TWI325963B - - Google Patents

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Publication number
TWI325963B
TWI325963B TW096112792A TW96112792A TWI325963B TW I325963 B TWI325963 B TW I325963B TW 096112792 A TW096112792 A TW 096112792A TW 96112792 A TW96112792 A TW 96112792A TW I325963 B TWI325963 B TW I325963B
Authority
TW
Taiwan
Prior art keywords
slit
probe
rod
support
region
Prior art date
Application number
TW096112792A
Other languages
English (en)
Chinese (zh)
Other versions
TW200745567A (en
Inventor
Tomoaki Kuga
Takao Yasuta
Harutada Dewa
Juri Rokunohe
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200745567A publication Critical patent/TW200745567A/zh
Application granted granted Critical
Publication of TWI325963B publication Critical patent/TWI325963B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
TW096112792A 2006-05-08 2007-04-12 Probe assembly TW200745567A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006129333A JP4916763B2 (ja) 2006-05-08 2006-05-08 プローブ組立体

Publications (2)

Publication Number Publication Date
TW200745567A TW200745567A (en) 2007-12-16
TWI325963B true TWI325963B (de) 2010-06-11

Family

ID=38837893

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096112792A TW200745567A (en) 2006-05-08 2007-04-12 Probe assembly

Country Status (3)

Country Link
JP (1) JP4916763B2 (de)
KR (1) KR100863987B1 (de)
TW (1) TW200745567A (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5396104B2 (ja) * 2009-03-05 2014-01-22 株式会社日本マイクロニクス プローブ組立体
JP5690105B2 (ja) * 2009-11-26 2015-03-25 株式会社日本マイクロニクス プローブ装置
JP5588892B2 (ja) * 2010-12-03 2014-09-10 株式会社日本マイクロニクス プローブ組立体
KR102265960B1 (ko) * 2020-12-29 2021-06-17 주식회사 프로이천 프로브 블록
KR102477553B1 (ko) * 2021-01-22 2022-12-15 주식회사 디앤에스시스템 디스플레이 패널 검사용 프로브 핀 블록
KR102294168B1 (ko) * 2021-06-18 2021-08-25 이시훈 블레이드형 프로브 블록
CN116908500B (zh) * 2023-09-12 2023-12-01 上海泽丰半导体科技有限公司 一种通用测试平台探针塔的拆装方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3750831B2 (ja) * 1996-10-28 2006-03-01 株式会社日本マイクロニクス プローブ組立体
JP2000111574A (ja) * 1998-10-01 2000-04-21 Mitsubishi Electric Corp プローブカード
JP2004069485A (ja) * 2002-08-06 2004-03-04 Yamaha Corp プローブユニットおよびその製造方法、プローブカードおよびその製造方法
JP2006098278A (ja) * 2004-09-30 2006-04-13 Micronics Japan Co Ltd プローブ及びプローブ組立体
KR100615907B1 (ko) 2005-12-12 2006-08-28 (주)엠씨티코리아 평판표시패널 검사용 프로브 장치

Also Published As

Publication number Publication date
TW200745567A (en) 2007-12-16
JP4916763B2 (ja) 2012-04-18
JP2007303834A (ja) 2007-11-22
KR20070108824A (ko) 2007-11-13
KR100863987B1 (ko) 2008-10-16

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