TW594954B - Semiconductor device - Google Patents
Semiconductor device Download PDFInfo
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- TW594954B TW594954B TW92103497A TW92103497A TW594954B TW 594954 B TW594954 B TW 594954B TW 92103497 A TW92103497 A TW 92103497A TW 92103497 A TW92103497 A TW 92103497A TW 594954 B TW594954 B TW 594954B
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- island
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- semiconductor device
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 54
- 239000011347 resin Substances 0.000 claims abstract description 72
- 229920005989 resin Polymers 0.000 claims abstract description 72
- 238000007789 sealing Methods 0.000 claims abstract description 4
- 239000000725 suspension Substances 0.000 claims description 17
- 238000003491 array Methods 0.000 claims 2
- 239000008188 pellet Substances 0.000 abstract 2
- 238000003466 welding Methods 0.000 description 12
- 238000005516 engineering process Methods 0.000 description 4
- 239000011800 void material Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 241001137251 Corvidae Species 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 101100272667 Xenopus laevis ripply2.2 gene Proteins 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 230000001337 psychedelic effect Effects 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000001993 wax Substances 0.000 description 1
- 230000003442 weekly effect Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49503—Lead-frames or other flat leads characterised by the die pad
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/4501—Shape
- H01L2224/45012—Cross-sectional shape
- H01L2224/45015—Cross-sectional shape being circular
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Lead Frames For Integrated Circuits (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Description
