TW505798B - A liquid crystal display device - Google Patents
A liquid crystal display device Download PDFInfo
- Publication number
- TW505798B TW505798B TW088103479A TW88103479A TW505798B TW 505798 B TW505798 B TW 505798B TW 088103479 A TW088103479 A TW 088103479A TW 88103479 A TW88103479 A TW 88103479A TW 505798 B TW505798 B TW 505798B
- Authority
- TW
- Taiwan
- Prior art keywords
- liquid crystal
- substrate
- crystal display
- display device
- signal line
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136213—Storage capacitors associated with the pixel electrode
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0321—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6704—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
- H10D30/6723—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device having light shields
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
- H10D30/6733—Multi-gate TFTs
- H10D30/6734—Multi-gate TFTs having gate electrodes arranged on both top and bottom sides of the channel, e.g. dual-gate TFTs
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136209—Light shielding layers, e.g. black matrix, incorporated in the active matrix substrate, e.g. structurally associated with the switching element
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2202/00—Materials and properties
- G02F2202/10—Materials and properties semiconductor
- G02F2202/104—Materials and properties semiconductor poly-Si
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Power Engineering (AREA)
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP09426898A JP3980167B2 (ja) | 1998-04-07 | 1998-04-07 | Tft電極基板 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW505798B true TW505798B (en) | 2002-10-11 |
Family
ID=14105540
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW088103479A TW505798B (en) | 1998-04-07 | 1999-03-06 | A liquid crystal display device |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US6344885B1 (enExample) |
| JP (1) | JP3980167B2 (enExample) |
| KR (1) | KR100691620B1 (enExample) |
| TW (1) | TW505798B (enExample) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104538456A (zh) * | 2014-12-31 | 2015-04-22 | 深圳市华星光电技术有限公司 | 低温多晶硅薄膜晶体管及薄膜晶体管基板 |
| WO2017016009A1 (zh) * | 2015-07-29 | 2017-02-02 | 武汉华星光电技术有限公司 | 一种薄膜晶体管的控制电路 |
| CN107797350A (zh) * | 2016-08-29 | 2018-03-13 | 株式会社日本显示器 | 显示装置 |
| US9935127B2 (en) | 2015-07-29 | 2018-04-03 | Wuhan China Star Optoelectronics Technology Co., Ltd. | Control circuit of thin film transistor |
| US11004882B2 (en) | 2015-03-30 | 2021-05-11 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR100288772B1 (ko) * | 1998-11-12 | 2001-05-02 | 윤종용 | 액정 표시 장치 및 그 제조 방법 |
| US7595771B1 (en) * | 1998-12-31 | 2009-09-29 | Texas Instruments Incorporated | Electro-optical, tunable, broadband color modulator |
| EP1020920B1 (en) * | 1999-01-11 | 2010-06-02 | Sel Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having a driver TFT and a pixel TFT on a common substrate |
| US6576926B1 (en) * | 1999-02-23 | 2003-06-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and fabrication method thereof |
| JP4403329B2 (ja) * | 1999-08-30 | 2010-01-27 | ソニー株式会社 | 液晶表示装置の製造方法 |
| JP3889533B2 (ja) * | 1999-09-22 | 2007-03-07 | シャープ株式会社 | 液晶表示装置及びその製造方法 |
| JP2001188217A (ja) * | 1999-10-20 | 2001-07-10 | Sharp Corp | アクティブマトリクス型液晶表示装置およびその駆動方法ならびに製造方法 |
| JP3414343B2 (ja) * | 1999-11-26 | 2003-06-09 | 日本電気株式会社 | イメージセンサ及びその製造方法 |
