TW335543B - Row decoder with level translator - Google Patents
Row decoder with level translatorInfo
- Publication number
- TW335543B TW335543B TW085114095A TW85114095A TW335543B TW 335543 B TW335543 B TW 335543B TW 085114095 A TW085114095 A TW 085114095A TW 85114095 A TW85114095 A TW 85114095A TW 335543 B TW335543 B TW 335543B
- Authority
- TW
- Taiwan
- Prior art keywords
- voltage
- row decoder
- level translator
- output signal
- voltage range
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/10—Decoders
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/435,689 US5696721A (en) | 1995-05-05 | 1995-05-05 | Dynamic random access memory having row decoder with level translator for driving a word line voltage above and below an operating supply voltage range |
Publications (1)
Publication Number | Publication Date |
---|---|
TW335543B true TW335543B (en) | 1998-07-01 |
Family
ID=23729402
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW085114095A TW335543B (en) | 1995-05-05 | 1996-11-18 | Row decoder with level translator |
Country Status (5)
Country | Link |
---|---|
US (2) | US5696721A (zh) |
EP (1) | EP0741386B1 (zh) |
JP (3) | JP4436897B2 (zh) |
KR (1) | KR100468549B1 (zh) |
TW (1) | TW335543B (zh) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6009037A (en) * | 1997-09-25 | 1999-12-28 | Texas Instruments Incorporated | Dynamic logic memory addressing circuits, systems, and methods with reduced capacitively loaded predecoders |
EP0933784A1 (en) * | 1997-12-31 | 1999-08-04 | STMicroelectronics S.r.l. | High voltage driver circuit for the decoding phase in multilevel non-volatile memory devices. |
KR100268446B1 (ko) * | 1998-08-07 | 2000-10-16 | 윤종용 | 트리플 웰 구조를 갖는 반도체 메모리 장치 |
US6278297B1 (en) | 1999-09-14 | 2001-08-21 | Texas Instruments Incorporated | Row decoder with switched power supply |
KR100368312B1 (ko) * | 1999-12-27 | 2003-01-24 | 주식회사 하이닉스반도체 | 워드라인 디코더 |
KR100481857B1 (ko) | 2002-08-14 | 2005-04-11 | 삼성전자주식회사 | 레이아웃 면적을 줄이고 뱅크 마다 독립적인 동작을수행할 수 있는 디코더를 갖는 플레쉬 메모리 장치 |
US6785186B2 (en) * | 2002-08-21 | 2004-08-31 | Micron Technology, Inc. | Design of an high speed xdecoder driving a large wordline load consuming less switching current for use in high speed syncflash memory |
US7006389B2 (en) * | 2003-12-12 | 2006-02-28 | Micron Technology, Inc. | Voltage translator for multiple voltage operations |
KR100582422B1 (ko) * | 2004-05-15 | 2006-05-22 | 에스티마이크로일렉트로닉스 엔.브이. | 낸드 플래시 메모리 소자 |
KR101064186B1 (ko) * | 2005-08-10 | 2011-09-14 | 삼성전자주식회사 | 레벨쉬프터와, 이를 갖는 표시장치 |
US7450454B1 (en) | 2007-05-09 | 2008-11-11 | Freescale Semiconductor, Inc. | Low voltage data path in memory array |
JP2008287826A (ja) * | 2007-05-21 | 2008-11-27 | Panasonic Corp | 半導体記憶装置 |
JP5191766B2 (ja) * | 2008-03-24 | 2013-05-08 | ルネサスエレクトロニクス株式会社 | デコーダ回路 |
US7859919B2 (en) * | 2008-08-27 | 2010-12-28 | Freescale Semiconductor, Inc. | Memory device and method thereof |
JP5202248B2 (ja) * | 2008-11-26 | 2013-06-05 | パナソニック株式会社 | 半導体記憶装置 |
KR101749009B1 (ko) | 2013-08-06 | 2017-06-19 | 애플 인크. | 원격 디바이스로부터의 활동에 기초한 스마트 응답의 자동 활성화 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57133668A (en) * | 1981-02-12 | 1982-08-18 | Nec Corp | Semiconductor memory storage |