594954 五、發明說明(1) [發明所屬之技術領域] 較多ί發明係有關於一種半導體裝置’且特別關於,旦有 置。弓丨線接腳且較小半導體片的樹脂密封型的半導體务: [先前技術] —半導體裝置在内部引線和島狀部之間因 較小半導體片的需要而有較大的空間。 轂夕接腳和 圖所示為目前先前技術之半導體裝置 二在一引導框架上’而上述半導體片的電 V:片 的邊緣部分利用焊接線相連接,如第7Α圖平 Λ ,為第Μ圖中虛線標示部分21◦之局部放及第7Β 一個懸掛引線和上述引線的周圍部分具有相同的。妹其他 引線3所支撐,引導框架200的内部引線5向 σ延伸,如上述幻線(phantom 1 ine)箭頭所示, 。 =部弓I線陣列在上述島狀部丨各側之固定節距上’上述複數 島狀部1四周,所有上述内部引線5之邊緣部分及上述曾 =的電極皆由銲接線所連接。如上述幻線“述丰: 述陣列焊接線4亦圍繞著上述島狀部丨。 、斤不,上
第8圖為平面圖,接著表示在先前技術中當 在第7圖狀態下被樹脂7密封時樹脂的二二f二 圖E-E部分的剖面放大圖。 圖為第8A 一般而言,樹脂首先填滿較大的填充部分,如 所示,以第7圖的引導框架形狀為例子中,樹脂首先圖
594954 五、發明說明(2) |述引線邊緣和上述島狀部片(固定部分)之間,接著填滿 上^半導體片的上下表面。上述樹脂在填滿上述半導體片 =先填滿上述周圍部分’氣泡20A發生在上述晶片(第8B ^的上表面’在上述填充的完成時’空隙(氣泡)議在沒 有壓壞上述氣泡的情形下發生,上述樹脂在上述空隙存在 的情形下硬化,上述半導體裝置具有絕緣問題(第8(:圖)。 在上述先前技術中,上述樹脂先填滿上述較大部分, 如第9圖所示,上述樹脂7首先填滿成型模15中上述焊接線 5之下表面,為消除上述填充差異,上述樹脂7移動上述焊 接線4向上以移開上述焊接線4,在上述移動中,焊接線形 變,也就是發生不需要的焊接線移動。 在先刖技術中,具有上述較薄PKG之上述較小半導體 片的上表面和上述内部引線邊緣—島狀部之間之上述樹脂 填充的差異在於前者之樹脂填充較大。一空隙(裂縫和缺 口)很容易產生,上述因上述長焊接線造成之焊接線變形 則很容易發生。 在先前技術中,因為上述較薄PKG,上述晶片和上述 晶片-島狀部之間的填充差異很容易產生,因為這樣,上 述接線形變更容易發生。 日本專利公開公報編號He i i〇-34〇976(此後稱為第一 已知技術)揭露一技術,在鄰近引導框架的閘門處有一控 制板,在上述框架側控制樹脂流量,因而減少裂縫/接線 變形/片移動。 曰本專利公開公報編號He i 5 - 1 5 2 5 0 1 (此後稱為第二
7061-5491-PF(Nl).ptd 第5頁 594954 五、發明說明(3) 已知技術)揭露一技術,使島狀部具有一凹陷部分,正對 表面的凹陷部分(排出部分),故在沒有減少上述排出 部分和島狀部部分間的空間之情況下輕易的填入樹脂。 如以上所述,在第7圖到第9圖所示之先前技術中,上 述半導體片上表面較上述内部引線邊緣—島狀部之間之上 述樹脂填充差異大。輕易的產生空隙和由上述長接線導致 的上述接線變形,因為上述較薄的PKG,容易在上述晶片 和上述晶片-島狀部之間的上述填充差異。 在上述第一已知技術中,甚至當上述PGK之上下部分 的上述填充差異減少了一些,仍不可能減少在上述片部分 和内部引線邊緣-島狀部之間以及上述接線之上下部分的 上述樹脂填充差異。 在上述第二已知技術中,僅改善在上述島狀部下側的 樹脂流’事實上在上述半導體片的上表面和上述内部引線 邊緣-島狀部之間的上述樹脂填充差異很大,並未解決上 述問題的產生。 [發明内容] 本發明之半導體裝置包括··一島狀部;一半導體片, 固定在上述島狀部上;複數内部引線,引伸至上述島狀 部;一樹脂,密封上述島狀部,半導體片和内部弓丨線;以 及樹脂流量控制板,設於上述内部引線的邊緣和上述島狀 部之間。 [實施方式] 現在,本發明的較佳實施例將參照附圖來詳細钦述。
7061-5491-PF(Nl).ptd 第6頁 594954 五、發明說明(4) Γ在明實施例之半導體裝置,上述半導體裝置固 緣部分由=ΐ:而上述半導體片的電極和内㈣線的邊 中虛C接’第㈣為平面圖而第1β圖為第1Α圖 和它們沾私之〇部分的放大平面圖,其他三個懸掛引線 和“門的周圍部分具有相同的結構。 掛引線 ^ 5ί ^ ^ ^ ^ ^ ^ 之第圖為平面圖,第2β圖為第2A圖中虛線所妒 之12〇部分的放大平面目,其他縣」变線所扣 圍部分具有相同的結構。個心掛引線和它們的周 定拍ΐ ΐ Ϊ圖示中’方形平面形狀島狀部1的方形部八田 鑲砍著由四懸掛引線3所支撐的半 °刀 1 〇〇的内部引線5向上述島 片2,引導框架 :圍數内部引線5陣列在上述島狀部的固广 數的上述内部引線5之邊緣 ΐϊ: 極部分都由焊接線連接,如久ΐ 前頭=,上述陣列焊接線亦圍繞著 ^迷幻線 在這個實施例中,如 馬狀邛1。 内部引線5最接近上述懸掛引線: = ::3曰的兩側’上述 引線,沒有連接到i;i二掛引最線i的内部引線5_ 上述内部引線5在上述引線形變:近亡述懸掛弓丨線3的 形變但不會造成短路電路。 守’表可能產生水平 在這個實施例中,上述 • l〇mm的引線寬,且以〇 Ή琛]的邊緣部分具有 °·20_的節距陣列,上述懸掛有引線 7061-5491-PF(Nl).ptd 594954 五、發明說明(5) 3和上述内部引線5之間的節距為〇1〇軸至〇2〇_。 上述由金製成的焊接線之I線半徑為28_,位於 上述+導體片表面0.20_高,並連接上述内部引缘接 分的邊緣部分和上述半導體片電極的環路中。 妾4 如第1圖和第2圖中所示’本發明之樹脂 (流量分流器)9位於上述内部引線5和上述島狀部之:板上 迷四個樹脂流量控制板9安置在上述島 並圍繞著上述島狀部。 運W封面, 每個上述樹脂流量控制板由一對第一支撐部分Μ支 在上述島狀部上,I由—對第二支#部 述懸掛引線3上。 又知任上迷上 上-r i述f ΐ流量控制板9包括形成部分上述引導框架的 上支撐部分’整合上述島狀部1,上述懸掛 ϋ、 Λ内部引線5和上述外部引線8形成(第6圖),舉 1 “況’稭著具有平板厚度為〇 ·丨5 mm的銅平板。 2上述樹脂流量控制板9和上述島狀部之間的間隔 1 =須為一空間以使樹脂流入上述上側和下側,在本實施 歹 在+上述島狀部1中的尺寸A為0· 3mm,最好是〇· lmm至 pq /ΤΙ這和位於上述樹脂流量控制板和上述懸掛引線之 間的間隔1 2相似。 1 2在上^島狀部方向中上述樹脂流量控制板9的尺寸Β為 二mm ’當上述樹脂流量控制板和上述内部引線之間的間 隔13平均值為◦時,b值最好為a + b + C的一半。 藉由第3圖,將描述形成於上述樹脂流量控制板(流量
594954
分流器)9的貫穿孔91 ’在第3A圖中,上述貫穿孔91為方形 如圖不一樣為長方形形狀’在第3B圖中,上述貫穿孔gi為 圓形如圖示一樣為橢圓形形狀。 ^ 在垂直於上述島狀部1的外側的方向上,上述貫穿孔 91具有尺寸Η和節距I,I/H不是如此重要而由上述尺寸b寬 而決定,如第1圖和第2圖所示,一貫穿孔在陣列靠近上述 懸掛插栓處改變Η。
上述貫穿孔9 1在平行於上述島狀部1外側的方向上具 有尺寸Ε和節距尺寸F,F/E是重要地,當ε太大,則失去'了 上述流量分流的效果,Ε的適合範圍為〇· lmm至〇· 7mm。在 本貫施例中’E為(K2mm°F的適合範圍為〇.1_至〇5_。 在部分陣列’一貫穿孔在靠近上述懸掛插栓處改變Η,上 述貝牙孔如其他部分的貫穿孔一樣,以相同的Ε和ρ值陣 列,如1圖和第2圖所示。 ^ 第4圖所示為一半導體片2固定在上述具有上述樹脂流 量控制板9的上述引導框架上,上述内部引線5的邊緣部分 和上述半導體片的電極由上述焊接線4所連接,而具有黏 性為lOPaos的上述環氧基樹脂流入封膠。 在本發明中’上述樹脂流量控制板位於上述内部引線
緣_和上述島狀部之間,上述樹脂首先以扇形填入這個部 (弟5 A @ ) 在上述樹脂填充硬化之後’沒有發生如龜裂 和溝的空隙。 、/如第5圖所示,為第4A圖中D-D的放大剖面圖,在上述 成幵7模1 5中’上述樹脂流量控制板(流量分流器)g存在在
594954 五、發明說明(7) 上述¥接線4較低方向上,上述焊接線上側方向和下側方 向的樹脂填充差異較小,上述焊接線上側方向和下側方向 的樹脂移動小以避免上述接線形變。 第6圖所示為由第1圖至第5圖所得到之半導體裝置, 由銅合金製成平板厚度0· 15mm的上述引導框架1〇〇具有上 述内部引線5,上述島狀部1,上述外部引線8以及上述樹 脂流量控制板9。上述半導體片2的電極6安置固定於上述 島狀部1上,而上述内部引線5的邊緣部分由上述焊接線4 ,接,引導上述外部引線8。上述形式密封樹脂7密封,接 著切除並移除上述引導框架不需要的部分,故得到 實施例之半導體裝置。 x 旦八ΐ:、'所示,根據本發明,上述樹脂流量控制板(流 里刀&益)在上述引導框架狀態中,控制上述内部引 狀部間的上述樹脂填充,上述半導體片和上述 c島狀部之間的樹腊襄名羞異可里滅少,減少上 述岔封樹脂中不利的空隙。 ^述樹脂流量控制板的存在可以減少上 :向和下側方向的樹脂填充差異較小,減少不利的妾 雖然本發明已以較佳實施例揭露如 限定本發明,任何熟習此ϋ、並非用以 神和範圍内,當可作更動與潤飾, 月之償 當親馇糾夕由▲主击d M u此本發明之保護範圍 田視後附之申睛專利範圍所界定者為準。