| JP4599655B2 (ja) * | 2000-04-24 | 2010-12-15 | セイコーエプソン株式会社 | 電気光学装置及びプロジェクタ |
| JP4896314B2 (ja) * | 2000-08-04 | 2012-03-14 | 株式会社半導体エネルギー研究所 | 表示装置 |
| JP3918412B2 (ja) * | 2000-08-10 | 2007-05-23 | ソニー株式会社 | 薄膜半導体装置及び液晶表示装置とこれらの製造方法 |
| US6509616B2 (en) * | 2000-09-29 | 2003-01-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and its manufacturing method |
| JP4974427B2 (ja) * | 2000-09-29 | 2012-07-11 | 株式会社半導体エネルギー研究所 | 半導体装置及び電子装置 |
| TW525216B (en) | 2000-12-11 | 2003-03-21 | Semiconductor Energy Lab | Semiconductor device, and manufacturing method thereof |
| JP4801262B2 (ja) * | 2001-01-30 | 2011-10-26 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP2002353245A (ja) * | 2001-03-23 | 2002-12-06 | Seiko Epson Corp | 電気光学基板装置及びその製造方法、電気光学装置、電子機器、並びに基板装置の製造方法 |
| JP4831885B2 (ja) | 2001-04-27 | 2011-12-07 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP3933422B2 (ja) * | 2001-08-10 | 2007-06-20 | シャープ株式会社 | 反射膜および反射膜の製造方法 |
| JP4634673B2 (ja) * | 2001-09-26 | 2011-02-16 | シャープ株式会社 | 液晶表示装置及びその製造方法 |
| JP4798907B2 (ja) * | 2001-09-26 | 2011-10-19 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP4031291B2 (ja) * | 2001-11-14 | 2008-01-09 | 東芝松下ディスプレイテクノロジー株式会社 | 液晶表示装置 |
| EP1343058A1 (en) * | 2002-03-08 | 2003-09-10 | Belal Establishments | Prayer clock |
| JP2004096079A (ja) * | 2002-07-11 | 2004-03-25 | Sharp Corp | 光電変換装置、画像読取装置および光電変換装置の製造方法 |
| JP4631255B2 (ja) * | 2003-07-16 | 2011-02-16 | セイコーエプソン株式会社 | アクティブマトリクス基板、表示装置、及び電子機器 |
| JP2006178356A (ja) * | 2004-12-24 | 2006-07-06 | Nec Electronics Corp | 表示装置の駆動回路 |
| JP4350106B2 (ja) | 2005-06-29 | 2009-10-21 | 三星モバイルディスプレイ株式會社 | 平板表示装置及びその駆動方法 |
| JP2007109868A (ja) * | 2005-10-13 | 2007-04-26 | Sanyo Electric Co Ltd | 薄膜トランジスタ及び有機エレクトロルミネッセンス表示装置 |
| JP4007412B2 (ja) * | 2007-01-12 | 2007-11-14 | ソニー株式会社 | 薄膜半導体装置及び液晶表示装置とこれらの製造方法 |
| JP2009049080A (ja) * | 2007-08-15 | 2009-03-05 | Hitachi Displays Ltd | 表示装置 |
| US8420458B2 (en) * | 2009-04-03 | 2013-04-16 | Sharp Kabushiki Kaisha | Semiconductor device and method of producing same |
| US20120033146A1 (en) * | 2010-08-03 | 2012-02-09 | Chimei Innolux Corporation | Liquid crystal display device and electronic device using the same |
| WO2013183495A1 (ja) * | 2012-06-08 | 2013-12-12 | シャープ株式会社 | 半導体装置およびその製造方法 |
| KR101614398B1 (ko) * | 2012-08-13 | 2016-05-02 | 엘지디스플레이 주식회사 | 박막 트랜지스터 기판과 그 제조방법 및 그를 이용한 유기 발광장치 |
| JP2014149429A (ja) | 2013-02-01 | 2014-08-21 | Japan Display Inc | 液晶表示装置および液晶表示装置の製造方法 |
| JP2015206819A (ja) * | 2014-04-17 | 2015-11-19 | 株式会社ジャパンディスプレイ | 表示装置 |
| JP2015122538A (ja) * | 2015-03-09 | 2015-07-02 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| KR102316458B1 (ko) * | 2015-03-24 | 2021-10-25 | 삼성디스플레이 주식회사 | 액정 표시장치 |
| JP2016200645A (ja) * | 2015-04-07 | 2016-12-01 | 株式会社ジャパンディスプレイ | 表示装置 |
| KR102374537B1 (ko) | 2015-08-21 | 2022-03-15 | 삼성디스플레이 주식회사 | 표시 장치 |
| CN106526992A (zh) * | 2016-12-30 | 2017-03-22 | 深圳市华星光电技术有限公司 | 一种coa基板及液晶面板 |
| CN106920804B (zh) | 2017-04-28 | 2020-03-24 | 厦门天马微电子有限公司 | 一种阵列基板、其驱动方法、显示面板及显示装置 |
| CN108767016B (zh) * | 2018-05-21 | 2021-09-21 | 京东方科技集团股份有限公司 | 一种薄膜晶体管及其制作方法、阵列基板、显示装置 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2653099B2 (ja) * | 1988-05-17 | 1997-09-10 | セイコーエプソン株式会社 | アクティブマトリクスパネル,投写型表示装置及びビューファインダー |
| JPH0824193B2 (ja) | 1990-10-16 | 1996-03-06 | 工業技術院長 | 平板型光弁駆動用半導体装置の製造方法 |
| JP3024661B2 (ja) | 1990-11-09 | 2000-03-21 | セイコーエプソン株式会社 | アクティブマトリクス基板及びその製造方法 |
| US6143582A (en) * | 1990-12-31 | 2000-11-07 | Kopin Corporation | High density electronic circuit modules |
| DE69223009T2 (de) * | 1991-08-02 | 1998-04-02 | Canon Kk | Flüssigkristall-Anzeigeeinheit |
| DE69529493T2 (de) | 1994-06-20 | 2003-10-30 | Canon K.K., Tokio/Tokyo | Anzeigevorrichtung und Verfahren zu ihrer Herstellung |
| US5563727A (en) | 1994-06-30 | 1996-10-08 | Honeywell Inc. | High aperture AMLCD with nonparallel alignment of addressing lines to the pixel edges or with distributed analog processing at the pixel level |
| JPH08152612A (ja) * | 1994-11-30 | 1996-06-11 | Sanyo Electric Co Ltd | 液晶表示装置 |
| JP3307181B2 (ja) | 1995-07-31 | 2002-07-24 | ソニー株式会社 | 透過型表示装置 |
| JPH0964366A (ja) | 1995-08-23 | 1997-03-07 | Toshiba Corp | 薄膜トランジスタ |
| JPH09127551A (ja) | 1995-10-31 | 1997-05-16 | Sharp Corp | 半導体装置およびアクティブマトリクス基板 |
| US5782665A (en) * | 1995-12-29 | 1998-07-21 | Xerox Corporation | Fabricating array with storage capacitor between cell electrode and dark matrix |
| JP2734444B2 (ja) * | 1996-03-22 | 1998-03-30 | 日本電気株式会社 | 液晶表示装置 |
| TW374860B (en) * | 1996-04-30 | 1999-11-21 | Matsushita Electric Industrial Co Ltd | Active matrix liquid crystal display for projection |
| JP3634089B2 (ja) * | 1996-09-04 | 2005-03-30 | 株式会社半導体エネルギー研究所 | 表示装置 |
| US5852486A (en) | 1996-12-30 | 1998-12-22 | Hoke, Jr.; Clare L. | Liquid crystal display with alternative electrode structure |
| JP3291457B2 (ja) * | 1997-10-13 | 2002-06-10 | 三洋電機株式会社 | 半導体装置の製造方法及び液晶表示装置の製造方法 |
| US5917199A (en) * | 1998-05-15 | 1999-06-29 | Ois Optical Imaging Systems, Inc. | Solid state imager including TFTS with variably doped contact layer system for reducing TFT leakage current and increasing mobility and method of making same |
-
1998
- 1998-04-07 JP JP09426898A patent/JP3980167B2/ja not_active Expired - Lifetime
-
1999
- 1999-03-06 TW TW088103479A patent/TW505798B/zh not_active IP Right Cessation
- 1999-03-30 KR KR1019990011675A patent/KR100691620B1/ko not_active Expired - Fee Related
- 1999-04-01 US US09/285,025 patent/US6344885B1/en not_active Expired - Lifetime
- 1999-10-29 US US09/430,133 patent/US6255131B1/en not_active Expired - Lifetime
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104538456A (zh) * | 2014-12-31 | 2015-04-22 | 深圳市华星光电技术有限公司 | 低温多晶硅薄膜晶体管及薄膜晶体管基板 |
| CN104538456B (zh) * | 2014-12-31 | 2018-07-17 | 深圳市华星光电技术有限公司 | 低温多晶硅薄膜晶体管及薄膜晶体管基板 |
| US11004882B2 (en) | 2015-03-30 | 2021-05-11 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
| TWI777164B (zh) * | 2015-03-30 | 2022-09-11 | 日商半導體能源研究所股份有限公司 | 半導體裝置的製造方法 |
| US11574944B2 (en) | 2015-03-30 | 2023-02-07 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device including step of simultaneous formation of plurality of contact openings |
| US12364041B2 (en) | 2015-03-30 | 2025-07-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising transistor |
| WO2017016009A1 (zh) * | 2015-07-29 | 2017-02-02 | 武汉华星光电技术有限公司 | 一种薄膜晶体管的控制电路 |
| US9935127B2 (en) | 2015-07-29 | 2018-04-03 | Wuhan China Star Optoelectronics Technology Co., Ltd. | Control circuit of thin film transistor |
| CN105093738B (zh) * | 2015-07-29 | 2018-09-04 | 武汉华星光电技术有限公司 | 一种薄膜晶体管的控制电路 |
| CN107797350A (zh) * | 2016-08-29 | 2018-03-13 | 株式会社日本显示器 | 显示装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR100691620B1 (ko) | 2007-03-09 |
| JPH11298002A (ja) | 1999-10-29 |
| KR19990082905A (ko) | 1999-11-25 |
| US6255131B1 (en) | 2001-07-03 |
| US6344885B1 (en) | 2002-02-05 |
| JP3980167B2 (ja) | 2007-09-26 |
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