TWI409323B - Hard crystalline substrate grinding methods and oily grinding slurry - Google Patents

Hard crystalline substrate grinding methods and oily grinding slurry Download PDF

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Publication number
TWI409323B
TWI409323B TW096145141A TW96145141A TWI409323B TW I409323 B TWI409323 B TW I409323B TW 096145141 A TW096145141 A TW 096145141A TW 96145141 A TW96145141 A TW 96145141A TW I409323 B TWI409323 B TW I409323B
Authority
TW
Taiwan
Prior art keywords
polishing
crystal substrate
hard crystal
less
slurry
Prior art date
Application number
TW096145141A
Other languages
English (en)
Chinese (zh)
Other versions
TW200835781A (en
Inventor
青木賢二
山崎亨
渡邊武洋
濱田直之
Original Assignee
日本精密研磨股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本精密研磨股份有限公司 filed Critical 日本精密研磨股份有限公司
Publication of TW200835781A publication Critical patent/TW200835781A/zh
Application granted granted Critical
Publication of TWI409323B publication Critical patent/TWI409323B/zh

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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12—Preparing bulk and homogeneous wafers
    • H10P90/129—Preparing bulk and homogeneous wafers by polishing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09G—POLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00—Polishing compositions
    • C09G1/02—Polishing compositions containing abrasives or grinding agents
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00—Materials not provided for elsewhere
    • C09K3/14—Anti-slip materials; Abrasives
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00—Materials not provided for elsewhere
    • C09K3/14—Anti-slip materials; Abrasives
    • C09K3/1436—Composite particles, e.g. coated particles
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00—Materials not provided for elsewhere
    • C09K3/14—Anti-slip materials; Abrasives
    • C09K3/1454—Abrasive powders, suspensions and pastes for polishing
    • C09K3/1472—Non-aqueous liquid suspensions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/83—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
    • H10D62/832—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge being Group IV materials comprising two or more elements, e.g. SiGe
    • H10D62/8325—Silicon carbide

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Composite Materials (AREA)
  • Mechanical Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
TW096145141A 2006-12-01 2007-11-28 Hard crystalline substrate grinding methods and oily grinding slurry TWI409323B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006326334A JP5599547B2 (ja) 2006-12-01 2006-12-01 硬質結晶基板研磨方法及び油性研磨スラリー

Publications (2)

Publication Number Publication Date
TW200835781A TW200835781A (en) 2008-09-01
TWI409323B true TWI409323B (zh) 2013-09-21

Family

ID=39498652

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096145141A TWI409323B (zh) 2006-12-01 2007-11-28 Hard crystalline substrate grinding methods and oily grinding slurry

Country Status (4)

Country Link
US (2) US7828628B2 (https=)
JP (1) JP5599547B2 (https=)
KR (1) KR101488987B1 (https=)
TW (1) TWI409323B (https=)

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TWI813999B (zh) * 2021-05-14 2023-09-01 日揚科技股份有限公司 硬質材料加工裝置及其系統

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JP5734435B2 (ja) * 2011-08-10 2015-06-17 三菱電機株式会社 半導体装置の製造方法
CN103959437B (zh) 2011-09-30 2017-08-01 圣戈班晶体及检测公司 具有特定结晶特征的iii‑v族衬底材料及其制备方法
WO2013049775A2 (en) 2011-09-30 2013-04-04 Saint-Gobain Ceramics & Plastics, Inc. Scintillation detection device with pressure sensitive adhesive
US9522454B2 (en) * 2012-12-17 2016-12-20 Seagate Technology Llc Method of patterning a lapping plate, and patterned lapping plates
CN103013345B (zh) * 2012-12-21 2015-02-18 清华大学 油性金刚石研磨液及其制备方法
TWI529964B (zh) 2012-12-31 2016-04-11 聖戈班晶體探測器公司 具有薄緩衝層的iii-v族基材及其製備方法
JP6694745B2 (ja) * 2016-03-31 2020-05-20 株式会社フジミインコーポレーテッド 研磨用組成物
CN109715751A (zh) 2016-09-23 2019-05-03 圣戈本陶瓷及塑料股份有限公司 化学机械平坦化浆料及其形成方法
JP7135531B2 (ja) * 2018-07-20 2022-09-13 株式会社デンソー 炭化珪素半導体装置の製造方法
EP3918023B1 (en) 2019-01-31 2025-12-31 Pureon Inc. Multimodal diamond-based abrasive suspension or assembly for polishing hard substrates
CN114341861A (zh) * 2019-08-29 2022-04-12 株式会社半导体能源研究所 特性预测系统
CN112480825A (zh) * 2020-12-10 2021-03-12 河南联合精密材料股份有限公司 碳化硅晶片粗抛用金刚石抛光液及制备方法
CN112980391A (zh) * 2021-03-02 2021-06-18 河北思瑞恩新材料科技有限公司 一种用于碳化硅晶片加工的粗磨液及其制备方法
US11365854B1 (en) 2021-09-24 2022-06-21 E. Mishan & Sons, Inc. Solar light with positionable panels
EP4424870A4 (en) * 2021-10-28 2025-10-08 Tokai Carbon Kk POLYCRYSTALLINE SIC MOLDED BODY AND ITS MANUFACTURING METHOD
CN114231251A (zh) * 2021-12-27 2022-03-25 河南联合精密材料股份有限公司 一种碳化硅晶片粗磨用金刚石研磨液及其制备方法
WO2024263357A1 (en) * 2023-06-21 2024-12-26 Corning Incorporated Coated articles, methods of polishing, and methods of making the same
CN117261002A (zh) * 2023-08-28 2023-12-22 深圳先进技术研究院 一种金属卤化物钙钛矿单晶的机械加工处理方法
JP7499934B1 (ja) 2023-11-13 2024-06-14 Ｊｘ金属株式会社 リン化インジウム基板及び半導体エピタキシャルウエハ
JP7499933B1 (ja) 2023-11-13 2024-06-14 Ｊｘ金属株式会社 リン化インジウム基板及び半導体エピタキシャルウエハ
JP7499932B1 (ja) 2023-11-13 2024-06-14 Ｊｘ金属株式会社 リン化インジウム基板及び半導体エピタキシャルウエハ

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Also Published As

Publication number Publication date
KR101488987B1 (ko) 2015-02-02
US20110005143A1 (en) 2011-01-13
KR20080050338A (ko) 2008-06-05
TW200835781A (en) 2008-09-01
JP5599547B2 (ja) 2014-10-01
JP2008138097A (ja) 2008-06-19
US7828628B2 (en) 2010-11-09
US20080139089A1 (en) 2008-06-12

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