TWI359273B - - Google Patents
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- Publication number
- TWI359273B TWI359273B TW096143670A TW96143670A TWI359273B TW I359273 B TWI359273 B TW I359273B TW 096143670 A TW096143670 A TW 096143670A TW 96143670 A TW96143670 A TW 96143670A TW I359273 B TWI359273 B TW I359273B
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- bracket
- electronic component
- transport
- carrier
- Prior art date
Links
- 238000012360 testing method Methods 0.000 claims description 353
- 230000032258 transport Effects 0.000 claims description 79
- 230000008646 thermal stress Effects 0.000 claims description 18
- 230000005856 abnormality Effects 0.000 claims description 8
- 238000001514 detection method Methods 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims description 4
- 230000007547 defect Effects 0.000 claims 1
- 230000000630 rising effect Effects 0.000 description 16
- 230000007246 mechanism Effects 0.000 description 12
- 238000012546 transfer Methods 0.000 description 11
- 238000010586 diagram Methods 0.000 description 7
- 238000003780 insertion Methods 0.000 description 4
- 230000037431 insertion Effects 0.000 description 4
- 230000013011 mating Effects 0.000 description 4
- 238000011084 recovery Methods 0.000 description 4
- 230000005484 gravity Effects 0.000 description 3
- 238000001179 sorption measurement Methods 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 239000007858 starting material Substances 0.000 description 2
- 230000035882 stress Effects 0.000 description 2
- 239000002023 wood Substances 0.000 description 2
- 108090000749 Aurora kinase B Proteins 0.000 description 1
- 241000219112 Cucumis Species 0.000 description 1
- 235000015510 Cucumis melo subsp melo Nutrition 0.000 description 1
- 102100020718 Receptor-type tyrosine-protein kinase FLT3 Human genes 0.000 description 1
- FJJCIZWZNKZHII-UHFFFAOYSA-N [4,6-bis(cyanoamino)-1,3,5-triazin-2-yl]cyanamide Chemical compound N#CNC1=NC(NC#N)=NC(NC#N)=N1 FJJCIZWZNKZHII-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 239000003999 initiator Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000001953 sensory effect Effects 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Environmental & Geological Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2006/325542 WO2008075439A1 (ja) | 2006-12-21 | 2006-12-21 | 電子部品試験装置及び電子部品の試験方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200827726A TW200827726A (en) | 2008-07-01 |
| TWI359273B true TWI359273B (enrdf_load_stackoverflow) | 2012-03-01 |
Family
ID=39536078
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096143670A TW200827726A (en) | 2006-12-21 | 2007-11-19 | Electronic component testing equipment and method of testing electronic component |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP5022381B2 (enrdf_load_stackoverflow) |
| KR (1) | KR101158064B1 (enrdf_load_stackoverflow) |
| CN (1) | CN101563620A (enrdf_load_stackoverflow) |
| TW (1) | TW200827726A (enrdf_load_stackoverflow) |
| WO (1) | WO2008075439A1 (enrdf_load_stackoverflow) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5840403B2 (ja) * | 2011-07-11 | 2016-01-06 | オリオン機械株式会社 | 環境試験装置 |
| JP2013053991A (ja) * | 2011-09-06 | 2013-03-21 | Seiko Epson Corp | ハンドラー及び部品検査装置 |
| KR101644481B1 (ko) * | 2011-12-08 | 2016-08-02 | (주)테크윙 | 테스트핸들러 |
| JP2013137284A (ja) * | 2011-12-28 | 2013-07-11 | Advantest Corp | 電子部品移載装置、電子部品ハンドリング装置、及び電子部品試験装置 |
| CN103852710B (zh) * | 2012-11-29 | 2017-08-15 | 鸿劲科技股份有限公司 | 对置式电子组件作业设备 |
| KR102254494B1 (ko) * | 2015-04-30 | 2021-05-24 | (주)테크윙 | 반도체소자 테스트용 핸들러 |
| KR102252638B1 (ko) * | 2015-05-04 | 2021-05-17 | (주)테크윙 | 테스트핸들러용 인서트 |
| CN105548787B (zh) * | 2015-11-30 | 2018-12-28 | 东莞市冠佳电子设备有限公司 | 电源自动测试系统 |
| KR102461321B1 (ko) * | 2017-08-18 | 2022-11-02 | (주)테크윙 | 전자부품 테스트용 핸들러 |
| KR102663462B1 (ko) * | 2018-11-07 | 2024-05-09 | (주)테크윙 | 핸들러 |
| JP7561534B2 (ja) * | 2020-07-21 | 2024-10-04 | 株式会社アドバンテスト | 電子部品ハンドリング装置及び電子部品試験装置 |
| KR102772944B1 (ko) * | 2022-05-31 | 2025-02-27 | 미래산업 주식회사 | 전자부품 테스트 핸들러 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH079825U (ja) * | 1993-06-16 | 1995-02-10 | 村田機械株式会社 | リトライ機能付きコンベア装置 |
| JPH1138083A (ja) * | 1997-07-14 | 1999-02-12 | Advantest Corp | Ｉｃテストハンドラ |
| JP4164182B2 (ja) * | 1999-01-11 | 2008-10-08 | 株式会社アドバンテスト | トレイ移送装置 |
| TW533317B (en) * | 1999-01-11 | 2003-05-21 | Advantest Corp | Testing device for electronic device substrate |
-
2006
- 2006-12-21 KR KR1020097013594A patent/KR101158064B1/ko active Active
- 2006-12-21 CN CNA2006800567097A patent/CN101563620A/zh active Pending
- 2006-12-21 JP JP2008550028A patent/JP5022381B2/ja not_active Expired - Fee Related
- 2006-12-21 WO PCT/JP2006/325542 patent/WO2008075439A1/ja active Application Filing
-
2007
- 2007-11-19 TW TW096143670A patent/TW200827726A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JP5022381B2 (ja) | 2012-09-12 |
| KR101158064B1 (ko) | 2012-06-18 |
| TW200827726A (en) | 2008-07-01 |
| KR20090095617A (ko) | 2009-09-09 |
| CN101563620A (zh) | 2009-10-21 |
| WO2008075439A1 (ja) | 2008-06-26 |
| JPWO2008075439A1 (ja) | 2010-04-08 |
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