TWI311158B - Process and device for positioning the mask - Google Patents

Process and device for positioning the mask Download PDF

Info

Publication number
TWI311158B
TWI311158B TW095111672A TW95111672A TWI311158B TW I311158 B TWI311158 B TW I311158B TW 095111672 A TW095111672 A TW 095111672A TW 95111672 A TW95111672 A TW 95111672A TW I311158 B TWI311158 B TW I311158B
Authority
TW
Taiwan
Prior art keywords
substrate
mask
support
magnets
electromagnets
Prior art date
Application number
TW095111672A
Other languages
English (en)
Chinese (zh)
Other versions
TW200706663A (en
Inventor
Manz Dieter
Original Assignee
Applied Materials Gmbh & Co K
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Gmbh & Co K filed Critical Applied Materials Gmbh & Co K
Publication of TW200706663A publication Critical patent/TW200706663A/zh
Application granted granted Critical
Publication of TWI311158B publication Critical patent/TWI311158B/zh

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/10Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)
  • Physical Vapour Deposition (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
TW095111672A 2005-04-20 2006-03-31 Process and device for positioning the mask TWI311158B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05008663A EP1715076B1 (de) 2005-04-20 2005-04-20 Verfahren und Vorrichtung zur Maskenpositionierung

Publications (2)

Publication Number Publication Date
TW200706663A TW200706663A (en) 2007-02-16
TWI311158B true TWI311158B (en) 2009-06-21

Family

ID=34935470

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095111672A TWI311158B (en) 2005-04-20 2006-03-31 Process and device for positioning the mask

Country Status (8)

