TWI277740B - Probe assembly - Google Patents

Probe assembly Download PDF

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Publication number
TWI277740B
TWI277740B TW094112699A TW94112699A TWI277740B TW I277740 B TWI277740 B TW I277740B TW 094112699 A TW094112699 A TW 094112699A TW 94112699 A TW94112699 A TW 94112699A TW I277740 B TWI277740 B TW I277740B
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TW
Taiwan
Prior art keywords
region
probe
assembly
needle
slit
Prior art date
Application number
TW094112699A
Other languages
Chinese (zh)
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TW200613741A (en
Inventor
Yoshiei Hasegawa
Tomoaki Kuga
Hiroki Saitoh
Takao Yasuda
Harutada Dewa
Original Assignee
Nihon Micronics Kabushiki Kais
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Publication of TW200613741A publication Critical patent/TW200613741A/en
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Publication of TWI277740B publication Critical patent/TWI277740B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

This present invention provides a probe assembly which is tightly pressed in a needle region of an electrode of object to be tested and despite an easily deformed form, damage of a slit rod while subjecting to an overloading condition. The probe assembly of the present invention employs a guide bar extending along an alignment direction of the probe assembly to support the probe in a support body for placing a needlepoint region at tip side of the probes in a slit of the slit rod so as to place a flexible body extending along the longitudinal axis of the guide bar between the probe and the support body or the slit rod. Thereby, since the probes are pressed against the guide bars by the elastic body, there's no gap between the probe and the guide bar, with respect to the guide bars, is eliminated and tilting of the probes can be prevented.

Description

^1277740 九、發明說明: 【發明所屬之技術領域】 本發明,係關於使用於液晶顯示面板等平板狀被檢查 體之檢查之探針組件。 【先前技術】 使用於液晶顯示面板等之平板狀被檢查體之檢查的探 針組件,有一種是將片狀(具備帶狀之裝配區域(中央區 域)、及從該裝配區域之前端及後端分別向前方及後方延伸 籲之苐1及弟2針尖區域)之複數個探針(接觸子),以該等 裝配區域之寬度方向為上下方向之狀態,使裝配區域對向 於支持體(塊)下側而並列配置(專利文獻丨)。 專利文獻1 :曰本特開平1〇_132853號公報 採針’藉由貫穿此等裝配區域而延伸並支撐於支持體 之1個以上之細長導桿,而裝配於支持體,又將第i及第 2針尖區域收納於複數個狹縫,該複數個狹縫,係於分別 配置於支持體之前端側及後端側而沿導桿之長轴方向延伸 之第1及第2狹缝桿上,沿此等狹縫桿之長轴方向相隔間 隔而形成。 *弟1針尖區域’越前端側越細,且於前端具有向下方 犬出之針尖。帛2針尖區域,越後端側越細,且於後端且 有向上方突出之針尖。 〃 探針組件,以第2 4f + ρ a ^ ^ 針太Q域之針尖緊壓於通電用配線 之狀恶,組裘於檢查裝置。 被檢查體之通電試驗時 針尖區域之針尖係緊壓 5 J277740 於被檢查體之電極。藉此,第i針尖區域則藉由作用於此 之過負荷(over drive,0D)而彎曲,使針尖在被檢查體之電 極上滑動。 葉片型之探針,由於係以微影技術或蝕刻技術來製作, 故有能將具相同機能之探針高精度地、大量地及廉價地製 造之優點。 但是,上述習知之探針,因無法使導桿與導桿所貫穿 之各探針間之空隙完全消除,故各探針會因過負荷而對支 持體或狹縫桿傾斜於導桿之長軸方向。 上述之結果,第1針尖區域不規則地撓曲,第1狹縫 才干被附著於被檢查體或探針組件之玻璃粉等異物緊壓,使 該狹縫桿之—部分,特別是形成狹縫之隔壁破損,或使針 尖區域折損。 特別是,若被檢查體之電極係以IZ0(Indium Zine 〇xide) :乍w田過負荷作用日夺’針尖區域之針尖容易在電極上 滑動:因,匕’於習知之探針’起因於過負荷之第^針尖區 域之彎曲量為多,而使隔壁更容易破損。 九 ^結果’在以往需要頻繁地進行被檢查體或探針組 【發明内容】 本發明之目的在於 域,在過負荷作用時, 止狹縫桿之破損。 ,緊壓於被檢查體之電極之針尖區 即使具有容易撓曲之形狀,仍2防 本發明之探針組件,包含·· 支持體;複數個探針,其 6 'I277740 具備帶狀之裝配區域、及從該奘 且1… 亥羞配區域之前端向前方延伸 且見度比该I配區域小之帶狀的 Μ ^ ^ ^ ^ L t大&域,並以該裝配區 持:見度方向為上下方向之狀態將該裝配區域對向於該支 持肢之下m方式將複數個探針並列配置 桿,貫穿該裝配區域於豆厚产方a 、、、長之導 撐.…θ 度方向而延伸且受該支 f,狹縫#,配置於該支持體之前端側而沿該狹縫桿之長 轴方向延伸,並具有沿其長軸方向相隔間隔且向下方開: 之禝數個狹縫;及至少1個彈性體,配置於該探物狹 =桿或該支持體之間,而沿該狹縫桿之長軸方向延f該 才朱針’係使该針尖區域收納於該狹縫。 使用於本發明之探針組件之探針,係將突出部之下端 緣作為對被檢查體之電極之接觸部位。如此之探針,因: 尖區域之寬度尺寸比裝配區域之寬度小,故容易彎曲。 但是,本發明之探針組件,由於係將沿狹縫桿之長軸 方向延伸之至少丨個彈性體配置於探針與狹縫桿或支^體 之間,故各探針以彈性體緊壓於導桿,而抵消各探針與^ 桿間之空隙。 ' 藉此,即使於探針作用過負荷,亦能防止探針對支持 體或狹縫桿傾斜於導桿之長轴方向,其結果,能防止針尖 區域之不規則彎曲’而能防止狹縫桿之破損或針尖Z域之 折損。 該彈性體亦可配置於該狹縫桿與該針尖區域之間。藉 此,因針尖區域能接觸於彈性體,故能將過負荷所造成^ 針尖區域之撓曲以彈性體來阻止。因此,能更確實地防止 7 J277740 形成狹縫桿之狹縫的隔壁之破損。 該狹縫桿,亦可進一步具有沿其長軸方向延伸而向下 方開口之凹處,並將該彈性體配置於該凹處。 該彈性體亦可配置於該裝配區域與該支持體之間。 亦可包含至少2個該彈性體,將一彈性體配置於該狹 縫桿與該針尖區域之間,將另一彈性體配置於該裝配區域 與該支持體之間。藉此,因針尖區域會接觸於彈性體,故 能將過負荷所造成之針尖區域之撓曲以彈性體來阻止。因 此,能更確實地防止形成狹縫桿之狹縫之隔壁的破損。 該狹縫桿,亦可進一步具有沿其長軸方向延伸而向下 方開口之凹處,並將其一之彈性體配置於該凹處。 亦可包含沿該探針之長軸方向相隔間隔之至少2個哕 彈性體,並將兩彈性體配置於該裝配區域與該支持體^ 間。 該針尖區域,能包含:第丨區域,從該裝配區域之前 端部延長;及第2區域,係從該第丨區域之前端部延伸, 且/、備穴出於该裳配區域之下端緣之下方之突出部。 該第1區域,可具備向上方開口之U字狀凹口部。於 此場合,亦可使該第丨區域之該凹口部形成部位之寬度比 其他部位之寬度尺寸小。藉此,針尖區域,在凹口部:形 成部位則成為更容易彎曲之形狀。 該第1區域之該凹口部形成部位之寬度尺寸,可比其 他部位之寬度尺寸小。 該第2區域,亦可進一步含有向上方開口之第2凹口 8 -1277740 邛,其位於該突ψ 出部形成部位,而 邛分收納於該筮 以h針將該彈性體之一 华2凹口部。 替代上述形狀…™^㈣之向下之面。 部位越朝前端侧傾〆大出彳’亦可形成為以越下方側之 面。藉此,將突出二,且具備越前端侧越朝上方之下端 確實地電氣連:部緊壓於被檢查體之電極時,能使兩者[Technical Field] The present invention relates to a probe assembly used for inspection of a flat object to be inspected such as a liquid crystal display panel. [Prior Art] One of the probe assemblies used for inspection of a flat object to be inspected such as a liquid crystal display panel has a sheet shape (a belt-shaped mounting region (central region), and a front end and a rear portion from the assembly region a plurality of probes (contactors) extending to the front and the rear respectively, and the width direction of the assembly areas is in the up-and-down direction, so that the assembly area is opposed to the support body ( Block) is arranged side by side (Patent Document 丨). Patent Document 1: Japanese Patent Application Laid-Open No. Hei No. Hei-132853 discloses that a needle is attached to a support by one or more elongated guide rods extending through the assembly area and supported by the support body, and And the second needle tip region is accommodated in the plurality of slits, and the plurality of slits are respectively disposed on the front end side and the rear end side of the support body, and the first and second slit rods extending in the longitudinal direction of the guide rod Upper, along the long axis direction of the slit rods are formed at intervals. *Different 1 needle tip area 'The thinner the front end side, and the tip of the needle to the lower end of the dog.帛 2 needle tip area, the thinner the rear end side, and the rear end and the needle tip protruding upward.探针 The probe assembly is placed on the inspection device with the tip of the 2 4f + ρ a ^ ^ needle too Q domain pressed against the wiring for energization. When the test object is energized, the tip of the needle tip area is pressed 5 J277740 to the electrode of the object to be inspected. Thereby, the i-th tip region is bent by the overdrive (0D) acting thereon, and the tip of the needle is slid over the electrode of the object to be inspected. Since the blade type probe is fabricated by lithography or etching technology, it is advantageous in that the probe having the same function can be manufactured with high precision, in a large amount, and at low cost. However, in the above-mentioned conventional probe, since the gap between the probe and the probe through which the guide rod is inserted cannot be completely eliminated, the probes may be inclined to the length of the guide rod due to the overload. Axis direction. As a result of the above, the first needle tip region is irregularly deflected, and the first slit is pressed by foreign matter such as glass frit adhered to the test object or the probe assembly, so that the slit rod is partially formed, in particular, narrowly formed. The next wall of the seam is broken or the needle tip area is broken. In particular, if the electrode of the object to be inspected is IZ0 (Indium Zine 〇xide): 乍w field overload effect, the needle tip of the tip region is easy to slide on the electrode: because 匕 'in the conventional probe' is caused by The amount of bending of the second tip region of the overload is large, and the partition wall is more likely to be broken.九 ^Results In the past, it is necessary to frequently perform an object to be inspected or a probe group. [Explanation] The object of the present invention is to prevent breakage of the slit rod during an overload. The probe tip portion of the electrode pressed against the object to be inspected has a shape that is easily deflected, and prevents the probe assembly of the present invention from containing the support body; the plurality of probes, the 6 'I277740 has a strip-like assembly a region, and a band Μ ^ ^ ^ ^ L t large & field extending from the front end of the 羞 奘 1 1 且 且 且 且 且 且 且 且 : : : : : : ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ The direction of the visibility is the up-and-down direction. The assembly area is opposite to the support limb. The plurality of probes are arranged side by side, and the rods are arranged in the assembly area to the abundance of the beans. The θ degree direction extends and is supported by the support f, and the slit # is disposed on the front end side of the support body and extends along the long axis direction of the slit rod, and has a space spaced apart along the long axis direction thereof and is opened downward: a plurality of slits; and at least one elastic body disposed between the probe narrowing rod or the support body, and extending along the long axis of the slit rod to make the needle tip region Stored in the slit. The probe used in the probe assembly of the present invention has the lower edge of the projection as a contact portion to the electrode of the test object. Such a probe is because the width of the tip region is smaller than the width of the assembly region, so that it is easy to bend. However, in the probe assembly of the present invention, since at least one elastic body extending along the long axis direction of the slit rod is disposed between the probe and the slit rod or the support body, each probe is elastically tight. Press on the guide rod to offset the gap between each probe and the rod. Therefore, even if the probe is overloaded, the probe can be prevented from tilting the support or the slit rod to the long axis direction of the guide rod, and as a result, the irregular curvature of the needle tip region can be prevented, and the slit rod can be prevented. Breakage or breakage of the tip Z domain. The elastomer may also be disposed between the slit rod and the tip region. Therefore, since the tip region can be in contact with the elastic body, the deflection of the needle tip region caused by the overload can be prevented by the elastic body. Therefore, it is possible to more reliably prevent the breakage of the partition wall of the slit of the slit beam formed by the 7 J277740. The slit rod may further have a recess extending in the longitudinal direction thereof to open downward, and the elastic body is disposed in the recess. The elastomer may also be disposed between the assembly area and the support. At least two of the elastic bodies may be included, an elastic body is disposed between the slit rod and the needle tip region, and another elastic body is disposed between the fitting region and the support body. Thereby, since the needle tip region comes into contact with the elastic body, the deflection of the needle tip region caused by the overload can be prevented by the elastic body. Therefore, it is possible to more reliably prevent the breakage of the partition wall forming the slit of the slit rod. The slit rod may further have a recess extending in the longitudinal direction thereof to open downward, and an elastic body may be disposed in the recess. At least two 哕 elastic bodies spaced apart along the long axis direction of the probe may be included, and the two elastic bodies may be disposed between the assembly region and the support. The tip region may include: a third region extending from a front end of the assembly region; and a second region extending from a front end of the second region, and/or a hole from a lower edge of the skirt region The protrusion below it. The first region may include a U-shaped notch portion that opens upward. In this case, the width of the notch portion forming portion of the second region may be made smaller than the width of the other portion. Thereby, the needle tip region has a shape that is more easily bent at the notch portion: the formed portion. The width dimension of the notch portion forming portion of the first region may be smaller than the width dimension of the other portion. The second region may further include a second recess 8 -1277740 开口 that is open upward, and is located at a portion where the protrusion portion is formed, and the enthalpy is stored in the 筮, and the elastic body is formed by the h needle. Notch. Replace the shape of the above...TM^(4) to the downside. The more the portion is inclined toward the front end, the larger the exit 彳 can be formed so as to be on the lower side. Thereby, the protrusion 2 is provided, and the front end side is provided to be electrically connected to the lower end of the object to be inspected.

其係從該突出部沿 成為以越下方側之 前端側越朝上方之 兮壯 < 〗延一步包含凸司 该裝配區域之長鉍士人^ 長軸方向相隔間隔,卫 ^位越朝前端側傾钭 、针而该凸部具傷 下端面。 该抹針,亦可、隹_ 之第3 e ϋ 1… 乂八備從该第2區域之前端部延伸 第2「该第3區域,具有以越上方側之部位越朝: 弟2區域側傾斜 越朝忒 該狹縫之前方。夢此:,針亦可使該前端面突出於 之電極的位置。、谷易從上方確認針尖對被檢查體 呑亥弟2區域亦可且古 成於兮且w 有長0形之形狀,而使該突出部形 成於T7亥長囡形之前總部 、 。於此場合,該帛2區域,可具有 :方側之邛位越朝該第1區域側傾斜之前端面。於此 场σ ’亦可错由將探針配置於狹縫桿’而能容易從上方 認針尖對被檢查體之電極的位置。 該第2區域,亦 區域側傾斜之前端面 之前方。於此場合, 可具有以越上方側之部位越朝該第夏 ’而該探針使該前端面突出於該狹縫 亦可藉由將探針配置於狹縫桿,而能 9 ^^77740 *易從上方確認針尖對被檢查體之電極的位置。 突出=:亦可進一步具備從該針尖區域之前端向下方 【實施方式】 於壯^:發明’將裝配區域之寬度方向稱為上下方向,對 、衣弋區域,緊壓於被檢查體之電極之針w、E H制 、 端側,腎於m+ 电位之針大區域側稱為前 用配線之針尖區域侧稱為後端側。但是, 牙、用铋針組件時,亦可使裝配區域之寬 橫方向,亦可使上下…c + A之是度方向為斜或 1更上下方向相反來使用。 i ,日、?、圖1〜圖3,探針組件1 〇 # # 册处 卞υ係包含·塊即支持體12 · 平狀之複數個探針14,並列 , 長之m 五巧配置於支持體12之下側;細 針 、牙铋針14 ; 一對狹縫桿18,收納探 ,’ 之一部分;長尺寸導引盖 丁導引構件20,用以安定探針14之 後立而側之針尖位置;及一 ^ 於支持體12。 子側-22,用以使導桿支擇 士持冑12,於上面側具有螺絲孔24及一對導孔“, 亚:各側:側具有—對導孔28。支持體12之下面,如圖 Τ’精由複數個段部形成階梯狀。支持體&可由不It is stronger from the front side of the protruding portion to the upper end side of the lower side, and the length of the long gentleman's length of the assembly area including the convex portion is spaced apart, and the guard position is toward the front end. The squat and the needle are tilted and the convex portion has a lower end surface. The squeegee may be the third e ϋ 1 of the 隹 ... 乂 备 备 备 备 第 第 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 「 The tilt is more toward the front of the slit. The dream: the needle can also make the front end protrude from the position of the electrode. Gu Yi confirms the needle tip from the top to the body to be inspected. w and w has a long 0-shaped shape, and the protrusion is formed at the headquarters before the T7 long 囡 shape. In this case, the 帛2 region may have a square side toward the first region side. The front end surface is inclined. In this case, σ ' may be misplaced by placing the probe on the slit rod', and the position of the needle tip to the electrode of the test object can be easily recognized from above. The second region is also inclined before the front side of the region side In this case, the portion of the upper side may be toward the summer portion, and the probe may protrude the front end surface from the slit by disposing the probe on the slit rod. ^77740 *Easy to confirm the position of the tip of the needle to the electrode of the object to be inspected from above. The tip end of the tip area is downward. [Embodiment] In the case of the invention, the width direction of the assembly area is referred to as the up and down direction, and the pair of clothes and the placket area are pressed against the electrodes of the object to be inspected by the needles w and EH. The side of the large area of the needle of the m+ potential is called the side of the needle tip of the front wiring. The side of the needle is called the rear end side. However, when the tooth and the needle assembly are used, the width of the assembly area can also be made wide and horizontal... c + A is used when the degree direction is oblique or 1 is up and down. i, day, ?, Fig. 1 to Fig. 3, probe assembly 1 〇# #册卞υ系系·块块 Supporting body 12 · a plurality of probes 14 in a flat shape, juxtaposed, long m is arranged on the lower side of the support body 12; a fine needle, a gum needle 14; a pair of slit rods 18, a part of the storage probe, 'long guide The cover guiding member 20 is used for stabilizing the position of the needle tip on the side of the probe 14; and a support body 12. The sub-side 22 is used to support the guide rod 12, on the upper side There are screw holes 24 and a pair of guide holes ", sub: each side: side has - opposite guide holes 28. Below the support body 12, as shown in Fig. 精, the plurality of segments are stepped. Support & can be no

通電之所謂非導雷今S 金屬材料、陶瓷或合成樹脂來製作。 各探針14,如圖2及圆 上仏姚 及圖3所不,具備··裝配區域30, 當作V狀之中央區域作田· Ώ磁 ^ 用,及贡狀之一對針尖區域Μ及 34,從裝配區域3〇 & 之則J而及後端分別更向前方及後方延 伸。 裂配區域3 0,在久㈣土 各食而部具有貫穿導桿16之導孔36, 1277740 並於導孔36間之部位且古 H , 具有设數個長孔38,其貫穿裳配區 域30之長軸方向之相隔間隔之部位。 各長孔38,係沿裝配區域3〇之長轴方向延伸 在裝配區域30之長軸方向相隔間隔。 、’ 在圖7F之例中,各導孔36,雖係圓形,但可對應 1 ό之截面形狀而形成。又,導 "干 拭Μ Ε ^ ^ 蜍孔36,亦可形成於裝配區 Β之長軸方向相隔間隔之其他部位,亦可 配區域30之長軸方向延伸 ^ ^ 衣 、狎之長孔。右係後者之情形,亦 可形成為延續於長孔38之長孔。 針尖區域3 2及3 4,公則rk壯nr r- i a 山 ^ 刀別由裝配區域30之長軸方向一 糙之上緣部及另一端之下緣部向前方及後方延伸,又1且 有比裝配區域30之寬度小的寬度尺寸。 一 —針大區域32 ’包含:第!區域4〇,從裝配區域%之 珂端部向前方延伸;第2區域42,從 ^ 部向前方延伸;第3區域44 〇〇 3 之刖翊 前方延伸。 …4…區域42之前端部向 立第1區域40,於前端部具備向上方開口之U字狀凹口 =46’並且於基端部(裝配區域3〇側之部位)具備向下方 開口之弧狀凹口部48。 —形成第1區域40之凹口部46及48之部位之寬度,係 比弟i區域40其他部位之寬度尺寸小。形成第】區域如 之凹口部46之部位’係稍微向下方突出於裝配區域30之 下端緣。 第2區域42,並具備比裳配區域3〇之下端緣更下方 11 .1277740 犬出之突出部5〇,並且於 古門 形成犬出部5〇之部位具備向卜 方開口之弧狀凹口部52。突出 之向下面。 …5〇之下側面’係倒梯形 突出部50之下端面54,在同-々η 士 體之電極转之水^,Β在圖g例巾’係與被檢查 > 使全體成為對於被檢杳體之f 極之接觸部。但是,下端 之電 朝上方傾钭(對水平:: 可使越前端側之部位越 54夕 千面傾斜0角度)。在此情形,下端面 之;部分當作對被檢查體之電極之接觸部而作用。 的方二ί &域44 ’具有以越上方側處越朝第2區域42側 的方式傾斜之前端面56。 針大區域3 4之'嫂立卩 » 成尖敍…、 ,如圖2所示,係向上方彎曲形 ,,、u 右將彳木針14從其厚度方向觀看時,針 大34a具有三角形之形狀。 十4係對導電性弱之金屬板施以蝕刻加工作成探 針之原形,J:戈,认# π 风休 ^ 於5亥原形以如聚醯亞胺材料等之電教举 緣性材料在探钍夕& , 乱 彳木針之針尖部分以外形成包覆層,藉此以製 作。 、 然而,亦可利用微影技術與電鑛技術來製作探針14。 &針14 ’以裝配區;或3〇之寬度方向為上下方向之狀 態,使裝配區域30,導孔36及長孔38對向,而並列配置 於支持體12之下側。 、各導才干16,在圖示之例中,具有圓形截面形狀,且以 #導電性金屬材料來形成。各導桿16,係被擠Μ於探針14 之導孔3 6,而嫂加" 合^部係貫穿側蓋22,藉此以兩側蓋22組 12 *1277740 裝於支持體1 2。 各狹縫桿18,在此等之長軸 成之複數個狭縫60。各狹縫60,具有既定之節距形 寸大致相同之寬度,且延伸至橫跨=尺 全體。 18之寬度方向 前端側之狹缝桿18,又㈣^ 方開口之槽狀凹處62。在凹斤〇 方向延伸而向下 在凹處62,配置棒狀 使其-部分突出於狹縫6〇而形成沿狹 ’ 伸之狀態。 仵丨8長軸方向延 在圖示之例中,凹處62,具有與探針14之 ::?向之半圓形形狀,彈㈣64具有圓形之截面形狀。 ::?,凹口部52、凹處62及彈性體…亦可具有其他形 狹縫桿18,可由陶竞等之非導電性材料來製作。又, 各狹縫60,可於將狹縫桿18裝設於支持體12之 嗖 之後形成。 ^ 具有凹處62之狹縫桿18,沿探針14之排列方向延伸, 以狹縫60朝向下方之狀態黏著於支持體12之前端下面。 另外之狹縫桿18 ’沿探針14之排列方向延伸,以狹縫⑼ 朝向下方之狀態黏著於支持體12之後端下面。但是,亦 可將各狹縫桿18藉由i個以上之螺絲構件或藉由喪合裝 配於支持體12。 各探針14,以前端面56突出於前端側之狹縫桿18之 前方、針尖34a突出於後端側之狹縫桿18之狹縫6〇之後 13 1277740 方之狀態,使針尖區域3 側之狹縫桿18之狹縫60。 別收納於前端側及後端 :上述之狀態’彈性體64,係將其一部分收 區域32之凹口部52。妙工 、’寸大 縫桿18之狹縫60之槽 之狹 Μ ^ ^ ^ ·幵,下多而面5 4係突出於前The so-called non-guided lightning-emitting S metal material, ceramic or synthetic resin is produced. Each of the probes 14 has a mounting area 30 as shown in Fig. 2 and the upper part of the circle, and the assembly area 30 is used as a V-shaped central area for the field and the magnetic field. 34, from the assembly area 3〇 & J and the rear end respectively extend further forward and rearward. The splitting area 30 has a guide hole 36 penetrating the guide rod 16 in each of the long-term (four) soils, and 1277740 is located between the guide holes 36 and has an ancient long H, which has a plurality of long holes 38 extending through the skirting area. The portion of the long axis direction of 30 is spaced apart. Each of the elongated holes 38 extends in the longitudinal direction of the fitting region 3〇 at intervals in the longitudinal direction of the fitting region 30. In the example of Fig. 7F, each of the guide holes 36 is formed in a circular shape, but may be formed in accordance with the cross-sectional shape of one turn. Also, the guide "dry wipe Μ ^ ^ ^ 蜍 36, can also be formed in the assembly area Β in the long axis direction of the other parts of the interval, can also be extended with the long axis of the area 30 ^ ^ clothing, 狎 long hole . The case of the right side of the latter may also be formed as a long hole extending through the long hole 38. The tip region 3 2 and 3 4, the male rk strong nr r- ia mountain ^ knife is extended from the long axis direction of the assembly area 30 to the upper edge and the lower edge of the other end to the front and the rear, and 1 A width dimension that is smaller than the width of the assembly area 30. One - needle large area 32 ‘ contains: the first! The region 4A extends forward from the end portion of the assembly area %; the second region 42 extends forward from the ^ portion; and the third region 44 extends from the front side of the 〇〇3. In the front end portion, the front end portion has a U-shaped notch that is opened upwards = 46', and the base end portion (portion on the side of the mounting region 3) has a lower opening. Arcuate notch 48. The width of the portion where the notch portions 46 and 48 of the first region 40 are formed is smaller than the width of the other portions of the region i. The portion where the first region such as the notch portion 46 is formed protrudes slightly downward from the lower end edge of the mounting region 30. The second region 42 has a protruding portion 5 117 which is lower than the lower edge of the skirting region 3 12, and has an arcuate notch that opens to the opening of the dog in the part where the dog is formed at 5 〇. Part 52. Highlight the direction below. ...the lower side of the 5" is the lower end surface 54 of the inverted trapezoidal projection 50, and the water is turned on the electrode of the same -々η士体, and the 例 例 例 例 例 例 例 例 例 例 例 例 使 使 使Check the contact of the f-pole of the body. However, the power at the lower end is tilted upwards (for the horizontal:: the more the front end side is, the more the angle is inclined by 0 degrees). In this case, the lower end face; the portion acts as a contact portion to the electrode of the test object. The square ί & field 44 ′ has a front end surface 56 that is inclined toward the second region 42 side at the upper side. The needle large area 3 4 '嫂立卩» becomes a sharp point..., as shown in Fig. 2, it is curved upwards, and u is right when the eucalyptus needle 14 is viewed from its thickness direction, the needle big 34a has a triangle The shape. The X4 series applies the original shape of the metal plate with weak conductivity to the work of the probe, J: Ge, recognizes # π 风休^ in the original shape of the 5th, and uses the electro-technical material such as polyimine material.钍 && , a coating layer formed outside the tip of the squid needle, thereby making. However, the probe 14 can also be fabricated using lithography and electrominening techniques. The needle 14' is placed in the up-and-down direction in the width direction of the assembly area; or the width direction of the 3' is aligned, and the mounting area 30, the guide hole 36 and the long hole 38 are opposed to each other, and are arranged side by side on the lower side of the support 12. Each of the guide members 16 has a circular cross-sectional shape and is formed of a # conductive metal material in the illustrated example. Each of the guide rods 16 is squeezed into the guide hole 3 6 of the probe 14 and is joined to the side cover 22, thereby being mounted on the support body 1 2 with the side cover 22 group 12 * 1277740 . Each slit rod 18 has a plurality of slits 60 that are axially elongated. Each of the slits 60 has a width which is substantially the same in a predetermined pitch shape and extends to a span of ft. The slit rod 18 on the front end side in the width direction of 18, and the groove-shaped recess 62 in the (four) square opening. Extending in the direction of the concavity and downward in the recess 62, a rod shape is arranged so as to partially protrude from the slit 6〇 to form a state of being stretched in a narrow shape.仵丨8 Long-axis direction extension In the illustrated example, the recess 62 has a semi-circular shape with respect to the ::14 direction of the probe 14, and the bullet (four) 64 has a circular cross-sectional shape. ::?, the notch portion 52, the recess 62, and the elastic body ... may have other shaped slit bars 18 which may be made of a non-conductive material such as Tao Jing. Further, each of the slits 60 can be formed after the slit rod 18 is attached to the support 12 . The slit rod 18 having the recess 62 extends in the direction in which the probes 14 are arranged, and is adhered to the lower side of the front end of the support 12 with the slit 60 facing downward. Further, the slit rods 18' extend in the direction in which the probes 14 are arranged, and are adhered to the lower side of the rear end of the support 12 with the slits (9) facing downward. However, each of the slit bars 18 may be attached to the support 12 by means of one or more screw members or by distraction. In each of the probes 14, the front end surface 56 protrudes in front of the slit rod 18 on the front end side, and the needle tip 34a protrudes from the slit 6 of the slit rod 18 on the rear end side to the state of 13 1277740, so that the needle tip region 3 side The slit 60 of the slit rod 18. It is not stored in the front end side and the rear end: the above-mentioned state 'elastic body 64' is a notch portion 52 which is partially received in the region 32. The fine work, the narrow slot of the slit 60 of the large slit 18, Μ ^ ^ ^ · 幵, the lower face, the 5 4 series protrudes from the front

知側之狹縫桿18之狹縫6〇之下方。 孓月J 具有^型之截面形狀,且於l字之一 之邊#刀具有沿導引構 數個書宗3 U之長轴方向相隔間隔之複 數们貝牙孔66(茶照目υ。導引構件2〇 等之非導電㈣膜來製作 由以胺材枓 形成。 又貝牙孔66可以雷射加工來 導引構件20,以各針尖 在L字之另-之邊部分…探二:牙孔“之方式’ 狀態藉由複數個螺絲構之排列方向延伸之 之後端面下部。作B t 地裝設於支持體12 著而裝設於支持體=^將導引構件2G藉由嵌合或黏 各側蓋22 =:……構件2。。 形成,且藉由—對導鎖=持體12側面形狀之板構件而 地裝設於支持體12之侧面—個螺絲構件72拆卸自如 之導=:端二 =出之方式嵌合於形成在支持體12 亦可將導鎖70固定於側蓋22。 二孔。但疋, 1 6之端部之貫穿孔。 现2,具有收納兩導桿 在圖中’雖以使相鄰之探針14相隔大間隔排列之方 14 •1277740 式,但實降μ 4贷 寸及排列節距^ 14之排列節距係小。探針Μ之厚度尺 被檢查體之種_ =縫⑼之配置節距及寬度尺寸,係依 不相同。、,特別係依電極之配置節距及寬度尺寸而 探針組件 1 A y ’係以下述步驟★丑择 止 18與導引構件 、,波百先,將兩狹縫桿 傅1千20以上述之狀態 態將各探針14夕二 4配於支持體12,以該狀 針尖34咖 兩端部插入狹縫桿18之狹縫60,並且將 針心穿入導?丨構件2〇之貫穿孔 將 通於探針14之道^ 妾者將V銷16插 支持體12,並曰36,接著將導銷70插通於側蓋22與 側芸22以料料銷16之端部插通於側蓋22,然後將 2以螺絲構件72裝配於支持體12。 I此’ &針14與導鎖16透 承,各探針M,以其厚度方向 支 態受支持體12支承。 ㈣Μ之長軸方向之狀 板等I::述組裳之狀態,探針14,以對應於液晶顯示面 板4被檢查體之電極 τ ® 俨12…,?之配置圖案的圖案’並列配置於支持 月丑12之下側,針尖 出而係由狹縫桿18向後方及上方突 出而犬出於導引構件20之上方。 又’各探針14之針尖囘衫 !〇,,,„ 卞大£域32,雖離開於前端侧之狹 、、連杯18之狹縫6〇的槽麻,伯妖 又夂4”力 一—於凹口部52抵接於彈性體64。 又’各捸針14之前端面56係 係犬出於狹縫桿1 8之前方。 組裝於檢查裝置時,探斜 ^ ^ ^ 木針、、且件10,係以針尖34a稍微 過度地緊壓於TAB帶(去闰一、 於产魯_ w — u 圖不)之通電用配線之狀態,組裝 於才欢查裝置。精此,各您牡 木針14,因其針尖區域34之寬度 15 •1277740 比&配區域30之寬度小,故會彎曲成弧狀,而針尖34a則 會確實接觸於通電用配線。 將探針組件10組裝於檢查裝置時,探針組件10,藉 由插入圖1所示之導孔26之導銷而使其對檢查裝置定位, 又藉由螺合於螺絲孔24之螺絲構件而拆卸自如地裝配於 才双查裝置。但是,亦可將探針組件10以其他方法及其他 機構組裝於檢查裝置。 楝針14之交換,係將探針組件從檢查裝置拆卸, 將側盍22從支持體12拆卸,拔出導桿16,拆卸欲交換之 祆針,將新探針取代其配置於支持體丨2,然後以已說明之 方法,組裝探針組件10,再將此探針組件裝配於檢查 裝置即可。因此,探針之交換變容易。 才欢查時,探針組件i 〇與被檢查體,以使下端面54與 被檢查體之電極為一致之狀態,使下端面54稍微過度地 I、二於被;^查體之電極。此時,因前端面56突出於狹縫6〇 幻方故此從上方谷易確認針尖對被檢查體之電極之位 置。 田下端面54緊壓被檢查體之電極,則過負荷(〇ver drive OD)作用於探針14。各探針14,因針尖區域u之 見度,特別是凹口部46部位之寬度比裝配區域3〇之寬度 尺寸小,故由於如上述之過負荷在針尖區域32容易彎曲。 但疋,探針14,其針尖區域32係離開於前端側之狹 縫柃1 8之狹縫60之槽底,而在凹口部52抵接於彈性體64。 因此,過負荷所造成之針尖部32之彎曲能以彈性體64阻 16 -1277740 止。 ^結果,由於能阻止針尖區域32之變形、下端面“ 在被檢杳體之帝士冗 W接觸:: 量亦小。因此,藉由下端面 :妾觸β作用)之滑動量小的探針14,即使作用過負荷, = 近被檢查體,而可防止起因 W 形成狹縫桿18之狹縫60)之破損。 14與又至了Λ14以彈性體64緊壓於導桿16 14作用、側之導桿16間之空隙。藉此,即使在探針 狹縫产Γ二何,亦能防止探針14對支持體12或前端側之 狹,4'18傾斜於導桿16之長軸方向。 止亡二::果,旎防止針尖區域32之不規則撓曲,而確實 心側之狹縫桿18之破損或針尖區域32之折損。、 下侧面形成為倒梯形之向下面之突可 有其他形狀之突出部來取代。 T了以具 圖4所示之突屮# 傾斜。突出部80, 越下方側之部位越朝前端侧 前端侧越朝上方傾斜;二…’其對水平面僅以越 分作為接觸部。如此=’而以遠下端面82之-部 ^ ^ ^ . 大出口Ρ Μ,若將其緊壓於被檢杳體 之电極時’能使兩者確實地作電氣連接。 仏一體 圖5所示之探針14,於第2區域& 了或3。之長轴方向後方(亦可前方 出: 。凸部…與突出部8〇相同 二』 側的方式傾斜。 万側處越朝前端 凸部 84之下嫂;^ Λ 下而面86,對水平面僅以越前端側越朝上 17 ^ 1277740 方傾斜0 2角度。0 2,亦可與 /、c i相冋,亦可不相同。 圖6所示之探針14,於箆9 、弟2區域42具有長圓形之形 狀’突出部88係形成於長圓形之前端部。突出部“之下 :面9〇’對水平面以越前端侧越朝下方的方式傾斜,而使 前端作為對被檢查體之電極之接觸部。 圖6所示之探針,未具備箆 、侑弟3區域。因此,以越上方 側處越朝第1區域40側的方式傾斜命 八1貝計之刖端面56,係形成 於弟2區域42。 在圖3,目4及圖5之任一實施例,亦可不具備第3 區域44,而將前端面56形成於第2區域竹。又,在圖3 至圖6之任一實施例,亦可且播 、 ^ J J具備以越上方側處越朝第1區 域40的方式傾斜之前端面56。 在圖3至圖5之任一實施例,亦可將凹處_成為矩 形之截面形狀’而使用具有對應其凹口部截面形狀之矩妒 截面形狀之彈性體。又’在圖6之實施例,亦可將凹處% 形成為弧狀截面形狀,使用具有對應其凹口部截面形狀之 圓形截面形狀之彈性體。 7 使用圖6所示之探針14時,如圖7所示, 5早性體94、及凹口部46與48。 如圖8所示之探針組件10,不僅可將彈性體μ配置 於針尖區域32與前端側之狹縫桿18間,亦可將彈性體% 配置於探針14之中央區域30與支持體12下面之間。疒 性體96,在圖示之例中’係以矽酮橡膠等之橡 : 成板狀。 了衣1下 18 -1277740 如上所述,若將複數個彈性體64、96沿探針μ 軸方向相隔間隔配置’ _ 14因在後端側以 : 導桿16緊壓,故能確實防止其傾斜。 除將彈性體6 4配置於斜出ρΞΓ 1 針大£域32與前端彻丨之狹縫桿 18間,如圖9所示,亦可將2個彈性體96、96沿探針14 之長軸方向相間隔配置於探針14與支持體12間。It is below the slit 6 of the slit rod 18 of the known side.孓月J has a cross-sectional shape of the shape of the ^, and is on the side of one of the l-words. The knives have a plurality of scallops 66 spaced apart along the long axis of the guide frame 3 U. The non-conductive (four) film of the guiding member 2〇 is formed by the amine material 。. The shell hole 66 can be laser-processed to guide the member 20, and the needle tips are on the other side of the L-shape. : The "mode" state of the perforation is extended by the arrangement of the plurality of screws in the direction of the rear end of the end face. The B t is mounted on the support 12 and mounted on the support body = ^ the guide member 2G is embedded The side cover 22 =: ... member 2 is formed, and is attached to the side of the support body 12 by a plate member having a side shape of the guide lock 12 - the screw member 72 is detachably freely Guide =: End 2 = Output is formed in the support body 12. The guide lock 70 can also be fixed to the side cover 22. Two holes. However, the through hole of the end of the 16 is now. In the figure, the two guide rods are arranged in such a way that the adjacent probes 14 are arranged at a large interval, but the actual pitch is 4 and the pitch is arranged. The pitch is small. The thickness of the probe is the type of the body to be inspected. _ = the pitch and width dimensions of the slit (9) are different. In particular, the probe assembly depends on the pitch and width of the electrode. 1 A y ' is equipped with the following steps: ugly 18 and the guiding member, and the first one of the two slits is 1200, and the probes 14 are placed on the support 12 in the state described above. Inserting the slit 60 of the slit rod 18 at both ends of the needle tip 34, and inserting the needle into the through hole of the guide member 2 will pass through the probe 14 and the V pin 16 The support body 12 is inserted into the support body 12, and then the guide pin 70 is inserted into the side cover 22 and the side sill 22 to insert the end of the material pin 16 into the side cover 22, and then the screw member 72 is assembled to the support body by the screw member 72. 12. The needle 14 and the guide lock 16 are permeable, and each probe M is supported by the support body 12 in its thickness direction. (4) The shape of the long axis of the cymbal, etc. I:: the state of the group The probe 14 is arranged side by side in a pattern accommodating the arrangement pattern of the electrodes τ ® 俨 12 ... of the liquid crystal display panel 4 to be inspected, and the needle tip is out. The dog is protruded rearward and upward by the slit rod 18 and the dog is above the guiding member 20. Further, the needle tip of each probe 14 is returned to the shirt! 〇,,, „ 卞大超域32, although narrow from the front end side The slot of the cup 18 is 6 inches, and the scorpion is 4" force one - the abutment portion 52 is abutted against the elastic body 64. When the sewing rod is assembled in the front of the inspection device, when it is assembled in the inspection device, the wooden needle is probed, and the member 10 is slightly over pressed against the TAB belt with the needle tip 34a (to the first, the production of Lu_w-u In the state of the wiring for energization, it is assembled in the device. In this case, each of the sized needles 14 has a width of 15 • 1277740 which is smaller than the width of the & area 30, and therefore is curved in an arc shape, and the tip 34a is surely in contact with the wiring for energization. When the probe assembly 10 is assembled to the inspection device, the probe assembly 10 is positioned to the inspection device by inserting the guide pin of the guide hole 26 shown in FIG. 1 and by the screw member screwed to the screw hole 24. And disassembled and assembled easily in the double check device. However, the probe assembly 10 can also be assembled to the inspection device by other methods and other mechanisms. The exchange of the cymbal 14 removes the probe assembly from the inspection device, detaches the side cymbal 22 from the support body 12, pulls out the guide rod 16, disassembles the sputum needle to be exchanged, and replaces the new probe with the support body. 2. The probe assembly 10 is then assembled in the manner described, and the probe assembly can be assembled to the inspection device. Therefore, the exchange of the probe becomes easy. At the time of the check, the probe unit i and the object to be inspected are in such a manner that the lower end surface 54 and the electrode of the object to be inspected are in a state of being identical, so that the lower end surface 54 is slightly excessively I. At this time, since the front end surface 56 protrudes from the slit 6 幻 magic square, it is easy to confirm the position of the needle tip to the electrode of the test object from the upper valley. When the field lower end surface 54 is pressed against the electrode of the object to be inspected, an overload (〇ver drive OD) acts on the probe 14. Each of the probes 14 is easily bent in the needle tip region 32 due to the above-described overload due to the visibility of the tip region u, in particular, the width of the notch portion 46 is smaller than the width of the fitting portion 3'. However, in the probe 14, the tip end region 32 is separated from the groove bottom of the slit 60 of the slit 182 of the leading end side, and the notch portion 52 abuts against the elastic body 64. Therefore, the bending of the tip end portion 32 caused by the overload can be blocked by the elastic body 64 16-1277740. ^ As a result, since the deformation of the needle tip region 32 can be prevented, the lower end surface "when the contact of the corpus callosum is in contact with the W:: the amount is also small. Therefore, the sliding amount of the lower end surface: the action of the sputum β is small" The needle 14, even if it is subjected to an overload, is close to the object to be inspected, and the breakage of the slit 60 which forms the slit rod 18 due to the W can be prevented. 14 and again, the elastic body 64 is pressed against the guide rod 16 14 The gap between the guide rods 16 on the side, thereby preventing the probe 14 from being narrowed to the support body 12 or the front end side even if the probe slit is produced, and the 4'18 is inclined to the length of the guide rod 16. Axis direction: Death 2::, 旎, to prevent irregular deflection of the needle tip region 32, and indeed the damage of the slit rod 18 on the heart side or the breakage of the needle tip region 32. The lower side surface is formed as an inverted trapezoid The protrusion may be replaced by a protrusion of another shape. The T is inclined by the protrusion # shown in Fig. 4. The portion of the lower portion is inclined toward the front end side toward the front end side; The horizontal plane is only used as the contact portion. Thus =' and the far lower end surface 82 is the part of the ^^^. Large exit Ρ Μ, if it is tight When the electrode of the body is inspected, the two can be electrically connected. The probe 14 shown in Fig. 5 is in the second region & or 3. The rear of the long axis (or in front) Out: The convex part is inclined in the same way as the protruding part 8〇. The more the side is toward the lower end of the front convex part 84; ^ Λ the lower side 86, the horizontal plane only faces the front end side upwards 17 ^ 1277740 square tilt 0 2 angle. 0 2, can also be different from /, ci, or different. The probe 14 shown in Figure 6, in the 箆9, brother 2 area 42 has an oblong shape 'protrusion The 88-series is formed at the front end of the oblong shape. The protrusion "underside: the surface 9" is inclined so that the horizontal plane faces downward toward the front end side, and the front end serves as a contact portion with respect to the electrode of the test object. In the illustrated probe, the 3 and 侑 3 regions are not provided. Therefore, the 刖 end face 56 of the 八 1 1 贝 , , 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 In any of the embodiments of FIG. 3 and FIG. 5, the third region 44 may not be provided, and the front end surface 56 may be formed in the second region. Further, in FIG. In any of the embodiments of FIG. 6, the front end surface 56 may be inclined so as to be toward the first region 40 at the upper side. In any of the embodiments of FIG. 3 to FIG. The portion _ becomes a rectangular cross-sectional shape' and uses an elastic body having a rectangular cross-sectional shape corresponding to the cross-sectional shape of the notch portion. Further, in the embodiment of Fig. 6, the concave portion may be formed into an arc-shaped cross-sectional shape, and used. An elastic body having a circular cross-sectional shape corresponding to the cross-sectional shape of the notch portion. 7 When the probe 14 shown in Fig. 6 is used, as shown in Fig. 7, the 5 early body 94 and the notched portions 46 and 48 are as shown. The probe assembly 10 shown in FIG. 8 can arrange not only the elastic body μ between the needle tip region 32 and the slit rod 18 on the distal end side but also the elastic body % in the central region 30 of the probe 14 and the support body 12. Between the following. The 疒 body 96, in the illustrated example, is made of a rubber such as an anthrone rubber: a plate shape.衣1下18 -1277740 As described above, when a plurality of elastic bodies 64 and 96 are arranged at intervals in the probe μ-axis direction, _ 14 is pressed on the rear end side by the guide rod 16 so that it can be surely prevented. tilt. In addition to arranging the elastic body 6 4 between the obliquely-shaped ρ ΞΓ 1 pin large area 32 and the front end of the slit rod 18, as shown in FIG. 9, the two elastic bodies 96, 96 may also be along the length of the probe 14. The axial directions are disposed between the probe 14 and the support 12 at intervals.

又’如圖1G所示’亦可將2個彈性體96、96沿探針 14之長軸方向相隔間隔配置於探針"與支持體η間,而 將其他彈性體98(以石夕酮橡膠等之橡膠材料製作成板狀)配 置於針尖區域32與狹縫桿間。 再者,如圖11所示’亦可將具有與中央區域30之長 度尺寸大致相同程度之寬度尺寸之彈性體ι〇〇,配置於探 針14與支持體12間。彈性體1〇〇,亦以石夕酮橡膠等之橡 膠材料製作成板狀。 即使藉由圖9, Η 10及圖u之任一實施例,探針14, 因在前端側及後端側之任一側皆緊壓於導桿“及Μ,故 能確實防止其傾斜。 然而’如圖12所示,亦可將彈性體96僅配置於探針 14之中央區域30與支持體12下面之間。 除使用如彈性體64、96、98、1〇〇等具有圓形或矩形 截面形狀之彈性體’亦可使用具有半圓形、六角形、長圓 形、橢圓形等,其他截面形狀之彈性體。 在圖13所示之實施例,係使用具有半圓形截面形狀之 彈性體1 02。 19 -1277740 使用於圖9至圖13所示之實施例之探針12,針尖區 域32雖具有比中央區域3〇之寬度小之寬度尺寸,但:尖 32a係由針尖區域32之前端向下方彎曲。 又’使用於圖9至圖13所示之實施例之探針I〕,雖 未於中央區域30具有長孔38’但亦可將如此之長孔%形 成於中央區域30。Further, as shown in FIG. 1G, two elastic bodies 96 and 96 may be disposed between the probe " and the support body n at intervals along the long axis direction of the probe 14, and the other elastic body 98 may be used. The rubber material such as ketone rubber is formed into a plate shape and disposed between the needle tip region 32 and the slit bar. Further, as shown in Fig. 11, an elastic body ι having a width dimension substantially equal to the length dimension of the central region 30 may be disposed between the probe 14 and the support 12. The elastomer 1 is also formed into a plate shape by a rubber material such as a rubber. Even in any of the embodiments of Fig. 9, Η 10 and Fig. u, the probe 14 is pressed against the guide rod "and the cymbal" on either the front end side and the rear end side, so that the tilt can be surely prevented. However, as shown in Fig. 12, the elastic body 96 may be disposed only between the central portion 30 of the probe 14 and the lower surface of the support body 12. In addition to using a circular shape such as an elastic body 64, 96, 98, 1 , etc. The elastic body of the rectangular cross-sectional shape may also be an elastic body having a semicircular shape, a hexagonal shape, an oblong shape, an elliptical shape, or the like, and other cross-sectional shapes. In the embodiment shown in Fig. 13, a semicircular cross section is used. Shaped Elastomers 01. 19 -1277740 For the probe 12 of the embodiment shown in Figures 9 to 13, the tip region 32 has a width dimension smaller than the width of the central region 3〇, but the tip 32a is The front end of the needle tip region 32 is bent downward. Further, the probe I used in the embodiment shown in Figs. 9 to 13 does not have the long hole 38' in the central portion 30, but the long hole % can be formed. In the central area 30.

本發明,不僅液晶顯示面板,亦能適用於在其玻璃基 板、有機EL等其他顯示用面板等其他平板狀被檢查體之 檢查所用之探針及探針組件。 本發明,不僅適用於液晶顯示面板或有機EL等顯示 用面板所使用之採針及採針組件,亦能適用於在積體電路 等其他平板狀被檢查體之檢查所用之探針及探針組件。 【圖式簡單說明】 圖1 ’係表示本發明之探針組件之第1實施例的立體 圖 ° 圖2 ’係圖1所示之探針組件的縱截面圖。 圖3 ’係圖1所示之第1實施例之前端側之針尖區域 附近的放大縱截面圖。 圖4,係顯示本發明之探針組件之第2實施例之前端 側之針尖區域附近的放大縱截面圖。 圖5,係顯示本發明之探針組件之第3實施例之前端 側之針尖區域附近的放大縱截面圖。 圖6,係顯示本發明之探針組件之第4實施例之前端 側之針尖區域附近的放大縱截面圖。 20 -1277740 圖7 ’係顯示本發明之探針組件之第5實施例之前端 側之針尖區域附近的放大縱截面圖。 圖8,係顯示本發明之探針組件之第6實施例的縱截 面圖。 圖9,係顯示本發明之探針組件之第7實施例的縱截 面圖。 圖1 〇,係顯示本發明之探針組件之第8實施例的縱截 面圖。 圖11,係顯示本發明之探針組件之第9實施例的縱截 面圖。 圖12,係顯示本發明之探針組件之前端侧之針尖區域 附近之第10實施例的放大縱截面圖。 圖1 3,係顯示本發明之探針組件之前端側之針尖區域 附近之第11實施例的放大縱截面圖。 【主要元件符號說明】 10 : 棟針組件 12 : 支持體 14 : 探針 16 : 導桿 18 : 狹縫桿 20 : 導引構件 22 : 側蓋 30 : 中央區域 32 > 34 :針尖 21 .1277740 40 :第1區域 42 :第2區域 44第3區域 46、48 :凹口部 50 、 80 、 88 :突出部 52:凹口部(第2凹口部)The present invention can be applied not only to a liquid crystal display panel but also to a probe and a probe assembly for inspection of other flat-shaped test objects such as a glass substrate or an organic EL panel. The present invention can be applied not only to a needle and a needle assembly used for a display panel such as a liquid crystal display panel or an organic EL, but also to a probe and a probe for inspection of other flat specimens such as an integrated circuit. Component. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a perspective view showing a probe assembly of the first embodiment of the probe assembly of the present invention. Fig. 2 is a longitudinal sectional view of the probe assembly shown in Fig. 1. Fig. 3 is an enlarged longitudinal sectional view showing the vicinity of the tip end region on the front end side of the first embodiment shown in Fig. 1. Fig. 4 is an enlarged longitudinal sectional view showing the vicinity of a tip end region on the end side before the second embodiment of the probe assembly of the present invention. Fig. 5 is an enlarged longitudinal sectional view showing the vicinity of a tip end region on the end side before the third embodiment of the probe assembly of the present invention. Fig. 6 is an enlarged longitudinal sectional view showing the vicinity of a tip end region on the end side before the fourth embodiment of the probe assembly of the present invention. 20 -1277740 Fig. 7 is an enlarged longitudinal sectional view showing the vicinity of the tip end region on the end side before the fifth embodiment of the probe assembly of the present invention. Fig. 8 is a longitudinal cross-sectional view showing a sixth embodiment of the probe assembly of the present invention. Fig. 9 is a longitudinal cross-sectional view showing a seventh embodiment of the probe assembly of the present invention. Fig. 1 is a longitudinal cross-sectional view showing an eighth embodiment of the probe assembly of the present invention. Figure 11 is a longitudinal cross-sectional view showing a ninth embodiment of the probe assembly of the present invention. Fig. 12 is an enlarged longitudinal sectional view showing a tenth embodiment in the vicinity of the tip end region on the front end side of the probe assembly of the present invention. Fig. 13 is an enlarged longitudinal sectional view showing the eleventh embodiment in the vicinity of the tip end region on the front end side of the probe assembly of the present invention. [Main component symbol description] 10 : Socket component 12 : Support body 14 : Probe 16 : Guide bar 18 : Slit bar 20 : Guide member 22 : Side cover 30 : Center area 32 > 34 : Tip 21 .1277740 40: first region 42: second region 44 third region 46, 48: notch portions 50, 80, 88: protruding portion 52: notch portion (second notch portion)

54、82、86、90 :下端面 60 :狹缝 62、92 :凹處 彈性體 64 、 94 、 96 、 98 、 100 、 102 : 66 :貫穿孔 84 :凸部54, 82, 86, 90: lower end face 60: slit 62, 92: recess elastic body 64, 94, 96, 98, 100, 102: 66: through hole 84: convex

22twenty two

Claims (1)

-1277740 並將該一彈性體配置於該凹處。 7·如申請專利筋图楚 p 具鈾方 項之採針組件,其至少含沿該 才木針之長轴方向相卩忌鬥阳 間隔之2個該彈性體,該兩彈性體传 配置於該裝配區域與該支持體之間。 知 、8.如申請專利範圍帛1項之探針組件,其中,該針小 &域包含’弟1區域’係由該裝配區域之前端部延 第二區域’係從…,域之前端部延伸,並具傑比該裝-1277740 and dispose the elastomer in the recess. 7. If applying for a patented rib diagram, the needle assembly having a uranium formula includes at least two of the elastic bodies along the long axis direction of the wood needle, and the two elastic bodies are disposed at The assembly area is between the support and the support. 8. The probe assembly of claim 1, wherein the needle small & field comprises a 'different 1 region' from the front end of the assembly region to the second region 'from the ..., the front end of the domain Extension, and with Jebbi 配區域之下端緣更向下方突出之突出部。 9·如中請專利範圍第8項之探針組件,其中該第】區 域,具備向上方開口之U字狀凹口部。 瓜如中請專利範圍帛9項之探針組件,其中,該第 L區域之該凹口部形成部位的寬度尺寸,係、比其他部位\ 寬度尺寸小。 11·如申請專利範圍第8項之探針組件,其中,該第 :區域’進-步含有向上方開口之第2凹口部,其位於該 二出部形成部位;該探針,係將該彈性體之_部分收納於 該第2凹口部。 、 12·如申請專利範圍第8項之探針組件,其中,該突 出u卩之下面係形成為倒梯形之向下之面。 、 13·如申請專利範圍第8項之探針組件,其中,該突 出部,係以越下方側之部位越朝前端側的方式傾斜,且具 備越前端側越朝上之下端面。 〃 14·如申請專利範圍第13項之探針組件,其中,該突 出部進一步包含凸部,其與該突出部沿該裝配區域之長軸 24 — 1277740 越朝前端侧傾斜;該凸 方向相隔間隔,且越下方側之部位 部,具備越前端侧越朝上之下端面 15 ·如申請專利範圍第8頂+ ^ Λ 乐8項之振針組件,其中,該探 針,進一步具備從該第2區域 二 Α之則碥部延伸之第3區域, -亥弟3區域,具有以越上方側 + 1 彳j之σ卩位越朝該第2區域側的 方式傾斜之前端面,而該探 ^ , 、十使"玄别螭面突出於該狹縫之 月*J万〇The lower edge of the matching area protrudes downward from the protruding edge. 9. The probe assembly of claim 8, wherein the first region has a U-shaped notch that opens upward. The probe assembly of the ninth aspect of the invention, wherein the width dimension of the portion of the notch portion of the L-th region is smaller than that of other portions. 11. The probe assembly of claim 8, wherein the first region includes a second notch portion that opens upwardly and is located at a portion where the second portion is formed; the probe is The portion of the elastic body is housed in the second notch portion. 12. The probe assembly of claim 8, wherein the underside of the protrusion is formed as a downward facing surface of the inverted trapezoid. The probe assembly according to the eighth aspect of the invention, wherein the protruding portion is inclined such that the portion on the lower side thereof is toward the front end side, and the upper end surface is provided toward the upper end side. The probe assembly of claim 13, wherein the protruding portion further comprises a convex portion that is inclined toward the front end side along the long axis 24-1277740 of the fitting portion; the convex direction is separated a portion of the portion that is spaced apart from the lower side, and has a front end surface that is higher toward the front end side. The vibrating needle assembly of the eighth top + ^ 乐 Le 8 item of the patent application range, wherein the probe further includes In the third region, the third region in which the crotch portion extends, and the Hedi 3 region, has a sigma position which is inclined toward the second region side by the σ position of the upper side + 1 彳j. ^ , , 十使 "玄玄螭面 prominent in the month of the slit *J Wan 16.如申請專利範圍第 2區域具有長圓形之形狀, 之前蠕部。 8項之4木針組件,其中,該第 而該突出部係形成於該長圓形 17.如申請專利範圍 6 2區域,且右以赭μ + 之鉍針組件,其中,該第 傾斜之前:面…方侧之部位越朝該帛1區域側的方式 方。 而 ❿錢針使該前端面突出於該狹縫之# 針16. If the second area of the patent application area has an oblong shape, the previous creeping portion. 8 item 4 wooden needle assembly, wherein the first protruding portion is formed in the oblong shape 17. As in the patent application range 62, and the right is the 赭μ+ 铋 needle assembly, wherein the first tilting : The side of the square side is on the side of the side of the 帛1 area. And the money pin makes the front end surface protrude from the slit of the # needle 18. 進— 如申請專利範圍第δ 步具備從該針尖區域 項之探針組件,其中,該探 之w端向下方突出之針尖。 十一、圖式·· 如次頁 2518. Into - as in the patent application, step δ has a probe assembly from the tip region, wherein the probe tip protrudes downward from the w-end. XI, schema·· as the next page 25
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JP4909803B2 (en) * 2007-05-16 2012-04-04 株式会社日本マイクロニクス Probe assembly and inspection device
KR100896916B1 (en) * 2007-08-17 2009-05-12 우리마이크론(주) Banding device of needle for probe card
KR101158763B1 (en) * 2010-10-19 2012-06-22 주식회사 코디에스 Blade type probe block
CN102289090B (en) * 2011-08-24 2013-07-24 深圳市华星光电技术有限公司 Detecting device of glass substrate
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KR101907447B1 (en) 2017-01-13 2018-10-12 주식회사 이엘피 Display panel testing apparatus
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