TW451372B - Die-holding mechanism, die-packing device and die-bonding device - Google Patents
Die-holding mechanism, die-packing device and die-bonding device Download PDFInfo
- Publication number
- TW451372B TW451372B TW089107950A TW89107950A TW451372B TW 451372 B TW451372 B TW 451372B TW 089107950 A TW089107950 A TW 089107950A TW 89107950 A TW89107950 A TW 89107950A TW 451372 B TW451372 B TW 451372B
- Authority
- TW
- Taiwan
- Prior art keywords
- die
- holding
- crystal grain
- crystal
- grain
- Prior art date
Links
- 238000012856 packing Methods 0.000 title 1
- 239000013078 crystal Substances 0.000 claims description 101
- 239000000758 substrate Substances 0.000 claims description 16
- 230000002079 cooperative effect Effects 0.000 claims description 7
- 239000004020 conductor Substances 0.000 abstract 1
- 230000002093 peripheral effect Effects 0.000 description 22
- 239000007779 soft material Substances 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 229910000679 solder Inorganic materials 0.000 description 5
- 238000001179 sorption measurement Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 206010011878 Deafness Diseases 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 230000000875 corresponding effect Effects 0.000 description 1
- 231100000895 deafness Toxicity 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 208000016354 hearing loss disease Diseases 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/52—Mounting semiconductor bodies in containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/17—Surface bonding means and/or assemblymeans with work feeding or handling means
- Y10T156/1702—For plural parts or plural areas of single part
- Y10T156/1744—Means bringing discrete articles into assembled relationship
- Y10T156/1768—Means simultaneously conveying plural articles from a single source and serially presenting them to an assembly station
- Y10T156/1771—Turret or rotary drum-type conveyor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T279/00—Chucks or sockets
- Y10T279/11—Vacuum
