US7078989B2 - Multi-mode surface acoustic wave filter device and duplexer - Google Patents

Multi-mode surface acoustic wave filter device and duplexer Download PDF

Info

Publication number
US7078989B2
US7078989B2 US10/682,917 US68291703A US7078989B2 US 7078989 B2 US7078989 B2 US 7078989B2 US 68291703 A US68291703 A US 68291703A US 7078989 B2 US7078989 B2 US 7078989B2
Authority
US
United States
Prior art keywords
surface acoustic
idt
acoustic wave
output
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US10/682,917
Other languages
English (en)
Other versions
US20040075511A1 (en
Inventor
Shogo Inoue
Jun Tsutsumi
Takashi Matsuda
Masanori Ueda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Media Devices Ltd
Taiyo Yuden Co Ltd
Taiyo Yuden Mobile Technology Co Ltd
Original Assignee
Fujitsu Ltd
Fujitsu Media Devices Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Fujitsu Media Devices Ltd filed Critical Fujitsu Ltd
Assigned to FUJITSU MEDIA DEVICES LIMITED, FUJITSU LIMITED reassignment FUJITSU MEDIA DEVICES LIMITED ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: INOUE, SHOGO, MATSUDA, TAKASHI, TSUTSUMI, JUN, UEDA, MASANORI
Publication of US20040075511A1 publication Critical patent/US20040075511A1/en
Application granted granted Critical
Publication of US7078989B2 publication Critical patent/US7078989B2/en
Assigned to TAIYO YUDEN CO., LTD. reassignment TAIYO YUDEN CO., LTD. ASSIGNMENT OF ASSIGNOR'S ENTIRE SHARE OF RIGHT, TITLE AND INTEREST Assignors: FUJITSU LIMITED
Assigned to TAIYO YUDEN MOBILE TECHNOLOGY CO., LTD. reassignment TAIYO YUDEN MOBILE TECHNOLOGY CO., LTD. ASSIGNMENT OF AN UNDIVIDED PARTIAL RIGHT, TITLE AND INTEREST Assignors: FUJITSU MEDIA DEVICES LIMITED
Assigned to TAIYO YUDEN CO., LTD. reassignment TAIYO YUDEN CO., LTD. ASSIGNMENT OF AN UNDIVIDED PARTIAL RIGHT, TITLE AND INTEREST Assignors: TAIYO YUDEN MOBILE TECHNOLOGY CO., LTD.
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/46Filters
    • H03H9/64Filters using surface acoustic waves
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02535Details of surface acoustic wave devices
    • H03H9/02637Details concerning reflective or coupling arrays
    • H03H9/02685Grating lines having particular arrangements
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/46Filters
    • H03H9/64Filters using surface acoustic waves
    • H03H9/6423Means for obtaining a particular transfer characteristic
    • H03H9/643Means for obtaining a particular transfer characteristic the transfer characteristic being determined by reflective or coupling array characteristics
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/46Filters
    • H03H9/64Filters using surface acoustic waves
    • H03H9/6423Means for obtaining a particular transfer characteristic
    • H03H9/6433Coupled resonator filters
    • H03H9/6436Coupled resonator filters having one acoustic track only
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/46Filters
    • H03H9/64Filters using surface acoustic waves
    • H03H9/6423Means for obtaining a particular transfer characteristic
    • H03H9/6433Coupled resonator filters
    • H03H9/644Coupled resonator filters having two acoustic tracks
    • H03H9/6456Coupled resonator filters having two acoustic tracks being electrically coupled
    • H03H9/6469Coupled resonator filters having two acoustic tracks being electrically coupled via two connecting electrodes
    • H03H9/6476Coupled resonator filters having two acoustic tracks being electrically coupled via two connecting electrodes the tracks being electrically parallel
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/46Filters
    • H03H9/64Filters using surface acoustic waves
    • H03H9/6423Means for obtaining a particular transfer characteristic
    • H03H9/6433Coupled resonator filters
    • H03H9/6483Ladder SAW filters
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/46Filters
    • H03H9/64Filters using surface acoustic waves
    • H03H9/6489Compensation of undesirable effects
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/70Multiple-port networks for connecting several sources or loads, working on different frequencies or frequency bands, to a common load or source
    • H03H9/72Networks using surface acoustic waves
    • H03H9/725Duplexers
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02535Details of surface acoustic wave devices
    • H03H9/02818Means for compensation or elimination of undesirable effects
    • H03H9/02913Measures for shielding against electromagnetic fields
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02535Details of surface acoustic wave devices
    • H03H9/02992Details of bus bars, contact pads or other electrical connections for finger electrodes

Definitions

  • the present invention relates to multi-mode surface acoustic wave filter devices.
  • Multi-mode surface acoustic wave (SAW) filters are well known as bandpass filters (see Proc. IEEE Ultrason. Symp., pp. 95–104, 1992, for example).
  • a multi-mode SAW filter normally has input IDTs (interdigital transducers) and output IDTs arranged alternately, with SAW reflectors being provided at either end.
  • the most common type of multi-mode SAW filter has one input IDT denoted by reference numeral 20 in FIG. 1 , and two output IDTs denoted by reference numerals 30 and 40 .
  • a filter having this structure utilizes two resonance modes, and therefore, is often called a “double-mode SAW (DMS) filter”.
  • DMS double-mode SAW
  • a grating reflector 50 is provided in the propagation direction of surface acoustic waves on the external side of the output IDT 30 .
  • a grating reflector 60 is provided in the propagation direction of surface acoustic waves on the external side of the output IDT 40 .
  • the input IDT 20 and the output IDTs 30 and 40 are formed on a piezoelectric substrate 10 .
  • Each of the input IDT 20 and the output IDTs 30 and 40 has a signal terminal (input/output) and a ground terminal that are connected to a signal bus bar and a ground bus bar, respectively.
  • a “bus bar” is a conductive thin film that is connected to IDT electrode fingers and extends in the propagation direction of surface acoustic waves. More specifically, the input IDT 20 has an input terminal 25 and a ground terminal 26 that are connected to a signal bus bar 21 and a ground bus bar 22 , respectively.
  • the output IDT 30 has an output terminal 35 and a ground terminal 36 that are connected to a signal bus bar 31 and a ground bus bar 32 , respectively.
  • the output IDT 40 has the output terminal 35 (shared with the output IDT 30 ) and the ground terminal 36 (also shared with the output IDT 30 ) that are connected to a signal bus bar 41 and a ground bus bar 42 , respectively.
  • the signal electrode fingers extend from the corresponding signal bus bar to the corresponding ground bus bar. More specifically, the signal electrode fingers 23 of the input IDT 20 extend from the signal bus bar 21 to the ground bus bar 22 . The signal electrode fingers 33 of the output IDT 30 extend from the signal bus bar 31 to the ground bus bar 32 . Likewise, the signal electrode fingers 43 of the output IDT 40 extend from the signal bus bar 41 to the ground bus bar 42 . Also, in each of the input IDT 20 and the output IDTs 30 and 40 , the ground electrode fingers extend from the corresponding ground bus bar to the corresponding signal bus bar.
  • ground electrode fingers 24 of the input IDT 20 extend from the ground bus bar 22 to the signal bus bar 21 .
  • the ground electrode fingers 34 of the output IDT 30 extend from the ground bus bar 32 to the signal bus bar 31 .
  • the ground electrode fingers 44 of the output IDT 40 extend from the ground bus bar 42 to the signal bus bar 41 .
  • the input terminal and the output terminal are normally arranged opposite to each other, so that signals can be prevented from reaching the output terminal from the input terminal through the air or the substrate. Accordingly, the ground electrode fingers 24 of the input IDT 20 extend in the opposite direction to (180-degree different from) the ground electrode fingers 34 and 44 .
  • FIG. 2 shows typical bandpass characteristics of a conventional DMS filter.
  • an insertion loss of approximately ⁇ 4 dB and a stop-band suppression of ⁇ 35 dB are obtained.
  • the bandpass characteristics of a conventional DMS filter exhibit poor steepness in the rising region and the declining region, as shown in FIG. 2 . Also, there is a lump-like shoulder formed in the stop-band area on the high-frequency side, as shown in FIG. 2 . Furthermore, the insertion loss becomes too great. Filters to be employed in communication systems for mobile telephone communications or the likes are normally expected to have only a small loss and to be able to exhibit a very steep decline at both ends of the pass-band area. Most conventional DMS filters have failed to maintain those characteristics that are expected in filters for mobile communication systems.
  • a more specific object of the present invention is to provide a high-performance surface acoustic wave filter that exhibits a small loss and steep cut-off characteristics, and a duplexer using such a surface acoustic wave filter.
  • a multi-mode surface acoustic wave filter device comprising: a piezoelectric substrate; at least one input IDT (interdigital transducer) and at least one output IDT that are formed on the piezoelectric substrate; reflectors that are formed on the piezoelectric substrate and arranged on external sides of the input IDT and the output IDT; an input terminal that supplies input signals to the input IDT; and an output terminal that receives output signals from the output IDT, the input terminal and the output terminal extending in an identical direction.
  • IDT interdigital transducer
  • a multi-mode surface acoustic wave filter device comprising: a piezoelectric substrate; at least one input IDT and at least one output IDT that are formed on the piezoelectric substrate; and reflectors that are formed on the piezoelectric substrate and arranged on external sides of the input IDT and the output IDT, ground electrode fingers of the input IDT and ground electrode fingers of the output IDT being connected to an identical ground bus bar.
  • a multi-mode surface acoustic wave filter device comprising at least two multi-mode surface acoustic wave filters that are electrically connected in parallel, each of the at least two multi-mode surface acoustic wave filters comprising: a piezoelectric substrate; at least one input IDT and at least one output IDT that are formed on the piezoelectric substrate; reflectors that are formed on the piezoelectric substrate and arranged on external sides of the input IDT and the output IDT; an input terminal that supplies input signals to the input IDT; and an output terminal that receives output signals from the output IDT, the input terminal and the output terminal extending in an identical direction.
  • a multi-mode surface acoustic wave filter device comprising at least two multi-mode surface acoustic wave filters that are electrically connected in parallel, each of the at least two multi-mode surface acoustic wave filters comprising: a piezoelectric substrate; at least one input IDT and at least one output IDT that are formed on the piezoelectric substrate; and reflectors that are formed on the piezoelectric substrate and arranged on external sides of the input IDT and the output IDT, ground electrode fingers of the input IDT and ground electrode fingers of the output IDT being connected to an identical ground bus bar.
  • a multi-mode surface acoustic wave filter device comprising at least two multi-mode surface acoustic wave filters that are electrically connected in parallel, each of the at least two multi-mode surface acoustic wave filters comprising: a piezoelectric substrate; at least one input IDT and at least one output IDT that are formed on the piezoelectric substrate; and reflectors that are formed on the piezoelectric substrate and arranged on external sides of the input IDT and the output IDT, the at least two multi-mode surface acoustic wave filters connected in parallel being arranged so as to have identical surface acoustic wave propagation paths, and a common reflector being interposed between the at least two multi-mode surface acoustic wave filters, the common reflector being shared between the at least two multi-mode surface acoustic wave filters.
  • a multi-mode surface acoustic wave filter device comprising at least two multi-mode surface acoustic wave filters that are electrically connected in parallel, each of the at least two multi-mode surface acoustic wave filters comprising: a piezoelectric substrate; at least one input IDT and at least one output IDT that are formed on the piezoelectric substrate; and reflectors that are formed on the piezoelectric substrate and arranged on external sides of the input IDT and the output IDT, the at least two multi-mode surface acoustic wave filters connected in parallel being arranged so as to have identical surface acoustic wave propagation paths, and grating electrodes being interposed between each two neighboring multi-mode surface acoustic wave filters among the at least two multi-mode surface acoustic wave filters connected in parallel, the grating electrodes being arranged at an angle not perpendicular to propagation directions of surface acoustic waves.
  • a multi-mode surface acoustic wave filter device comprising at least two multi-mode surface acoustic wave filters that are electrically connected in parallel, each of the at least two multi-mode surface acoustic wave filters comprising: a piezoelectric substrate; and at least one input IDT and at least one output IDT that are formed on the piezoelectric substrate, the at least two multi-mode surface acoustic wave filters connected in parallel being arranged so as to have identical surface acoustic wave propagation paths, and a triangular prism pattern being interposed between each two neighboring multi-mode surface acoustic wave filters among the at least two multi-mode surface acoustic wave filters connected in parallel.
  • a multi-mode surface acoustic filter device comprising two or more multi-mode surface acoustic wave filters that are cascaded to each other, forming two or more sets of multi-mode surface acoustic wave filters, each of the two or more cascaded multi-mode surface acoustic wave filters comprising: a piezoelectric substrate; at least one input IDT and at least one output IDT that are formed on the piezoelectric substrate; reflectors that are formed on the piezoelectric substrate and arranged on external sides of the input IDT and the output IDT; an input terminal that supplies input signals to the input IDT; and an output terminal that receives output signals from the output IDT, the input terminal and the output terminal extending in an identical direction.
  • a multi-mode surface acoustic wave filter device comprising: a piezoelectric substrate; at least one input IDT and at least one output IDT that are formed on the piezoelectric substrate; and reflectors that are formed on the piezoelectric substrate and arranged on external sides of the input IDT and the output IDT, ground electrode fingers of the input IDT extending in the same direction as ground electrode fingers of the output IDT.
  • a multi-mode surface acoustic wave filter device comprising at least two multi-mode surface acoustic wave filters that are electrically connected in parallel, each of the at least two multi-mode surface acoustic wave filters comprising: a piezoelectric substrate; at least one input IDT and at least one output IDT that are formed on the piezoelectric substrate; and reflectors that are formed on the piezoelectric substrate and arranged on external sides of the input IDT and the output IDT, ground electrode fingers of the input IDT extending in the same direction as ground electrode fingers of the output IDT.
  • a surface acoustic wave duplexer comprising a transmission filter and a reception filter, at least one of the transmission filter and the reception filter being a multi-mode surface acoustic wave filter that comprises: a piezoelectric substrate; at least one input IDT and at least one output IDT that are formed on the piezoelectric substrate; reflectors that are formed on the piezoelectric substrate and arranged on external sides of the input IDT and the output IDT; an input terminal that supplies input signals to the input IDT; and an output terminal that receives output signals from the output IDT, the input terminal and the output terminal extending in an identical direction.
  • FIG. 1 illustrates a conventional double-mode SAW (DMS) filter
  • FIG. 2 shows the characteristics of the conventional DMS filter shown in FIG. 1 ;
  • FIG. 3 illustrates a DMS filter device in accordance of a first embodiment of the present invention
  • FIG. 4 illustrates a first modification of the first embodiment
  • FIG. 5 illustrates a second modification of the first embodiment
  • FIG. 6 shows the filter characteristics of the conventional DMS filter of FIG. 1 and the DMS filters of the first embodiment and the first and second modifications;
  • FIG. 7 shows the results of 1.9-GHz-band simulations carried out on the conventional DMS filter of FIG. 1 and the DMS filters of the first embodiment and the first and second modifications;
  • FIG. 8 shows the results of 800-MHz-band simulations carried out on the conventional DMS filter of FIG. 1 and the DMS filters of the first embodiment and the first and second modifications;
  • FIG. 9 shows the results of 2.4-GHz-band simulations carried out on the conventional DMS filter of FIG. 1 and the DMS filters of the first embodiment and the first and second modifications;
  • FIG. 10 shows standardized filter characteristics of the conventional DMS filter of FIG. 1 and the DMS filters of the first embodiment and the first and second modifications;
  • FIGS. 11A through 11L show wiring patterns that were used in experiments for the present invention.
  • FIG. 12 shows the filter characteristics of the first embodiment and the first and second modifications, with the IDT aperture length being varied
  • FIGS. 13A through 13C illustrate structures in which filters of the second modification are connected in parallel in accordance with a second embodiment of the present invention
  • FIG. 14 shows filter characteristics differences caused by differences in the number of filters connected in parallel
  • FIG. 15 shows the results of simulations carried out on the structures shown in FIGS. 13A through 13C ;
  • FIG. 16 shows standardized filter characteristics of the structures shown in FIGS. 13A through 13C ;
  • FIG. 17 illustrates a filter structure in accordance with a third embodiment of the present invention.
  • FIG. 18 illustrates a modification of the filter structure shown in FIG. 17 ;
  • FIG. 19 shows the characteristics difference between the structure with uniform propagation paths shown in FIG. 17 and the structure with different propagation paths shown in FIG. 18 ;
  • FIG. 20 illustrates a filter structure having diagonal grating electrodes as a modification of the third embodiment
  • FIG. 21 illustrates a filter structure having a prism pattern as another modification of the third embodiment
  • FIG. 22 illustrates a filter structure in accordance with a fourth embodiment of the present invention.
  • FIG. 23 illustrates a comparative example in which two sets or stages of three DMS filters connected in parallel are cascaded to each other;
  • FIG. 24 shows the filter characteristics of the fourth embodiment and the comparative example
  • FIG. 25 shows standardized filter characteristics of the fourth embodiment and the comparative example
  • FIG. 26 illustrates a filter structure in accordance with a fifth embodiment of the present invention.
  • FIG. 27 shows a comparison between the characteristics of the fourth embodiment and the characteristics of the fifth embodiment
  • FIG. 28 illustrates a filter structure in accordance with a sixth embodiment of the present invention.
  • FIG. 29 shows a comparison between the characteristics of the fifth embodiment and the characteristics of the sixth embodiment.
  • FIG. 30 illustrates a duplexer in accordance with a seventh embodiment of the present invention.
  • the conventional DMS filter shown in FIG. 1 has the input and output terminals arranged at a distance from each other, so that signals can be prevented from reaching the output terminal from the input terminal, and that the stop-band suppression can be increased. More specifically, the IDTs are arranged in such a manner that the input terminal and the output terminal are situated opposite to each other. To increase the stop-band suppression, it is natural to design a surface acoustic wave filter in such a manner that the input terminal and the output terminal are situated opposite to each other.
  • the inventors of the present invention made an intensive study on a DMS filter in which an input terminal and an output terminal are located close to each other, i.e., a DMS filter in which an input terminal and an output terminal are adjacent to each other.
  • the input terminal for supplying input signals to the input IDT extends in the same direction as the output terminal that receives output signals from the output IDTs.
  • the ground electrode fingers of the input IDT also extend in the same direction as the ground electrode fingers of the output IDTs.
  • the inventors manufactured DMS filters each having the above structure as experiments, and observed how the filter characteristics differed from those of conventional DMS filters.
  • Each of the following embodiments and modifications has the above described arrangement and structure.
  • FIG. 3 is a plan view of a multi-mode SAW filter device in accordance with a first embodiment of the present invention.
  • This multi-mode SAW filter is a DMS filter that has an input IDT 20 and output IDTs 30 A and 40 A.
  • Reflectors 50 and 60 that include grating electrodes formed on a piezoelectric substrate 10 are provided on the external sides of the output IDTs 30 A and 40 A.
  • the ground electrode fingers 24 of the input IDT 20 extend in the same direction as the ground electrode fingers 34 and 44 of the output IDTs 30 A and 40 A.
  • the signal electrode fingers 23 of the input IDT 20 extend in the same direction as the signal electrode fingers 33 and 43 of the output IDTs 30 A and 40 A.
  • the input terminal 25 of the input IDT 20 and the output terminal 35 of the output IDTs 30 A and 40 A extend in the same direction and are adjacent to each other.
  • the ground terminal 26 of the input IDT 20 and the ground terminal 36 of the output IDTs 30 A and 40 A extend in the same direction and are adjacent to each other.
  • the DMS filter shown in FIG. 3 was produced, and the frequency characteristics in the 1.9 GHz band were measured.
  • the measurement results are shown in FIG. 6 .
  • the abscissa axis in FIG. 6 indicates frequency (MHz), while the ordinate axis indicates insertion loss (dB).
  • the aperture length W (the length of the overlapping part of the adjacent electrode fingers, as shown in FIG. 1 ) is 80 ⁇ .
  • represents the wavelength of surface acoustic waves.
  • the broken line indicates the characteristics of the DMS filter shown in FIG. 3
  • the thin solid line indicates the characteristics of the conventional DMS filter shown in FIG. 1 .
  • the steepness in the rising region and the declining region of the filter characteristics greatly increased without impedance mismatching, compared with the conventional filter characteristics indicated by the thin solid line. Also, the insertion loss in the pass band decreased.
  • FIG. 4 illustrates a first modification of the first embodiment.
  • the same components as those shown in FIG. 3 are denoted by the same reference numerals as those in FIG. 3 .
  • the ground terminal 26 of the input IDT 20 of FIG. 3 is connected to the ground terminal 36 of the output IDTs 30 A and 40 A of FIG. 3 on the piezoelectric substrate 10 , so that a common ground terminal 26 A is formed.
  • FIG. 5 illustrates a second modification of the first embodiment.
  • the same components as those shown in FIG. 3 are denoted by the same reference numerals as the corresponding ones in FIG. 3 .
  • the ground bus bar 22 of the input IDT 20 is connected to the ground bus bars 32 and 42 of the output IDTs 30 A and 40 A on the piezoelectric substrate 10 , so that a common ground bus bar 22 A is formed.
  • the ground potential of the input IDT 20 is equal to the ground potential of the output IDTs 30 A and 40 A on the piezoelectric substrate 10 .
  • the steepness increased further, and the loss decreased further, as indicated by the bold solid line in FIG. 6 .
  • FIG. 7 shows the results of simulations in which the 1.9-GHz-band filter characteristics of the first embodiment and its modifications shown in FIG. 6 were reproduced.
  • the thin solid line indicates the characteristics of the conventional DMS filter shown in FIG. 1
  • the broken line indicates the characteristics of the DMS filter of the first embodiment shown in FIG. 3
  • the bold solid line indicates the characteristics of the DMS filters of the modifications shown in FIGS. 4 and 5 .
  • FIG. 8 shows the results of the calculations carried out on the filter characteristics in the 800 MHz band that is often used in mobile telephone communications.
  • FIG. 9 shows the results of the calculations carried out on the filter characteristics in the 2.4 GHz band that is often used in wireless LANs or the likes.
  • the electrode pitch, the aperture length, the electrode thickness, the bus bar width, the wiring patterns, and others were analogously enlarged or reduced, so that the center frequency became 800 MHz or 2.4 GHz.
  • FIG. 10 shows filter characteristics that were obtained by standardizing (normalizing) the characteristics improving effects of the DMS filters shown in FIG. 6 using the center frequency of the DMS filters, with the above observations being taken into consideration.
  • the abscissa axis indicates standardized frequency f/f 0 that is normalized with the center frequency f 0 of each filter, and the ordinate axis indicates insertion loss (dB).
  • dB insertion loss
  • FIGS. 11A through 11L show twelve different wiring layouts.
  • the input terminal for supplying input signals to the input IDT and the output terminals that receive output signals from the output IDTs extend in the same direction through the respective wiring patterns.
  • the ground electrode fingers of the input IDT extend in the same directions as the ground electrode fingers of the output IDTs.
  • the input wiring patterns and the output wiring patterns are denoted by “IN” and “OUT” only in FIGS. 11A , 11 B, and 11 C, but the denotations are omitted in the other drawings for convenience sake.
  • the input wiring pattern IN is interposed between two output wiring patterns OUT.
  • the number of electrode finger pairs is 7.5 in each input IDT, and 6.5 in each output IDT.
  • the number of electrode finger pairs of each IDT is not limited to the above.
  • the number of electrode finger pairs may be 7 to 20 in an input IDT, and 6 to 18 in an output IDT, for example.
  • the number of electrodes that are actually employed in each of the reflectors is several tens to several hundreds. Filters were produced according to the twelve layouts shown in FIGS. 11A through 11L , and the characteristics of each of the filters were then evaluated. The evaluation results showed that the effects of increasing steepness and decreasing insertion loss were obtained with each of the filters of FIGS. 11A through 11L . This proves that, regardless of a small difference in the wiring layout, the same characteristics improving effects can be obtained with filters each having the input terminal and the output terminals extending in the same direction.
  • the second embodiment has a structure that can increase the steepness in the declining region of the filter characteristics more than that in the first embodiment, and can reduce the insertion loss even further.
  • Changes in the characteristics were first observed as to a structure having the input terminal and the output terminal adjacent to each other, with the aperture length W of each IDT being varied.
  • the electrode structure used in this experiment is the same as the structure shown in FIG. 5 , having a shared ground bus bar (the common ground bus bar 22 A).
  • the experiment results are shown in FIG. 12 . From these results, it was found that the declining region of the filter characteristics on the high-frequency side shifted toward the low-frequency side after the aperture length was reduced, and that the steepness in the declining region increased.
  • FIGS. 13A through 13C show examples of such DMS filters connected in parallel.
  • the DMS filter shown in FIG. 5 is used. If the aperture length of a DMS filter 100 (shown in FIG. 13A ) in which impedance matching is maintained with the aperture length W is reduced to 1/N (N being an integer) of the aperture length W, the IDT electrostatic capacitance also becomes 1/N of its original quantity.
  • N of DMS filters each having the aperture length of 1/N of the aperture length W are electrically connected in parallel, so that the total electrostatic capacitance becomes equal to the electrostatic capacitance of a DMS filter having the aperture length W.
  • impedance matching can be maintained with DMS filters having smaller aperture lengths, and a great steepness can be achieved in the declining region of the filter characteristics.
  • the DMS filters to be connected in parallel should preferably have the same pass bands. If the DMS filters have different pass bands, spurious peaks might appear in the pass bands.
  • the inventors actually manufactured, as experiments, a 1.9-GHz-band filter having two DMS filters 100 1 and 100 2 (N being 2) connected in parallel, and another 1.9-GHz-band filter having three DMS filters 100 1 , 100 2 , and 100 3 (N being 3) connected in parallel, as shown in FIGS. 13B and 13C .
  • the results of evaluation made on these filters are shown in FIG. 14 .
  • the aperture length of each DMS filter became smaller, and the steepness in the declining region of the filter characteristics increased, accordingly.
  • N of DMS filters were connected in parallel, the aperture length of each DMS filter became 1/N of the original aperture length W, and the number of IDT electrode finger pairs was multiplied by N. Accordingly, the IDT resistance greatly decreased to 1/N 2 of the original IDT resistance. As a result, the insertion loss greatly decreased.
  • the frequency characteristics of the DMS filters shown in FIGS. 13A through 13C were calculated in frequency bands other than the 1.9 GHz band in the same manner as in the simulations shown in FIGS. 7 through 9 .
  • the calculations were carried out in the 800 MHz band and the 2.4 GHz band, as in the simulations shown in FIGS. 7 through 9 , and the results were substantially the same as the results of calculations carried out in the 1.9 GHz band.
  • the simulation results are shown in FIG. 15 .
  • the abscissa axis indicates standardized frequency f/f 0
  • the ordinate axis indicates insertion loss (dB).
  • the calculation results are very similar to the experiment results of the experimental DMS filters.
  • DMS filters connected in parallel exhibit the effect of improving filter characteristics in any frequency band, regardless of the center frequency of each DMS filter.
  • FIG. 16 shows filter characteristics that were obtained by standardizing the characteristics improving effects of the DMS filters shown in FIG. 14 , with the center frequency of the DMS filters being the standard.
  • the abscissa axis indicates standardized frequency f/f 0 that is normalized with the filter center frequency f 0
  • the ordinate axis indicates insertion loss (dB).
  • the characteristics improving effects of DMS filters connected in parallel are seen with filters of any frequency band, regardless of the center frequency of each filter.
  • FIG. 17 shows an arrangement that can realize the smallest possible filter size.
  • Two DMS filters 100 1 and 100 2 are aligned so as to have the same SAW propagation directions.
  • a common reflector 70 is provided between the two DMS filters 100 1 and 100 2 .
  • This common reflector 70 serves as a common reflector for the two DMS filters 100 1 and 100 2 . With this arrangement, the area of one reflector can be saved, and the filter size can be reduced accordingly.
  • FIG. 18 illustrates the structure of a SAW filter in which the two DMS filters are arranged so as to have different SAW propagation paths.
  • the common reflector 70 is divided into two reflectors 70 A and 70 B.
  • the reflector 70 A serves as a reflector for the DMS filter 100 1
  • the reflector 70 B serves as a reflector for the DMS filter 100 2 .
  • the reflectors 70 A and 70 B are aligned in the perpendicular direction to the SAW propagation direction.
  • FIG. 19 shows the characteristics of the SAW filter of FIG. 17 and the characteristics of the SAW filter of FIG. 18 .
  • the characteristics of the SAW filter of FIG. 17 have small spurious peaks on the low-frequency side of the pass band, though the two SAW filters exhibit similar filter characteristics.
  • the spurious peaks are formed due to surface acoustic waves reaching the other DMS filter through the common reflector 70 , and might cause a problem.
  • FIGS. 20 and 21 The structure shown in FIG. 20 has diagonal grating electrodes 71 inside a common reflector 70 A between the two DMS filters 100 1 and 100 2 .
  • the diagonal grating electrodes 71 extend in a direction not perpendicular to the SAW propagation direction (or, not in parallel with the reflector electrodes). As the diagonal grating electrodes 71 bend the SAW propagation paths, surface acoustic waves are prevented from passing through the common reflector.
  • the structure of the SAW filter shown in FIG. 21 has a triangular prism pattern (a solid pattern) 72 inside a reflector 70 B between the two DMS filters 100 1 and 100 2 .
  • a triangular prism pattern 72 When entering the prism pattern 72 , surface acoustic waves are bent by virtue of a difference in propagation speed. Accordingly, surface acoustic waves are prevented from passing through the common reflector.
  • spurious peaks outside the pass band can be suppressed, and a small-sized filter can be realized.
  • the present invention can be readily applied not only to DMS filters each having one input IDT and two output IDTs, but also to multi-mode SAW filters each having, for example, two input IDTs and three output IDTs, thereby providing excellent SAW filters that exhibit low insertion losses and steep cut-off characteristics.
  • FIG. 22 illustrates a filter structure in accordance with a fourth embodiment of the present invention.
  • This filter structure includes two cascaded sets or stages of DMS filters.
  • each set has three DMS filters connected in parallel. With the two sets of cascaded DMS filters, the stop-band suppression can be at least doubled.
  • the three DMS filters of the first set are denoted by reference numerals 200 1 , 200 2 , and 200 3
  • the three DMS filters of the second set are denoted by reference numerals 200 4 , 200 5 , and 200 6 .
  • the DMS filters 200 1 , 200 2 , and 200 3 of the first set each has one input IDT and two output IDTs.
  • the DMS filters 200 4 , 200 5 , and 200 6 of the second set each has two input IDTs and one output IDT.
  • the input IDTs of the DMS filters 200 4 , 200 5 , and 200 6 of the second set are connected to the output IDTs of the DMS filters 200 1 , 200 2 , and 200 3 of the first set via common signal lines 90 .
  • the DMS filters 200 1 , 200 2 , and 200 3 of the first set have a common ground bus bar 91 .
  • the ground electrode fingers of the input IDTs and the output IDTs and the electrode fingers of the common reflectors of the first set extend from the common ground bus bar 91 .
  • the DMS filters 200 4 , 200 5 , and 200 6 of the second set have a common ground bus bar 92 .
  • the ground electrode fingers of the input IDTs and the output IDTs and the electrode fingers of the common reflectors of the second set extend from the common ground bus bar 92 . In this manner, the ground terminals of the DMS filters connected in parallel are connected to one another in each set on the piezoelectric substrate 10 .
  • the ground terminals of the DMS filters of each set can be connected to the ground terminal of a package with only one bonding wire or one bonding bump. Accordingly, the packaging process can be simplified. Also, the DMS filters connected in parallel are aligned on the same propagation path in each set, so that reflectors can be shared among the filters, and the filter size can be reduced accordingly.
  • FIG. 23 shows a structure in which two sets of three parallel-connected conventional DMS filters are longitudinally coupled with each other or cascaded. Since the reflectors are not shared among the filters in this structure, the filter size in the SAW propagation direction is larger than that of the structure shown in FIG. 22 . Also, since the ground terminals of the parallel-connected DMS filters of each set are not connected to one another on the piezoelectric substrate 10 , there exist a large number of ground terminals, and at least six bonding wires or six bonding bumps are required for connecting each set to the ground terminal of a package. As a result, the packaging process becomes complicated.
  • FIG. 24 shows a comparison between the 1.9-GHz-band filter characteristics of the SAW filter of the fourth embodiment shown in FIG. 22 , and the filter characteristics of the comparative example shown in FIG. 23 .
  • the abscissa axis indicates frequency (MHz), and the ordinate axis indicates insertion loss (dB).
  • the SAW filter of the present invention has the input terminal and the output terminal adjacent to each other (i.e., the ground electrode fingers of the input IDTs extend in the same direction as the ground electrode fingers of the output IDTs in the SAW filter of the present invention). Accordingly, the rising region and the declining region of the filter characteristics are steep, as shown in FIG. 24 .
  • the insertion loss in the pass band is reduced by 1 dB or more.
  • the SAW filter of this embodiment has three DMS filters connected in parallel, the aperture length of each DMS filter is 1 ⁇ 3 of the aperture length of a DMS filter that is not connected in parallel with any other filter. This further increases the steepness in the declining region of the filter characteristics. As a result, the lump-like shoulder that is seen in the stop-band area on the high-frequency side in the prior art is eliminated, and a high-performance filter is obtained.
  • FIG. 25 shows filter characteristics that were obtained by standardizing the filter characteristics of the fourth embodiment.
  • the filter characteristics shown in FIG. 25 can be obtained with any pass-band frequency.
  • FIG. 26 illustrates a filter structure in accordance with the fifth embodiment.
  • a set of three DMS filters 210 1 , 210 2 , and 210 3 connected in parallel is cascaded to another set of three DMS filters 210 4 , 210 5 , and 210 6 connected in parallel.
  • a prism pattern 73 is provided between the DMS filters 210 1 and 210 2 , and also between the DMS filters 210 4 and 210 5 .
  • a prism pattern 74 is provided between the DMS filters 210 2 and 210 3 , and also between the DMS filters 210 5 and 210 6 .
  • the prism patterns 73 and 74 are not limited to the shape shown in FIG.
  • the SAW propagation paths 26 may not be triangular, as long as the SAW propagation paths can be bent. Also, two or more prism patterns may be provided between each two neighboring DMS filters. As long as the SAW propagation paths can be bent, the number and the shape of prism patterns to be employed in this embodiment are not particularly restricted. To bend the SAW propagation paths, it is also possible to employ grating electrodes extending in a direction that is not perpendicular to the SAW propagation direction, as shown in FIG. 20 .
  • FIG. 27 shows a comparison between the filter characteristics of the SAW filter of the fifth embodiment shown in FIG. 26 and the filter characteristics of the SAW filter of the fourth embodiment shown in FIG. 22 .
  • the surface acoustic waves reaching neighboring DMS filters through common reflectors are reduced, and the spurious peaks on the low-frequency side are suppressed.
  • the DMS filters that are connected in parallel so as to suppress the spurious peaks do not need to be arranged in such a manner that the SAW propagation paths of the DMS filters differ from one another. Accordingly, the filter size can be reduced.
  • FIG. 27 shows the filter characteristics in the 1.9 GHz band, the same effects can be obtained in other frequency bands, such as the 800 MHz band and the 2.4 GHz band.
  • a sixth embodiment of the present invention is the same as the fifth embodiment, except that the ground terminals of the first set of DMS filters are connected to the ground terminals of the second set of DMS filters on the piezoelectric substrate 10 .
  • FIG. 28 shows a filter device structure in accordance with the sixth embodiment.
  • a common ground pattern 95 is provided to surround all the six DMS filters, so that the entire filter structure can be connected to the ground terminal of a package with only one bonding wire or one bonding bump. Accordingly, this embodiment should realize the simplest packaging process.
  • the stop-band suppression greatly deteriorates due to the ground terminal connection between the first set and the second set on the piezoelectric substrate 10 .
  • the insertion loss in the pass band also increases.
  • FIG. 29 shows the filter characteristics in the 1.9 GHz band, the same filter characteristics can be obtained in other frequency bands, such as the 800 MHz band and the 2.4 GHz band.
  • a seventh embodiment of the present invention provides a duplexer in which any of the multi-mode SAW filters of the first to sixth embodiments can be employed.
  • FIG. 30 illustrates a duplexer that includes multi-mode SAW filters of the present invention.
  • a ladder-type SAW filter 300 is employed as the transmission filter
  • a multi-mode SAW filter 350 that has two multi-mode SAW filters cascaded is employed as the reception filter.
  • Each of the two multi-mode SAW filters of the reception filter is the same as the multi-mode SAW filter shown in FIG. 21 .
  • any one of the other embodiments of the present invention can be used for the reception filter.
  • the transmission filter may also include a multi-mode SAW filter of the present invention, or both the transmission filter and the reception filter include one or more multi-mode SAW filters of the present invention.
  • the duplexer shown in FIG. 30 further includes an input terminal 400 that is connected to an antenna, a matching circuit 410 that performs impedance matching between the transmission side and the reception side, a transmission terminal 420 that receives transmission signals, and a reception terminal 430 that outputs reception signals.
  • the rising and declining regions of the characteristics of the reception filter of the duplexer become steep. Accordingly, transmission signals and reception signals do not adversely affect each other, even if the transmission frequency band is very close to the reception frequency band.
  • Any one of the SAW filters of the above embodiments and modifications of the present invention can be mounted to a package so as to provide a packaged SAW filter device.

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
US10/682,917 2002-10-18 2003-10-14 Multi-mode surface acoustic wave filter device and duplexer Expired - Lifetime US7078989B2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2002304035 2002-10-18
JP2002-304035 2002-10-18
JP2003119132A JP3764731B2 (ja) 2002-10-18 2003-04-23 多重モード弾性表面波フィルタ及び分波器
JP2003-119132 2003-04-23

Publications (2)

Publication Number Publication Date
US20040075511A1 US20040075511A1 (en) 2004-04-22
US7078989B2 true US7078989B2 (en) 2006-07-18

Family

ID=32044698

Family Applications (1)

Application Number Title Priority Date Filing Date
US10/682,917 Expired - Lifetime US7078989B2 (en) 2002-10-18 2003-10-14 Multi-mode surface acoustic wave filter device and duplexer

Country Status (5)

Country Link
US (1) US7078989B2 (de)
EP (1) EP1411635A3 (de)
JP (1) JP3764731B2 (de)
KR (1) KR100714350B1 (de)
SG (1) SG121808A1 (de)

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070296522A1 (en) * 2006-06-21 2007-12-27 Murata Manufacturing Co., Ltd. Elastic wave filter device and duplexer
US20080168638A1 (en) * 2007-01-17 2008-07-17 Rf Micro Devices, Inc. Piezoelectric substrate for a saw device
US20080186106A1 (en) * 2005-04-29 2008-08-07 Block Christian Electrical Multiband Component
US20090002097A1 (en) * 2006-04-06 2009-01-01 Murata Manufacturing Co., Ltd. Duplexer
US20090091404A1 (en) * 2006-06-21 2009-04-09 Murata Manufacturing Co., Ltd. Acoustic wave filter device and duplexer
US20090115547A1 (en) * 2006-09-25 2009-05-07 Murata Manufacturing Co., Ltd. Boundary acoustic wave filter
US20100060103A1 (en) * 2006-11-08 2010-03-11 Yosuke Hamaoka Surface acoustic wave resonator
US20100194488A1 (en) * 2009-02-02 2010-08-05 Nihon Dempa Kogyo Co., Ltd. Receiving side filter of duplexer and duplexer
US7849582B1 (en) * 2005-05-24 2010-12-14 Rf Micro Devices, Inc. SAW architecture with series connected interdigitated transducers
US8138858B1 (en) 2007-10-29 2012-03-20 Rf Micro Devices, Inc. Architectures using multiple dual-mode surface acoustic wave devices
US20120274418A1 (en) * 2010-01-28 2012-11-01 Murata Manufacturing Co., Ltd. Branching filter
US8490260B1 (en) 2007-01-17 2013-07-23 Rf Micro Devices, Inc. Method of manufacturing SAW device substrates
US20140159833A1 (en) * 2012-03-14 2014-06-12 Panasonic Corporation Elastic wave device
US20160065175A1 (en) * 2013-06-13 2016-03-03 Murata Manufacturing Co., Ltd. Surface acoustic wave filter, surface acoustic wave filter device, and duplexer
US9860006B1 (en) * 2016-07-15 2018-01-02 Murata Manufacturing Co., Ltd. Multiplexer, high-frequency front-end circuit, and communication device
US20180254765A1 (en) * 2015-12-24 2018-09-06 Murata Manufacturing Co., Ltd. Elastic wave device
US20220149812A1 (en) * 2019-04-04 2022-05-12 RF360 Europe GmbH Modified saw transducer, saw resonator, and saw filter comprising same

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3833569B2 (ja) * 2001-12-21 2006-10-11 富士通メディアデバイス株式会社 分波器及びこれを用いた電子装置
KR100638780B1 (ko) * 2003-04-25 2006-10-30 후지쓰 메디아 데바이스 가부시키가이샤 분파기
JP4303178B2 (ja) 2004-08-31 2009-07-29 富士通メディアデバイス株式会社 弾性表面波装置
JP2006135447A (ja) * 2004-11-02 2006-05-25 Fujitsu Media Device Kk 分波器
JP4537254B2 (ja) * 2005-04-28 2010-09-01 富士通メディアデバイス株式会社 弾性表面波フィルタおよび分波器
JP5039290B2 (ja) * 2005-08-25 2012-10-03 太陽誘電株式会社 フィルタおよびアンテナ分波器
KR100697764B1 (ko) * 2005-10-26 2007-03-22 후지쓰 메디아 데바이스 가부시키가이샤 탄성 표면파 장치
JP4294632B2 (ja) * 2005-10-26 2009-07-15 富士通メディアデバイス株式会社 弾性表面波装置
WO2007083432A1 (ja) * 2006-01-18 2007-07-26 Murata Manufacturing Co., Ltd. 弾性表面波装置及び弾性境界波装置
JP4876658B2 (ja) * 2006-03-23 2012-02-15 パナソニック株式会社 弾性表面波フィルタ及びそれを用いた通信機器
JP4244057B2 (ja) 2006-08-30 2009-03-25 富士通メディアデバイス株式会社 バランスフィルタおよび分波器
WO2009119016A1 (ja) * 2008-03-27 2009-10-01 株式会社村田製作所 弾性波フィルタ装置
JP5158725B2 (ja) 2008-04-25 2013-03-06 京セラ株式会社 弾性表面波装置およびそれを用いた通信装置
JPWO2010001534A1 (ja) * 2008-07-04 2011-12-15 株式会社村田製作所 弾性波フィルタ装置
KR101232242B1 (ko) * 2008-11-04 2013-02-12 가부시키가이샤 무라타 세이사쿠쇼 탄성파 필터장치 및 그것을 포함하는 모듈
DE102009009484B4 (de) 2009-02-19 2014-07-17 Epcos Ag Zweikanal-SAW Filter
KR102443568B1 (ko) 2015-08-05 2022-09-16 가부시키가이샤 와이솔재팬 탄성 표면파 장치
KR102432680B1 (ko) 2015-08-05 2022-08-16 가부시키가이샤 와이솔재팬 탄성 표면파 장치
JP6402704B2 (ja) * 2015-11-19 2018-10-10 株式会社村田製作所 弾性波装置、デュプレクサ及びマルチプレクサ
JP6888691B2 (ja) * 2017-12-19 2021-06-16 株式会社村田製作所 弾性波装置

Citations (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0555871A (ja) * 1991-08-21 1993-03-05 Toyo Commun Equip Co Ltd 縦結合多重モードsawフイルタ
US5392013A (en) * 1992-07-17 1995-02-21 Nec Corporation Surface acoustic wave filter capable of widening a bandwidth
US5396199A (en) * 1992-09-02 1995-03-07 Mitsubishi Denki Kabushiki Kaisha Surface acoustic wave device
JPH07283689A (ja) 1994-04-12 1995-10-27 Murata Mfg Co Ltd 弾性表面波共振子フィルタ
JPH08181566A (ja) * 1994-12-27 1996-07-12 Toshiba Corp 弾性表面波フィルタ装置
JPH08242140A (ja) 1994-12-23 1996-09-17 Advanced Saw Prod Sa Sawフィルタ
JPH08250969A (ja) * 1995-03-14 1996-09-27 Toyo Commun Equip Co Ltd 縦結合二重モードsawフィルタ
JPH09130203A (ja) 1995-11-01 1997-05-16 Toyo Commun Equip Co Ltd 二段縦続接続縦結合二重モードsawフィルタ
JPH09162676A (ja) 1995-12-06 1997-06-20 Japan Energy Corp 弾性表面波装置
JPH09205342A (ja) * 1996-01-26 1997-08-05 Matsushita Electric Ind Co Ltd 弾性表面波フィルタ
JPH09232908A (ja) 1996-02-22 1997-09-05 Oki Electric Ind Co Ltd 弾性表面波フィルタ
JPH1070436A (ja) 1996-08-28 1998-03-10 Murata Mfg Co Ltd 弾性表面波共振子フィルタ
JPH10284988A (ja) 1997-04-09 1998-10-23 Toyo Commun Equip Co Ltd 弾性表面波フィルタ
US5929724A (en) * 1998-07-28 1999-07-27 Com Dev Ltd. Low loss saw filters with non-sequential coupling and method of operation thereof
JP2000201048A (ja) * 1999-01-08 2000-07-18 Toyo Commun Equip Co Ltd 弾性表面波フィルタ
US6163236A (en) * 1996-09-19 2000-12-19 Siemens Matsushita Components Gmbh & Co. Twin dual mode filters with reflectors between transducers being electrically connected between DMS tracks
US6329888B1 (en) * 1998-01-20 2001-12-11 Toyo Communication Equipment Co., Ltd. Reflection inversion surface acoustic wave transducer and filter
US6339365B1 (en) * 1998-12-29 2002-01-15 Kabushiki Kaisha Toshiba Surface acoustic wave device comprising first and second chips face down bonded to a common package ground
JP2002135078A (ja) 2000-10-27 2002-05-10 Murata Mfg Co Ltd 弾性表面波フィルタおよび通信機装置
US6388545B1 (en) * 1998-05-29 2002-05-14 Fujitsu Limited Surface-acoustic-wave filter having an improved suppression outside a pass-band
JP2002185284A (ja) 2000-12-15 2002-06-28 Sanyo Electric Co Ltd 弾性表面波フィルタ
US6424240B1 (en) * 1999-03-29 2002-07-23 Sanyo Electric Co., Ltd. Surface acoustic wave filter device with a shared reflector and portable telephone comprising same
JP2002300005A (ja) 2001-01-26 2002-10-11 Murata Mfg Co Ltd 弾性表面波フィルタ装置
JP2003174350A (ja) * 2001-12-06 2003-06-20 Mitsubishi Electric Corp 縦結合型弾性表面波フィルタ
US6667673B1 (en) * 1999-08-16 2003-12-23 Epcos Ag Dual-mode surface wave filter with enhanced symmetry and optionally enhanced stop-band attenuation
US6720842B2 (en) * 2000-02-14 2004-04-13 Murata Manufacturing Co., Ltd. Surface acoustic wave filter device having first through third surface acoustic wave filter elements
US6828879B2 (en) * 2001-02-16 2004-12-07 Sanyo Electric Co., Ltd. Longitudinal coupled multiple mode surface acoustic wave filter

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02272817A (ja) * 1989-04-14 1990-11-07 Hitachi Ltd 弾性表面波装置、その製造方法、及びそれを用いた通信装置
JPH03283710A (ja) * 1990-03-30 1991-12-13 Toshiba Corp 弾性表面波共振子
US5666091A (en) * 1995-03-20 1997-09-09 Hitachi Media Electronics Co., Ltd. Structure of surface acoustic wave filter
JPH08293757A (ja) * 1995-04-21 1996-11-05 Toko Inc 表面弾性波フィルタ
JP3253568B2 (ja) * 1997-08-29 2002-02-04 富士通株式会社 多段接続型弾性表面波フィルタ
DE19818826B4 (de) * 1998-04-27 2004-11-04 Epcos Ag Oberflächenwellenfilter mit erhöhter Bandbreite
KR100361692B1 (ko) * 1999-06-24 2002-11-22 주식회사 케이이씨 표면탄성파 소자
JP3435640B2 (ja) * 2000-05-22 2003-08-11 株式会社村田製作所 縦結合共振子型弾性表面波フィルタ
JP3435146B2 (ja) * 2001-04-23 2003-08-11 富士通株式会社 弾性表面波装置

Patent Citations (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0555871A (ja) * 1991-08-21 1993-03-05 Toyo Commun Equip Co Ltd 縦結合多重モードsawフイルタ
US5392013A (en) * 1992-07-17 1995-02-21 Nec Corporation Surface acoustic wave filter capable of widening a bandwidth
US5396199A (en) * 1992-09-02 1995-03-07 Mitsubishi Denki Kabushiki Kaisha Surface acoustic wave device
JPH07283689A (ja) 1994-04-12 1995-10-27 Murata Mfg Co Ltd 弾性表面波共振子フィルタ
JPH08242140A (ja) 1994-12-23 1996-09-17 Advanced Saw Prod Sa Sawフィルタ
JPH08181566A (ja) * 1994-12-27 1996-07-12 Toshiba Corp 弾性表面波フィルタ装置
JPH08250969A (ja) * 1995-03-14 1996-09-27 Toyo Commun Equip Co Ltd 縦結合二重モードsawフィルタ
JPH09130203A (ja) 1995-11-01 1997-05-16 Toyo Commun Equip Co Ltd 二段縦続接続縦結合二重モードsawフィルタ
JPH09162676A (ja) 1995-12-06 1997-06-20 Japan Energy Corp 弾性表面波装置
JPH09205342A (ja) * 1996-01-26 1997-08-05 Matsushita Electric Ind Co Ltd 弾性表面波フィルタ
JPH09232908A (ja) 1996-02-22 1997-09-05 Oki Electric Ind Co Ltd 弾性表面波フィルタ
JPH1070436A (ja) 1996-08-28 1998-03-10 Murata Mfg Co Ltd 弾性表面波共振子フィルタ
US5909158A (en) * 1996-08-28 1999-06-01 Murata Manufacturing Co., Ltd. Surface acoustic wave resonator filter with longitudinally coupled resonators having specific resonance frequency placements
US6163236A (en) * 1996-09-19 2000-12-19 Siemens Matsushita Components Gmbh & Co. Twin dual mode filters with reflectors between transducers being electrically connected between DMS tracks
JPH10284988A (ja) 1997-04-09 1998-10-23 Toyo Commun Equip Co Ltd 弾性表面波フィルタ
US6329888B1 (en) * 1998-01-20 2001-12-11 Toyo Communication Equipment Co., Ltd. Reflection inversion surface acoustic wave transducer and filter
US6388545B1 (en) * 1998-05-29 2002-05-14 Fujitsu Limited Surface-acoustic-wave filter having an improved suppression outside a pass-band
US5929724A (en) * 1998-07-28 1999-07-27 Com Dev Ltd. Low loss saw filters with non-sequential coupling and method of operation thereof
US6339365B1 (en) * 1998-12-29 2002-01-15 Kabushiki Kaisha Toshiba Surface acoustic wave device comprising first and second chips face down bonded to a common package ground
JP2000201048A (ja) * 1999-01-08 2000-07-18 Toyo Commun Equip Co Ltd 弾性表面波フィルタ
US6424240B1 (en) * 1999-03-29 2002-07-23 Sanyo Electric Co., Ltd. Surface acoustic wave filter device with a shared reflector and portable telephone comprising same
US6667673B1 (en) * 1999-08-16 2003-12-23 Epcos Ag Dual-mode surface wave filter with enhanced symmetry and optionally enhanced stop-band attenuation
US6720842B2 (en) * 2000-02-14 2004-04-13 Murata Manufacturing Co., Ltd. Surface acoustic wave filter device having first through third surface acoustic wave filter elements
JP2002135078A (ja) 2000-10-27 2002-05-10 Murata Mfg Co Ltd 弾性表面波フィルタおよび通信機装置
US6597262B2 (en) * 2000-10-27 2003-07-22 Murata Manufacturing Co., Ltd. Surface acoustic wave filter and communication apparatus incorporating the same
JP2002185284A (ja) 2000-12-15 2002-06-28 Sanyo Electric Co Ltd 弾性表面波フィルタ
JP2002300005A (ja) 2001-01-26 2002-10-11 Murata Mfg Co Ltd 弾性表面波フィルタ装置
US6710676B2 (en) * 2001-01-26 2004-03-23 Murata Manufacturing Co., Ltd. Surface acoustic wave filter device
US6828879B2 (en) * 2001-02-16 2004-12-07 Sanyo Electric Co., Ltd. Longitudinal coupled multiple mode surface acoustic wave filter
JP2003174350A (ja) * 2001-12-06 2003-06-20 Mitsubishi Electric Corp 縦結合型弾性表面波フィルタ

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
"Wideband Low Loss Double Mode Saw Filters", Takao Morita et al., IEEE 1992 Ultrasonics Symposium, pp. 95-104.

Cited By (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080186106A1 (en) * 2005-04-29 2008-08-07 Block Christian Electrical Multiband Component
US8069542B1 (en) 2005-05-24 2011-12-06 Rf Micro Devices, Inc. Interleaved interdigitated transducers
US8529986B1 (en) 2005-05-24 2013-09-10 Rf Micro Devices, Inc. Layer acoustic wave device and method of making the same
US8225470B1 (en) 2005-05-24 2012-07-24 Rf Micro Devices, Inc. Process of making series connected interdigitated transducers with center chirping
US7849582B1 (en) * 2005-05-24 2010-12-14 Rf Micro Devices, Inc. SAW architecture with series connected interdigitated transducers
US20090002097A1 (en) * 2006-04-06 2009-01-01 Murata Manufacturing Co., Ltd. Duplexer
US7459997B2 (en) 2006-06-21 2008-12-02 Murata Manufacturing Co., Ltd. Elastic wave filter device and duplexer
US20090091404A1 (en) * 2006-06-21 2009-04-09 Murata Manufacturing Co., Ltd. Acoustic wave filter device and duplexer
US20070296522A1 (en) * 2006-06-21 2007-12-27 Murata Manufacturing Co., Ltd. Elastic wave filter device and duplexer
US7876176B2 (en) * 2006-06-21 2011-01-25 Murata Manufacturing Co., Ltd. Acoustic wave filter device and duplexer
US20090115547A1 (en) * 2006-09-25 2009-05-07 Murata Manufacturing Co., Ltd. Boundary acoustic wave filter
US7808344B2 (en) * 2006-09-25 2010-10-05 Murata Manufacturing Co., Ltd. Boundary acoustic wave filter
US8084915B2 (en) * 2006-11-08 2011-12-27 Panasonic Corporation Surface acoustic wave resonator having comb electrodes with different overlapping lengths
US20100060103A1 (en) * 2006-11-08 2010-03-11 Yosuke Hamaoka Surface acoustic wave resonator
US8490260B1 (en) 2007-01-17 2013-07-23 Rf Micro Devices, Inc. Method of manufacturing SAW device substrates
US20080168638A1 (en) * 2007-01-17 2008-07-17 Rf Micro Devices, Inc. Piezoelectric substrate for a saw device
US8011074B2 (en) 2007-01-17 2011-09-06 Rf Micro Devices, Inc. Method for manufacture of piezoelectric substrate for a saw device
US8138858B1 (en) 2007-10-29 2012-03-20 Rf Micro Devices, Inc. Architectures using multiple dual-mode surface acoustic wave devices
US20100194488A1 (en) * 2009-02-02 2010-08-05 Nihon Dempa Kogyo Co., Ltd. Receiving side filter of duplexer and duplexer
US8421555B2 (en) * 2009-02-02 2013-04-16 Nihon Dempa Kogyo Co., Ltd. Receiving side filter of duplexer and duplexer
US8791774B2 (en) * 2010-01-28 2014-07-29 Murata Manufacturing Co., Ltd. Branching filter
US20120274418A1 (en) * 2010-01-28 2012-11-01 Murata Manufacturing Co., Ltd. Branching filter
US20140159833A1 (en) * 2012-03-14 2014-06-12 Panasonic Corporation Elastic wave device
US9287849B2 (en) * 2012-03-14 2016-03-15 Skyworks Panasonic Filter Solutions Japan Co., Ltd. Elastic wave device
US20160065175A1 (en) * 2013-06-13 2016-03-03 Murata Manufacturing Co., Ltd. Surface acoustic wave filter, surface acoustic wave filter device, and duplexer
US9667225B2 (en) * 2013-06-13 2017-05-30 Murata Manufacturing Co., Ltd. Surface acoustic wave filter, surface acoustic wave filter device, and duplexer including a shared reflector
US20180254765A1 (en) * 2015-12-24 2018-09-06 Murata Manufacturing Co., Ltd. Elastic wave device
US11742830B2 (en) * 2015-12-24 2023-08-29 Murata Manufacturing Co., Ltd. Elastic wave device
US9860006B1 (en) * 2016-07-15 2018-01-02 Murata Manufacturing Co., Ltd. Multiplexer, high-frequency front-end circuit, and communication device
US20220149812A1 (en) * 2019-04-04 2022-05-12 RF360 Europe GmbH Modified saw transducer, saw resonator, and saw filter comprising same
US12040777B2 (en) * 2019-04-04 2024-07-16 Rf360 Singapore Pte. Ltd. Modified saw transducer, saw resonator, and saw filter comprising same

Also Published As

Publication number Publication date
KR20040034496A (ko) 2004-04-28
KR100714350B1 (ko) 2007-05-04
JP3764731B2 (ja) 2006-04-12
US20040075511A1 (en) 2004-04-22
JP2004194269A (ja) 2004-07-08
EP1411635A3 (de) 2009-07-22
SG121808A1 (en) 2006-05-26
EP1411635A2 (de) 2004-04-21

Similar Documents

Publication Publication Date Title
US7078989B2 (en) Multi-mode surface acoustic wave filter device and duplexer
EP0652637B1 (de) Akustisches Oberflächenwellenfilter
EP2530838B1 (de) Abstimmbarer filter
US6900577B2 (en) Surface acoustic wave device and communication apparatus
US7646266B2 (en) Surface acoustic wave resonator and surface acoustic wave filter using the same
US7154359B2 (en) Surface acoustic wave filter and duplexer including the same
EP0605884A1 (de) Akustische Oberflächenwellenanordnung von IIDT-Typ
US7453335B2 (en) Surface acoustic wave resonator, surface acoustic wave filter and surface acoustic wave duplexer, and communications equipment
CA2234513C (en) Surface acoustic wave device
US7211925B2 (en) Surface acoustic wave device and branching filter
EP1263137B1 (de) Akustisches Oberflächenwellenfilter, symmetrisches Filter und Kommunikationsgerät
JP2007124085A (ja) 弾性表面波装置
US5223762A (en) Surface acoustic wave filter
JP3743341B2 (ja) 弾性表面波装置
US7327206B2 (en) Surface acoustic wave duplexer
US6933803B2 (en) Surface acoustic wave filter, branching filter, and communication apparatus
JP4373390B2 (ja) 多重モード弾性表面波フィルタ及び分波器
JP3377902B2 (ja) 弾性表面波フィルタ
US6943649B2 (en) Surface acoustic wave filter with a ground pattern partially surrounding a signal pad and communication device using same
JPWO2003096533A1 (ja) 弾性表面波素子、弾性表面波装置及び分波器
JP2001024471A (ja) 弾性表面波共振子および弾性表面波フィルタ
JP2000151355A (ja) ラダー型sawフィルタ
JP3400897B2 (ja) 多段接続型弾性表面波フィルタ

Legal Events

Date Code Title Description
AS Assignment

Owner name: FUJITSU MEDIA DEVICES LIMITED, JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:INOUE, SHOGO;TSUTSUMI, JUN;MATSUDA, TAKASHI;AND OTHERS;REEL/FRAME:014614/0196

Effective date: 20031002

Owner name: FUJITSU LIMITED, JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:INOUE, SHOGO;TSUTSUMI, JUN;MATSUDA, TAKASHI;AND OTHERS;REEL/FRAME:014614/0196

Effective date: 20031002

FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

STCF Information on status: patent grant

Free format text: PATENTED CASE

FPAY Fee payment

Year of fee payment: 4

AS Assignment

Owner name: TAIYO YUDEN CO., LTD.,JAPAN

Free format text: ASSIGNMENT OF ASSIGNOR'S ENTIRE SHARE OF RIGHT, TITLE AND INTEREST;ASSIGNOR:FUJITSU LIMITED;REEL/FRAME:024380/0001

Effective date: 20100331

Owner name: TAIYO YUDEN CO., LTD., JAPAN

Free format text: ASSIGNMENT OF ASSIGNOR'S ENTIRE SHARE OF RIGHT, TITLE AND INTEREST;ASSIGNOR:FUJITSU LIMITED;REEL/FRAME:024380/0001

Effective date: 20100331

AS Assignment

Owner name: TAIYO YUDEN MOBILE TECHNOLOGY CO., LTD., JAPAN

Free format text: ASSIGNMENT OF AN UNDIVIDED PARTIAL RIGHT, TITLE AND INTEREST;ASSIGNOR:FUJITSU MEDIA DEVICES LIMITED;REEL/FRAME:025095/0227

Effective date: 20100331

AS Assignment

Owner name: TAIYO YUDEN CO., LTD., JAPAN

Free format text: ASSIGNMENT OF AN UNDIVIDED PARTIAL RIGHT, TITLE AND INTEREST;ASSIGNOR:TAIYO YUDEN MOBILE TECHNOLOGY CO., LTD.;REEL/FRAME:025095/0899

Effective date: 20100331

FPAY Fee payment

Year of fee payment: 8

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 12TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1553)

Year of fee payment: 12