TWI572871B - 半導體元件測試用分選機的托盤裝載裝置 - Google Patents

半導體元件測試用分選機的托盤裝載裝置 Download PDF

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Publication number
TWI572871B
TWI572871B TW103116584A TW103116584A TWI572871B TW I572871 B TWI572871 B TW I572871B TW 103116584 A TW103116584 A TW 103116584A TW 103116584 A TW103116584 A TW 103116584A TW I572871 B TWI572871 B TW I572871B
Authority
TW
Taiwan
Prior art keywords
loading
tray
mover
customer tray
guides
Prior art date
Application number
TW103116584A
Other languages
English (en)
Chinese (zh)
Other versions
TW201506422A (zh
Inventor
劉永旻
金鎭洙
Original Assignee
泰克元股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 泰克元股份有限公司 filed Critical 泰克元股份有限公司
Publication of TW201506422A publication Critical patent/TW201506422A/zh
Application granted granted Critical
Publication of TWI572871B publication Critical patent/TWI572871B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW103116584A 2013-05-10 2014-05-09 半導體元件測試用分選機的托盤裝載裝置 TWI572871B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020130052809A KR101999623B1 (ko) 2013-05-10 2013-05-10 반도체소자 테스트용 핸들러의 트레이 적재장치

Publications (2)

Publication Number Publication Date
TW201506422A TW201506422A (zh) 2015-02-16
TWI572871B true TWI572871B (zh) 2017-03-01

Family

ID=51848287

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103116584A TWI572871B (zh) 2013-05-10 2014-05-09 半導體元件測試用分選機的托盤裝載裝置

Country Status (3)

Country Link
KR (1) KR101999623B1 (ko)
CN (1) CN104138853B (ko)
TW (1) TWI572871B (ko)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102120713B1 (ko) 2014-03-18 2020-06-11 (주)테크윙 반도체소자 테스트용 핸들러
KR102249574B1 (ko) * 2015-01-30 2021-05-10 (주)테크윙 전자부품 언로딩장비
KR102650702B1 (ko) * 2016-03-04 2024-03-25 (주)테크윙 전자부품 공급용 트레이 공급대차 및 전자부품을 처리하는 핸들러
KR102656451B1 (ko) * 2016-03-18 2024-04-12 (주)테크윙 전자부품 테스트용 핸들러
CN108622654A (zh) * 2017-03-15 2018-10-09 苏州汉扬精密电子有限公司 自动上下料结构
KR102289107B1 (ko) * 2017-03-29 2021-08-13 (주)테크윙 전자부품 테스트용 핸들러
CN113546853A (zh) * 2021-06-30 2021-10-26 江苏筑一智能装备科技有限公司 全自动视觉检测分拣及下料装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW368770B (en) * 1995-11-20 1999-09-01 Advantest Corp IC socket body and guiding component
US20080191725A1 (en) * 2006-03-08 2008-08-14 Testmetrix, Inc. Apparatus and method for testing semiconductor devices
US20080252320A1 (en) * 2007-04-12 2008-10-16 Semiconductor Testing Advanced Research Lab Inc. Apparatus for testing micro SD devices
CN101738500B (zh) * 2008-11-20 2013-01-16 未来产业株式会社 用于校正用户托盘位置的设备以及测试处理机

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3739844B2 (ja) * 1995-12-19 2006-01-25 株式会社アドバンテスト ハンドラ装置のストッカ部
JP3417528B2 (ja) * 1996-04-05 2003-06-16 株式会社アドバンテスト Ｉｃ試験装置
JP3809008B2 (ja) * 1998-03-27 2006-08-16 株式会社アドバンテスト カストマトレイストッカ
DE102007005749A1 (de) * 2007-01-31 2008-08-14 Hauni Maschinenbau Ag Entleermagazin und Verfahren zum Entleeren von mit stabförmigen Produkten gefüllten Schragen, insbesondere Schachtschragen
KR100884257B1 (ko) * 2007-02-13 2009-02-17 (주)제이티 트레이이송장치
KR200445542Y1 (ko) * 2007-11-12 2009-08-11 (주)테크윙 테스트핸들러용 셋플레이트
KR100941674B1 (ko) * 2008-01-29 2010-02-12 (주)테크윙 전자부품 검사 지원을 위한 핸들러용 캐리어보드이송시스템 및 전자부품 검사 지원을 위한 핸들러의 챔버내에서의 캐리어보드 이송방법
KR100958275B1 (ko) 2008-02-05 2010-05-19 에버테크노 주식회사 핸들러의 스택커
TWI372437B (en) * 2008-02-26 2012-09-11 Cheng Mei Instr Co Ltd System for inspecting chip surface in a tray, tray handling apparatus and method thereof
KR101133188B1 (ko) * 2009-03-27 2012-04-09 (주)제이티 소자소팅장치 및 그 방법
KR101364485B1 (ko) * 2009-11-25 2014-02-20 가부시키가이샤 아드반테스트 기판장착장치, 테스트 헤드 및 전자부품 시험장치

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW368770B (en) * 1995-11-20 1999-09-01 Advantest Corp IC socket body and guiding component
US20080191725A1 (en) * 2006-03-08 2008-08-14 Testmetrix, Inc. Apparatus and method for testing semiconductor devices
US20080252320A1 (en) * 2007-04-12 2008-10-16 Semiconductor Testing Advanced Research Lab Inc. Apparatus for testing micro SD devices
CN101738500B (zh) * 2008-11-20 2013-01-16 未来产业株式会社 用于校正用户托盘位置的设备以及测试处理机

Also Published As

Publication number Publication date
CN104138853A (zh) 2014-11-12
TW201506422A (zh) 2015-02-16
KR20140133976A (ko) 2014-11-21
KR101999623B1 (ko) 2019-07-16
CN104138853B (zh) 2017-05-31

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