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
- Y10T29/49144—Assembling to base an electrical component, e.g., capacitor, etc. by metal fusion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53174—Means to fasten electrical component to wiring board, base, or substrate
- Y10T29/53178—Chip component
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53191—Means to apply vacuum directly to position or hold work part
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53265—Means to assemble electrical device with work-holder for assembly
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
經濟部智慧財產局員工消費合作社印製 451372 A7 ___B7 ___ 五、發明說明(I ) 〔發明所屬之技術領域〕 本發明係關於用以拾取具有連接線的晶粒之晶粒保持 機構,用以將該晶粒保持機構所拾取之晶粒裝塡於托架之 晶粒裝塡裝置,以及用以將該晶粒保持機構所拾取之晶粒 接合於基板之晶粒接合裝置。 〔先前技術〕 近幾年,已開發出一種半導體裝置,其晶粒係具有能 吸.收晶粒和基板的熱膨脹差之連接線。如圖5(a)所示般, 晶粒1具有連接線2,基板3上係藉由印刷來形成對應於 連接線2之焊料4。於是,藉由將連接線2接合於焊料4, 即得出圖5(b)所示般之半導體裝置5。該半導體裝置5,其 晶粒1和基板3的熱膨脹差能用連接線2來吸收。 即述晶粒1,如圖6所7F般,是在晶圓狀態下藉線接 合方法來形成連接線2。之後,貼在晶圓墊6·上,將晶圓7 做縱橫向的細分割而形成各個晶粒1。保持這種狀態而移 到下一製程,或將晶圓墊6拉伸而使晶粒1的間隔加大後 再移到下一製程。或是,將晶圓7貼附於晶圓墊6上,藉 .線接合方法來彤成連接線2。 如此般,爲將晶圓墊6上所貼附之晶粒1裝塡於托架 :或接合於基板3上,必須藉晶粒保持機構來從晶圓墊6 i:拾取晶粒1。以往的晶粒保持機構,其用以真聋吸附晶 粒1之吸嘴的吸附面,已知有例如日本專利特公昭61_ 32813號公報所示之呈平型者,特公平3-54858號公報所 示之呈角錐型者。又將所拾取的晶粒1反轉後再接合於基 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) (請先閱讀背面之注意事項再填寫本頁) ^--------訂---------線 4 51372 . A7 ____B7___ 五、發明說明(1 ) 板3上之晶粒保持機構,已知有例如特開平8-13〇23〇號公 報、特許第2725701號公報等等。 〔發明所要解決的課題〕 具備連接線2之晶粒1,並無法用前述平型吸嘴來吸 附保持住。而角錐型吸嘴方面,由於角錐面會接觸連接線 2而使該連接線2變形,又連接線2之彈力所致之從角錐 面落下,故仍無法用角錐型吸嘴來達成吸附保持。如此般 ,要怎樣才能將具備連接線2的晶粒1從晶圓墊6上拾取 乃構成一課題。 本發明的課題係提供一晶粒保持機構,其不致使連接 線變形即可從晶圓墊上拾取晶粒,並提供出用以將該晶粒 保持機構所拾取之晶粒裝塡於托架之晶粒裝塡裝置,以及 用以將該晶粒保持機構所拾取之晶粒接合於基板之晶粒接 合裝置。 〔用以解決課題之手段〕 用以解決上述課題之本發明的晶粒保持機構,係具備 :用以頂起晶圓墊上的晶粒之晶粒頂起機構,及用以將晶 粒頂起機構所頂起的晶粒保持住之晶粒保持機構;其特徵 在於,前述晶粒在上面具有連接線,前述晶粒保持機構係 具備:可上下移動之連接線支承軸,具有晶粒保持部之以 開閉自如的方式配設於連接線支承軸兩側之一對的晶粒保 持臂,以及用以開閉該晶粒保持臂之晶粒保持臂開閉機構 ;藉前述晶粒頂起機構將晶粒頂起,在該晶粒的上昇途中 用前述連接線支承軸壓住,當該連接線支承軸上昇既定量 (請先閱讀背面之注意事項再填寫本頁) ------- 訂! - -----線 經濟部智慧財產局員工淡費合作社印製 本紙張尺度適用令國國家標準<CNS)A4規格(210x297公釐〉 4 5.1: 3 7 2 A7 B7 五、發明說明(>) 時閉合前述晶粒保持臂而使晶粒保持部位於晶粒下面的下 方或夾住晶粒的側面,之後降下晶粒頂起機構的頂針而使 晶粒被目丨』述晶粒保持臂所保持住。 