ kA ⁇ k + 20 k: coefficient of linear expansion of heat-resistant insulating film
- the present invention is a heat-resistant resin laminated film in which a heat-resistant resin layer is laminated on at least one surface of a heat-resistant resin film, wherein the heat-resistant resin layer is composed of two or more heat-resistant resin layers. At least one of the heat-resistant resin layers has a linear expansion coefficient kA (ppm / ° C) of k-10 ⁇ kA ⁇ k + 20 (k: linear expansion coefficient of the heat-resistant insulating film).
- kA linear expansion coefficient of the heat-resistant resin laminated film according to claim 1
- the present invention provides a laminated film with a metal layer, wherein a metal foil is laminated on the heat-resistant resin layer side of the heat-resistant resin laminated film of the present invention.
- the present invention provides a semiconductor device including the above-mentioned laminated film with a metal layer of the present invention. Further, the present invention relates to a method for producing a laminated film with a metal layer obtained by laminating a metal foil on at least one surface of a heat-resistant insulating film via a heat-resistant resin layer, wherein the metal foil has a linear expansion coefficient kA (ppm / ° C) is a process of laminating at least one heat-resistant resin layer including a heat-resistant resin layer whose k is within the range of k-10 ⁇ kA ⁇ k + 20 (k: coefficient of linear thermal expansion of the heat-resistant insulating film).
- kA linear expansion coefficient
- the present invention relates to a method for producing a laminated film with a metal layer in which a metal foil is laminated on at least one side of a heat-resistant insulating film via a heat-resistant resin layer, wherein the heat-resistant insulating film has a linear expansion coefficient kA Laminate at least one heat-resistant resin layer, including a heat-resistant resin layer whose (ppm / ° C) is within the range of k-10 ⁇ kA ⁇ k + 20 (k: coefficient of thermal expansion of heat-resistant insulating film) And laminating the heat-resistant insulating film and the heat-resistant resin layer laminate with a metal foil on which at least one heat-resistant resin layer is laminated as required, and performing heat-press bonding.
- a method for manufacturing a laminated film is provided.
- a heat-resistant resin laminated film in which a heat-resistant resin film is laminated on a heat-resistant resin film such as a polyimide film.
- a laminated film with a metal layer laminated via a conductive resin layer the copper layer is etched, that is, a wiring pattern is formed and Then, an FPC board without warpage can be obtained.
- a highly reliable semiconductor device can be provided by using the laminated film with a metal layer of the present invention.
- FIG. 1 is a schematic view showing one embodiment of a printed circuit board according to the present invention.
- FIG. 3 is a schematic view showing one embodiment of a printed circuit board according to the present invention.
- FIG. 4 is a schematic view showing one embodiment of a roll laminator that can be used in the present invention.
- FIG. 5 is a schematic view showing another embodiment of a roll laminator that can be used in the present invention.
- the heat-resistant resin laminated film of the present invention is obtained by laminating a heat-resistant resin layer on at least one surface of a heat-resistant insulating film, and has a linear expansion coefficient kA (ppm / ° C) of the heat-resistant resin layer. Is in the range of k 10 ⁇ kA ⁇ k + 20 (k: coefficient of linear expansion of the heat-resistant insulating film). Also, two or more heat-resistant resin layers may be used.In this case, if there is at least one resin layer whose linear expansion coefficient satisfies the kA (ppm / ° C) force k 10 ⁇ kA ⁇ k + 20 good.
- heat-resistant resin layer A having a linear expansion coefficient kA (ppm / .C) in a range of k-10 ⁇ kA ⁇ k + 20 (k: linear expansion coefficient of a heat-resistant insulating film) is used. Sometimes referred to as "heat resistant resin layer A".
- the coefficient of linear expansion kA (ppm / ° C) is k10 or more, preferably k7 or more, more preferably k-5 or more, and k + 20 or less, preferably k + 15 or less, and more preferably k + 10 or less.
- K coefficient of linear expansion of the heat-resistant insulating film
- the heat-resistant resin laminated film becomes concave when the heat-resistant resin film becomes concave, and conversely, when the coefficient of linear expansion becomes k + 20 or more, the heat-resistant resin layer A becomes concave. Warping occurs.
- the coefficient (k) is 5-25 ppm / ° C, and even 10-20 ppm / ° C. Therefore, the coefficient of linear expansion kA of the heat-resistant resin layer A at this time is 5 to 30 ppm / ° C, preferably 8 to 25 ppm / ° C, and more preferably 11 to 23 ppm / ° C.
- the coefficient of linear expansion includes a coefficient of thermal expansion, a coefficient of humidity expansion, and the like, and the coefficient of linear expansion in the present invention is a coefficient of thermal expansion.
- the coefficient of linear expansion can be measured by a measurement method using a thermomechanical analyzer (TMA method), and it can be used for any of 30 ° C force, 300 ° C, 50 ° C force, 200 ° C, 100 ° C to 300 ° C, etc.
- TMA method thermomechanical analyzer
- the coefficient of linear expansion in the present invention is the average coefficient of linear expansion up to the measurement temperature of the reference temperature force, and is calculated from the formula (1).
- TO reference temperature
- Tt set temperature
- L sample length
- LO sample length at the reference temperature
- Lt sample length at the set temperature
- the reference temperature is room temperature of 25 to 35 ° C
- the heat-resistant resin layer A in each temperature range from room temperature to 100 ° C, or 200 ° C or 300 ° C.
- the coefficient of linear expansion kA (ppm / ° C) is preferably in the range of k-10 ⁇ kA ⁇ k + 20 (k: linear expansion coefficient of the heat-resistant insulating film).
- a temperature of around 300 ° C may be strong depending on the manufacturing process of the heat-resistant resin laminated film, the laminated film with the metal layer using the heat-resistant resin laminated film, or the use conditions of the laminated film with the metal layer. Therefore, it is particularly preferable that the coefficient of linear expansion kA in the temperature range from room temperature to 300 ° C. is in the above range.
- the heat-resistant resin layer A used in the present invention includes an acrylic resin, a polyimide resin, a polyamide resin, a polyamideimide resin, a polyetherimide resin, and a polyethenoresulfone resin. Fats, polysulfone resins, and the like can be used, and the above resins may be used alone or as a mixture of two or more.
- a polyimide resin is preferably used in terms of heat resistance, insulation reliability, and adhesiveness.
- the polyimide resin is a polymer resin in which an imide ring or other cyclic structure is formed from a polyamic acid or an esterified product thereof, which is a precursor thereof, by using heat or an appropriate catalyst.
- an aromatic diamine having a structure represented by the general formula (1)-(3) is used as a diamine component in an amount of 40 mol% or more of the total diamine component. , Preferably at least 50 mol%, more preferably at least 60 mol%. If the content of the aromatic diamine is less than 40 mol%, the coefficient of linear expansion becomes large, and a heat-resistant resin laminated film is obtained. Warpage occurs in the throat.
- R 1 — R ° may be the same or different, and may be a hydrogen atom, an alkyl group having 130 carbon atoms, an alkoxy group having 130 carbon atoms, a halogen, a hydroxyl group, a carboxyl group, a sulfone group) , Nitro group, cyano group is selected.
- aromatic diamine examples include p-dienediamine, m-dienediamine, 2,5-diaminotoluene, 2,4-diaminotoluene, 3,5-diaminobenzoic acid, and 2,6-diamine.
- Minobenzoic acid 2-Methoxy-1,4-phenylenediamine, 2-Hydroxy-1,4-phenylenediamine, 2-Chloro-1,4-phenylenediamine, 2-Ditro-1,4-phenylenediamine, 2-Cyanone 1 , 4 Phagelendiamine, 2,5-diaminosulfonic acid, 4,4, diaminobenzuayuride, 3,4, diaminobenzuayulide, 3,3, diaminobenzuayuride, 3,3, -dimethyl-4,4 Diaminobenzalide, 3-methoxy-4,4, -diaminobenzalide, benzidine, 2,2-dimethylbenzidine, 3,3-dimethylbenzidine, 3,3, diene Methoxybenzidine, 3,3, diclo-benzidine and the like.
- monocyclic aromatic heterocyclic ring systems such as 2,4-diaminopyridine and 2,6-diaminopyridine, and polycyclic rings such as 1,5-diaminonaphthalene and 2,7-diaminofluorene.
- Aromatic diamines and the like can also be used. Among the above diamines, p-phenylenediamine, 4,4, diaminobenzalide and 2,2-dimethylbenzidine are preferably used.
- the siloxane-based diamine represented by the general formula (4) in combination with the above-described diamine, the water absorption of the obtained polyimide-based resin can be reduced.
- siloxane Jiamin coefficient of linear expansion rapidly increases, its ⁇ is 0. 1- 10 mol 0/0 for all Jiamin component, preferably 0. 5-8 mole 0 / 0, preferably a further 1 one 6 mol 0/0.
- n in the general formula (4) represents an integer of 130.
- R 11 and R 12 are the same or different and each represents a lower alkylene group or a phenylene group.
- R 13 to R 16 may be the same or different and each represents a lower alkyl group, a phenyl group or a phenoxy group.
- the water absorption of the heat-resistant resin layer A is 1.5% or less, preferably 1.3% or less, and more preferably 1.2% or less. If the water absorption exceeds 1.5%, warpage occurs due to humidity expansion, or insulation reliability decreases.
- n in the general formula (4) is in the range of 110, preferably 115, and more preferably 115.
- siloxane-based diamine represented by the general formula (4) examples include 1,1,3,3-tetramethyl-1,3-bis (4-aminophenyl) disiloxane, 1,1, 3, 3—tetraphenoxy-1,3 —Bis (4-aminoethyl) disiloxane, 1,1,3,3,5,5-hexamethyl-1,5 bis (4-aminophenyl) trisiloxane, 1,1,3,3-tetraphenyl — 1,3-bis (2-aminoethyl) disiloxane, 1,1,3,3-tetraphenyl-1,3 bis (3-aminopropyl) disiloxane, 1,1,5,5-tetraphenyl-3 , 3-Dimethyl-1,5-bis (3-aminopropyl) trisiloxane, 1,1,5,5-tetraphenyl-3,3-dimethoxy-1,5bis (4aminobutyl) trisiloxane, 1,1,1,1,
- an aliphatic diamine, an alicyclic diamine containing a cyclic hydrocarbon, an aromatic diamine other than the above can be used in combination, and specific examples thereof include 1,3-diaminocyclo Xane, 1,4-diaminocyclohexane, 4,4'-methylenebis (cyclohexylamine), 3,3'-methylenebis (cyclohexylamine), 4,4'-diamino-3,3'-dimethyldicyclohexylmethane 4,4'-Diamino-3,3'-dimethyldicyclohexyl, p-aminobenzylamine, m-aminobenzylamine, 4,4'-diaminodiphenyl ether, 3,3'-diaminodiph Enyl ether, 3,4'-diaminodiphenyl ether, 4,4'-diaminodiphenylsulfone, 3,3'-d
- the polyimide resin used for the heat-resistant resin layer A includes, as a tetracarboxylic acid component, pyromellitic dianhydride, 3,3,4'-biphenyltetracarboxylic dianhydride, 2,3 , 3 ', 4'-biphenyl-tetracarboxylic dianhydride, 2,2,3'-biphenyl-tetracarboxylic dianhydride, 3,4,9,10-perylenetetracarboxylic dianhydride , 2, 3, 6, 7 naphthalenetetracarboxylic dianhydride, 1, 4, 5, 8 naphthalenetetracarboxylic dianhydride, 1,2,5,6 naphthalenetetracarboxylic dianhydride, 3,3 4,4 p-tert-tetracarboxylic dianhydride, 3, 3 4,4 meta-tertratetracarboxylic dianhydride, 2, 3, 6, 7-anthracenete
- pyromellitic dianhydride and 3,3 ', 4,4'-biphenyltetracarboxylic dianhydride are particularly preferred.
- tetracarboxylic acid component examples include an alicyclic tetracarboxylic dianhydride having a cyclic hydrocarbon, an aromatic tetracarboxylic dianhydride other than the above, and specific examples thereof.
- the molecular weight of the polyimide resin used in the present invention can be adjusted by making the tetracarboxylic acid component and the diamine component equimolar, or by making one of them excess. Either the tetracarboxylic acid component or the diamine component can be made excess, and the polymer chain end can be sealed with a terminal blocking agent such as an acid component or an amine component. Dicarboxylic acid or its anhydride is preferably used as a terminal blocking agent for the acid component, and monoamine is preferably used as a terminal blocking agent for the amine component. At this time, it is preferable to make the acid equivalent of the tetracarboxylic acid component including the terminal blocking agent of the acid component or the amine component and the amine equivalent of the diamine component equimolar.
- dicarboxylic acid such as benzoic acid, phthalic anhydride, tetrachlorophthalic anhydride, a-phosphoric acid, or anhydride thereof is used.
- a monoamine may be added as a terminal blocking agent.
- the molar ratio of the tetracarboxylic acid component and the diamine component of the polyimide resin is usually set to 100Z100.
- polyamic acid which is one of the precursors of the polyimide resin
- the compound can be synthesized by selectively combining a tetracarboxylic acid component and a diamine component, and reacting the mixture at a predetermined molar ratio in a solvent at 0 to 80 ° C.
- the monoamine, dicarboxylic acid or anhydride thereof for blocking the polymer chain terminal may be reacted at the same time as the tetracarboxylic dianhydride or diamine.
- tetracarboxylic dianhydride and diamine may be reacted and added after polymerization to cause a reaction.
- Examples of the solvent for synthesizing the polyamic acid include amide polar solvents such as N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, 13-propyne lactone, ⁇ -butyrolataton Rataton-based polar solvents such as ⁇ -force ratactone, ⁇ -force ratactone, ⁇ -force prolactone, ⁇ -force prolatatatone, and other solvents such as methylcellosesolve, methylcellsolveacetate, ethylcellsolvesolve, etilcell.
- amide polar solvents such as N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, 13-propyne lactone, ⁇ -butyrolataton Rataton-based polar solvents such as ⁇ -force ratactone, ⁇ -force ratactone, ⁇ -force prolactone
- Solvent acetate, methyl carbitol, ethyl carbitol, diethylene glycol dimethyl ether (diglyme), and ethyl lactate can be mentioned. These may be used alone or as a mixture of two or more.
- the concentration of the polyamic acid is usually preferably 5 to 60% by weight, more preferably 10 to 40% by weight.
- other resin fillers can be added to the resin used for the heat-resistant resin layer, as long as the effects of the present invention are not impaired.
- Other resins include acrylic resin, acrylonitrile resin, butadiene resin, urethane resin, polyester resin, polyamide resin, polyamideimide resin, polyetherimide resin.
- heat-resistant polymer resins such as epoxy resins, phenol resins, polysulfone resins, and polyethersulfone resins.
- the filler include organic or inorganic fine particles and fillers. Specific examples of the fine particles and the filler include silica, alumina, titanium oxide, quartz powder, magnesium carbonate, potassium carbonate, barium sulfate, magnesium, and talc.
- the total content of these heat-resistant polymer resin / filler is 60% or less, preferably 20% or less, most preferably 0%, based on the total weight of the heat-resistant resin layer A. is there.
- the glass transition temperature of the heat-resistant resin layer A is 250-400 ° C, preferably 260-380 ° C, and more preferably 280-350 ° C.
- the glass transition temperature exceeds 250 ° C, the coefficient of linear expansion from room temperature to 300 ° C becomes too large.
- the glass transition temperature is 400 ° C or more, the adhesiveness is deteriorated.
- the measurement of the glass transition temperature of the heat-resistant resin layer A in the present invention also uses various measurement methods.
- a measurement method using a differential scanning calorimeter (DSC method) a measurement method using a thermomechanical analyzer (TMA method), and a dynamic viscoelasticity measurement method using a dynamic thermomechanical analyzer (DMA Method).
- DSC method differential scanning calorimeter
- TMA method thermomechanical analyzer
- DMA Method dynamic viscoelasticity measurement method using a dynamic thermomechanical analyzer
- the thickness of the heat-resistant resin layer ⁇ ⁇ is not particularly limited, but is usually 0.2-m, preferably 0.1-m.
- the heat-resistant insulating film used in the present invention uses a heat-resistant polymer, for example, aromatic polyimide resin, polyphenylene sulfide resin, aromatic polyamide resin, polyamide imide resin, and the like.
- a heat-resistant polymer for example, aromatic polyimide resin, polyphenylene sulfide resin, aromatic polyamide resin, polyamide imide resin, and the like.
- Specific products include “Kapton” manufactured by Toray DuPont, “Upilex” manufactured by Ube Industries, “Abical” manufactured by Kanegafuchi Chemical Industry Co., Ltd. "Mictron” manufactured by Toray Industries, Inc., and “Bettastar” manufactured by Kuraray Co., Ltd. are examples.
- aromatic polyimide resins are particularly preferably used.
- the glass transition temperature of the heat-resistant insulating film is not particularly limited, but is usually 300 ° C or higher, preferably 400 ° C or higher. Those having no clear glass transition point at 500 ° C or lower are more preferable.
- the thickness of the heat-resistant insulating film is not particularly limited, but is preferably 3 to 150 m, more preferably 5 to 75 m, and particularly preferably 10 to 50 m. If it is less than 3 ⁇ m, the strength as a support may be insufficient. On the other hand, if it exceeds 150 m, the flexibility decreases, and bending may be difficult.
- One or both surfaces of the heat-resistant insulating film used in the present invention are preferably subjected to an adhesion improving treatment according to the purpose.
- Examples of the adhesion improving treatment include a process of physically forming unevenness on the surface of the film by wet blasting or the like in which a liquid in which fine particles such as glass beads are dispersed in sand blast or water is sprayed onto the film at a high speed.
- There are discharge treatments such as a treatment for forming irregularities on the film surface with a permanganic acid solution or an alkali solution, a normal pressure plasma treatment, a corona discharge treatment, and a low-temperature plasma treatment.
- Atmospheric pressure plasma processing refers to an atmosphere in an atmosphere of Ar, N, He, CO, CO, air, water vapor or the like.
- Means a discharge treatment Means a discharge treatment.
- the processing conditions vary depending on the processing apparatus, the type and flow rate of the processing gas, the frequency of the power supply, and the like, but the optimum conditions can be appropriately selected.
- the low-temperature plasma treatment can be performed under reduced pressure, and the method is not particularly limited.
- an internal electrode-type discharge treatment having a drum electrode and a counter electrode composed of a plurality of rod electrodes is used.
- the substrate to be treated is set in the apparatus, and while the treatment gas is adjusted to 1 to 1000 Pa, preferably 5 to 100 Pa, a high voltage of DC or AC is applied between the electrodes to discharge, and the treatment gas is discharged.
- a method of generating plasma and exposing the substrate surface to the plasma for treatment is preferably used.
- the conditions for the low-temperature plasma processing vary depending on the processing apparatus, the type of the processing gas, the pressure, the frequency of the power supply, and the like, but the optimum conditions can be appropriately selected. Examples of the type of processing gas include Ar, N
- CO, air, steam, O, CF, etc. can be used alone or as a mixture.
- the effect of improving adhesiveness may be small compared to low-temperature plasma treatment, so that the heat-resistant resin layer to be laminated easily adheres. Prefer to choose one.
- the heat-resistant resin laminated film of the present invention is used as a laminated film with a metal layer for an FPC board (flexible printed wiring board) in which a metal foil is adhered to the heat-resistant resin layer side.
- FPC board flexible printed wiring board
- the heat-resistant resin laminated film is bonded to a metal foil to produce a laminated film with a metal layer, or in the bonding process of IC chips, etc., at around 300 ° C. Since the temperature can be strong, the coefficient of linear expansion in the temperature range from room temperature (20-35 ° C) to 300 ° C is important.
- the metal layer can be formed by a single method such as lamination of metal foil, vacuum deposition, sputtering, ion plating, electroless plating, electrolytic plating, or a combination of two or more kinds.
- a metal layer is formed by laminating a metal foil on the heat-resistant resin layer side of the heat-resistant resin-laminated film, and then heat-pressing to produce a laminated film with a metal layer.
- the laminating method is most preferable.
- the metal layer used in the present invention is formed of a metal foil such as a copper foil, an aluminum foil, and a SUS foil, and thus a copper foil is usually used.
- Copper foil includes electrolytic copper foil and rolled copper foil. You can do it.
- Metal foils such as copper foils may be subjected to roughing treatment on the bonding surface side in order to improve the adhesiveness with resin or the like.
- the both sides of the copper foil are generally referred to as the S side and the M side, respectively, and when bonding resin or the like, it is usually bonded to the M side. Therefore, the roughening process is usually performed on the M surface side in many cases.
- roughening treatment may be performed on both the S surface and the M surface.
- fine particles of 115 ⁇ m copper are deposited on one or both surfaces of an original foil formed by electrolytic plating by electrodeposition or the like to form irregularities on the surface. It is a process.
- the surface of the copper foil is preferably uneven not only on the S surface but also on the M surface as much as possible. More preferred is a copper foil having a smooth surface on both sides.
- the surface roughness of the copper foil is such that Ra (center line average roughness) on the S surface is 0.5 m or less, preferably 0.4 m or less, and Rz (ten-point average roughness) is 2. O / zm Hereinafter, it is preferably 1.8 ⁇ m or less.
- the Ra force on the M plane is 0.7 ⁇ m or less, preferably 0.5 ⁇ m or less, more preferably 0.4 ⁇ m or less, and Rz is 3.0 ⁇ m or less, preferably 2.0 ⁇ m or less. ⁇ m or less, more preferably 1.8 m or less.
- the thickness of the copper foil is in the range of 11 to 150 m and can be used as appropriate according to the application. However, as the wiring pattern of the FPC becomes finer, the thickness of the copper foil also increases. Thinner is better. However, when the copper foil becomes thinner, it becomes difficult to handle it alone. Copper foil of 3 ⁇ m or 5 ⁇ m thickness adheres to a support (carrier) such as resin or metal foil of about 20-50 m thickness. It is treated as copper foil with a carrier, and is used after peeling off the support after heat-pressing to resin or the like.
- the thickness of the copper foil in the present invention is 20 m or less, preferably 15 m or less, more preferably 10 m or less. In addition, it is 1 m or more, preferably 3 m or more, and more preferably 5 ⁇ m or more.
- the surface of the copper foil is treated to prevent discoloration or the like!
- the protection treatment is generally performed by laminating a thin film layer of a nickel, zinc, chromium compound or the like on the copper foil surface. Further, the surface of the copper foil may be further subjected to a silane coupling treatment in order to improve the adhesiveness with the resin or the like.
- the laminated film with a metal layer of the present invention can be used not only for single-sided or double-sided metal layers, but also for resistance to Various configurations such as a layer configuration of the thermal resin layer can be adopted, and various production methods can be adopted depending on the configurations.
- the evaluation of the warpage in the present invention is performed by measuring a heat-resistant resin laminated film in which a metal foil such as a copper foil is laminated, and the metal layer is entirely etched.
- the measurement may be performed after a heat-resistant resin layer is laminated on the heat-resistant insulating film and heat treatment is appropriately performed.
- force measurement is preferably performed by leaving the sample at room temperature of 20-30 ° C and humidity of 50-60% RH for 24 hours or more. The sample was cut into an arbitrary size such as a 50 mm ⁇ 50 mm mouth and allowed to stand on a flat plate. The height of the four corners was measured, and the average value was used as the warpage value.
- the warp height is 20 mm or more, the sample will be rounded into a cylindrical shape, so that the warp height cannot be measured accurately.
- the warp height is 4 mm or less, preferably 3 mm or less, more preferably 1 mm or less.
- FIG. 1 shows a first embodiment of the laminated film with a metal layer of the present invention.
- FIG. 1 (a) is an embodiment of a laminated film with a single-sided metal layer
- FIG. 1 (b) is an embodiment of a laminated film with a double-sided metal layer.
- the heat-resistant insulating film 2, the heat-resistant resin layer 3, the metal foil 1 Is formed on the laminate.
- the manufacturing method is, for example, to apply a linear expansion coefficient kA (p pm / ° C) force k-10 ⁇ kA ⁇ k + 20 (k: linear expansion coefficient of the heat-resistant insulating film to the heat-resistant resin film 2 or the metal foil 1).
- the heat-resistant resin layer 3 in the range of (2) is formed.
- a metal foil is attached to the heat-resistant insulating film Z obtained in the above, so as to face the heat-resistant resin layer, and then heat-pressed.
- a laminated film with a metal layer is obtained by laminating a heat-resistant insulating film to the laminated body of the metal foil Z heat-resistant resin layer so as to be in close contact with the heat-resistant resin layer, and heat-pressing.
- a heat-resistant resin layer 3 and a metal foil 1 of a laminate obtained by laminating a heat-resistant resin layer 3 on a heat-resistant insulating film 2 or a metal foil The heat-resistant resin layer 3 of the laminate in which the heat-resistant resin layer 3 is laminated on the foil 1 is heat-pressed with the heat-resistant resin layer 3 facing the heat-resistant insulating film 2.
- a high temperature of 350 ° C or higher, more preferably 380 ° C or higher is required. Also, even when the thermocompression bonding is performed at such a high temperature, the bonding strength after bonding is relatively small.
- FIG. 2 shows a second embodiment of the laminated film with a metal layer of the present invention.
- Fig. 2 (a) shows an embodiment of a laminated film with a single-sided metal layer
- Fig. 2 (b) shows an embodiment of a laminated film with a double-sided metal layer, in which a heat-resistant resin layer has a multilayer structure of two or more layers. , At least one of which has a coefficient of linear expansion kA (ppm / .C) 1S k-10 ⁇ kA ⁇ k + 20 (k: coefficient of linear expansion of heat-resistant insulating film). is there.
- a laminated film with a metal layer in which the heat-resistant resin layer A is laminated so as to be in contact with the metal layer is the most preferable mode in which warpage after etching of the metal layer hardly appears.
- a heat-resistant resin layer having a composition and physical properties different from those of the heat-resistant resin layer A is used between the metal layer and the heat-resistant resin layer A for the purpose of improving adhesiveness, etc. It may be provided with a film thickness.
- the thickness of the heat-resistant resin layer provided between the metal layer and the heat-resistant resin layer A is 0.001 to 5 m, preferably 0.01 to 3 m, and more preferably 0.1 to 2 m. .
- As the resin constituting the heat-resistant resin layer a resin similar to the resin used in the heat-resistant resin layer B described later can be used.
- Examples of the method for producing the laminated film with a metal layer shown in Fig. 2 include the following method.
- a multilayer heat-resistant resin layer 4 including at least one heat-resistant resin layer A3 is sequentially laminated.
- the metal foil 1 is attached to the laminate of the heat-resistant insulating film 2 and the heat-resistant resin layer 4 obtained in the above so as to face the heat-resistant resin layer 4 of the laminate, and is heat-pressed.
- the heat-resistant insulating film 2 is bonded to the laminate of the metal foil 1Z heat-resistant resin layer 4 so as to be fitted to the heat-resistant resin layer of the laminate, and heated and pressed to form the laminated film with the metal layer. obtain.
- one or more heat-resistant resin layers are formed on the heat-resistant insulating film 2 and the metal foil 1, respectively, and the obtained heat-resistant insulating film Z laminate of the heat-resistant resin layer and the metal foil Z heat resistance
- the heat-resistant resin layers of the resin layer laminate are bonded to face each other, and then heat-pressed to obtain a laminated film with a metal layer.
- FIG. 3 shows a third embodiment of the laminated film with a metal layer of the present invention.
- FIG. 3 (a) shows an embodiment of a laminated film with a single-sided metal layer
- FIG. 3 (b) shows an embodiment of a laminated film with a double-sided metal layer.
- the laminated film with a metal layer shown in FIG. 3 was particularly preferable in the embodiment shown in FIG.
- the linear expansion coefficient kA (ppm / ° C) on the metal layer side is k-10 ⁇ kA ⁇ k + 20 (k : Heat-resistant resin layer A in the range of the heat-resistant insulating film), and a heat-resistant resin layer with a lower glass transition temperature than the heat-resistant resin layer A on the heat-resistant insulating film side. (A resin layer B).
- the manufacturing method of the laminated film with a metal layer of the third embodiment can be the same as the manufacturing method of the laminated film with a metal layer of the second embodiment.
- a particularly preferable manufacturing method is to laminate the heat-resistant resin layer A3 on the metal foil 1 and the heat-resistant resin layer B5 on the heat-resistant insulating film 2 , respectively.
- Insulating film 2Z A laminated body of heat-resistant resin layer B5 is formed, heat-resistant resin layer A3 and heat-resistant resin layer B5 are bonded so as to face each other, and then heat-pressed to form a laminated film with a metal layer. It is a manufacturing method including a step of obtaining.
- This laminated film with a metal layer does not warp after etching of the metal layer, has high adhesive strength, and can be heated and pressed at a relatively low temperature, which is advantageous in productivity.
- the linear expansion coefficient of the heat-resistant resin layer B (one or two or more heat-resistant resin layers other than the heat-resistant resin layer A that satisfies the above-mentioned range of the coefficient of linear expansion) is as described above. Usually, it is not necessary to fall within the range of the linear expansion coefficient of the layer A, but is about 30 ppmZ ° C to 500 ppmZ ° C, preferably about 40 ppmZ ° C to 200 ppmZ ° C.
- the present inventors have found that if at least one heat-resistant resin layer A described above is present, at least one heat-resistant resin layer B having a larger linear expansion coefficient is present, even if a laminated film and a metal This is the first finding that warpage of a laminated film with layers can be suppressed to a satisfactory degree. For this reason, a resin having better adhesiveness can be employed for forming the heat-resistant resin layer B, whereby the adhesiveness of the laminated film and the laminated film with a metal layer can be further improved.
- thermoplastic resin and Z or a thermosetting resin can be used, and acrylic resin, acrylonitrile-based resin, butadiene-based resin, Urethane resin, polyester resin, epoxy resin, phenol resin, polyimide resin, polyamide resin, polyamideimide resin, polyetherimide resin, polyethersulfone resin And polysulfone resins.
- the above resins may be used alone or in combination of two or more. From the viewpoint of heat resistance, insulation reliability and adhesiveness, polyimide resin, epoxy resin, phenol resin, and polyamide resin are preferably used.
- these resins have fine particles and A filler such as irritant may be added. Specific examples of the fine particles and the filler include silica, alumina, titanium oxide, quartz powder, magnesium carbonate, potassium carbonate, barium sulfate, myric acid, and talc.
- the glass transition temperature of the heat-resistant resin layer B of the present invention is 120 to 280. C, preferably 150-250. C, more preferably 170-220. C.
- the glass transition temperature is lower than 120 ° C, the adhesive strength is good but the wet heat resistance is poor.
- the glass transition temperature is higher than 280 ° C, the adhesiveness is poor.
- various diamines and tetracarboxylic dianhydrides can be used as long as the temperature falls within the above glass transition temperature.
- a siloxane-based diamine represented by the general formula (4) as the diamine component, it is easy to adjust the glass transition temperature of the obtained polyimide-based resin, and it is possible to further reduce the water absorption rate and to improve the adhesion. This is preferable because the force is high.
- n in the general formula (4) represents an integer of 130.
- R 11 and R 12 may be the same or different and each represents a lower alkylene group or a phenylene group.
- R 13 to R 16 may be the same or different and each represents a lower alkyl group, a phenyl group or a phenoxy group.
- the glass transition temperature of the heat-resistant resin layer B of the present invention is 50 to 250 ° C., preferably 80 to 220 ° C. And more preferably 100-200 ° C.
- the glass transition temperature is lower than 50 ° C, heat resistance and wet heat resistance are deteriorated, and when the glass transition temperature is higher than 250 ° C, adhesion is deteriorated.
- the thermosetting resin include unsaturated resins such as epoxy compounds, cyanate compounds, benzoxazole compounds, bismaleimide compounds, and compounds having an acetylene group.
- a resin made of an epoxy compound is preferable.
- the epoxy compound used for the heat-resistant resin layer B of the present invention includes a phenol novolak type epoxy compound, a cresol novolak type epoxy compound, a bisphenol A type epoxy compound, a bisphenol F type epoxy compound, and a bisphenol F type epoxy compound.
- Phenol S-type epoxy compound epoxy compound of aralkyl resin by xylylene bond of thiodiphenol, phenol, naphthol, epoxy compound of phenol dicyclopentadiene resin, cyclic aliphatic epoxy compound, heterocyclic epoxy compound, phthalate Of glycidyl ester-type epoxy compounds, diaminodiphenylmethane, diaminodiphenylsulfone, isocyanuric acid and other polyamines and epichlorohydrin obtained by the reaction of polybasic acids such as acid and dimer acid with epichlorohydrin.
- organopolysiloxane having a glycidyl group or silicon-modified epoxy conjugate obtained by reacting the above-mentioned epoxy compound with the carboxyl-containing organosiloxane can be used, but the present invention is not limited thereto. It is also possible to use a combination of at least one of these epoxy conjugates or silicon-modified epoxy compounds!
- the curing agent for the epoxy compound is not particularly limited, and polyamines such as diethylenetriamine, triethylenetriamine, metaxylenediamine, diaminodiphenylmethane, polyamides such as dimer acid polyamide, and phthalic anhydride Acid anhydrides such as tetrahydromethylphthalic anhydride, hexahydrophthalic anhydride, trimellitic anhydride, methylnadic anhydride, 3-aminophenol, resorcinol, catechol, hydroquinone, pyrogallol, 3-hi Droxybenzoic acid, 3-cyanophenol, 2,3-diaminophenol, 2-amino-3-hydroxybenzoic acid, 3-hydroxyphenylacetamide, 3-hydroxyisophthalic acid, 3-hydroxyphenylacetic acid and 3-phenolsulfone Tertiary acids such as acids, phenol novolak, phenol aralkyl, phenolic resins such as bisphenol A and bisphenol F, resole type phenolic
- thermoplastic resin having plasticity in a temperature range of 80 to 200 ° C may be further added.
- resins include polyolefins such as polyethylene, polypropylene, and ethylene copolymer resins, styrene resins such as polystyrene and ABS resins, polyvinyl chloride, bilidene chloride, polyethylene terephthalate, polyethylene naphthalate, and the like.
- polyamide resins can be used.
- those containing a low water-absorbing dicarboxylic acid having 36 carbon atoms (so-called dimer acid) as an essential component are preferable.
- Polyamide resin containing dimer acid has the power obtained by polycondensation of dimer acid and diamine according to a conventional method.In this case, it contains dicarboxylic acid other than dimer acid such as adipic acid, azelaic acid and sebacic acid as a copolymer component. May be.
- Known diamines such as ethylenediamine, hexamethylenediamine and piperazine can be used, and a mixture of two or more types may be used from the viewpoint of hygroscopicity and solubility.
- the content of such a thermoplastic resin is not particularly limited, but is usually 70% or less, preferably 20% or less based on the weight of the heat-resistant resin layer B.
- a curing accelerator may be added to the thermosetting resin constituting the heat-resistant resin layer B.
- curing accelerators include aromatic polyamines, amine complexes of boron trifluoride such as boron trifluoride triethylamine complex, imidazole derivatives such as 2-alkyl 4-methylimidazole, 2-phenyl-4-alkylimidazole, phthalic anhydride, Organic acids such as trimellitic anhydride, dicyandiamide, and known compounds such as triphenylphosphine can be used.
- the content of such a hardening accelerator is not particularly limited, but is usually 5% based on the weight of the heat-resistant resin layer B. Or less, preferably 1% or less.
- Solvents used for dissolving and mixing the above compounds include methyl sorb, butyl sorb, methyl ethyl ketone, dioxane, acetone, cyclohexanone, cyclopentanone, isobutyl alcohol, isopropyl alcohol, tetrahydrofuran, and dimethyl sulfoxide. , Y butyrolataton, toluene, xylene, benzene, benzyl alcohol, isophorone, methoxymethylbutanol, ethyl lactate, propylene glycol monomethyl ether and its acetate, N-methyl-2-pyrrolidone, and one or more of these Is used.
- the film thickness of the heat-resistant resin layer A (or the total film thickness of the heat-resistant resin layer A when there are a plurality of layers) is the heat-resistant resin layer B (the heat-resistant resin layer B is composed of a plurality of layers). If present, it is at least twice, preferably at least 2.5 times, more preferably at least 3 times the total film thickness. If the thickness of the heat-resistant resin layer A is less than twice the thickness of the heat-resistant resin layer B, the warpage after etching of the metal layer may increase.
- thermocompression bonding in the present invention can be performed using a hot press, a heated roll laminator, or the like. Since the heating roll laminator can continuously heat and press a long film or metal foil, the power of productivity can also be preferably used.
- the thermocompression bonding using a heating roll laminator is performed by passing a film 9 having at least one pair of heating rolls 6 and 7 on which a metal foil 8 and a heat-resistant resin layer are laminated through a heating roll.
- FIG. 4 (a) shows a laminated film with a single-sided metal layer
- FIG. 4 (b) shows a laminated film with a double-sided metal layer, and a thermocompression bonding method using respective heating roll laminators.
- Reference numeral 10 in FIG. 4 (and FIG. 5 described later) indicates a product winding roll.
- the roll of the heating roll laminator can be used in various combinations such as a metal roll, a metal roll, a rubber roll, a rubber roll and a rubber roll.
- a metal roll a metal roll
- a rubber roll a rubber roll
- a rubber roll a rubber roll
- a rubber roll a rubber roll
- heat-pressing is performed so that a copper foil is in contact with the metal roll and a heat-resistant insulating film is in contact with the rubber roll.
- the roll temperature is 200 ° C. or more
- a combination of a metal roll and a metal roll is preferable.
- a combination of a metal roll and a metal roll is used in the case of a laminated film with a double-sided copper layer.
- Conditions such as the roll temperature, roll-up pressure, and transfer speed of the heated roll laminator are appropriately selected depending on the type, composition, production method, and the like of the heat-resistant resin layer used.
- the roll temperature is set in the range of 50-500 ° C, preferably 100-450 ° C.
- the heating of the mouth may be such that only one roll can be heated, but it is preferable that both rolls can be heated. More preferably, both rolls can be heated, and the temperature can be independently controlled.
- the roll-up pressure of the heated roll laminator is generally set in the range of 0.5 to 200 N / mm, preferably 2 to 150 N / mm in linear pressure.
- the transfer speed is generally set in the range of 0.1 to 50 m / min, preferably 0.4 to 30 m / min.
- the lamination When laminating at a roll temperature of 300 ° C. or higher, the lamination may be performed in a nitrogen atmosphere or in a vacuum in order to prevent metal foil such as copper foil from being oxidized.
- a heat-resistant resin film such as a polyimide film or a metal foil such as SUS or aluminum is used as a protective film 11 to form a film in which a heating roll surface and a metal foil 8 or a heat-resistant resin layer are laminated. 9 may be interposed between them and heat-pressed.
- FIG. 5 (a) shows a laminated film with a single-sided metal layer
- FIG. 5 (b) shows a laminated film with a double-sided metal layer, and a thermocompression bonding method using respective heating roll laminators.
- reference numeral 11 denotes a protective film unwinding roll
- reference numeral 12 denotes a protective film rewinding roll.
- An acid / resin solution is applied to at least one surface of a heat-resistant insulating film (eg, a polyimide film) so that the cured film has a thickness of 0.2 to 12 / zm, preferably 0.5 to 10 / ⁇ , more preferably 1 to 1 / zm. Coat to 7 m.
- the coating method include a bar coater, a roll coater, a knife coater, a comma coater, a Reno-Ki coater, a doctor blade float coater, and a gravure coater.
- the solvent of the solution applied on the polyimide film as described above is removed by heating continuously or intermittently at a temperature of about 60 to 200 ° C for 1 to 160 minutes. This is followed by a heat treatment at a temperature range of 200-400 ° C, preferably 240-350 ° C, more preferably 260-320 ° C for 1-48 hours. Then, the polyamide acid resin of the heat resistant resin layer is converted into a polyimide resin to form a laminate of a heat resistant resin layer composed of a polyimide film and a polyimide resin. In the heat treatment in the present invention, the temperature may be increased stepwise to the target temperature in the above range.
- the obtained polyimide film Z is laminated with a copper foil so as to face the heat-resistant resin layer side of the heat-resistant resin layer side of the laminate of the heat-resistant resin layer, and is heat-pressed with a heating roll laminator.
- Figure 5 (For a laminated film with a single-sided metal layer, use Fig. 5 (Fig. 5 a) In the case of a laminated film with a double-sided metal layer, as shown in FIG. 5 (b), a laminate of a copper foil and a polyimide film Z heat-resistant resin layer A is sandwiched between protective films.
- the temperature of the heating roll at this time is, for example, 300 to 500 ° C, preferably 350 to 450 ° C, and more preferably 380 to 420 ° C in the structure shown in FIG.
- the Rhono lap pressure is a linear pressure of 2 to 150 N / mm, preferably 5 to 100 N / mm, and more preferably 10 to 80 N / mm.
- the obtained laminated film with a copper layer may be further heat-treated.
- a heat treatment method may be a batch-type treatment in which the laminated film with a copper layer is wound into a roll, or a roll-to-roll method. The deviation between the continuous processing in the step and the sheet processing in the cut sheet may be used.
- the heat treatment may be performed in a temperature range of 200 to 400 ° C., preferably 240 to 350 ° C., more preferably 260 to 320 ° C. for 1 to 48 hours, and the temperature may be raised stepwise to the target temperature. Further, the treatment is preferably performed in a vacuum or a nitrogen atmosphere in order to prevent oxidation of the copper layer.
- a polyamic acid resin solution having a glass transition temperature lower than that of the heat-resistant resin layer A and a polyimide resin precursor is applied to at least one surface of the polyimide film after curing. Coating, drying, and heat-treating so that the thickness becomes 0.01-1-5 / zm, preferably 0.1-, more preferably 0.5-3 m ⁇ ⁇ Laminate of resin layer B was formed.
- the coating, drying and heat treatment methods are the same as described above.
- the heat-resistant resin layer A and the heat-resistant resin layer B of each of the laminates are bonded together so as to face each other, and then heat-pressed to obtain a laminated film with a copper layer.
- the temperature of the heating roll at this time in the heating and pressing by the heating roll laminator is, for example, 200 to 400 in the structure shown in FIG. C, preferably 250-380. C, more preferably 280-350. C.
- the roll-up pressure is 2 to 100 N / mm, preferably 5 to 80 N / mm, more preferably 10 to 60 N / mm as a linear pressure.
- thermocompression bonding When the temperature of the heating roll is 300 ° C. or less, it is not necessary to perform thermocompression bonding via a protective film as shown in FIG. 5, and it is possible to perform thermocompression bonding by a method as shown in FIG. Further, the heat treatment method in which the obtained laminated film with a copper layer may be further heat-treated after the thermocompression bonding is the same as described above.
- the heat-resistant resin layer A and the heat-resistant resin layer B were bonded to each other in the state of a polyamide acid resin without being converted into a polyimide resin, followed by thermocompression bonding.
- a preferred method is to heat-treat the laminated film to convert the polyamic acid resin of the heat-resistant resin layer A and the heat-resistant resin layer B into a polyimide resin.
- thermocompression bonding is performed in the state of polyamic acid, the temperature during thermocompression bonding can be further reduced, and the temperature of the heating roll of the heating roll laminator is 100-260. C, preferably 140-240 ° C, more preferably 160-220 ° C.
- a flexible printed circuit board can be manufactured by forming a wiring pattern on a metal layer using the laminated film with a metal layer of the present invention.
- the pitch of the wiring pattern is not particularly limited, but is preferably in the range of 10 to 150 m, more preferably 15 to 100 m, and still more preferably 20 to 80 ⁇ m.
- the laminated film with a metal layer of the present invention is slit to a desired width.
- a photoresist film is applied on the metal layer, and a wiring pattern is formed by mask exposure.
- the remaining photoresist film was removed to form a metal wiring pattern.
- COF tape is obtained by applying solder resist on the wiring pattern.
- the semiconductor device of the present invention can be obtained by bonding the IC having the gold bumps formed on the inner leads of the COF tape obtained by the above method by flip-chip mounting and sealing with resin.
- IC mounting methods include a metal bonding method in which the wiring and the bumps of the IC are gang-bonded, a wire bonding method in which the bonding part of the IC and the inner lead of the COF tape are bonded by wire bonding, and a conductive material in the adhesive layer.
- a metal bonding method in which the wiring and the bumps of the IC are gang-bonded
- a wire bonding method in which the bonding part of the IC and the inner lead of the COF tape are bonded by wire bonding
- a conductive material in the adhesive layer There is an ACF method in which bonding is performed with an adhesive film containing a conductive filler in between, and an NCP method in which bonding is performed using a non-conductive adhesive.
- the ACF and NCP methods can be joined at a relatively low temperature, but from the viewpoint of connection reliability and the like, the metal joining method, particularly the joining method using gold-tin eutectic, is generally widely used.
- a load of 20 to 30 g is applied per bump in order to absorb the height variation between the bump on the IC side and the wiring on the wiring side.
- a temperature of 280 ° C or higher is required to form a eutectic between gold and tin and achieve reliable bonding. Therefore, the temperature of the bonding surface is generally set to 300-400 ° C. Is done.
- the laminated film with a copper layer is etched to a width of 2 mm with a ferric iron solution, and a 2 mm-wide metal layer is pulled at a tensile speed of 50 mm / min by "TOTEN BILWIN” "Tensilon” UTM-4-100.
- the obtained monolayer was cut into a shape having a specific width, formed into a cylindrical shape, and subjected to 30-300 using a thermomechanical analyzer SS-6100 (manufactured by Seiko Instruments Inc.). The measurement was performed at a temperature range of ° C and a heating rate of 5 ° C / min. From the obtained measurement results, the average linear expansion coefficient at 30 to 300 ° C was calculated using the formula (2).
- L30 is the sample length at 30 ° C
- L300 is the sample length at 300 ° C.
- PA1-8 polyamic acid resin solution
- a bar coater so that it has the specified thickness
- 10 minutes 80 ° C and 10 minutes at 150 ° C.
- a heat treatment was performed at 280 ° C. for 1 hour in a nitrogen atmosphere, followed by heat curing.
- the entire surface of the electrolytic copper foil was etched with a ferric chloride solution to obtain a single film of a heat-resistant resin layer.
- a polyamide / epoxy / phenolic heat-resistant resin solution (EP1) was applied to the glossy surface of an electrolytic copper foil with a thickness of 18 ⁇ m with a bar coater so as to have a predetermined thickness.
- the coating was dried at 120 ° C for 10 minutes for 10 minutes, and then heat-treated at 160 ° C for 1 hour for thermosetting.
- the entire surface of the electrolytic copper foil was etched with a ferric chloride solution to obtain a single film of a heat-resistant resin layer.
- Measurement was performed using a DSC-50 (manufactured by Shimadzu Corporation) (DSC method), and the glass transition temperature was calculated from the inflection point of the obtained DSC curve. After preliminary drying at 80 ° C for XI hours, the measurement was performed at a heating rate of 20 ° C / min.
- PA1-8 polyamic acid resin solution
- a bar coater so that it has the specified thickness
- 10 minutes 80 ° C and 10 minutes at 150 ° C.
- a heat treatment was performed at 280 ° C. for 1 hour in a nitrogen atmosphere, followed by heat curing.
- the entire surface of the electrolytic copper foil was etched with a ferric chloride solution to obtain a single film of a heat-resistant resin layer.
- a polyamide / epoxy / phenolic heat-resistant resin solution (EP1) was applied to the glossy surface of an electrolytic copper foil with a thickness of 18 ⁇ m with a bar coater so as to have a predetermined thickness.
- the coating was dried at 120 ° C for 10 minutes for 10 minutes, and then heat-treated at 160 ° C for 1 hour for thermosetting.
- the entire surface of the electrolytic copper foil was etched with a ferric chloride solution to obtain a single film of a heat-resistant resin layer.
- SiDA l, 1,3,3-tetramethyl-1,3-bis (3-aminopropyl) disiloxane
- DAE 4,4'diaminodiphenyl ether
- NMP N-methyl-2-pyrrolidone
- Polyamic acid resin Table 1 shows the coefficient of linear expansion, water absorption and glass transition temperature of the resin obtained by imidizing the solution (PA2-7).