Country Link
US (1) US20070009671A1 (https=)
EP (1) EP1715076B1 (https=)
JP (1) JP5063925B2 (https=)
KR (1) KR100800237B1 (https=)
CN (1) CN1854909A (https=)
AT (1) ATE437248T1 (https=)
DE (1) DE502005007746D1 (https=)
TW (1) TWI311158B (https=)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PL1715075T3 (pl) * 2005-04-20 2008-10-31 Applied Mat Gmbh & Co Kg Magnetyczny uchwyt maski
JP2007062354A (ja) * 2005-08-30 2007-03-15 Samsung Sdi Co Ltd レーザ熱転写ドナーフィルム、レーザ熱転写装置、レーザ熱転写法及び有機発光素子の製造方法
US7817175B2 (en) 2005-08-30 2010-10-19 Samsung Mobile Display Co., Ltd. Laser induced thermal imaging apparatus and fabricating method of organic light emitting diode using the same
KR100711878B1 (ko) * 2005-08-30 2007-04-25 삼성에스디아이 주식회사 레이저 열 전사 장치 및 레이저 열 전사 방법
JP2007128845A (ja) * 2005-11-04 2007-05-24 Samsung Sdi Co Ltd レーザ熱転写装置及びレーザ熱転写方法
JP2007128844A (ja) * 2005-11-04 2007-05-24 Samsung Sdi Co Ltd レーザ熱転写装置及びレーザ熱転写方法そしてこれを利用した有機発光表示素子
KR20100132517A (ko) * 2008-03-05 2010-12-17 어플라이드 머티어리얼스, 인코포레이티드 회전 모듈을 갖는 코팅 장치
DE102008037387A1 (de) * 2008-09-24 2010-03-25 Aixtron Ag Verfahren sowie Vorrichtung zum Abscheiden lateral strukturierter Schichten mittels einer magnetisch auf einem Substrathalter gehaltenen Schattenmaske
KR101569796B1 (ko) * 2009-06-23 2015-11-20 주성엔지니어링(주) 기판 정렬 장치, 이를 포함하는 기판 처리 장치 및 기판 정렬 방법
US20110107964A1 (en) * 2009-11-10 2011-05-12 Molten Corporation Object Holding Apparatus
CN102110787B (zh) * 2010-11-05 2012-07-25 四川虹视显示技术有限公司 Oled掩膜板对位方法
CN103205703B (zh) * 2012-01-16 2016-04-27 昆山允升吉光电科技有限公司 提高掩模板开口位置精度的方法及其装置
US10679883B2 (en) * 2012-04-19 2020-06-09 Intevac, Inc. Wafer plate and mask arrangement for substrate fabrication
CN104685095B (zh) * 2012-04-19 2017-12-29 因特瓦克公司 用于制造太阳能电池的双掩模装置
US10062600B2 (en) 2012-04-26 2018-08-28 Intevac, Inc. System and method for bi-facial processing of substrates
KR102072872B1 (ko) 2012-04-26 2020-02-03 인테벡, 인코포레이티드 진공 처리용 시스템 아키텍처
CN103676488B (zh) * 2012-09-10 2016-02-03 上海微电子装备有限公司 掩模交接机构及具有该掩模交接机构的掩模台
US20140166203A1 (en) * 2012-12-14 2014-06-19 Shenzhen China Star Optoelectronics Technology Co., Ltd Blocking device, sealant curing device, and sealant curing method
KR102081254B1 (ko) * 2013-07-09 2020-04-16 삼성디스플레이 주식회사 금속 마스크 고정 장치
JP6607923B2 (ja) 2014-08-05 2019-11-20 インテヴァック インコーポレイテッド 注入マスク及びアライメント
WO2016109975A1 (en) * 2015-01-09 2016-07-14 Applied Materials,Inc. Method for coating thin metal substrates using pulsed or combustion coating processes
KR102123335B1 (ko) * 2015-01-12 2020-06-17 어플라이드 머티어리얼스, 인코포레이티드 프로세싱 챔버에서 층 증착 동안에 기판 캐리어 및 마스크 캐리어를 지지하기 위한 홀딩 어레인지먼트, 기판 상에 층을 증착하기 위한 장치, 및 기판을 지지하는 기판 캐리어와 마스크 캐리어를 정렬시키기 위한 방법
JP6650440B2 (ja) * 2015-04-20 2020-02-19 シャープ株式会社 成膜方法
CN105428552B (zh) * 2015-12-31 2017-06-09 昆山国显光电有限公司 Oled器件发光层形成方法
CN109563608A (zh) * 2017-02-24 2019-04-02 应用材料公司 用于基板载体和掩模载体的定位配置、用于基板载体和掩模载体的传送系统及其方法
DE102017105374A1 (de) * 2017-03-14 2018-09-20 Aixtron Se Vorrichtung zum Abscheiden einer strukturierten Schicht auf einem Substrat sowie Verfahren zum Einrichten der Vorrichtung
DE102017105379A1 (de) * 2017-03-14 2018-09-20 Aixtron Se Substrathalteranordnung mit Maskenträger
CN108198958B (zh) * 2018-01-30 2020-06-30 京东方科技集团股份有限公司 显示基板及其制作方法、制作设备、显示装置
KR102591646B1 (ko) * 2018-06-29 2023-10-20 삼성디스플레이 주식회사 증착 장치 및 증착 장치의 마그넷 플레이트 얼라인 방법
WO2020242611A1 (en) 2019-05-24 2020-12-03 Applied Materials, Inc. System and method for aligning a mask with a substrate
US11189516B2 (en) 2019-05-24 2021-11-30 Applied Materials, Inc. Method for mask and substrate alignment
US10916464B1 (en) 2019-07-26 2021-02-09 Applied Materials, Inc. Method of pre aligning carrier, wafer and carrier-wafer combination for throughput efficiency
US11196360B2 (en) 2019-07-26 2021-12-07 Applied Materials, Inc. System and method for electrostatically chucking a substrate to a carrier
US11756816B2 (en) 2019-07-26 2023-09-12 Applied Materials, Inc. Carrier FOUP and a method of placing a carrier
US10950441B1 (en) * 2019-09-03 2021-03-16 Kyoka Utsumi Mimura Low energy e-beam contact printing lithography
JP7266555B2 (ja) * 2020-06-16 2023-04-28 キヤノン株式会社 アライメント方法および蒸着方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5474611A (en) * 1992-05-20 1995-12-12 Yoichi Murayama, Shincron Co., Ltd. Plasma vapor deposition apparatus
JP3885261B2 (ja) * 1996-11-21 2007-02-21 東レ株式会社 基板支持具および基板の支持方法
JP4058149B2 (ja) * 1997-12-01 2008-03-05 キヤノンアネルバ株式会社 真空成膜装置のマスク位置合わせ方法
US6719516B2 (en) * 1998-09-28 2004-04-13 Applied Materials, Inc. Single wafer load lock with internal wafer transport
JP2001049422A (ja) * 1999-08-09 2001-02-20 Hitachi Ltd メタルマスクの基板への保持固定構造、保持固定治具、その補助具、及びトレイ
DE10132348A1 (de) * 2001-07-04 2003-02-06 Aixtron Ag Masken- und Substrathalteranordnung
KR100422487B1 (ko) * 2001-12-10 2004-03-11 에이엔 에스 주식회사 전자석을 이용한 유기전계발광소자 제작용 증착장치 및그를 이용한 증착방법
US8808457B2 (en) * 2002-04-15 2014-08-19 Samsung Display Co., Ltd. Apparatus for depositing a multilayer coating on discrete sheets
CN100464440C (zh) * 2002-06-03 2009-02-25 三星移动显示器株式会社 用于有机电致发光装置的薄层真空蒸发的掩模框组件
JP3592690B2 (ja) * 2002-07-10 2004-11-24 エイエヌエス インコーポレイテッド 有機電界発光表示装置用製造設備のシャドーマスク着脱装置
US20040026634A1 (en) * 2002-08-08 2004-02-12 Takao Utsumi Electron beam proximity exposure apparatus
JP4257497B2 (ja) * 2003-02-26 2009-04-22 株式会社日立ハイテクノロジーズ 真空蒸着方法及び真空蒸着装置、並びにこの真空蒸着方法により製造したelパネル
PL1715075T3 (pl) * 2005-04-20 2008-10-31 Applied Mat Gmbh & Co Kg Magnetyczny uchwyt maski