用以解決上述課題之本發明的晶粒裝塡裝置,其特徵 在於,係使用前述晶粒保持機構,該晶粒保持機構,係以 可移動的方式裝設於用以裝塡晶粒之托架的上方,在該托 架的上方,配設著可轉動之用以吸附保持晶粒之夾頭,該 夾頭從前述晶粒保持機構接收晶粒後,翻轉成前述連接線 向下,並將晶粒收納於前述托架中。 用以解決上述課題之本發明的晶粒接合裝置,其特徵 在於,係使用前述晶粒保持機構,該晶粒保持機構,係以 可移動的方式裝設於用以接合晶粒之基板的上方1在該基 板的上方,配設著可轉動之用以吸附保持晶粒之夾頭,該 夾頭從前述晶粒保持機構接收晶粒後,翻轉成前述連接線 向下,並將晶粒接合於前述基板上。 〔發明之實施形態〕 用圖1~圖3來說明本發明之一實施形態。晶粒保持機 構,如圖1(a)所示般,係由晶粒頂起機構1〇和晶粒保持機 構20所構成。 晶粒頂起機構10係採如下的構造。貼附著備有連接 線2的晶粒1之晶圓墊6,被固定在能移動於ΧΥ方向之 未圖示的框體上。在晶圓墊6的下方,配設著形成有真空 孔11a之晶圓吸附體11,在晶圓吸附體11的中央部,配 設著用以頂起晶粒I之中心頂針12。在晶圓吸附體Η和 6 本紙張尺度適用t國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) i I I I-----II----^ J - ^--- 經濟部智慧財產局員工消費合作社印製 4 51312 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(4·) 中心頂針12間,配設著可上下移動之以中心頂針12爲中 心之筒狀頂起筒體13。在頂起筒體13的外側,以能頂起 晶粒1的周邊部之方式配設複數根(圖中僅圖示2根)之可 上下移動的周邊頂針14。此處,藉頂起筒體13頂起晶粒1 後,用中心頂針12和周邊頂針14來進一步頂起晶粒1。 又,該晶粒頂起機構10,係採和特公平3-54858號公報相 同的構造。 晶粒保持機構20係採下述構造。在被未圖示之驅動 機構來驅動於上下(Z方向)及XY方向之移動本體21上, 固定著備有軸孔22a之軸支持具22,在軸孔22a上配設著 能上下移動之連接線支承軸23。在軸孔22a上形成縱槽 22b,將縱槽22b內所插入之插銷24固定在連接線支承軸 23。在連接線支承軸23的下端固定著軟質材25,在縱軸 22b的下端部固定著用以抵接插銷24之擋件26。將彈簧 27以抵接於連接線支承軸23上面的方式配設於軸孔22a 內,彈簧27是以連接線支承軸23上所螺合之螺栓28來向 下彈壓。此處,彈簧27是以連接線支承軸23不致對連接 線2賦予過度的彈壓力之方式來形成弱彈力。 移動本體21上,在軸支持具22的兩側固定著支柱 30A、30B,在支柱30A、30B上固定著支軸31A、31B。 在支軸31A、31B上將晶粒保持臂32A、32B支承成能轉 動自如,晶粒保持臂32A、32B的下端係形成向內突出的 晶粒保持部32a、32b。在晶粒保持臂32A、32B上掛設著 朝向晶粒保持臂32A、32B的閉合方向之彈簧33A、3;3B。 7 (請先閱讀背面之注意事項再填寫本頁> • ί n I I--訂·!--—I —--線 I ί
.I n n ϋ ϋ ϋ I 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 4 5 t3T2 B7 五、發明說明(< ) . 爲了控制晶粒保持臂32A、32B之閉合位置 > 將擋件34A 、34B固定於移動本體21上。在晶粒保持臂32A、32B的 上端部之外側,配設著爲開閉晶粒保持臂32A、32B之開 閉桿35A、35B,開閉桿35A、35B是由晶粒保持臂32A、 32B上所固定之未圖示的驅動機構所驅動。 接著對動作做說明。如圖1(a)所示般,在用晶圓吸附 體11將晶圓墊6吸附保持住的狀態下,如圖1(b)所示般, 使頂起筒體13、中心頂針12及周邊頂針14稍上昇,再使 中心頂針12及周邊頂針14進一步向上昇。這時,藉由頂 起筒體13、中心頂針12及周邊頂針14之稍上昇,待拾取 之晶粒1將被頂起筒體13稍稍頂起。如此般,若用頂起筒 體13將晶粒1稍稍頂起,晶粒1的四個角即脫離晶圓墊6 〇 又藉由僅使中心頂針12及周邊頂針14進一步向上昇 ,則僅晶粒1被頂起,而使晶粒1脫離晶圓墊6。在中心 頂針12及周邊頂針14的上昇中,連接線2係抵接於軟質 材25下面,連接線支承軸23將和中心頂針12及周邊頂針 14 一起向上昇。又,中心頂針12及周邊頂針14會一直上 昇、直到晶粒1下面比晶粒保持臂32A的晶粒保持部32a 、32b上面高的位置爲止。 接著如圖1(c)所示般,開閉桿35A、35B向外側(箭頭 A方向)移動,晶粒保持臂32A、32B受到彈簧33A、33B .的彈壓力將以支軸31A、31B爲中心而向內轉動後抵接於 擋件34A、34B,以使晶粒保持部32a、32b位於晶粒1的 8 本紙張尺度適用中國國家標準(CNS〉A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製
