WO1998016466A1 - Procede et appareil de preparation de silicium polycristallin et procede de preparation d'un substrat en silicium pour cellule solaire - Google Patents
Procede et appareil de preparation de silicium polycristallin et procede de preparation d'un substrat en silicium pour cellule solaire Download PDFInfo
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- WO1998016466A1 WO1998016466A1 PCT/JP1996/002965 JP9602965W WO9816466A1 WO 1998016466 A1 WO1998016466 A1 WO 1998016466A1 JP 9602965 W JP9602965 W JP 9602965W WO 9816466 A1 WO9816466 A1 WO 9816466A1
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- WIPO (PCT)
- Prior art keywords
- silicon
- polycrystalline silicon
- molten metal
- lump
- producing polycrystalline
- Prior art date
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 95
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 91
- 239000010703 silicon Substances 0.000 title claims abstract description 90
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 67
- 229910021420 polycrystalline silicon Inorganic materials 0.000 title claims abstract description 64
- 239000000758 substrate Substances 0.000 title claims abstract description 50
- 238000000034 method Methods 0.000 title claims abstract description 29
- 229910052751 metal Inorganic materials 0.000 claims abstract description 76
- 239000002184 metal Substances 0.000 claims abstract description 75
- 238000007711 solidification Methods 0.000 claims abstract description 32
- 230000008023 solidification Effects 0.000 claims abstract description 32
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 25
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims abstract description 22
- 239000012535 impurity Substances 0.000 claims abstract description 20
- 230000001590 oxidative effect Effects 0.000 claims abstract description 19
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 18
- 229910052814 silicon oxide Inorganic materials 0.000 claims abstract description 17
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052796 boron Inorganic materials 0.000 claims abstract description 15
- 229910052786 argon Inorganic materials 0.000 claims abstract description 11
- 239000012298 atmosphere Substances 0.000 claims abstract description 11
- 238000007670 refining Methods 0.000 claims abstract description 11
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 10
- 238000005520 cutting process Methods 0.000 claims abstract description 10
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 9
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 8
- 239000001257 hydrogen Substances 0.000 claims abstract description 7
- 239000007789 gas Substances 0.000 claims description 29
- 238000010438 heat treatment Methods 0.000 claims description 16
- 238000002844 melting Methods 0.000 claims description 14
- 230000008018 melting Effects 0.000 claims description 12
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 11
- 229910052698 phosphorus Inorganic materials 0.000 claims description 11
- 239000011574 phosphorus Substances 0.000 claims description 11
- 229910002804 graphite Inorganic materials 0.000 claims description 9
- 239000010439 graphite Substances 0.000 claims description 9
- 230000006837 decompression Effects 0.000 claims description 8
- 239000000155 melt Substances 0.000 claims description 7
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 5
- 239000003795 chemical substances by application Substances 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 5
- 239000010949 copper Substances 0.000 claims description 5
- 230000008016 vaporization Effects 0.000 claims description 4
- 239000011810 insulating material Substances 0.000 claims description 3
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 claims 1
- 238000009991 scouring Methods 0.000 claims 1
- 238000007664 blowing Methods 0.000 abstract description 7
- 239000007858 starting material Substances 0.000 abstract description 7
- 230000003647 oxidation Effects 0.000 abstract description 5
- 238000007254 oxidation reaction Methods 0.000 abstract description 5
- 238000005266 casting Methods 0.000 abstract 1
- 239000008246 gaseous mixture Substances 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 10
- 238000006243 chemical reaction Methods 0.000 description 9
- 239000000126 substance Substances 0.000 description 9
- 239000000047 product Substances 0.000 description 8
- 238000000746 purification Methods 0.000 description 8
- 239000000203 mixture Substances 0.000 description 7
- 239000013078 crystal Substances 0.000 description 6
- 238000005261 decarburization Methods 0.000 description 6
- 238000010310 metallurgical process Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 238000001311 chemical methods and process Methods 0.000 description 4
- 238000010502 deborylation reaction Methods 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- CMBZEFASPGWDEN-UHFFFAOYSA-N argon;hydrate Chemical compound O.[Ar] CMBZEFASPGWDEN-UHFFFAOYSA-N 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 239000003638 chemical reducing agent Substances 0.000 description 2
- 230000015271 coagulation Effects 0.000 description 2
- 238000005345 coagulation Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 238000005265 energy consumption Methods 0.000 description 2
- 239000003344 environmental pollutant Substances 0.000 description 2
- 239000002440 industrial waste Substances 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 231100000719 pollutant Toxicity 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000004071 soot Substances 0.000 description 2
- 238000009628 steelmaking Methods 0.000 description 2
- 238000009834 vaporization Methods 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 239000012300 argon atmosphere Substances 0.000 description 1
- 229910052810 boron oxide Inorganic materials 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 229910002090 carbon oxide Inorganic materials 0.000 description 1
- 239000003575 carbonaceous material Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 238000005485 electric heating Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000010298 pulverizing process Methods 0.000 description 1
- 238000010079 rubber tapping Methods 0.000 description 1
- 238000013341 scale-up Methods 0.000 description 1
- 239000003923 scrap metal Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- SBEQWOXEGHQIMW-UHFFFAOYSA-N silicon Chemical compound [Si].[Si] SBEQWOXEGHQIMW-UHFFFAOYSA-N 0.000 description 1
- 239000011856 silicon-based particle Substances 0.000 description 1
- 239000011863 silicon-based powder Substances 0.000 description 1
- ZDHXKXAHOVTTAH-UHFFFAOYSA-N trichlorosilane Chemical compound Cl[SiH](Cl)Cl ZDHXKXAHOVTTAH-UHFFFAOYSA-N 0.000 description 1
- 239000005052 trichlorosilane Substances 0.000 description 1
- 238000004857 zone melting Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/02—Silicon
- C01B33/021—Preparation
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
- H01L31/182—Special manufacturing methods for polycrystalline Si, e.g. Si ribbon, poly Si ingots, thin films of polycrystalline Si
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/546—Polycrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to a method and an apparatus for producing polycrystalline silicon, and a method for producing a silicon substrate for a solar cell.
- the present invention relates to a polycrystalline silicon substrate for a solar cell as a final product starting from metallic silicon or silicon oxide. Is a technology that can be manufactured as a series of processes in a series of processes. Background art
- a low-purity metal silicon 99.5% by weight Si
- Si a low-purity metal silicon
- the massive high-purity silicon is redissolved, adjusted to a chemical composition suitable for a solar cell, and the obtained molten metal is ingoted by a pulling method or directional solidification, and then cut into thin plates.
- metallic silicon is first gasified as trichlorosilane by reacting with hydrochloric acid, and after rectifying the gas to remove impurity elements, the metallic silicon is reacted with hydrogen gas.
- High-purity silicon is deposited from the gas by the so-called CV D (Chemical Vapor Deposition) method.
- CV D Chemical Vapor Deposition
- the resulting high-purity silicon has a weak bonding force between the crystal particles, and is merely an aggregate of silicon particles.
- boron of high-purity silicon forming the aggregate drops to the order of 0.001 ppm, and the specific resistance as a substrate for a P-type semiconductor is 0.5 to 1.5 ohm ⁇ cm. The concentration is not enough to satisfy the conditions.
- the crystal grain For use in solar cells, it is essential to adjust the specific resistance and control the crystallinity so that the crystal grain has a single crystal or crystal grain size of several mm or more and the grain boundaries do not adversely affect the photoelectric conversion efficiency. In this state, it cannot be immediately turned into a substrate. Therefore, as shown on the right side of FIG. 5, the mass is re-dissolved, the components of the molten metal are adjusted (polon addition), and ingots are formed (in the case of a single crystal, the pulling method is changed to polycrystal). In such a case, a unidirectional solidification is used), and then a process of forming a substrate is required.
- Japanese Unexamined Patent Publication No. Hei 5-139713 discloses that “silica or a vessel containing silica as a main component holds molten silicon, and a plasma gas jet stream of an inert gas is injected onto the surface thereof. And an inert gas is supplied from the bottom of the container. Blowing to obtain silicon with low boron content ”. Also, Japanese Patent Application Laid-Open No.
- Japanese Unexamined Patent Publication No. 62-252393 discloses that, as a starting material, silicon of electronic industrial waste once used as a semiconductor was generated using a mixed gas of argon, hydrogen and oxygen. It discloses a method for zone melting with a plasma jet. However, this method uses only industrial waste and cannot be the mainstream technology for silicon substrates that require mass production. In addition, although the silicon as a raw material has been used, it has been once purified to a high degree, and there is no change to the technology that inherited the complicated production method described above. Also, Japanese Patent Application Laid-Open No.
- the present invention can produce polycrystalline silicon as a product and a substrate using the same from metal silicon or silicon oxide as a starting material at low cost and in large quantities as a series of continuous processes in a flow operation. It is intended to provide a manufacturing method and apparatus.
- the inventor conducted intensive research focusing on obtaining the maximum economic effect only by using a metallurgical process without using a chemical process, and completed the present invention.
- the present invention is a method for producing polycrystalline silicon, characterized in that metallic silicon is converted into polycrystalline silicon using the following steps.
- the present invention is a method for producing polycrystalline silicon, characterized in that the metal silicon is obtained by reduction of silicon oxide.
- the molten silicon metal obtained by the purification of silicon oxide is transferred to a ladle and solidified after oxidizing and removing boron and carbon under an oxidizing atmosphere.
- a method for producing polycrystalline silicon comprising performing melting under vacuum and performing the steps C, D, and E of claim 1.
- the oxidizing atmosphere, or formed by the degree of H 2 0, C O 2 or 0 2 gas interface of the molten metal and gas is not exhausted covered with silicon oxide, on Wherein the serial silicon oxide generated in ⁇ surface, or locally heat removed by plasma arc, or instead of the oxidizing atmosphere, the blowing of H 2 0, C0 2 or ⁇ 2 gas into the molten metal Is a method for producing polycrystalline silicon.
- the present invention the release agent or the S i 0 2 or S i 3 N 4, the solidification interface moving speed 5 mm / min hereinafter coagulation for the impurity removal, directionally solidified
- the solidification interface moving speed is set to 2 mmZmin or less, or the lump is cut at a height of 70% or more from the bottom of the lump.
- the present invention provides a polycrystal characterized in that the concentration of phosphorus in the molten metal is 0.3 ppm or less, the concentration of boron is 0.6 ppm or less, or the concentration of carbon is 10 ppm or less. It is also a method for manufacturing silicon.
- the invention also relates to a manufacturing apparatus, which comprises a heating means for melting or heating metallic silicon, a holding container for holding the molten metal silicon, and a first mold for filling the molten metal in the holding container, A decompression chamber surrounding these holding containers and the mold and vaporizing and removing phosphorus from the molten metal, a re-dissolving means for re-dissolving or heating a part of the lump from the mold and holding the re-dissolved molten metal A refining vessel, a nozzle for blowing or blowing an oxidizing gas, a hydrogen gas, or a mixed gas of hydrogen and argon into the molten metal in the refining vessel, and a nozzle for blowing the deoxidized molten metal into a lump.
- An apparatus for producing polycrystalline silicon characterized in that the apparatus has two types (1) and (2).
- the present invention also Ri and the degree of vacuum of the vacuum chamber higher than 1 0- 3 torr, the holding container is made of copper water-cooled jacket or graphite crucible, the seminal ⁇ unit, S i 0 2 quality crucible, an apparatus for producing polycrystalline silicon which is characterized by comprising as S i 0 2 stamps or crucible which has been subjected to S i 0 2 Rainin grayed.
- the heating means may be an electron gun, or the re-melting means may be a This is a polycrystalline silicon manufacturing equipment characterized by using a plasma torch or DC arc source.
- the side walls of the first and second molds are formed of a heat insulating material, the bottom is formed of a water-cooled jacket, and a heating device for heating the molten metal is provided above these molds.
- a polycrystalline silicon manufacturing apparatus characterized in that a source is arranged or a ratio of the height H to the diameter W of the ⁇ is WZH> 0.5.
- the present invention is to cut a lump of polycrystalline silicon obtained by any one of the above-mentioned production methods into a thin plate, and to reduce the thickness of the thin plate to 100 to 450 ⁇ m.
- a method for manufacturing a silicon substrate for a solar cell is characterized in that a source is arranged or a ratio of the height H to the diameter W of the ⁇ is WZH> 0.5.
- the polycrystalline silicon-silicon substrate for a solar cell is manufactured by the above-described method and apparatus, it is not necessary to adjust the composition of high purity silicon, which is indispensable in the conventional method.
- the use of only metallurgical processes and the generation of large amounts of pollutant-generating substances unique to chemical processes make it possible to increase the size of equipment with confidence.
- a silicon substrate for a solar cell with excellent photoelectric conversion efficiency can be provided at a much lower cost than before.
- the polycrystalline silicon obtained by the practice of the present invention can be effectively used for other uses, such as a raw material for steelmaking, without using a substrate.
- FIG. 1 is a flowchart showing one example of a method for producing polycrystalline silicon and a solar cell silicon substrate according to the present invention.
- FIG. 2 is a flowchart showing another embodiment of the method for producing polycrystalline silicon and a silicon substrate for a solar cell according to the present invention.
- FIG. 3 is a schematic view of an apparatus for carrying out the method for producing polycrystalline silicon and a solar cell silicon substrate according to the present invention.
- FIG. 4 is an apparatus example of another embodiment in which the method for producing polycrystalline silicon and a solar cell silicon substrate according to the present invention is implemented.
- FIG. 5 is a flowchart showing a conventional method for manufacturing a silicon substrate for a solar cell.
- FIG. 1 shows one example of a method for producing a polycrystalline silicon and a silicon substrate for a solar cell according to the present invention in one flow chart at the same time (the part enclosed by a broken line is the production of the substrate).
- the heating means is most preferably a power electron gun which can use well-known gas heating, electric heating or the like.
- the melted metal silicon hereinafter, referred to as molten metal
- molten metal is held in the holding container at a temperature of 1450 ° C or more and 1900 ° C or less for a predetermined time (for example, 30 to 60 minutes),
- phosphorus and aluminum are removed by vaporization (vacuum purification).
- the concentration of phosphorus in the molten metal is preferably less than 0.3 Ppm.
- the melt is poured into the first mold and directed upward from the bottom. Cool so that the moving speed of the solidification interface is 5 mm Zmin. As a result, a lump in which the molten metal in which the impurity element is concentrated is finally solidified is obtained. Subsequently, about 30% of the upper portion of the above-mentioned lump enriched with impurity elements is cut off. Then, the remaining lump is charged into a melting furnace equipped with, for example, a plasma arc, and remelted. Also in this case, the heating means is not limited to the plasma arc.
- the temperature of the molten metal after the melting is raised to a temperature of 1450 ° C. or higher, and at the same time, is reacted with an oxidizing gas atmosphere to remove boron and carbon in the molten metal as oxides. ). Furthermore, argon gas or a mixed gas of argon and hydrogen is blown into the molten metal after the oxidation and purification for a certain period of time. As a result, oxygen in the molten metal is deoxidized to 1 O ppm or less. Note that the above oxidation purification may be performed in a decompression chamber or in the air.
- the molten metal after deoxidation is poured into a second mold to which a release agent has been applied as a finishing finish, and solidifies from one direction to obtain a solid mass. Since the impurity element is concentrated in the upper part of the lump, that part (usually about 20%) is cut and removed, and the remaining part is made of polycrystalline silicon.
- the above is the method of manufacturing polycrystalline silicon. In the case of a silicon substrate for a solar cell, the remaining part is cut into thin sheets with a thickness of 100 to 450 urn using a multi-wire system (slicing). ).
- the starting silicon metal is usually obtained by reduction and purification of silicon oxide
- the case where the starting material is used as a starting material is also added to the present invention.
- a method for refining silicon oxide any known method may be used as long as it has a purity comparable to that of metallic silicon used first in the present invention.
- a method of melting and reducing silicon oxide using a carbon material as a reducing agent by using a submerged arc melting furnace is used.
- a method of melting and reducing silicon oxide using a carbon material as a reducing agent by using a submerged arc melting furnace is used.
- the present invention when obtaining metallic silicon from this silicon oxide, it was considered that components unnecessary as polycrystalline silicon / silicon substrate for solar cells were removed in advance. That is, as shown in the flow chart of FIG.
- a relatively low-purity molten silicon obtained from silicon oxide is charged into a refining vessel (for example, a ladle) to perform a so-called pre-refining. It is. Specifically, oxidation blown, boron and carbon oxide gas (H 2 0, C 0 2, etc.) into the molten metal in the ladle Removed as an object and solidifies. Thereafter, the obtained lump is melted in the above-mentioned decompression chamber, dephosphorized by vacuum refining, and unidirectionally solidified to obtain a lump of polycrystalline silicon. In order to form a substrate, cutting into a thin plate may be performed in the same manner as described above.
- the advantage of this method is that by changing a part of the normal metal silicon manufacturing operation, the above-mentioned "deboron and decarburization” and “solidification for removing impurities” of the present invention are not required. It is. As a result, the effects of omitting equipment and reducing energy consumption are remarkable, and polycrystalline silicon and a silicon substrate for a solar cell at a similar level to those obtained by the method according to the present invention can be obtained at a lower cost. In particular, if deboron and decarburization work is performed in the production stage of the metal silicon in Yamamoto, the subsequent work becomes very easy for a polycrystalline silicon substrate manufacturer.
- the reason why the lump is cut at a height of 70% or more from the bottom of the lump is that the target composition as polycrystalline silicon is achieved with a lower balance.
- the reason why the degree of vacuum in the decompression chamber is set higher than 10 ⁇ 3 torr is that it is suitable for vaporization and dephosphorization from the vapor pressure of phosphorus in metal silicon.
- the reason why the phosphorus concentration of the molten metal is set to 0.3 ppm or less is to secure stable operation of the solar cell, and the boron concentration is set to 0.6 ppm or less.
- the carbon concentration is set to 10 ppm or less to suppress the precipitation of SiC in the silicon crystal and reduce the photoelectric conversion efficiency. This is to prevent it.
- the holding container at the time of silicon metal dissolution as described above, a copper water-cooled jacket or graphite crucible, the seminal ⁇ device subjected S i 0 2 quality crucible, the S i 0 2 stamp or S i 0 2 Lining
- the crucible is made of silicon Is liable to react with other substances, and if other substances are used, their constituent elements are mixed into silicon. Note that for de Polo emissions such as during manufacture of metal silicon, can be used lining refractory for use S i 0 2 than inexpensive A 1 2 0 3, M g O, graphite and the like. This is because even if impurities are mixed in, they can be removed in a later processing step.
- the release agent ⁇ used for coagulation was S i 0 2 or S i N 4, is the same reason as described above.
- the reason for the need for a release agent is that when the molten silicon solidifies, the volume expands by 10%, so that no stress remains in the lump.
- the molten metal 2 of the metallic silicon 1 flows almost continuously to the next stage.
- the production work becomes smoother, and the production cost is reduced by shortening the operation time.
- the apparatus used in the present invention is only based on a metallurgical process, it can be easily enlarged, and does not generate pollutants. Therefore, it is expected that the production cost can be reduced by mass production.
- Oxidizing atmosphere for de boron and decarburization the molten metal 2 is weaker oxidizing power there Re may be, H 2 0, C 0 2 use is preferred.
- Re oxidizing power
- S i 0 2 film is formed on the surface of the melt, to inhibit de-boron or decarburization 0 2. Therefore, in such a case, it is necessary to eject an arc from the plasma torch 4 or a DC arc source to remove the film.
- the oxidizing gas may be blown directly into the molten metal. Blowing an oxidizing gas-free nozzle 5, the material is limited to graphite or S i 0 2. Otherwise, it will contaminate the melt 2.
- the cutting machine (not shown) for cutting the mass 6 removed from the second mold 9 into a thin plate shape
- a known multi 'wire' saw / multi-blade machine is sufficient.
- the reason for setting the thickness of the thin plate to 100 to 450 is that if the thickness is less than 100, the strength is too weak, and if it exceeds 450 m, the photoelectric conversion efficiency decreases.
- the shape is a so-called evening rye shape with a ratio of diameter W / height H of 0.5 or more.
- a heat insulating material 11 was provided on the side wall, a water-cooled jacket 10 was provided on the bottom, and a heating source 8 was provided on the upper side, so that the moving speed of the solidification interface was adjusted.
- solidification in the first and second molds may be repeated a plurality of times (solidification-remelting). Further, a plurality of molds may be prepared, the holding container or the refining container may be made large, and the molten metal may be dispensed therefrom.
- the order of performing the steps A, B, C, D, and E may be different except that D and E are final.
- an electron gun 3 with a power of 300 kW is installed in the decompression chamber 18 and metal silicon 1 is supplied at a rate of 10 kg / hour to a graphite holding vessel 19 (also called a melting furnace). Dissolved.
- the decompression chamber 18 is a 10- 5 torr true Sorado, part of the melt 2 of phosphorus and aluminum element is vaporized and removed.
- the molten metal 2 was poured into a water-cooled copper mold 9 and solidified at a moving speed of a solidification interface of 1 mm / min from the bottom while irradiating the molten metal surface with an electron beam 3 to maintain a molten state. 50 kg of lump 6 were obtained.
- the upper 20% (symbol A) of the lump 6 was cut and removed to give a lump having the chemical composition shown in Table 1.
- the cut and removed residue of the lump 6 was dissolved in a silica crucible (refining vessel) 16 with a plasma torch 4 having an output of 100 kW disposed above. Then, the temperature of the molten metal was maintained at 1600 ° C., and a mixed gas 21 of argon-water vapor containing 15% by volume of water vapor was sprayed on the surface of the molten metal. During that time, a sample was taken from the melt 2 and its specific resistance was measured. After a lapse of about 2 hours, the specific resistance reached 1 ohm ⁇ cm, and the mixed gas 21 was switched to argon / gas only for deoxidation for 30 minutes.
- the molten metal was poured into a second mold made of graphite coated with a release agent of Si 3 N 4 , cooled under the argon atmosphere from the bottom, and solidified to obtain a solid mass.
- a graphite heater 8 was placed above the mold 9 to heat the molten metal surface. As a result, the moving speed of the solidification interface was 0.7 mmZ.
- the product was sliced with a multi-wire soot into a thin plate having a thickness of 350, and 300 silicon substrates for solar cells of 15 cm ⁇ 15 cm were obtained.
- the specific resistance was 1.2 ohm'cm
- the lifetime of the minority carrier was 12 seconds
- the photoelectric conversion efficiency was 13.8%.
- the chemical composition is as shown in Table 1.
- Example 3 The size, number and performance of the obtained substrates were almost the same as in Example 1. (Example 3)
- Silicon oxide as a starting material was dissolved and reduced in an electric arc furnace 12 shown in FIG. 4 using a carbonaceous reducing agent to produce molten metal silicon having a chemical composition shown in Table 2.
- 50 kg of this metallic silicon 1 was charged into a ladle 14 provided with a porous plug 15 at the bottom and lined with a siliceous refractory.
- an argon-water vapor mixed gas containing 20% by volume of water vapor was blown into the molten metal through the porous plug 15 for 30 minutes.
- the temperature of the molten metal 2 was raised to 165 ° C. by the heat of oxidation of silicon, and the deboron and decarburization reactions occurred.
- the molten metal 2 is placed above the heater made of SiC, inserted into the first mold of the lower cooling method, cooled at a moving speed of the solidification interface of 1.5 mm / min, and solidified. I let it. Subsequently, the lower 80% of the obtained lump was melted in the holding vessel placed in the above-mentioned decompression chamber, dephosphorized and deoxidized, and then the molten metal was poured into the above-mentioned second mold. To perform unidirectional solidification. The lump 6 obtained here was further cut and removed at the upper 30% to obtain a polycrystalline silicon product.
- the product was sliced into a thin plate having the above-mentioned size using a multi-blade soot to obtain 300 polycrystalline silicon substrates for a solar cell.
- the specific resistance of the substrate is 0.9 cm ⁇ cm, the life time of the minority carrier is 10 seconds, and the photoelectric conversion efficiency is 13.5%.
- Table 2 shows the chemical composition. Table 2 Unit PP m;
- the method for producing polycrystalline silicon and the method for producing a polycrystalline silicon substrate for a solar cell according to the present invention has no problem in resources (no shortage of raw materials), and a substance that pollutes by-products. It is essentially suitable for scale-up and mass production of equipment as a metallurgical technology, so it is possible to supply substrates stably even if the demand for solar cells is several hundred times the current level.
- a loss of about 20% by weight or a defective product is generated by pulverization or the like before the substrate is converted from massive high-purity silicon to a substrate. Since they are integrated continuously, there is little loss, and power and energy can be used effectively. Therefore, the cost of the silicon substrate obtained by implementing the present invention is less than half of the conventional price, and the solar cell can function economically as a power generator.
- high-purity polycrystalline silicon or a silicon substrate for a solar cell is manufactured as a series of flow operations using only a metallurgical process. Therefore, the size of the equipment can be freely increased, and unnecessary energy can be saved, which is very useful for manufacturing a silicon substrate for a solar cell.
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- Crystallography & Structural Chemistry (AREA)
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- Metallurgy (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
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Description
Claims
Priority Applications (10)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE69621348T DE69621348T2 (de) | 1996-10-14 | 1996-10-14 | Verfahren und vorrichtung zur herstellung von polykristallinem silizium und verfahren zur herstellung eines siliziumsubstrats für eine solarzelle |
JP52506797A JP3325900B2 (ja) | 1996-10-14 | 1996-10-14 | 多結晶シリコンの製造方法及び装置、並びに太陽電池用シリコン基板の製造方法 |
US08/894,030 US5961944A (en) | 1996-10-14 | 1996-10-14 | Process and apparatus for manufacturing polycrystalline silicon, and process for manufacturing silicon wafer for solar cell |
PCT/JP1996/002965 WO1998016466A1 (fr) | 1996-10-14 | 1996-10-14 | Procede et appareil de preparation de silicium polycristallin et procede de preparation d'un substrat en silicium pour cellule solaire |
CA002211028A CA2211028C (en) | 1996-10-14 | 1996-10-14 | Process and apparatus for manufacturing polycrystalline silicon, and process for manufacturing silicon wafer for solar cell |
BR9611816A BR9611816A (pt) | 1996-10-14 | 1996-10-14 | Processo e aparelho para fabricação de silício policristalino e processo para fabricação de pastilhas de silício para baterias solares |
KR1019970706925A KR100263220B1 (ko) | 1996-10-14 | 1996-10-14 | 다결정실리콘의 제조방법과 장치 및 태양전지용실리콘기판의 제조방법 |
EP96933633A EP0869102B1 (en) | 1996-10-14 | 1996-10-14 | Process and apparatus for preparing polycrystalline silicon and process for preparing silicon substrate for solar cell |
TW085113055A TW335539B (en) | 1996-10-14 | 1996-10-24 | Method and apparatus for making multi-crystal silicon and method of manufacturing of silicon substrate for solar batteries |
NO974454A NO974454L (no) | 1996-10-14 | 1997-09-26 | FremgangsmÕte og anordning for fremstilling av polykrystallinsk silisium og fremgangsmÕte ved fremstilling av silisiumplater for solceller |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP1996/002965 WO1998016466A1 (fr) | 1996-10-14 | 1996-10-14 | Procede et appareil de preparation de silicium polycristallin et procede de preparation d'un substrat en silicium pour cellule solaire |
CA002211028A CA2211028C (en) | 1996-10-14 | 1996-10-14 | Process and apparatus for manufacturing polycrystalline silicon, and process for manufacturing silicon wafer for solar cell |
NO974454A NO974454L (no) | 1996-10-14 | 1997-09-26 | FremgangsmÕte og anordning for fremstilling av polykrystallinsk silisium og fremgangsmÕte ved fremstilling av silisiumplater for solceller |
Publications (1)
Publication Number | Publication Date |
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WO1998016466A1 true WO1998016466A1 (fr) | 1998-04-23 |
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Application Number | Title | Priority Date | Filing Date |
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PCT/JP1996/002965 WO1998016466A1 (fr) | 1996-10-14 | 1996-10-14 | Procede et appareil de preparation de silicium polycristallin et procede de preparation d'un substrat en silicium pour cellule solaire |
Country Status (2)
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EP (1) | EP0869102B1 (ja) |
WO (1) | WO1998016466A1 (ja) |
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EP1048758A1 (en) * | 1999-04-30 | 2000-11-02 | Mitsubishi Materials Corporation | Method for producing crystalline silicon |
WO2006093089A1 (ja) * | 2005-02-28 | 2006-09-08 | Kyocera Corporation | 多結晶シリコン基板、多結晶シリコンインゴット及びそれらの製造方法、光電変換素子、並びに光電変換モジュール |
WO2006093099A1 (ja) * | 2005-02-28 | 2006-09-08 | Kyocera Corporation | 多結晶シリコン基板、多結晶シリコンインゴット及びそれらの製造方法、光電変換素子、並びに光電変換モジュール |
JP2007051047A (ja) * | 2005-08-16 | 2007-03-01 | Norichika Yamauchi | 電子ビームを用いたシリコンの精錬方法及び装置 |
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JP2013519619A (ja) * | 2010-02-12 | 2013-05-30 | 政宏 星野 | 太陽電池用金属シリコンを精製するための装置及び方法 |
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US8801855B2 (en) | 2007-10-03 | 2014-08-12 | Silicor Materials Inc. | Method for processing silicon powder to obtain silicon crystals |
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WO2010013484A1 (ja) | 2008-08-01 | 2010-02-04 | 株式会社アルバック | 金属の精製方法 |
KR101318239B1 (ko) | 2008-08-12 | 2013-10-15 | 가부시키가이샤 아루박 | 실리콘의 정제 방법 |
DE102009014562A1 (de) | 2009-03-16 | 2010-09-23 | Schmid Silicon Technology Gmbh | Aufreinigung von metallurgischem Silizium |
CN103318893A (zh) * | 2013-06-19 | 2013-09-25 | 青岛隆盛晶硅科技有限公司 | 多晶硅旋转凝固分离杂质的方法 |
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Cited By (15)
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US6383285B1 (en) | 1999-04-30 | 2002-05-07 | Mitsubishi Materials Corporation | Method for producing crystalline silicon |
US6540828B2 (en) | 1999-04-30 | 2003-04-01 | Mitsubishi Materials Corporation | Method for producing crystalline silicon |
EP1048758A1 (en) * | 1999-04-30 | 2000-11-02 | Mitsubishi Materials Corporation | Method for producing crystalline silicon |
WO2006093089A1 (ja) * | 2005-02-28 | 2006-09-08 | Kyocera Corporation | 多結晶シリコン基板、多結晶シリコンインゴット及びそれらの製造方法、光電変換素子、並びに光電変換モジュール |
WO2006093099A1 (ja) * | 2005-02-28 | 2006-09-08 | Kyocera Corporation | 多結晶シリコン基板、多結晶シリコンインゴット及びそれらの製造方法、光電変換素子、並びに光電変換モジュール |
JP2007051047A (ja) * | 2005-08-16 | 2007-03-01 | Norichika Yamauchi | 電子ビームを用いたシリコンの精錬方法及び装置 |
JP2009532316A (ja) * | 2006-04-04 | 2009-09-10 | 6エヌ シリコン インク. | 珪素精製方法 |
US7682585B2 (en) | 2006-04-25 | 2010-03-23 | The Arizona Board Of Regents On Behalf Of The University Of Arizona | Silicon refining process |
JP2008247723A (ja) * | 2007-03-30 | 2008-10-16 | Admatechs Co Ltd | 金属ケイ素粉末の製造方法、球状シリカ粉末の製造方法及び樹脂組成物の製造方法 |
US8801855B2 (en) | 2007-10-03 | 2014-08-12 | Silicor Materials Inc. | Method for processing silicon powder to obtain silicon crystals |
JP2009114053A (ja) * | 2007-10-17 | 2009-05-28 | Sumitomo Chemical Co Ltd | 精製シリコンの製造方法 |
JP2010235322A (ja) * | 2009-03-30 | 2010-10-21 | Cosmo Oil Co Ltd | 多結晶シリコンインゴットの製造方法 |
US8580218B2 (en) | 2009-08-21 | 2013-11-12 | Silicor Materials Inc. | Method of purifying silicon utilizing cascading process |
JP2013519619A (ja) * | 2010-02-12 | 2013-05-30 | 政宏 星野 | 太陽電池用金属シリコンを精製するための装置及び方法 |
WO2012133986A1 (ko) * | 2011-03-31 | 2012-10-04 | 연세대학교 산학협력단 | 슬래그와 실리콘의 밀도차이를 이용한 MG-Si중 불순물의 정련 방법 |
Also Published As
Publication number | Publication date |
---|---|
EP0869102B1 (en) | 2002-05-22 |
EP0869102A4 (en) | 1998-12-23 |
EP0869102A1 (en) | 1998-10-07 |
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