TWI272234B - Inspection device for display panel - Google Patents

Inspection device for display panel Download PDF

Info

Publication number
TWI272234B
TWI272234B TW093117145A TW93117145A TWI272234B TW I272234 B TWI272234 B TW I272234B TW 093117145 A TW093117145 A TW 093117145A TW 93117145 A TW93117145 A TW 93117145A TW I272234 B TWI272234 B TW I272234B
Authority
TW
Taiwan
Prior art keywords
panel
inspection
mentioned
arm
platform
Prior art date
Application number
TW093117145A
Other languages
English (en)
Chinese (zh)
Other versions
TW200512143A (en
Inventor
Takeshi Saito
Shinji Fujiwara
Original Assignee
Nihon Micronics Kabushiki Kais
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kabushiki Kais filed Critical Nihon Micronics Kabushiki Kais
Publication of TW200512143A publication Critical patent/TW200512143A/zh
Application granted granted Critical
Publication of TWI272234B publication Critical patent/TWI272234B/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00—Function characteristic
    • G02F2203/69—Arrangements or methods for testing or calibrating a device

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nonlinear Science (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW093117145A 2003-09-18 2004-06-15 Inspection device for display panel TWI272234B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003326124A JP4490066B2 (ja) 2003-09-18 2003-09-18 表示用パネルの検査装置

Publications (2)

Publication Number Publication Date
TW200512143A TW200512143A (en) 2005-04-01
TWI272234B true TWI272234B (en) 2007-02-01

Family

ID=34456394

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093117145A TWI272234B (en) 2003-09-18 2004-06-15 Inspection device for display panel

Country Status (4)

Country Link
JP (1) JP4490066B2 (ja)
KR (1) KR100634059B1 (ja)
CN (1) CN100401495C (ja)
TW (1) TWI272234B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI424177B (zh) * 2009-05-01 2014-01-21 Nihon Micronics Kk Test device for flat plate-like specimen

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006317332A (ja) * 2005-05-13 2006-11-24 Micronics Japan Co Ltd 点灯検査装置
KR101166839B1 (ko) * 2005-12-29 2012-07-19 엘지디스플레이 주식회사 액정패널 검사 장치
JP4914702B2 (ja) * 2006-12-06 2012-04-11 新光電気工業株式会社 ワークの位置決め装置
JP5111285B2 (ja) * 2008-08-06 2013-01-09 株式会社日立ハイテクノロジーズ 試料搬送機構
KR101093646B1 (ko) * 2009-05-01 2011-12-15 가부시키가이샤 니혼 마이크로닉스 평판형상 피검사체의 시험장치
KR101868083B1 (ko) * 2011-04-13 2018-06-19 삼성디스플레이 주식회사 표시 패널 검사용 지그 유닛
KR101367910B1 (ko) * 2011-12-30 2014-02-28 엘아이지에이디피 주식회사 기판 얼라인장치 및 이것을 포함하는 기판 검사장비
JP6084426B2 (ja) * 2012-10-15 2017-02-22 株式会社日本マイクロニクス 検査装置
KR101979903B1 (ko) * 2012-11-08 2019-05-20 삼성디스플레이 주식회사 패널 검사용 가이드 어셈블리 및 이를 포함하는 트레이
JP5978937B2 (ja) * 2012-11-13 2016-08-24 旭硝子株式会社 基板搬送用ハンド及び基板搬送方法
CN102998823B (zh) 2012-12-06 2015-04-08 京东方科技集团股份有限公司 点灯检查设备的偏光片支撑部件及点灯检查设备
KR101281075B1 (ko) * 2013-01-31 2013-07-09 주식회사 현성오토텍 3차원 형상의 차체 패키지 검사장치
JP7205823B2 (ja) * 2018-12-05 2023-01-17 株式会社ニックス 把持機構及び運搬物搬送装置
JP2020167256A (ja) * 2019-03-29 2020-10-08 日本電産サンキョー株式会社 パネル搬送装置およびパネル搬送システム
JP2020164282A (ja) * 2019-03-29 2020-10-08 日本電産サンキョー株式会社 パネル搬送システム
CN111999919B (zh) * 2020-08-31 2023-05-05 晟光科技股份有限公司 一种lcd显示屏定位检测机构

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4217370B2 (ja) * 2000-06-30 2009-01-28 芝浦メカトロニクス株式会社 基板搬送装置
JP3914717B2 (ja) * 2001-04-13 2007-05-16 武秀 林 フラットパネル搬送システム
JP4745536B2 (ja) * 2001-06-04 2011-08-10 株式会社日本マイクロニクス 表示用基板の搬送装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI424177B (zh) * 2009-05-01 2014-01-21 Nihon Micronics Kk Test device for flat plate-like specimen

Also Published As

Publication number Publication date
KR20050028298A (ko) 2005-03-22
CN100401495C (zh) 2008-07-09
JP2005091862A (ja) 2005-04-07
KR100634059B1 (ko) 2006-10-16
JP4490066B2 (ja) 2010-06-23
TW200512143A (en) 2005-04-01
CN1598598A (zh) 2005-03-23

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