一10, I ·1 ϋ *1 n I n I I (/^ —i κ ϋ ϋ ϋ I I I ϋ I I I f -- ] n ϋ I - ϋ I A7 451372 ___B7____ 五、發明說明(G ) 下方。接著如圖1(d)所示般,使頂起筒體13、中心頂針12 及周邊頂針14下降。藉此,晶粒1即被晶粒保持臂32A、 32B之晶粒保持部32a、32b及連接線支承軸23之軟質材 25所保持住.。 如此般,由於晶粒1是被晶粒保持臂32A、32B之晶 粒保持部' 32b、以及受到弱彈簧27的彈壓之連接線 支承軸23之軟質材25所保持住’故不致使連接線2變形 即可完成拾取。 接著,針對將該構成之晶粒保持機構應用於晶粒裝塡 裝置或晶粒接合裝置的情形做說明。如圖2及圖3所不般 ,在托架40或基板3的上方配設夾頭(c〇Uet)41 ’該夾頭 41上形成有用以真空吸附住晶粒1之吸附孔41a。夾頭41 係設置成,能用未圖示的驅動機構來進行ISO度往復驅動 ,同時可朝上下方向及XY方向移動。 於是,如圖1(d)所示般,在周晶粒保持機構保持住晶 粒1的狀態下,使移動本體21上昇(箭頭C方向),接著如 圖2(a)及圖3(a)所示般,移動至夾頭41的上方(箭頭D方 向),接著下降移動本體21(箭頭E方向)而使晶粒1抵接於 夾頭,而將晶粒1稍稍舉起。同時將夾頭41的吸附孔 41a之真空接通,夾頭41即將晶粒1吸附保持住。接著如 圖2(b)及圖3(b)所示般,開閉桿35A、35B向內(箭頭B方 向)移動後推壓晶粒保持臂32A、32B,以將晶粒保持部 32a、32b打開。之後,移動本體21向上昇(箭頭F方向), 向下個待拾取的晶粒1上方移動(箭頭G方向),接著下降 _____9____ &張尺度適用申國國家標準(CNS)A4規格(210x297公爱) (請先閲讀背面之注意事項再填寫本頁) 2--------訂. 經濟部智慧財產局員工消費合作社印製 -線-〇----------1------------ A7 451372 __ B7___ 五、發明說明("I ) 而呈圖1(a)之狀態。當移動本體21上昇時’如圖2(c)及圖 3(c)所示般夾頭4丨將.180度旋轉’而使連接線2位於下方 〇 如圖2般之要將晶粒1收納於托架40時’托架4丨係 如圖2(d)所示般,下降到連接線2位於托架40收納部稍上 方之位置’之後將夾頭41的真空切斷。藉此’以將晶粒1 收納於托架40內。如圖3般之要將晶粒1接合於基板3時 ,托架41係如圖3(d)所不般 > 下降到連接線2壓接於焊料 4爲止,之後將夾頭41的真空切斷。藉此’以將連接線2 連接於焊料4。當晶粒1收納於托架40或晶粒1接合於基 板3後,夾頭41上昇並朝180度逆方向旋轉’而成爲用以 接收晶粒1的狀態。 圖4係顯示本發明的其他實施形態。前述實施形態中 ,晶粒1下面是由晶粒保持臂32A、32B之晶粒保持部32a 、32b所保持住。本實施形態所示的情形,是將晶粒1的 側面用晶粒保持臂362A、32B之晶粒保持部32a、32b來保 持住。如圖4(a)所示般,在用晶圓吸附體11將晶圓墊6吸 附保持住的狀態下,如圖4(b)所示般,使頂起筒體13、中 心頂針12及周邊頂針14稍上昇,再使中心頂針12及周邊 頂針14進一步向上昇。這時,藉由頂起筒體13 '中心頂 針I2及周邊頂針14之稍上昇,待拾取之晶粒1將被頂起 筒體Π稍稍頂起。如此般,若用頂起筒體Π將晶粒1稍 稍頂起,晶粒1的四個角即脫離晶圓墊6。 又藉由僅使中心頂針12及周邊頂針14進一步向上昇 _______10_ _尺度國國家標準(CNS)A4規格(210 X 297公釐)" :~ (绩先閱讀背面之注意事項再填寫本頁) ,di 經濟部智慧財產局員工消費合作社印製 ^•BJ n I— I— I— I I ^\/ n n n .^1 n It I n i · A7 B7 五、發明說明(《) ,則僅晶粒1被頂起,而使晶粒1脫離晶圓墊6。在中心 頂針12及周邊頂針14的上昇中,連接線2係抵接於軟質 材25下面,連接線支承軸23將和中心頂針12及周邊頂針 14 一起向上昇。這個動作和前述實施形態相同。然而,與 前述實施形態之不同點在於,中心頂針12及周邊頂針14 的上昇量不同。亦即,本實施形態中,中心頂針12及周邊 頂針14會一直上昇、直到晶粒1側面到達晶粒保持臂32A 的晶粒保持部32a、32b之保持位置爲止。 接著如圖1(c)所不般,開閉桿35A、35B向外側(箭頭 A方向)移動,晶粒保持臂32A、32B受到彈簧33A ' 33B 的彈壓力將以支軸31A、31B爲中心而向內轉動後,使晶 粒保持部32a、32b夾住晶粒1的側面。