TWI691976B - 異向性導電膜、其製造方法及連接構造體 - Google Patents
異向性導電膜、其製造方法及連接構造體 Download PDFInfo
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- TWI691976B TWI691976B TW105100669A TW105100669A TWI691976B TW I691976 B TWI691976 B TW I691976B TW 105100669 A TW105100669 A TW 105100669A TW 105100669 A TW105100669 A TW 105100669A TW I691976 B TWI691976 B TW I691976B
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- Prior art keywords
- anisotropic conductive
- metal particles
- conductive film
- flux
- insulating film
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- 0 CC*=C=C=CCC(C)N Chemical compound CC*=C=C=CCC(C)N 0.000 description 1
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- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B5/00—Non-insulated conductors or conductive bodies characterised by their form
- H01B5/16—Non-insulated conductors or conductive bodies characterised by their form comprising conductive material in insulating or poorly conductive material, e.g. conductive rubber
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- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
- H05K3/323—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives by applying an anisotropic conductive adhesive layer over an array of pads
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- C09J5/00—Adhesive processes in general; Adhesive processes not provided for elsewhere, e.g. relating to primers
- C09J5/06—Adhesive processes in general; Adhesive processes not provided for elsewhere, e.g. relating to primers involving heating of the applied adhesive
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- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
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- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
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- H01L2224/32227—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the layer connector connecting to a bond pad of the item
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- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/8119—Arrangement of the bump connectors prior to mounting
- H01L2224/81191—Arrangement of the bump connectors prior to mounting wherein the bump connectors are disposed only on the semiconductor or solid-state body
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/819—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector with the bump connector not providing any mechanical bonding
- H01L2224/81901—Pressing the bump connector against the bonding areas by means of another connector
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- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H01L2224/83101—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus as prepeg comprising a layer connector, e.g. provided in an insulating plate member
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
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- H01L2224/832—Applying energy for connecting
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H01L2224/83851—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester being an anisotropic conductive adhesive
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L2224/91—Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
- H01L2224/92—Specific sequence of method steps
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- H01L2224/9211—Parallel connecting processes
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- H—ELECTRICITY
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- H01L2224/93—Batch processes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
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- H—ELECTRICITY
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- H01L24/93—Batch processes
- H01L24/94—Batch processes at wafer-level, i.e. with connecting carried out on a wafer comprising a plurality of undiced individual devices
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/04—Soldering or other types of metallurgic bonding
- H05K2203/0425—Solder powder or solder coated metal powder
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Thermal Sciences (AREA)
- Non-Insulated Conductors (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Manufacturing Of Electrical Connectors (AREA)
- Conductive Materials (AREA)
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| JP6935702B2 (ja) * | 2016-10-24 | 2021-09-15 | デクセリアルズ株式会社 | 異方性導電フィルム |
| WO2018139552A1 (ja) * | 2017-01-27 | 2018-08-02 | 日立化成株式会社 | 絶縁被覆導電粒子、異方導電フィルム、異方導電フィルムの製造方法、接続構造体及び接続構造体の製造方法 |
| JP2019029135A (ja) * | 2017-07-27 | 2019-02-21 | 日立化成株式会社 | 異方性導電フィルム及びその製造方法、並びに接続構造体及びその製造方法 |
| JP7042121B2 (ja) * | 2018-03-14 | 2022-03-25 | デクセリアルズ株式会社 | 異方導電性シート、及び異方導電性シートの製造方法 |
| KR102856173B1 (ko) | 2018-06-26 | 2025-09-04 | 가부시끼가이샤 레조낙 | 땜납 입자 |
| JP7452418B2 (ja) * | 2018-06-26 | 2024-03-19 | 株式会社レゾナック | 異方性導電フィルム及びその製造方法並びに接続構造体の製造方法 |
| CN110767348A (zh) * | 2019-11-12 | 2020-02-07 | 业成科技(成都)有限公司 | 异方性导电膜及其制作方法 |
| US12418130B2 (en) | 2020-03-19 | 2025-09-16 | Dexerials Corporation | Connection body and method for manufacturing connection body |
| JP2021153049A (ja) * | 2020-03-19 | 2021-09-30 | デクセリアルズ株式会社 | 接続体、及び接続体の製造方法 |
| KR20230107273A (ko) * | 2020-11-12 | 2023-07-14 | 가부시끼가이샤 레조낙 | 회로 접속용 접착제 필름 및 그 제조 방법, 및 접속 구조체 및 그 제조 방법 |
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|---|---|---|---|---|
| US20110127068A1 (en) * | 2008-07-31 | 2011-06-02 | Takuya Wada | Polymer particle, conductive particle, anisotropic conductive material and connection structure |
| TW201140623A (en) * | 2010-04-22 | 2011-11-16 | Sekisui Chemical Co Ltd | Anisotropic conductive material and connection structure |
| WO2014088095A1 (ja) * | 2012-12-06 | 2014-06-12 | 積水化学工業株式会社 | 導電材料、接続構造体及び接続構造体の製造方法 |
| TW201431674A (zh) * | 2012-08-24 | 2014-08-16 | 迪睿合股份有限公司 | 異向性導電膜及其製造方法 |
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| JPS62123607A (ja) | 1985-11-25 | 1987-06-04 | シャープ株式会社 | 異方導電性テ−プの製造方法 |
| TW277152B (enExample) * | 1994-05-10 | 1996-06-01 | Hitachi Chemical Co Ltd | |
| JP3196845B2 (ja) | 1999-02-22 | 2001-08-06 | 日本電気株式会社 | バンプ電極形成方法 |
| JP2001185570A (ja) * | 1999-10-15 | 2001-07-06 | Nec Corp | バンプ形成方法 |
| JP4130747B2 (ja) * | 2002-03-28 | 2008-08-06 | 旭化成エレクトロニクス株式会社 | 異方導電性接着シートおよびその製造方法 |
| JP4822322B2 (ja) * | 2003-12-04 | 2011-11-24 | 旭化成イーマテリアルズ株式会社 | 異方導電性接着シートの製造方法 |
| US20060280912A1 (en) * | 2005-06-13 | 2006-12-14 | Rong-Chang Liang | Non-random array anisotropic conductive film (ACF) and manufacturing processes |
| US9123835B2 (en) * | 2006-10-10 | 2015-09-01 | Hitachi Chemical Company, Ltd. | Connected structure and method for manufacture thereof |
| JP2009152160A (ja) | 2007-12-25 | 2009-07-09 | Tokai Rubber Ind Ltd | 粒子転写型およびその製造方法、粒子転写膜の製造方法ならびに異方性導電膜 |
| JP5268515B2 (ja) | 2008-09-17 | 2013-08-21 | 積水化学工業株式会社 | フラックス内包カプセル含有導電性粒子、異方性導電材料及び接続構造体 |
| PH12012500386A1 (en) * | 2009-09-16 | 2013-01-14 | Sumitomo Bakelite Co | Adhesive film, multilayer circuit board, electronic component, and semiconductor device |
| JP2011185570A (ja) | 2010-03-10 | 2011-09-22 | Osaka Gas Co Ltd | 排熱回収装置 |
| JP5796242B2 (ja) * | 2011-02-24 | 2015-10-21 | デクセリアルズ株式会社 | 熱伝導性接着剤 |
| JP5162728B1 (ja) * | 2011-08-05 | 2013-03-13 | 積水化学工業株式会社 | 導電材料及び接続構造体 |
| JP5445558B2 (ja) | 2011-10-24 | 2014-03-19 | デクセリアルズ株式会社 | 異方導電性接着シート及び接続方法 |
| US9231178B2 (en) * | 2012-06-07 | 2016-01-05 | Cooledge Lighting, Inc. | Wafer-level flip chip device packages and related methods |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110127068A1 (en) * | 2008-07-31 | 2011-06-02 | Takuya Wada | Polymer particle, conductive particle, anisotropic conductive material and connection structure |
| TW201140623A (en) * | 2010-04-22 | 2011-11-16 | Sekisui Chemical Co Ltd | Anisotropic conductive material and connection structure |
| TW201431674A (zh) * | 2012-08-24 | 2014-08-16 | 迪睿合股份有限公司 | 異向性導電膜及其製造方法 |
| WO2014088095A1 (ja) * | 2012-12-06 | 2014-06-12 | 積水化学工業株式会社 | 導電材料、接続構造体及び接続構造体の製造方法 |
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| KR20170057363A (ko) | 2017-05-24 |
| JP6458503B2 (ja) | 2019-01-30 |
| CN107112657B (zh) | 2019-05-17 |
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| KR102028900B1 (ko) | 2019-10-07 |
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| US20170359904A1 (en) | 2017-12-14 |
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