594954 圖式簡單說明 弟1圖係本發明貫施例之半導體裝置在半導體片固定 在引導框木上’且上述半導體片的電極和内部引線的邊緣 部分由焊接線連接的狀態下,第1 A圖為為平面圖,第丨B圖 為第1A圖中110部分之放大圖。 第2圖係本發明實施例之引導框架之内部引線和它們 的周圍部分,第2A圖為平面圖,第2B圖為第2A圖中120部 分之放大平面圖。 第3圖係本發明實施例之樹脂流量控制板(流量分流 器)之平面圖,第3A圖為顯示貫穿孔為方形,第3B圖顯示 貫穿孔為圓形。 第4 A - 4 C圖係為本發明實施例之連續的樹脂流的平面 圖 第5圖係為第4 A圖中D - D的剖面放大圖。 第6圖係為本發明實施例之半導體裝置之概要側視 圖 第7圖係先前技術之半導體裝置,半導體片固定在引 導框架上而上述半導體片電極和内部引線的邊緣部分由焊 接線連接,第7A圖為平面圖,第7B圖為第7A圖中210部分 之放大平面圖。 第8 A-8C圖係為先前技術中連續的樹脂流的平面圖。 第9圖係第8 A圖中E - E部分的剖面放大圖。 [符號說明] 1〜島狀部,
7061-5491-PF(Nl).ptd 第11頁 594954 圖式簡單說明 2〜半導體片, 3〜懸掛引線, 4〜焊接線, 5〜内部引線, 6〜電極, 7〜樹脂’ 8〜夕卜部引線, 9〜樹脂流量控制板(流量分流器), 1 1〜樹脂流量控制板9和島狀部1之間的間隔, 1 2〜樹脂流量控制板9和懸掛引線3之間的間隔, 1 3〜樹脂流量控制板9和内部引線5之間的間隔, 1 5〜成型模, 2 Ο A〜氣泡, 20B〜空隙(氣泡), 9 1〜貫穿孔, 9 2〜第一支撐部分, 9 3〜第二支撐部分, 1 0 0〜弓I導框架, 11 0〜第1 A圖之局部放大部分, 120〜第2A圖之局部放大部分, 2 0 0〜引導框架, 210〜第7A圖之局部放大部分, A〜〜樹脂流量控制板9和島狀部1之間的間隔11的尺 寸,
7061-5491-PF(Nl).ptd 第12頁 594954 圖式簡單說明 B〜樹脂流量控制板9的尺寸, C〜樹脂流量控制板和内部引線之間的間隔1 3平均值, E〜在平行於上述島狀部1外側的方向上貫穿孔9 1的尺 寸 F〜在平行於上述島狀部1外側的方向上貫穿孔9 1的節 距 Η〜垂直島狀部1外側方向之貫穿孔9 1的尺寸, I〜垂直島狀部1外側方向之貫穿孔9 1的節距。
7061-5491-PF(Nl).ptd 第13頁
Claims (1)
- 594954六、申請專利範圍 1 · 一種半導體裝置,包栝: 一島狀部; 一半導體片,固定在上述島狀部上; 複數内部引線,延伸到上述島狀部; 一樹脂,密封上述島狀部,半導體片和内部引線;以 樹脂流量控制板,位於上述内部引線邊緣和上述島狀 部之間。2 ·如申請專利範圍第1項所述之半導體裝置,其中上 述島狀部由懸掛引線支撐,而上述樹脂流量控制板由上述 島狀部和上述懸掛引線支撐。 3·如申請專利範圍第1項所述之半導體裝置,其中上 述樹脂流量控制板圍繞著上述島狀部。 4·如申請專利範圍第1項所述之半導體裂置,其中上 述島狀部為一方形,而上述島狀部的四的角由上述懸掛引 線所支撐。 5 ·如申請專利範圍第4項所述之半導體裝置,其中上 述樹脂流量控制板由上述島狀部和上述懸掛弓丨線支撐且形 成在上述島狀部外側周圍對面。 6·如申請專利範圍第1項所述之半導體裝置,其中上 f 述樹脂流量控制板的形狀具有許多貫穿孔陣列。 7·如申請專利範圍第6項所述之半導體裝置,其中上 述貫穿孔為方形,而上述樹脂流f控制板為袼子形狀。 8·如申請專利範圍第6項所述之半導體裝置,其中上594954六、申請專利範圍 述貫穿孔為圓形。 9·如申請專利範圍第1項所述之半導體裝置,其中速 接上述内部引線邊緣部分和上述半導體片電極之間的焊接 線延伸在上述樹脂流量控制板上。 10· —種半導體裝置,包括: 一島狀部; 複數内部引線,延伸到上述島狀部;以及 樹脂流量控制板,位於上述内部引線邊緣和上述島狀 部之間。1 1 ·如申請專利範圍第1 〇項所述之半導體裝置’其中 上述島狀部由懸掛引線支撑,而上述樹脂流量控制板由上 述島狀部和上述懸掛引線支撐,而上述島狀部,上述懸掛 引線和上述懸掛引線支撐整合形成。 12·如申請專利範圍第1〇項所述之半導體裝置,其中 上述樹脂流量控制板圍繞著上述島狀部。1 3 ·如申請專利範圍第丨2項所述之半導體裝置,其中 上述島狀部為一方形,而上述島狀部的四的角由上述懸掛 引線所支撐’上述樹脂流量控制板由上述島狀部和上述懸 掛引線支撐,且上述島狀部,懸掛引線以及樹脂流量控制 板整合形成。 1 4.如申請專利範圍第1 3項所述之半導體裝置,其中 上述樹脂流量控制板形成在上述島狀部外側周圍對面。 1 5 ·如申請專利範圍第1 〇項所述之半導體裝置,其中 上述樹脂流量控制板的形狀具有許多貫穿孔陣列。7061-5491>PF(Nl).ptd 第15頁 594954 六、申請專利範圍 1 6.如申請專利範圍第1 5項所述之半導體裝置,其中 上述貫穿孔為方形,而上述樹脂流量控制板為格子形狀< 1 7.如申請專利範圍第1 5項所述之半導體裝置,其中 上述貫穿孔為圓形。 ❿7061-5491-PF(Nl).ptd 第16頁
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US6812481B2 (en) * | 2001-09-03 | 2004-11-02 | Toyoda Gosei Co., Ltd. | LED device and manufacturing method thereof |
JP2008166699A (ja) * | 2006-12-04 | 2008-07-17 | Asmo Co Ltd | 樹脂封止型半導体装置 |
JP2008300587A (ja) * | 2007-05-31 | 2008-12-11 | Renesas Technology Corp | 半導体装置およびその製造方法 |
US8148825B2 (en) * | 2007-06-05 | 2012-04-03 | Stats Chippac Ltd. | Integrated circuit package system with leadfinger |
JP5247626B2 (ja) * | 2008-08-22 | 2013-07-24 | 住友化学株式会社 | リードフレーム、樹脂パッケージ、半導体装置及び樹脂パッケージの製造方法 |
TWI390746B (zh) * | 2009-05-07 | 2013-03-21 | Atomic Energy Council | 太陽能電池元件 |
US9196504B2 (en) * | 2012-07-03 | 2015-11-24 | Utac Dongguan Ltd. | Thermal leadless array package with die attach pad locking feature |
JP6845903B1 (ja) * | 2019-09-18 | 2021-03-24 | Towa株式会社 | 成形型、樹脂成形装置及び樹脂成形品の製造方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05152501A (ja) | 1991-11-28 | 1993-06-18 | Toshiba Corp | 半導体装置 |
JP2989476B2 (ja) * | 1994-06-23 | 1999-12-13 | シャープ株式会社 | Tcp半導体装置 |
JPH10340976A (ja) | 1997-04-10 | 1998-12-22 | Nittetsu Semiconductor Kk | 樹脂封止型半導体装置 |
-
2002
- 2002-02-27 JP JP2002051418A patent/JP2003258184A/ja active Pending
-
2003
- 2003-02-20 TW TW92103497A patent/TW594954B/zh not_active IP Right Cessation
- 2003-02-26 CN CN03106456A patent/CN1441488A/zh active Pending
- 2003-02-26 US US10/373,110 patent/US6737735B2/en not_active Expired - Fee Related
- 2003-02-27 KR KR10-2003-0012240A patent/KR100523714B1/ko not_active IP Right Cessation
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TW200304207A (en) | 2003-09-16 |
CN1441488A (zh) | 2003-09-10 |
US6737735B2 (en) | 2004-05-18 |
JP2003258184A (ja) | 2003-09-12 |
KR20030071545A (ko) | 2003-09-03 |
KR100523714B1 (ko) | 2005-10-26 |
US20030160308A1 (en) | 2003-08-28 |
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