接著如圖1(d)所示 般,使頂起筒體13、中心頂針12及周邊頂針14下降。 如此般,將晶粒1側面用晶粒保持臂32A、32B之晶 粒保持部32a、32b來夾住亦可。然而,本實施形態中,由 於彈簧33A、33B的彈壓力會施加於晶粒1側面,故以前 述實施形態爲較佳。 又,上述實施形態中,所圖示出的連接線2係採為形 ,當然也適用於直線形者。又圖示係針對連接線2的情形 做說明,當然也適用於晶粒1具備連接用突起、而以習知 的真空吸附方式所無法拾取之晶粒。 〔發明之效果〕 本發明之晶粒保持機構係具備:可上下移動之連接線 支承軸,具有晶粒保持部之以開閉自如的方式配設於連接 11 (請先閱讀背面之注意事項再填寫本頁)
^ ------—訂-- - ----I 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準<CNS>A4規格(210 X 297公釐) 經濟部智慧財產局員工消費合作社印製 4 5 t 3 7 Ά ^ A7 B7 五、發明說明(1 ) 線支承軸兩側之一對的晶粒保持臂’以及用以開閉該晶粒 保持臂之晶粒保持臂開閉機構;藉前述晶粒頂起機構將晶 粒頂起,在該晶粒的上昇途中用前述連接線支承軸壓住’ 當該連接線支承軸上昇既定量時閉合前述晶粒保持臂而使 晶粒保持部位於晶粒下面的下方或夾住晶粒的側面,之後 .降下晶粒頂起機構的頂針而使晶粒被前述晶粒保持臂所保 持住。故不致使連接線變形即可從晶圓墊上拾取晶粒。 〔圖式之簡單說明〕 圖1(a)〜(d)係顯示本發明的晶粒保持機構之一實施形 態的動作之截面圖。 圖2(a)〜(d)係顯示採用圖1的晶粒保持機構之晶粒裝 塡裝置的一實施形態的動作之截面圖。 圖3(a)〜(d)係顯示採用圖1的晶粒保持機構之晶粒接 合裝置的一實施形態的動作之截面圖。 圖4(a)〜(d)係顯示本發明的晶粒保持機構之其他實施 形態的動作之截面圖。 圖5(a)及(b)係備有連接線的半導體裝置之說明圖。 圖6係晶圖墊上所貼附的晶粒之說明圖 〔符號說明〕 1晶粒 2 連接線 3基板 _ 4焊料 5 半導體裝置 12 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) I ^1 ϋ *1·^— I H V ^ '^1 a— l I— IB· at— . 4S1372 A7 _____ B7 五、發明說明(β ) 6晶圓墊 10 晶粒頂起機構 11 晶圓吸附體 12 中心頂針 13 頂起筒體 14 周邊頂針 20 晶粒保持機構 21 移動本體 23 連接線支承軸 25 軟質材 27 彈簧 32A、32B 晶粒保持臂 32a ' 32b 晶粒保持部 35A'35B 開閉桿 40 托架 - 41 夾頭 (請先閱讀背面之注意事項再填寫本頁)
i-^f n n n n ϋ 1 n 一34r I n I ] 1· n I 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)
Claims (1)
- 4 51 3 7 2 A8 瑪 D8 六、申請專利範圍 1、 一種晶粒保持機構,係具備:用以頂起晶圓墊上的 晶粒之晶粒頂起機構,及用以將晶粒頂起機構所頂起的晶 粒保持住之晶粒保持機構;其特徵在於,前述晶粒在上面 具有連接線,前述晶粒保持機構係具備:可上下移動之連 接線支承軸,具有晶粒保持部之以開閉自如的方式配設於 連接線支承軸兩側之一對的晶粒保持臂,以及用以開閉該 晶粒保持臂之晶粒保持臂開閉機構;藉前述晶粒頂起機構 將晶粒頂起,在該晶粒的上昇途中用前述連接線支承軸壓 住’當該連接線支承軸上昇既定量時閉合前述晶粒保持臂 而使晶粒保持部位於晶粒下面的下方或夾住晶粒的側面, 之後降下晶粒頂起機構的頂針而使晶粒被前述晶粒保持臂 所保持住。 2、 一種晶粒裝塡裝置,其特徵在於,係使用申請專 利範圔第1項之晶粒保持機構,該晶粒保持機構,係以可 移動的方式裝設於用以裝塡晶粒之托架的上方,在該托架 的上方,配設著可轉動之用以吸附保持晶粒之夾頭,該夾 頭從前述晶粒保持機構接收晶粒後,翻轉成前述連接線向 下,並將晶粒收納於前述托架中。 3、 一種晶粒接合裝置,其特徵在於,係使用申請專 利範圍第1項之晶粒保持機構,該晶粒保持機構,係以可 移動的方式裝設於用以接合晶粒之基板的上方,在該基板 的上方,配設著可轉動之用以吸附保持晶粒之夾頭,該夾 頭從前述晶粒保持機構接收晶粒後,翻轉成前述連接線向 下,並將晶粒接合於前述基板上。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐〉 (請先閱讀背面之注意事項再填寫本頁} 經濟部智慧財產局員工消費合作社印製 ^-5' t ϋ 1 ϋ I n \ i at I I i - - -. I (I - -l I I ϋ I .