Also Published As

Publication number Publication date
EP1715076A1 (de) 2006-10-25
JP2006302896A (ja) 2006-11-02
JP5063925B2 (ja) 2012-10-31
EP1715076B1 (de) 2009-07-22
ATE437248T1 (de) 2009-08-15
CN1854909A (zh) 2006-11-01
TW200706663A (en) 2007-02-16
KR100800237B1 (ko) 2008-02-01
US20070009671A1 (en) 2007-01-11
DE502005007746D1 (de) 2009-09-03
KR20060110804A (ko) 2006-10-25

Similar Documents

Publication Publication Date Title
TWI311158B (en) Process and device for positioning the mask
KR100777534B1 (ko) 자석 마스크 홀더
JP4375232B2 (ja) マスク成膜方法
JP4058149B2 (ja) 真空成膜装置のマスク位置合わせ方法
TWI327175B (https=)
JP7289421B2 (ja) 基板支持装置および成膜装置
JP2019099910A (ja) 成膜装置、成膜方法、及び電子デバイス製造方法
JP2006302896A5 (https=)
CN109972083A (zh) 静电吸盘、成膜装置、基板吸附/剥离方法、成膜方法以及电子设备的制造方法
KR102871998B1 (ko) 성막 장치 및 성막 방법
KR20140146441A (ko) 박막증착장치의 자동정렬장치
KR102748864B1 (ko) 성막 장치
JP2021072320A (ja) 基板保持装置、基板処理装置、基板保持方法、成膜方法、及び電子デバイスの製造方法
JP5399084B2 (ja) 薄膜形成システムおよび薄膜形成方法
JP7057335B2 (ja) 基板保持装置、基板処理装置、基板保持方法、成膜方法、及び電子デバイスの製造方法
KR101448347B1 (ko) 척 플레이트를 이용한 마스크 얼라인 시스템
JP2021072323A (ja) 基板剥離装置、基板処理装置、及び基板剥離方法
WO2024047999A1 (ja) 成膜装置、成膜装置の駆動方法、及び成膜方法
KR102809545B1 (ko) 성막 장치 및 성막 방법
WO2024095718A1 (ja) 成膜装置、成膜装置の駆動方法、及び成膜方法
JP2021072322A (ja) 基板保持部材、基板保持装置、基板処理装置、基板保持方法、成膜方法、及び電子デバイスの製造方法
WO2024190772A1 (ja) 成膜装置及び成膜方法
JP5193739B2 (ja) 薄膜形成システムおよび薄膜形成方法
KR20250061817A (ko) 성막 장치, 성막 장치의 구동 방법, 및 성막 방법
JP2012146844A (ja) 薄膜形成システム

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees