WO2003019995A1 - Dispositif de production de rayons x - Google Patents

Dispositif de production de rayons x Download PDF

Info

Publication number
WO2003019995A1
WO2003019995A1 PCT/JP2002/008700 JP0208700W WO03019995A1 WO 2003019995 A1 WO2003019995 A1 WO 2003019995A1 JP 0208700 W JP0208700 W JP 0208700W WO 03019995 A1 WO03019995 A1 WO 03019995A1
Authority
WO
WIPO (PCT)
Prior art keywords
voltage
focus
electrode
electron beam
tubular
Prior art date
Application number
PCT/JP2002/008700
Other languages
English (en)
French (fr)
Inventor
Takashi Shimono
Original Assignee
Kabushiki Kaisha Toshiba
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kabushiki Kaisha Toshiba filed Critical Kabushiki Kaisha Toshiba
Priority to EP02765365A priority Critical patent/EP1429587A4/en
Priority to KR1020037010742A priority patent/KR100567501B1/ko
Priority to US10/469,769 priority patent/US6944268B2/en
Publication of WO2003019995A1 publication Critical patent/WO2003019995A1/ja

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08Electrical details
    • H05G1/26Measuring, controlling or protecting
    • H05G1/30Controlling
    • H05G1/32Supply voltage of the X-ray apparatus or tube
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/045Electrodes for controlling the current of the cathode ray, e.g. control grids
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08Electrical details
    • H05G1/26Measuring, controlling or protecting
    • H05G1/30Controlling
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08Electrical details
    • H05G1/26Measuring, controlling or protecting
    • H05G1/30Controlling
    • H05G1/34Anode current, heater current or heater voltage of X-ray tube

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • X-Ray Techniques (AREA)
PCT/JP2002/008700 2001-08-29 2002-08-29 Dispositif de production de rayons x WO2003019995A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP02765365A EP1429587A4 (en) 2001-08-29 2002-08-29 X-RAY GENERATOR
KR1020037010742A KR100567501B1 (ko) 2001-08-29 2002-08-29 X선 발생장치
US10/469,769 US6944268B2 (en) 2001-08-29 2002-08-29 X-ray generator

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001-259088 2001-08-29
JP2001259088 2001-08-29

Publications (1)

Publication Number Publication Date
WO2003019995A1 true WO2003019995A1 (fr) 2003-03-06

Family

ID=19086515

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/008700 WO2003019995A1 (fr) 2001-08-29 2002-08-29 Dispositif de production de rayons x

Country Status (7)

Country Link
US (1) US6944268B2 (ja)
EP (1) EP1429587A4 (ja)
JP (1) JP4796112B2 (ja)
KR (1) KR100567501B1 (ja)
CN (1) CN1279795C (ja)
TW (1) TWI279825B (ja)
WO (1) WO2003019995A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1530408A2 (de) * 2003-11-06 2005-05-11 feinfocus Röntgen-Systeme GmbH Microfocus-Röntgeneinrichtung

Families Citing this family (30)

* Cited by examiner, † Cited by third party
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ES2865724T3 (es) * 2006-02-09 2021-10-15 Leidos Security Detection & Automation Inc Sistemas y métodos de exploración con radiación
US20080095317A1 (en) * 2006-10-17 2008-04-24 General Electric Company Method and apparatus for focusing and deflecting the electron beam of an x-ray device
CN101536135A (zh) * 2006-11-21 2009-09-16 株式会社岛津制作所 X射线发生装置
US9305735B2 (en) 2007-09-28 2016-04-05 Brigham Young University Reinforced polymer x-ray window
JP5201017B2 (ja) * 2009-03-10 2013-06-05 株式会社島津製作所 X線発生装置、およびそれを備えたx線撮影装置
FR2947691B1 (fr) * 2009-07-06 2016-12-16 Gen Electric Procede pour le controle de l'emission d'un faisceau d'electrons dans une cathode, cathode, tube et systeme d'imagerie correspondants
DE102009037688B4 (de) * 2009-08-17 2011-06-16 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur Steuerung eines Elektronenstrahls für die Erzeugung von Röntgenstrahlung sowie Röntgenröhre
DE102009038687B4 (de) * 2009-08-24 2015-10-15 Siemens Aktiengesellschaft Vorrichtung sowie Verfahren zur Steuerung eines Elektronenstrahls bei einer Röntgenröhre
DE102009051633B4 (de) * 2009-11-02 2015-10-22 Siemens Aktiengesellschaft Spannungsstabilisierung für gittergesteuerte Röntgenröhren
US8401151B2 (en) * 2009-12-16 2013-03-19 General Electric Company X-ray tube for microsecond X-ray intensity switching
US8526574B2 (en) * 2010-09-24 2013-09-03 Moxtek, Inc. Capacitor AC power coupling across high DC voltage differential
JP5661432B2 (ja) * 2010-11-17 2015-01-28 キヤノン株式会社 X線発生装置
JP5893350B2 (ja) * 2011-11-10 2016-03-23 キヤノン株式会社 放射線管及びそれを用いた放射線発生装置
CN103260325A (zh) * 2012-02-15 2013-08-21 南京普爱射线影像设备有限公司 一种用于牙科机栅控冷阴极x射线管的电源装置
CN103260327B (zh) * 2012-02-15 2015-05-20 南京普爱射线影像设备有限公司 用于栅控冷阴极x射线球管的管电流稳流装置
US9069092B2 (en) 2012-02-22 2015-06-30 L-3 Communication Security and Detection Systems Corp. X-ray imager with sparse detector array
CN102592927B (zh) * 2012-03-29 2014-10-15 中国科学院西安光学精密机械研究所 一种任意波形x射线发生装置及产生方法
JP5763032B2 (ja) * 2012-10-02 2015-08-12 双葉電子工業株式会社 X線管
US9484179B2 (en) 2012-12-18 2016-11-01 General Electric Company X-ray tube with adjustable intensity profile
US9224572B2 (en) 2012-12-18 2015-12-29 General Electric Company X-ray tube with adjustable electron beam
JP6168770B2 (ja) * 2012-12-28 2017-07-26 キヤノン株式会社 放射線発生ユニット及び放射線撮影システム
TWI456620B (zh) * 2012-12-28 2014-10-11 Delta Electronics Inc X光管電源裝置、具該裝置之電源系統及其操作方法
US9173623B2 (en) 2013-04-19 2015-11-03 Samuel Soonho Lee X-ray tube and receiver inside mouth
JP6188470B2 (ja) * 2013-07-24 2017-08-30 キヤノン株式会社 放射線発生装置及びそれを用いた放射線撮影システム
JP6441015B2 (ja) * 2014-10-06 2018-12-19 キヤノンメディカルシステムズ株式会社 X線診断装置及びx線管制御方法
KR101648063B1 (ko) * 2015-03-31 2016-08-12 주식회사 쎄크 X선 발생장치 및 그 제어방법
KR101869753B1 (ko) * 2016-10-28 2018-06-22 테크밸리 주식회사 전자빔제어수단을 포함하는 엑스선 발생장치
DE102016222365B3 (de) * 2016-11-15 2018-04-05 Siemens Healthcare Gmbh Verfahren, Computerprogrammprodukt, computerlesbares Medium und Vorrichtung zur Erzeugung von Röntgenpulsen bei einer Röntgenbildgebung
FR3073702A1 (fr) * 2017-11-10 2019-05-17 General Electric Company Systemes permettant d'ameliorer le fonctionnement de generateurs de rayons x
JP6543377B1 (ja) * 2018-04-12 2019-07-10 浜松ホトニクス株式会社 X線発生装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5788699A (en) * 1980-09-29 1982-06-02 Gen Electric X-ray tube bias feeding controller
JPS636730A (ja) * 1986-06-27 1988-01-12 Toshiba Corp 厚膜抵抗素子及びそれを内蔵する電子管
JPH02276142A (ja) * 1989-04-15 1990-11-13 Toshiba Corp X線イメージ管
JPH0729532A (ja) * 1993-07-15 1995-01-31 Hamamatsu Photonics Kk X線装置
JP2001273860A (ja) * 2000-03-28 2001-10-05 Hitachi Medical Corp マイクロフォーカスx線管装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
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US2844757A (en) * 1956-07-02 1958-07-22 Gen Electric Bias for electron beam apparatus
US3034009A (en) * 1960-01-18 1962-05-08 Gen Electric Pin seal accelerator tubes
US3395311A (en) * 1966-05-23 1968-07-30 Rca Corp Regulated power supply
US3603839A (en) * 1968-06-04 1971-09-07 Victor Company Of Japan Color television picture tube of the single electron gun type
US4104526A (en) * 1973-04-24 1978-08-01 Albert Richard D Grid-cathode controlled X-ray tube
US3962583A (en) * 1974-12-30 1976-06-08 The Machlett Laboratories, Incorporated X-ray tube focusing means
US4007375A (en) * 1975-07-14 1977-02-08 Albert Richard D Multi-target X-ray source
JPS60254538A (ja) 1984-05-31 1985-12-16 Toshiba Corp X線管装置
JPS6224543A (ja) 1985-07-24 1987-02-02 Toshiba Corp X線管装置
DE3774943D1 (de) 1986-06-27 1992-01-16 Toshiba Kawasaki Kk Ein widerstand und eine diesen widerstand enthaltende elektronenroehre.
JPH0684664U (ja) * 1993-05-17 1994-12-02 横河電機株式会社 劣化検出機能付きx線管
JP4026976B2 (ja) * 1999-03-02 2007-12-26 浜松ホトニクス株式会社 X線発生装置、x線撮像装置及びx線検査システム
JP3571568B2 (ja) * 1999-03-03 2004-09-29 日本電子株式会社 質量分析装置のフォーカス電圧源
JP2001167724A (ja) * 1999-12-09 2001-06-22 Rigaku Corp X線発生装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5788699A (en) * 1980-09-29 1982-06-02 Gen Electric X-ray tube bias feeding controller
JPS636730A (ja) * 1986-06-27 1988-01-12 Toshiba Corp 厚膜抵抗素子及びそれを内蔵する電子管
JPH02276142A (ja) * 1989-04-15 1990-11-13 Toshiba Corp X線イメージ管
JPH0729532A (ja) * 1993-07-15 1995-01-31 Hamamatsu Photonics Kk X線装置
JP2001273860A (ja) * 2000-03-28 2001-10-05 Hitachi Medical Corp マイクロフォーカスx線管装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP1429587A4 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1530408A2 (de) * 2003-11-06 2005-05-11 feinfocus Röntgen-Systeme GmbH Microfocus-Röntgeneinrichtung
EP1530408A3 (de) * 2003-11-06 2007-08-01 COMET GmbH Microfocus-Röntgeneinrichtung

Also Published As

Publication number Publication date
EP1429587A4 (en) 2008-12-10
EP1429587A1 (en) 2004-06-16
CN1279795C (zh) 2006-10-11
JP2009049018A (ja) 2009-03-05
CN1535559A (zh) 2004-10-06
US6944268B2 (en) 2005-09-13
KR100567501B1 (ko) 2006-04-03
JP4796112B2 (ja) 2011-10-19
TWI279825B (en) 2007-04-21
US20040114722A1 (en) 2004-06-17
KR20030079999A (ko) 2003-10-10
EP1429587A8 (en) 2004-09-08

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