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17152199 | 1999-06-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW451372B true TW451372B (en) | 2001-08-21 |
Family
ID=15924668
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW089107950A TW451372B (en) | 1999-06-17 | 2000-04-27 | Die-holding mechanism, die-packing device and die-bonding device |
Country Status (3)
Country | Link |
---|---|
US (2) | US6505397B1 (zh) |
KR (1) | KR100368625B1 (zh) |
TW (1) | TW451372B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112366176A (zh) * | 2020-11-23 | 2021-02-12 | 中芯长电半导体(江阴)有限公司 | 晶粒拾取装置及方法 |
TWI750094B (zh) * | 2020-05-29 | 2021-12-11 | 日商日立功率半導體股份有限公司 | 接合治具及半導體裝置之製造方法 |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW451372B (en) * | 1999-06-17 | 2001-08-21 | Shinkawa Kk | Die-holding mechanism, die-packing device and die-bonding device |
JP4541601B2 (ja) * | 2001-07-19 | 2010-09-08 | 富士機械製造株式会社 | 電動チャックを用いた電気部品装着システム |
US8026126B2 (en) * | 2002-11-27 | 2011-09-27 | Asm Assembly Automation Ltd | Apparatus and method for thin die detachment |
US20040105750A1 (en) * | 2002-11-29 | 2004-06-03 | Esec Trading Sa, A Swiss Corporation | Method for picking semiconductor chips from a foil |
US7028396B2 (en) * | 2003-04-14 | 2006-04-18 | Texas Instruments Incorporated | Semiconductor chip pick and place process and equipment |
US7377028B2 (en) * | 2003-09-19 | 2008-05-27 | Tyco Electronics Corporation | Electrical connector insertion and removal tool |
JP3808465B2 (ja) | 2003-12-24 | 2006-08-09 | エルピーダメモリ株式会社 | マウント方法及び装置 |
US7257887B2 (en) * | 2004-06-14 | 2007-08-21 | David Lee | Die holding apparatus for bonding systems |
US7276396B2 (en) * | 2004-10-06 | 2007-10-02 | Intel Corporation | Die handling system |
US7407359B2 (en) * | 2005-05-27 | 2008-08-05 | Danville Automation Holdings Llc | Funnel plate |
JP4616748B2 (ja) * | 2005-10-11 | 2011-01-19 | 株式会社新川 | ダイピックアップ装置 |
US7726540B2 (en) * | 2005-12-12 | 2010-06-01 | Asm Assembly Automation Ltd. | Apparatus and method for arranging devices for processing |
WO2009056469A1 (en) * | 2007-10-31 | 2009-05-07 | Oerlikon Assembly Equipment Ag, Steinhausen | Foil perforating needle for detaching a small die from a foil |
FR2926890B1 (fr) * | 2008-01-30 | 2011-01-07 | St Microelectronics Grenoble | Procede et dispositif de transport de modules electroniques et equipements de manipulation et de test de modules electroniques |
TWI451522B (zh) * | 2008-06-30 | 2014-09-01 | Apparatus and method for removing crystal grains | |
US7895734B2 (en) * | 2008-11-07 | 2011-03-01 | Research In Motion Limited | Camera module insertion machine with gripper |
DE102009012331A1 (de) * | 2009-03-09 | 2010-09-16 | Weber Maschinenbau Gmbh Breidenbach | Produktgreifer |
IT1393030B1 (it) * | 2009-03-11 | 2012-04-11 | Gimatic Spa | Dispositivo di supporto per organi prensili |
CN110214369A (zh) * | 2017-03-02 | 2019-09-06 | Ev 集团 E·索尔纳有限责任公司 | 用于键合芯片的方法和装置 |
US10410905B1 (en) * | 2018-05-12 | 2019-09-10 | Rohinni, LLC | Method and apparatus for direct transfer of multiple semiconductor devices |
US11366156B2 (en) | 2019-01-24 | 2022-06-21 | Stmicroelectronics Pte Ltd | Crack detection integrity check |
KR102365660B1 (ko) * | 2019-08-27 | 2022-02-18 | 세메스 주식회사 | 다이 픽업 모듈 및 이를 포함하는 다이 본딩 장치 |
KR102284457B1 (ko) * | 2019-08-27 | 2021-07-30 | 세메스 주식회사 | 다이 픽업 모듈 및 이를 포함하는 다이 본딩 장치 |
KR102267953B1 (ko) * | 2019-08-27 | 2021-06-22 | 세메스 주식회사 | 다이 픽업 모듈 및 이를 포함하는 다이 본딩 장치 |
KR102360569B1 (ko) * | 2019-08-29 | 2022-02-09 | 장현삼 | 미소 소자 전사 시스템 및 이를 이용한 전사 방법 |
KR102284151B1 (ko) * | 2019-09-06 | 2021-07-30 | 세메스 주식회사 | 다이 픽업 모듈 및 이를 포함하는 다이 본딩 장치 |
KR102386339B1 (ko) * | 2019-12-19 | 2022-04-13 | 세메스 주식회사 | 다이 이젝터 및 이를 포함하는 다이 이송 장치 |
KR102441538B1 (ko) * | 2020-10-13 | 2022-09-07 | 정라파엘 | 본딩 블록 및 이를 이용한 칩 본딩 방법 |
US20220165590A1 (en) * | 2020-11-23 | 2022-05-26 | Sj Semiconductor(Jiangyin) Corporation | Die pickup device and method |
CN117133708B (zh) * | 2023-10-26 | 2024-01-30 | 迈为技术(珠海)有限公司 | 一种键合装置及半导体键合设备 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3442432A (en) * | 1967-06-15 | 1969-05-06 | Western Electric Co | Bonding a beam-leaded device to a substrate |
US3785507A (en) * | 1968-12-19 | 1974-01-15 | Teledyne Inc | Die sorting system |
US3738560A (en) * | 1970-12-08 | 1973-06-12 | Kulicke & Soffa Ind Inc | Semiconductor die bonder |
JPS5537283A (en) * | 1978-09-08 | 1980-03-15 | Matsushita Electric Ind Co Ltd | Article shifter |
NL8103573A (nl) * | 1981-07-29 | 1983-02-16 | Philips Nv | Inrichting voor het tegelijkertijd toevoeren van meerdere in banden verpakte electrische en/of electronische onderdelen aan een bepaalde positie. |
JPS59161040A (ja) * | 1983-03-03 | 1984-09-11 | Shinkawa Ltd | インナ−リ−ドボンダ− |
US4915565A (en) * | 1984-03-22 | 1990-04-10 | Sgs-Thomson Microelectronics, Inc. | Manipulation and handling of integrated circuit dice |
JPS6132813A (ja) | 1984-07-25 | 1986-02-15 | Matsushita Electric Ind Co Ltd | 光信号送受信装置 |
JPS6194719A (ja) * | 1984-10-17 | 1986-05-13 | Takara Co Ltd | 合成樹脂製人形等の成形装置 |
JPH0297031A (ja) * | 1988-10-03 | 1990-04-09 | Oki Electric Ind Co Ltd | 半導体ダイボンディング装置 |
JPH0354858A (ja) | 1989-07-24 | 1991-03-08 | Fuji Photo Film Co Ltd | 固体撮像素子 |
JPH05152356A (ja) * | 1991-11-29 | 1993-06-18 | Shimadzu Corp | 光半導体素子組立装置 |
JPH077026A (ja) * | 1993-06-16 | 1995-01-10 | Fujitsu Miyagi Electron:Kk | 半導体装置組立方法 |
JPH08130230A (ja) | 1994-10-31 | 1996-05-21 | Matsushita Electric Ind Co Ltd | フリップチップの実装装置 |
JP2658915B2 (ja) * | 1994-11-04 | 1997-09-30 | 日本電気株式会社 | 半導体チップ移載装置 |
WO1998012908A1 (fr) * | 1996-09-17 | 1998-03-26 | Matsushita Electric Industrial Co., Ltd. | Procede et appareil pour la mise sous boitier des puces a circuit integre, et support en forme de bande conçu pour etre utilise a cet effet |
JP3243190B2 (ja) * | 1996-10-04 | 2002-01-07 | 株式会社東芝 | 半導体装置の製造装置および製造方法 |
JPH10256349A (ja) * | 1997-03-12 | 1998-09-25 | Hitachi Ltd | ピックアップ装置 |
US6202292B1 (en) * | 1998-08-26 | 2001-03-20 | Micron Technology, Inc. | Apparatus for removing carrier film from a semiconductor die |
TW451372B (en) * | 1999-06-17 | 2001-08-21 | Shinkawa Kk | Die-holding mechanism, die-packing device and die-bonding device |
JP3792996B2 (ja) * | 2000-06-08 | 2006-07-05 | 株式会社新川 | ダイ及び小物部品の移送装置 |
-
2000
- 2000-04-27 TW TW089107950A patent/TW451372B/zh not_active IP Right Cessation
- 2000-06-05 KR KR10-2000-0030765A patent/KR100368625B1/ko not_active IP Right Cessation
- 2000-06-19 US US09/596,681 patent/US6505397B1/en not_active Expired - Fee Related
-
2001
- 2001-10-26 US US10/014,251 patent/US6760968B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI750094B (zh) * | 2020-05-29 | 2021-12-11 | 日商日立功率半導體股份有限公司 | 接合治具及半導體裝置之製造方法 |
CN112366176A (zh) * | 2020-11-23 | 2021-02-12 | 中芯长电半导体(江阴)有限公司 | 晶粒拾取装置及方法 |
Also Published As
Publication number | Publication date |
---|---|
US6505397B1 (en) | 2003-01-14 |
US20020046460A1 (en) | 2002-04-25 |
US6760968B2 (en) | 2004-07-13 |
KR20010007245A (ko) | 2001-01-26 |
KR100368625B1 (ko) | 2003-01-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW451372B (en) | Die-holding mechanism, die-packing device and die-bonding device | |
US4381601A (en) | Apparatus for mounting electronic components | |
US4627787A (en) | Chip selection in automatic assembly of integrated circuit | |
TWI615905B (zh) | 黏晶裝置及半導體裝置的製造方法 | |
KR20020046203A (ko) | 반도체 칩의 픽업 장치 및 그 픽업방법 | |
CN102376609B (zh) | 装载口 | |
KR20140086361A (ko) | 다이 본딩 방법 및 장치 | |
TW478024B (en) | Die Bonder or Wire Bonder with a suction device for pulling flat and holding down a curved substrate | |
TWI353957B (zh) | ||
JP2000237983A (ja) | 基板チャック装置 | |
JP2001196443A (ja) | 半導体チップのピックアップ装置およびピックアップ方法 | |
JP3400338B2 (ja) | バンプボンディング装置 | |
CN213922977U (zh) | 一种芯片生产用翻转装置 | |
JPH0225773A (ja) | 測定用端子に対するicの接触・離し機構 | |
JP2845161B2 (ja) | コレット及びそれを用いたダイボンダ | |
JP3075398B2 (ja) | 超音波ボンディング用コレットおよびボンディング方法 | |
JP3967310B2 (ja) | 部品の実装装置及び実装方法 | |
JP2001060611A (ja) | ダイ保持機構、ダイ詰め装置及びダイボンディング装置 | |
KR102220346B1 (ko) | 다이 픽업 모듈 및 이를 포함하는 다이 본딩 장치 | |
JP4457715B2 (ja) | チップのピックアップ装置およびピックアップ方法 | |
CN216104808U (zh) | 一种用于显示模组的拾取机构及上料装置 | |
TW202016549A (zh) | 具定位功能之電子元件移載裝置、具備該裝置之檢測設備及其移載方法 | |
JP2004063107A (ja) | Icソケット | |
JP3024951B2 (ja) | 半導体パッケージのリードの折曲げ装置 | |
JP3440803B2 (ja) | チップの突き上げ方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent | ||
MM4A | Annulment or lapse of patent due to non-payment of fees |