US4417325A (en) * | 1981-07-13 | 1983-11-22 | Eliyahou Harari | Highly scaleable dynamic ram cell with self-signal amplification |
JPS5922359A (ja) * | 1982-07-29 | 1984-02-04 | Nec Corp | 集積化半導体記憶装置 |
JPS60209996A (ja) * | 1984-03-31 | 1985-10-22 | Toshiba Corp | 半導体記憶装置 |
US5324982A (en) * | 1985-09-25 | 1994-06-28 | Hitachi, Ltd. | Semiconductor memory device having bipolar transistor and structure to avoid soft error |
US5238860A (en) * | 1987-07-10 | 1993-08-24 | Kabushiki Kaisha Toshiba | Semiconductor device having different impurity concentration wells |
DE3886283T2 (de) * | 1987-07-10 | 1994-05-11 | Toshiba Kawasaki Kk | Halbleiterbauelement mit Bereichen unterschiedlicher Störstellenkonzentration. |
JPH02168494A (ja) * | 1988-12-21 | 1990-06-28 | Nec Corp | 半導体記憶回路 |
GB2243233A (en) * | 1990-04-06 | 1991-10-23 | Mosaid Inc | DRAM word line driver |
JP2523409B2 (ja) * | 1990-05-02 | 1996-08-07 | 三菱電機株式会社 | 半導体記憶装置およびその製造方法 |
KR940002859B1 (ko) * | 1991-03-14 | 1994-04-04 | 삼성전자 주식회사 | 반도체 메모리장치에서의 워드라인 구동회로 |
JP3128262B2 (ja) * | 1991-05-28 | 2001-01-29 | 株式会社東芝 | 半導体集積回路装置 |
KR940010837B1 (ko) * | 1991-10-21 | 1994-11-17 | 현대전자산업 주식회사 | Dram의 워드선 구동회로 |
KR960000836B1 (ko) * | 1991-11-21 | 1996-01-13 | 삼성전자주식회사 | 반도체 메모리 장치의 워드라인 구동회로 |
KR0113252Y1 (ko) * | 1991-12-24 | 1998-04-14 | 문정환 | 워드라인 전압 공급회로 |
JPH05189968A (ja) * | 1992-01-16 | 1993-07-30 | Mitsubishi Electric Corp | 半導体記憶装置 |
KR940003026A (ko) * | 1992-07-13 | 1994-02-19 | 김광호 | 트리플웰을 이용한 반도체장치 |
KR960006373B1 (ko) * | 1992-10-31 | 1996-05-15 | 삼성전자주식회사 | 반도체 메모리 장치의 워드라인 구동회로 |
JPH06223568A (ja) * | 1993-01-29 | 1994-08-12 | Mitsubishi Electric Corp | 中間電位発生装置 |
US5410508A (en) * | 1993-05-14 | 1995-04-25 | Micron Semiconductor, Inc. | Pumped wordlines |
JPH06333386A (ja) * | 1993-05-20 | 1994-12-02 | Fujitsu Ltd | 半導体記憶装置 |
JP3150503B2 (ja) * | 1993-08-06 | 2001-03-26 | 株式会社日立製作所 | 半導体装置 |
JP3667787B2 (ja) * | 1994-05-11 | 2005-07-06 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
US5650346A (en) * | 1994-08-29 | 1997-07-22 | United Microelectronics Corporation | Method of forming MOSFET devices with buried bitline capacitors |
-
1995
- 1995-05-05 US US08/435,689 patent/US5696721A/en not_active Expired - Lifetime
-
1996
- 1996-05-03 EP EP96303139A patent/EP0741386B1/en not_active Expired - Lifetime
- 1996-05-07 JP JP11273196A patent/JP4436897B2/ja not_active Expired - Lifetime
- 1996-11-18 TW TW085114095A patent/TW335543B/zh not_active IP Right Cessation
-
1997
- 1997-04-23 US US08/839,004 patent/US5792682A/en not_active Expired - Lifetime
-
2003
- 2003-06-30 KR KR1020030043554A patent/KR100468549B1/ko not_active IP Right Cessation
-
2007
- 2007-07-30 JP JP2007197558A patent/JP2007328906A/ja active Pending
-
2011
- 2011-06-01 JP JP2011123506A patent/JP5314086B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5696721A (en) | 1997-12-09 |
JP5314086B2 (ja) | 2013-10-16 |
JPH09106677A (ja) | 1997-04-22 |
KR100468549B1 (ko) | 2005-01-29 |
EP0741386A2 (en) | 1996-11-06 |
JP2007328906A (ja) | 2007-12-20 |
US5792682A (en) | 1998-08-11 |
JP4436897B2 (ja) | 2010-03-24 |
JP2011210362A (ja) | 2011-10-20 |
EP0741386B1 (en) | 2011-09-21 |
EP0741386A3 (en) | 2004-02-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |