TWI484064B - - Google Patents

Info

Publication number
TWI484064B
TWI484064B TW101145132A TW101145132A TWI484064B TW I484064 B TWI484064 B TW I484064B TW 101145132 A TW101145132 A TW 101145132A TW 101145132 A TW101145132 A TW 101145132A TW I484064 B TWI484064 B TW I484064B
Authority
TW
Taiwan
Application number
TW101145132A
Other languages
Chinese (zh)
Other versions
TW201346065A (zh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of TW201346065A publication Critical patent/TW201346065A/zh
Application granted granted Critical
Publication of TWI484064B publication Critical patent/TWI484064B/zh

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45514Mixing in close vicinity to the substrate
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45517Confinement of gases to vicinity of substrate
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45565Shower nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45572Cooled nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45574Nozzles for more than one gas
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45578Elongated nozzles, tubes with holes
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/14Feed and outlet means for the gases; Modifying the flow of the reactive gases
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/24Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0431Apparatus for thermal treatment
    • H10P72/0434Apparatus for thermal treatment mainly by convection
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/0318Processes
    • Y10T137/0402Cleaning, repairing, or assembling
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/6416With heating or cooling of the system

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
  • General Engineering & Computer Science (AREA)
TW101145132A 2012-05-11 2012-11-30 氣體噴淋頭、其製造方法及薄膜生長反應器 TW201346065A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201210147710.8A CN103388132B (zh) 2012-05-11 2012-05-11 气体喷淋头、其制造方法及薄膜生长反应器

Publications (2)

Publication Number Publication Date
TW201346065A TW201346065A (zh) 2013-11-16
TWI484064B true TWI484064B (https=) 2015-05-11

Family

ID=49532550

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101145132A TW201346065A (zh) 2012-05-11 2012-11-30 氣體噴淋頭、其製造方法及薄膜生長反應器

Country Status (5)

Country Link
US (1) US9534724B2 (https=)
JP (1) JP5863050B2 (https=)
KR (1) KR101523633B1 (https=)
CN (2) CN103388132B (https=)
TW (1) TW201346065A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI835740B (zh) * 2017-07-28 2024-03-21 美商蘭姆研究公司 單片陶瓷氣體分配板

Families Citing this family (98)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7879401B2 (en) * 2006-12-22 2011-02-01 The Regents Of The University Of Michigan Organic vapor jet deposition using an exhaust
DE102011056589A1 (de) * 2011-07-12 2013-01-17 Aixtron Se Gaseinlassorgan eines CVD-Reaktors
CN103388132B (zh) * 2012-05-11 2015-11-25 中微半导体设备(上海)有限公司 气体喷淋头、其制造方法及薄膜生长反应器
US9132436B2 (en) 2012-09-21 2015-09-15 Applied Materials, Inc. Chemical control features in wafer process equipment
US10256079B2 (en) 2013-02-08 2019-04-09 Applied Materials, Inc. Semiconductor processing systems having multiple plasma configurations
JP6199619B2 (ja) * 2013-06-13 2017-09-20 株式会社ニューフレアテクノロジー 気相成長装置
JP6320824B2 (ja) * 2014-03-31 2018-05-09 株式会社東芝 ガス供給管、およびガス処理装置
CN105088334B (zh) * 2014-04-28 2018-01-09 北京北方华创微电子装备有限公司 顶盖装置及工艺设备
US20150361582A1 (en) * 2014-06-17 2015-12-17 Veeco Instruments, Inc. Gas Flow Flange For A Rotating Disk Reactor For Chemical Vapor Deposition
US9966240B2 (en) 2014-10-14 2018-05-08 Applied Materials, Inc. Systems and methods for internal surface conditioning assessment in plasma processing equipment
JP6305314B2 (ja) * 2014-10-29 2018-04-04 東京エレクトロン株式会社 成膜装置およびシャワーヘッド
CN105624645B (zh) * 2014-11-06 2018-04-24 中微半导体设备(上海)有限公司 反应气体输送装置及化学气相沉积或外延层生长反应器
US11637002B2 (en) 2014-11-26 2023-04-25 Applied Materials, Inc. Methods and systems to enhance process uniformity
CN104498904B (zh) * 2014-12-29 2017-04-26 华中科技大学 一种用于mocvd设备的喷淋头
US20160225652A1 (en) 2015-02-03 2016-08-04 Applied Materials, Inc. Low temperature chuck for plasma processing systems
WO2016135377A1 (en) * 2015-02-25 2016-09-01 Beneq Oy Apparatus for subjecting a surface of a substrate to successive surface reactions
JP5872089B1 (ja) * 2015-04-27 2016-03-01 中外炉工業株式会社 シャワープレート装置
JP6550962B2 (ja) * 2015-06-24 2019-07-31 株式会社デンソー 炭化珪素半導体のエピタキシャル成長装置
CN106356315B (zh) * 2015-07-13 2020-08-04 中微半导体设备(上海)股份有限公司 一种气体喷淋装置
US9741593B2 (en) 2015-08-06 2017-08-22 Applied Materials, Inc. Thermal management systems and methods for wafer processing systems
US10504700B2 (en) 2015-08-27 2019-12-10 Applied Materials, Inc. Plasma etching systems and methods with secondary plasma injection
TWI733712B (zh) * 2015-12-18 2021-07-21 美商應用材料股份有限公司 用於沉積腔室的擴散器及用於沉積腔室的電極
JP6718730B2 (ja) 2016-04-19 2020-07-08 株式会社ニューフレアテクノロジー シャワープレート、気相成長装置及び気相成長方法
US10504754B2 (en) 2016-05-19 2019-12-10 Applied Materials, Inc. Systems and methods for improved semiconductor etching and component protection
EP3255173B1 (de) * 2016-06-06 2018-11-21 Meyer Burger (Germany) AG Fluidtemperierter gasverteiler in schichtbauweise
US9865484B1 (en) 2016-06-29 2018-01-09 Applied Materials, Inc. Selective etch using material modification and RF pulsing
JP6352993B2 (ja) * 2016-08-10 2018-07-04 株式会社東芝 流路構造及び処理装置
TWI624561B (zh) * 2016-08-12 2018-05-21 漢民科技股份有限公司 用於半導體製程之氣體噴射器及成膜裝置
TWI688992B (zh) * 2016-08-12 2020-03-21 漢民科技股份有限公司 用於半導體製程之氣體噴射器及成膜裝置
CN106191803B (zh) * 2016-09-07 2017-07-28 吉林大学 过渡金属化学气相沉积微纳增材制造装置与方法
JP6495875B2 (ja) 2016-09-12 2019-04-03 株式会社東芝 流路構造及び処理装置
US10546729B2 (en) 2016-10-04 2020-01-28 Applied Materials, Inc. Dual-channel showerhead with improved profile
US10431429B2 (en) 2017-02-03 2019-10-01 Applied Materials, Inc. Systems and methods for radial and azimuthal control of plasma uniformity
US10943834B2 (en) 2017-03-13 2021-03-09 Applied Materials, Inc. Replacement contact process
CN108728821B (zh) * 2017-04-21 2020-05-01 中微半导体设备(上海)股份有限公司 Mocvd处理装置以及用于mocvd的气体供应装置
US11276559B2 (en) 2017-05-17 2022-03-15 Applied Materials, Inc. Semiconductor processing chamber for multiple precursor flow
US11276590B2 (en) 2017-05-17 2022-03-15 Applied Materials, Inc. Multi-zone semiconductor substrate supports
JP7176860B6 (ja) 2017-05-17 2022-12-16 アプライド マテリアルズ インコーポレイテッド 前駆体の流れを改善する半導体処理チャンバ
US11380557B2 (en) * 2017-06-05 2022-07-05 Applied Materials, Inc. Apparatus and method for gas delivery in semiconductor process chambers
US10920320B2 (en) 2017-06-16 2021-02-16 Applied Materials, Inc. Plasma health determination in semiconductor substrate processing reactors
US10727080B2 (en) 2017-07-07 2020-07-28 Applied Materials, Inc. Tantalum-containing material removal
US10297458B2 (en) 2017-08-07 2019-05-21 Applied Materials, Inc. Process window widening using coated parts in plasma etch processes
US20190048467A1 (en) * 2017-08-10 2019-02-14 Applied Materials, Inc. Showerhead and process chamber incorporating same
US10903054B2 (en) 2017-12-19 2021-01-26 Applied Materials, Inc. Multi-zone gas distribution systems and methods
US11328909B2 (en) 2017-12-22 2022-05-10 Applied Materials, Inc. Chamber conditioning and removal processes
US10854426B2 (en) 2018-01-08 2020-12-01 Applied Materials, Inc. Metal recess for semiconductor structures
US10964512B2 (en) 2018-02-15 2021-03-30 Applied Materials, Inc. Semiconductor processing chamber multistage mixing apparatus and methods
US10679870B2 (en) 2018-02-15 2020-06-09 Applied Materials, Inc. Semiconductor processing chamber multistage mixing apparatus
US10319600B1 (en) 2018-03-12 2019-06-11 Applied Materials, Inc. Thermal silicon etch
CN108539052B (zh) * 2018-03-30 2019-07-09 华中科技大学 一种封装柔性显示薄膜的装置、系统及方法
TWM597506U (zh) 2018-04-13 2020-06-21 美商維高儀器股份有限公司 具有多區域噴射器塊的化學氣相沉積設備
US10699879B2 (en) 2018-04-17 2020-06-30 Applied Materials, Inc. Two piece electrode assembly with gap for plasma control
US10886137B2 (en) 2018-04-30 2021-01-05 Applied Materials, Inc. Selective nitride removal
US10755941B2 (en) 2018-07-06 2020-08-25 Applied Materials, Inc. Self-limiting selective etching systems and methods
US10872778B2 (en) 2018-07-06 2020-12-22 Applied Materials, Inc. Systems and methods utilizing solid-phase etchants
US10672642B2 (en) 2018-07-24 2020-06-02 Applied Materials, Inc. Systems and methods for pedestal configuration
JP7365761B2 (ja) * 2018-08-24 2023-10-20 株式会社ニューフレアテクノロジー 気相成長装置
WO2020046567A1 (en) * 2018-08-29 2020-03-05 Applied Materials, Inc. Chamber injector
US10892198B2 (en) 2018-09-14 2021-01-12 Applied Materials, Inc. Systems and methods for improved performance in semiconductor processing
US11049755B2 (en) 2018-09-14 2021-06-29 Applied Materials, Inc. Semiconductor substrate supports with embedded RF shield
US20200087788A1 (en) * 2018-09-17 2020-03-19 Applied Materials, Inc. Multiple channel showerheads
US11062887B2 (en) 2018-09-17 2021-07-13 Applied Materials, Inc. High temperature RF heater pedestals
US11417534B2 (en) 2018-09-21 2022-08-16 Applied Materials, Inc. Selective material removal
US11682560B2 (en) 2018-10-11 2023-06-20 Applied Materials, Inc. Systems and methods for hafnium-containing film removal
US11121002B2 (en) 2018-10-24 2021-09-14 Applied Materials, Inc. Systems and methods for etching metals and metal derivatives
US11437242B2 (en) 2018-11-27 2022-09-06 Applied Materials, Inc. Selective removal of silicon-containing materials
CN109457236A (zh) * 2019-01-04 2019-03-12 中晟光电设备(上海)股份有限公司 一种进气顶盘及金属有机物化学气相沉积反应器
US11721527B2 (en) 2019-01-07 2023-08-08 Applied Materials, Inc. Processing chamber mixing systems
KR101952703B1 (ko) * 2019-01-11 2019-02-27 이영식 디스플레이 글래스 표면 도포용 인샤워 나이프
US10920319B2 (en) 2019-01-11 2021-02-16 Applied Materials, Inc. Ceramic showerheads with conductive electrodes
CN113396240A (zh) * 2019-03-11 2021-09-14 应用材料公司 用于基板处理腔室的盖组件设备及方法
KR20200109620A (ko) * 2019-03-13 2020-09-23 (주)포인트엔지니어링 접합부품
TWI725444B (zh) * 2019-06-04 2021-04-21 金碳洁股份有限公司 循環式磊晶沉積系統及其氣體分流模組
DE102019129788A1 (de) * 2019-11-05 2021-05-06 Aixtron Se Verwendung eines CVD Reaktors zum Abscheiden zweidimensionaler Schichten
DE102019131794A1 (de) * 2019-11-25 2021-05-27 Aixtron Se Wandgekühltes Gaseinlassorgan für einen CVD-Reaktor
CN111254490A (zh) * 2020-03-09 2020-06-09 西安奕斯伟硅片技术有限公司 外延气体注入单元及外延反应器
US20210310122A1 (en) * 2020-04-03 2021-10-07 Applied Materials, Inc. Method of forming holes from both sides of substrate
CN111270221B (zh) * 2020-04-03 2022-07-22 北京北方华创微电子装备有限公司 半导体设备中的气体分配器和半导体设备
DE102020123076A1 (de) 2020-09-03 2022-03-03 Aixtron Se Gaseinlassorgan eines CVD-Reaktors mit zwei Einspeisestellen
CN114351117B (zh) * 2020-10-13 2022-12-20 东部超导科技(苏州)有限公司 喷淋板、配置喷淋板的mocvd反应系统及其使用方法
CN115478261B (zh) * 2021-05-31 2025-02-14 中微半导体设备(上海)股份有限公司 一种气体喷淋头及化学气相沉积设备
CN113725061A (zh) * 2021-09-01 2021-11-30 长鑫存储技术有限公司 晶圆处理装置及方法
CN114107953A (zh) * 2021-09-18 2022-03-01 江苏微导纳米科技股份有限公司 原子层沉积装置及其喷淋板
CN114059164B (zh) * 2022-01-06 2022-11-04 芯三代半导体科技(苏州)有限公司 一种碳化硅外延生长装置
JP7709926B2 (ja) * 2022-02-03 2025-07-17 東京エレクトロン株式会社 基板処理装置及び基板処理方法
JP7724040B2 (ja) * 2022-02-24 2025-08-15 東京エレクトロン株式会社 基板処理装置
JP2025507892A (ja) * 2022-03-17 2025-03-21 ラム リサーチ コーポレーション 中心から縁までの調整が可能な二重プレナムシャワーヘッド
CN114810218B (zh) * 2022-04-12 2025-03-18 中国联合重型燃气轮机技术有限公司 燃气轮机叶片及燃气轮机
CN117127167B (zh) * 2022-05-18 2026-01-09 江苏微导纳米科技股份有限公司 一种装置和加工方法
CN115058702A (zh) * 2022-07-27 2022-09-16 拓荆科技(上海)有限公司 一种喷淋头及真空处理设备
CN115537765B (zh) * 2022-09-27 2024-07-12 盛吉盛(宁波)半导体科技有限公司 等离子体化学气相沉积装置和小尺寸沟槽填充方法
CN115572958B (zh) * 2022-09-30 2023-08-11 楚赟精工科技(上海)有限公司 一种气体输送组件及气相反应装置
CN116240519B (zh) * 2022-12-28 2024-11-22 楚赟精工科技(上海)有限公司 气体喷淋头及气相反应装置
CN117089924B (zh) * 2023-10-17 2023-12-19 凯德芯贝(沈阳)石英有限公司 一种半导体气相外延用石英喷嘴及其制备和使用方法
CN117418217B (zh) * 2023-12-18 2024-08-27 上海谙邦半导体设备有限公司 一种匀气装置及化学气相沉积匀气系统
CN118127485B (zh) * 2024-04-30 2024-08-30 无锡松煜科技有限公司 用于硅片表面沉积氧化铝膜的方法
CN118932316B (zh) * 2024-10-15 2025-01-07 江苏博涛智能热工股份有限公司 气体扩散板、组合体及装置
CN120272881B (zh) * 2025-06-09 2025-08-12 蓝河科技(绍兴)有限公司 喷淋装置和半导体生长设备

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5781693A (en) * 1996-07-24 1998-07-14 Applied Materials, Inc. Gas introduction showerhead for an RTP chamber with upper and lower transparent plates and gas flow therebetween
US6872258B2 (en) * 2001-07-16 2005-03-29 Samsung Electronics Co., Ltd. Shower head of a wafer treatment apparatus having a gap controller
US6983892B2 (en) * 2004-02-05 2006-01-10 Applied Materials, Inc. Gas distribution showerhead for semiconductor processing
US7601223B2 (en) * 2003-04-29 2009-10-13 Asm International N.V. Showerhead assembly and ALD methods
CN102181844A (zh) * 2011-04-07 2011-09-14 中微半导体设备(上海)有限公司 清洁装置及清洁方法、薄膜生长反应装置及生长方法

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0271511A (ja) * 1988-09-06 1990-03-12 Fujitsu Ltd Cvd用ガス導入装置
JPH1180959A (ja) * 1997-09-08 1999-03-26 Sony Corp 気相成長装置
KR100505310B1 (ko) * 1998-05-13 2005-08-04 동경 엘렉트론 주식회사 성막 장치 및 방법
US6302964B1 (en) * 1998-06-16 2001-10-16 Applied Materials, Inc. One-piece dual gas faceplate for a showerhead in a semiconductor wafer processing system
EP1115147A4 (en) * 1999-05-26 2007-05-02 Tadahiro Ohmi DEVICE FOR PLASMA TREATMENT
JP2002155366A (ja) * 2000-11-15 2002-05-31 Tokyo Electron Ltd 枚葉式熱処理方法および枚葉式熱処理装置
EP1454346B1 (en) * 2001-10-18 2012-01-04 Chul Soo Byun Method and apparatus for chemical vapor deposition capable of preventing contamination and enhancing film growth rate
KR100513920B1 (ko) * 2003-10-31 2005-09-08 주식회사 시스넥스 화학기상증착 반응기
JP4451684B2 (ja) * 2004-03-17 2010-04-14 キヤノンアネルバ株式会社 真空処理装置
US8083853B2 (en) * 2004-05-12 2011-12-27 Applied Materials, Inc. Plasma uniformity control by gas diffuser hole design
JP5519105B2 (ja) * 2004-08-02 2014-06-11 ビーコ・インストゥルメンツ・インコーポレイテッド 化学気相成長の方法及び化学気相成長リアクタ用のガス供給システム
US7686971B2 (en) * 2004-11-24 2010-03-30 Panasonic Corporation Plasma processing apparatus and method
CN1664165A (zh) * 2005-02-02 2005-09-07 南昌大学 用于化合物半导体材料生长的喷头及原料输入方法
JP5045000B2 (ja) * 2006-06-20 2012-10-10 東京エレクトロン株式会社 成膜装置、ガス供給装置、成膜方法及び記憶媒体
US7850828B2 (en) * 2006-09-15 2010-12-14 Cardinal Cg Company Enhanced virtual anode
WO2008032910A1 (en) 2006-09-16 2008-03-20 Piezonics Co. Ltd. Apparatus of chemical vapor deposition with a showerhead regulating injection velocity of reactive gases positively and method thereof
KR100849929B1 (ko) * 2006-09-16 2008-08-26 주식회사 피에조닉스 반응 기체의 분사 속도를 적극적으로 조절하는 샤워헤드를구비한 화학기상 증착 방법 및 장치
US20080099147A1 (en) * 2006-10-26 2008-05-01 Nyi Oo Myo Temperature controlled multi-gas distribution assembly
CN102174693B (zh) * 2007-01-12 2014-10-29 威科仪器有限公司 气体处理系统
US20080236495A1 (en) * 2007-03-27 2008-10-02 Structured Materials Inc. Showerhead for chemical vapor deposition (CVD) apparatus
DE102007026349A1 (de) * 2007-06-06 2008-12-11 Aixtron Ag Aus einer Vielzahl diffusionsverschweißter Scheiben bestehender Gasverteiler
US7976631B2 (en) * 2007-10-16 2011-07-12 Applied Materials, Inc. Multi-gas straight channel showerhead
JP2009152434A (ja) * 2007-12-21 2009-07-09 Tokyo Electron Ltd 基板処理装置
KR101639230B1 (ko) * 2008-12-04 2016-07-13 비코 인스트루먼츠 인코포레이티드 화학 기상 증착 유동물 유입구 부재 및 방법
WO2010101369A2 (ko) * 2009-03-03 2010-09-10 주성엔지니어링㈜ 가스 분배 장치 및 이를 구비하는 기판 처리 장치
CN201618638U (zh) * 2010-02-09 2010-11-03 沈阳慧宇真空技术有限公司 制备半导体材料的金属有机源喷雾器
KR101765754B1 (ko) * 2010-05-12 2017-08-09 주식회사 탑 엔지니어링 샤워헤드 및 이를 포함하는 반도체 기판 가공 장치
WO2012008440A1 (ja) * 2010-07-12 2012-01-19 株式会社アルバック 成膜装置
US20120024478A1 (en) * 2010-07-29 2012-02-02 Hermes-Epitek Corporation Showerhead
CN201933153U (zh) * 2010-12-31 2011-08-17 中微半导体设备(上海)有限公司 用于金属有机化学气相沉积反应器的气体分布装置及反应器
CN202090055U (zh) * 2011-04-29 2011-12-28 中微半导体设备(上海)有限公司 气体输送装置及使用该气体输送装置的反应器
CN103388132B (zh) * 2012-05-11 2015-11-25 中微半导体设备(上海)有限公司 气体喷淋头、其制造方法及薄膜生长反应器

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5781693A (en) * 1996-07-24 1998-07-14 Applied Materials, Inc. Gas introduction showerhead for an RTP chamber with upper and lower transparent plates and gas flow therebetween
US6872258B2 (en) * 2001-07-16 2005-03-29 Samsung Electronics Co., Ltd. Shower head of a wafer treatment apparatus having a gap controller
US7601223B2 (en) * 2003-04-29 2009-10-13 Asm International N.V. Showerhead assembly and ALD methods
US6983892B2 (en) * 2004-02-05 2006-01-10 Applied Materials, Inc. Gas distribution showerhead for semiconductor processing
CN102181844A (zh) * 2011-04-07 2011-09-14 中微半导体设备(上海)有限公司 清洁装置及清洁方法、薄膜生长反应装置及生长方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI835740B (zh) * 2017-07-28 2024-03-21 美商蘭姆研究公司 單片陶瓷氣體分配板

Also Published As

Publication number Publication date
KR20130126477A (ko) 2013-11-20
US9534724B2 (en) 2017-01-03
CN103388132B (zh) 2015-11-25
CN105274498B (zh) 2017-10-27
JP2013239707A (ja) 2013-11-28
CN103388132A (zh) 2013-11-13
KR101523633B1 (ko) 2015-05-28
TW201346065A (zh) 2013-11-16
US20130299009A1 (en) 2013-11-14
JP5863050B2 (ja) 2016-02-16
CN105274498A (zh) 2016-01-27

Similar Documents

Publication Publication Date Title
TWI484064B (https=)
BR112014017614A2 (https=)
BR112014017784A2 (https=)
BR112014019290A2 (https=)
BR112014017625A2 (https=)
BR112014017592A2 (https=)
BR112014017607A2 (https=)
AR092201A1 (https=)
BR112014018924A2 (https=)
BR112013027865A2 (https=)
BR112014017609A2 (https=)
BR112014018706A2 (https=)
BR112014017634A2 (https=)
BR112014019407A2 (https=)
BR112014017588A2 (https=)
BR112014013184A8 (https=)
BR112014017618A2 (https=)
BR112014017627A2 (https=)
BR112014017623A2 (https=)
BR112014020229A2 (https=)
BR112014017630A2 (https=)
BR112014017621A2 (https=)
BR112014017631A2 (https=)
BR112014017622A2 (https=)
BR112014019536A2 (https=)