- Polyamide acid resin solution PA1 was treated with low-temperature plasma treatment in an argon atmosphere at low temperature, and a 25- ⁇ m-thick polyimide film (“Kapton” 100EN manufactured by Toray DuPont Co., Ltd., constituent components: PMDA / BPDA / DAE / PDA, 500 ° C or less with no clear glass transition point) Coating with a reverse coater so that the film thickness after drying becomes 3 m, 10 minutes at 80 ° C, and 10 minutes at 140 ° C And dried. The coated product was subjected to a heat treatment at 290 ° C. for 5 minutes in a nitrogen atmosphere to perform imidization and removal of a residual solvent, thereby obtaining a laminate of a polyimide film Z and a heat-resistant resin layer.
- Kapton 100EN manufactured by Toray DuPont Co., Ltd., constituent components: PMDA / BPDA / DAE / PDA, 500 ° C or less with no clear glass transition point
- a 12 ⁇ m-thick roughened copper foil TQ—VLP Mitsui Kinzoku ( And a roll laminator heated to a roll surface temperature of 380 ° C.
- a 125 ⁇ m-thick polyimide film ("Kapton” 500 ⁇ Toray) was used as a protective film.
- DuPont Co., Ltd. between the rolls and the polyimide film Z heat-resistant resin layer laminate and copper foil, respectively, and heat-press at a linear pressure of 70 N / mm at a speed of lm / min.
- a laminated film with layers was obtained.
- the warpage of the obtained laminated film with a single-sided copper layer was measured and found to be Omm.
- the adhesive strength was 7 N / cm.
- a laminated film with a single-sided copper layer was obtained in the same manner as in Example 1, except that the type and thickness of the polyimide film, copper foil, and heat-resistant resin layer were changed as shown in Table 2.
- Table 2 summarizes the evaluation results of the warpage of the obtained laminated film with a copper layer on one side.
- the polyimide film used here was Kapton "100EN (thickness 25 / zm) manufactured by Toray DuPont Co., Ltd., and" Upilex "25S manufactured by Ube Industries, Ltd.
- the copper foil is a single-side roughened copper foil, TQ-VLP (12 m thick), manufactured by Mitsui Kinzoku Co., Ltd.
- F1—WS thinness 12 m
- FO-WS thinness 12 ⁇ m
- Furukawa Circuit Oil Co., Ltd. which is a double-sided smooth copper foil.
- a laminated film with a single-sided copper layer was obtained in the same manner as in Example 1, except that the type and thickness of the polyimide film, copper foil, and heat-resistant resin layer were changed as shown in Table 2.
- Table 2 summarizes the evaluation results of the warpage of the obtained laminated film with a copper layer on one side.
- Polyamide acid resin solution PA1 is roughened on the bonding side and roughened copper foil (T Q-VLP Mitsui Kinzoku Co., Ltd.) is 12 m thick. Reverse coater And dried at 80 ° C for 10 minutes and at 140 ° C for 10 minutes. The coated product was subjected to a heat treatment at 290 ° C. for 5 minutes in a nitrogen atmosphere to remove imidation and the remaining solvent, thereby obtaining a laminate of a copper foil Z heat-resistant resin layer A.
- a polyamic acid resin solution PA7 was previously subjected to a low-temperature plasma treatment in an argon atmosphere at a low temperature of 25 ⁇ m to form a polyimide film ("Kapton" 100EN Toray DuPont) Was coated with a reverse coater so that the film thickness after drying was 1 ⁇ m, and dried at 80 ° C. for 10 minutes and further at 140 ° C. for 10 minutes.
- the coated product was subjected to a heat treatment at 290 ° C. for 5 minutes in a nitrogen atmosphere to perform imidization and removal of a residual solvent, thereby obtaining a laminate of a polyimide film Z and a heat-resistant resin layer B.
- the heat-resistant resin layer A and the heat-resistant resin layer B of the laminate of the copper foil Z heat-resistant resin layer A and the laminate of the polyimide film Z heat-resistant resin layer B prepared as described above were facing each other.
- a 125 m thick polyimide film ("Kapton" 500H manufactured by Toray DuPont) was used as a protective film on a roll laminator heated to a roll surface temperature of 350 ° C. Heat-pressing at a linear pressure of 50 N / mm and a speed of 2 m / min., One side between the roll and the copper foil Z heat-resistant resin layer A laminate and polyimide film Z heat-resistant resin layer B laminate A laminated film with a copper layer was obtained. When the warpage of the obtained laminated film with a single-sided copper layer was measured, it was 0 mm. Further, the adhesive strength was lIN / cm.
- Example 4 The same operation as in Example 4 was performed except that the type and thickness of the polyimide film, copper foil, heat-resistant resin layer A, and heat-resistant resin layer B were changed as shown in Table 3, except that a single-sided copper layer was provided. A laminated film was obtained. Table 3 summarizes the evaluation results of the warpage of the obtained laminated film with a copper layer on one side.
- Example 4 The same operation as in Example 4 was performed except that the type and thickness of the polyimide film, copper foil, heat-resistant resin layer A, and heat-resistant resin layer B were changed as shown in Table 3, except that a single-sided copper layer was provided. A laminated film was obtained. Table 3 summarizes the evaluation results of the warpage of the obtained laminated film with a copper layer on one side.
- Polyamide acid resin solution PA1 was roughened on the adhesive side with a roughened copper foil (T Q-VLP Mitsui Kinzoku Co., Ltd.) with a thickness of 12 m so that the film thickness after drying was 3 m.
- a reverse coater was coated with a reverse coater and dried at 80 ° C for 10 minutes and further at 140 ° C for 10 minutes to obtain a laminate of a copper foil Z heat-resistant resin layer A.
- a polyamic acid resin solution PA7 was preliminarily treated with a low-temperature plasma treatment in an argon atmosphere at a low temperature of 25 ⁇ m to form a polyimide film ("Kapton" 100EN Toray DuPont Co., Ltd.) Coated with a reverse coater so that the film thickness after drying becomes 1 ⁇ m, dried at 80 ° C for 10 minutes, and further dried at 140 ° C for 10 minutes to obtain a polyimide film Z heat-resistant resin layer A laminate of B was obtained.
- a polyimide film (“Kapton” 100EN Toray DuPont Co., Ltd.)
- the heat-resistant resin layer A and the heat-resistant resin layer B of the laminate of the copper foil Z heat-resistant resin layer A and the polyimide film Z heat-resistant resin layer B prepared above were facing each other. After applying heat and pressure at a linear pressure of 10 N / mm at a speed of lm / min using a roll laminator heated to a roll surface temperature of 200 ° C, further heat step cure under nitrogen atmosphere [(80 ° C, 30 min) + (150 ° C, 1 hour) + (280 ° C, 2 hours)], the heat-resistant resin layer was imidized, and gradually cooled to room temperature to obtain a laminated film with a single-sided copper layer. When the warpage of the obtained laminated film with a copper layer on one side was measured, it was Omm. The adhesive strength was 12 N / cm.
- Example 10 The same operation as in Example 10 was performed except that the types and thicknesses of the polyimide film, copper foil, heat-resistant resin layer A, and heat-resistant resin layer B were changed as shown in Table 4, with a single-sided copper layer. A laminated film was obtained. Table 4 summarizes the evaluation results of the warpage of the obtained laminated film with a copper layer on one side.
- Example 10 The same operation as in Example 10 was performed except that the types and thicknesses of the polyimide film, copper foil, heat-resistant resin layer A, and heat-resistant resin layer B were changed as shown in Table 4, with a single-sided copper layer. A laminated film was obtained. Table 4 summarizes the evaluation results of the warpage of the obtained laminated film with a copper layer on one side.
- Example 4 The same operation as in Example 4 was performed except that the type and thickness of the polyimide film, copper foil, heat-resistant resin layer A, and heat-resistant resin layer B were changed as shown in Table 4, with a single-sided copper layer. Got a laminated film .
- Table 4 summarizes the evaluation results of the warpage of the obtained laminated film with a copper layer on one side.
- the polyamic acid resin solution PA1 was dried in a low-temperature plasma treatment in an argon atmosphere and dried on a 25 ⁇ m-thick polyimide film (“Kapton” 100EN manufactured by Toray DuPont). With a reverse coater and dried at 80 ° C for 10 minutes, and further at 140 ° C for 10 minutes, and then the polyamic acid resin solution PA6 is further dried. : Coated with a reverse coater so as to obtain Lm, and dried at 80 ° C for 10 minutes and further at 140 ° C for 10 minutes. The coated product was subjected to a heat treatment at 290 ° C. for 5 minutes in a nitrogen atmosphere to perform imidization and removal of a residual solvent, thereby obtaining a polyimide film, a heat-resistant resin layer AZ and a heat-resistant resin layer B laminate. Got.
- the polyamic acid resin solution PA6 was roughened on the adhesive side with a roughened copper foil (TQ-VLP, Mitsui Kinzoku Co., Ltd.) with a thickness of 12 m. After coating with a reverse coater and drying at 80 ° C for 10 minutes and at 140 ° C for 10 minutes, the polyamic acid / resin solution PA1 was further dried to a thickness of 3 ⁇ m. m, and dried at 80 ° C for 10 minutes and further at 140 ° C for 10 minutes. The coated product was subjected to a heat treatment at 290 ° C. for 5 minutes in a nitrogen atmosphere to perform imidization and removal of a residual solvent to obtain a laminate of a copper foil Z heat-resistant resin layer BZ heat-resistant resin layer A. .
- a polyamic acid resin solution PA7 was previously subjected to a low-temperature plasma treatment in an argon atmosphere at a low temperature of 25 ⁇ m to form a polyimide film ("Kapton" 100EN Toray DuPont) Coated with a reverse coater so that the film thickness after drying is 1 ⁇ m. It was dried for 0 minutes and further at 140 ° C for 10 minutes. The coated product was subjected to a heat treatment at 290 ° C. for 5 minutes in a nitrogen atmosphere to perform imidization and removal of a residual solvent, thereby obtaining a laminate of a polyimide film Z and a heat-resistant resin layer B.
- the polyamic acid resin solution PA7 was roughened on the adhesive side with a 12 m thick roughened copper foil (manufactured by TQ-VLP Mitsui Kinzoku Co., Ltd.). After coating with a reverse coater and drying at 80 ° C for 10 minutes and at 140 ° C for 10 minutes, the polyamic acid / resin solution PA1 was further dried to a thickness of 3 ⁇ m. m, and dried at 80 ° C for 10 minutes and further at 140 ° C for 10 minutes to obtain a laminate of copper foil Z heat-resistant resin layer BZ heat-resistant resin layer A. .
- a polyamic acid resin solution PA7 was previously subjected to a low-temperature plasma treatment in an argon atmosphere at a low temperature of 25 ⁇ m to form a polyimide film ("Kapton" 100EN Toray DuPont) Coated with a reverse coater so that the film thickness after drying becomes 1 ⁇ m, dried at 80 ° C for 10 minutes, and further dried at 140 ° C for 10 minutes to obtain a polyimide film Z heat-resistant resin layer A laminate of B was obtained.
- a polyimide film (“Kapton” 100EN Toray DuPont) Coated with a reverse coater so that the film thickness after drying becomes 1 ⁇ m, dried at 80 ° C for 10 minutes, and further dried at 140 ° C for 10 minutes to obtain a polyimide film Z heat-resistant resin layer A laminate of B was obtained.
- Polyamide acid resin solution PA1 was roughened on the bonding surface side to roughened copper foil (T Q-VLP Mitsui Kinzoku Co., Ltd.) with a thickness of 12 m so that the film thickness after drying was 5 m.
- the resultant was coated with a reverse coater and dried at 80 ° C for 10 minutes and further at 140 ° C for 10 minutes.
- the coated product was subjected to a heat treatment at 290 ° C. for 5 minutes in a nitrogen atmosphere to remove imidation and the remaining solvent, thereby obtaining a laminate of a copper foil Z heat-resistant resin layer A.
- a polyamide / epoxy / phenolic heat-resistant resin solution (EP1) was subjected to low-temperature plasma treatment in an argon atmosphere, and a 25- ⁇ m-thick polyimide film ("Upilex") "25S Ube Industries, Ltd.), coated with a reverse coater so that the film thickness after drying is 2 / zm, dried at 80 ° C for 10 minutes, and further dried at 120 ° C for 10 minutes to obtain polyimide.
- a laminate of film Z heat resistant resin layer B was obtained.
- the heat-resistant resin layer A and the heat-resistant resin layer B of the laminate of the copper foil Z heat-resistant resin layer A and the laminate of the polyimide film Z heat-resistant resin layer B prepared above were facing each other. After applying heat and pressure at a linear pressure of 6 N / mm at a speed of lm / min with a roll laminator heated to a roll surface temperature of 140 ° C, a heating step cure [(80 ° C, 30 minutes) + (120 ° C) C, 1 hour) + (160 ° C, 2 hours)], and the heat-resistant resin layer B was thermally cured and gradually cooled to room temperature to obtain a laminated film with a single-sided copper layer. The warpage of the obtained laminated film with a single-sided copper layer was measured and found to be Omm. Further, the adhesive strength was lIN / cm.
- Polyamide acid resin solution PA8 was roughened on the bonding surface side to roughened copper foil (T Q-VLP Mitsui Kinzoku Co., Ltd.) with a thickness of 12 m so that the film thickness after drying was 5 m.
- a polyamide / epoxy / phenol-based heat-resistant resin solution (EP1) was preliminarily subjected to low-temperature plasma treatment in an argon atmosphere to form a 25- ⁇ m-thick polyimide film (“Capton®”). "100EN Toray Dupont Co., Ltd.) to make the dried film thickness 2 / zm Coating was performed in a single coater, and the coating was dried at 80 ° C. for 10 minutes and further at 120 ° C. for 10 minutes to obtain a laminate of a polyimide film Z and a heat-resistant resin layer B.
- a photoresist film was applied on a copper layer of the laminated film with a copper layer obtained in Example 1 so as to have a thickness of 4 m after drying by a reverse coater, dried, exposed to a mask, and exposed to an alkaline developing solution.
- the copper foil was wet-etched with an aqueous solution of a second salt / iron.
- the remaining photoresist film was removed to form a copper wiring pattern.
- electroless plating of 0.4 m of tin on the formed copper wiring pattern a solder resist was applied on the wiring pattern to obtain a COF tape.
- the obtained COF tape was not warped.
- a semiconductor chip having gold bumps formed thereon was bonded to the inner leads of the COF tape obtained by the above method by flip-chip mounting, and sealed with a resin to obtain a semiconductor device. Since the COF tape has no warpage, the semiconductor device, which has few defects due to bonding defects, has shown good reliability.
- Example 22 The same operation as in Example 20 was performed except that the laminated film with a copper layer obtained in Example 6 was used. There is no warpage in the COF tape. The semiconductor device fabricated from now on showed good reliability without wiring short-circuit.
- Example 22
- Example 20 The same operation as in Example 20 was performed except that the laminated film with a copper layer obtained in Example 13 was used. There is no warpage in the COF tape. The semiconductor device fabricated from now on showed good reliability without short-circuiting of the wiring.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Laminated Bodies (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Wire Bonding (AREA)
Abstract
Description
Claims
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JP2006510672A JP4591444B2 (ja) | 2004-03-04 | 2005-03-01 | 金属層付き積層フィルム及び半導体装置 |
US10/591,580 US20070169886A1 (en) | 2004-03-04 | 2005-03-01 | Heat-resistant resin laminated film, multilayer film with metal layer including same and semiconductor device |
EP20050719697 EP1721740A1 (en) | 2004-03-04 | 2005-03-01 | Heat-resistant resin laminated film, multilayer film with metal layer including same, and semiconductor device |
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JP (1) | JP4591444B2 (ja) |
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Also Published As
Publication number | Publication date |
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KR20070007083A (ko) | 2007-01-12 |
JP4591444B2 (ja) | 2010-12-01 |
CN1929994A (zh) | 2007-03-14 |
TW200536443A (en) | 2005-11-01 |
EP1721740A1 (en) | 2006-11-15 |
JPWO2005084948A1 (ja) | 2007-12-06 |
US20070169886A1 (en) | 2007-07-26 |
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