TW287321B - A PMOS flash memory cell with hot electron injection programming and tunnelling erasing - Google Patents
A PMOS flash memory cell with hot electron injection programming and tunnelling erasingInfo
- Publication number
- TW287321B TW287321B TW084112625A TW84112625A TW287321B TW 287321 B TW287321 B TW 287321B TW 084112625 A TW084112625 A TW 084112625A TW 84112625 A TW84112625 A TW 84112625A TW 287321 B TW287321 B TW 287321B
- Authority
- TW
- Taiwan
- Prior art keywords
- well
- floating gate
- drain
- erasing
- memory cell
- Prior art date
Links
- 239000002784 hot electron Substances 0.000 title abstract 2
- 238000002347 injection Methods 0.000 title abstract 2
- 239000007924 injection Substances 0.000 title abstract 2
- 230000015556 catabolic process Effects 0.000 abstract 1
- 230000001066 destructive effect Effects 0.000 abstract 1
- 230000005641 tunneling Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/40—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the peripheral circuit region
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0416—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and no select transistor, e.g. UV EPROM
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0433—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and one or more separate select transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
- H01L29/7881—Programmable transistors with only two possible levels of programmation
- H01L29/7884—Programmable transistors with only two possible levels of programmation charging by hot carrier injection
- H01L29/7885—Hot carrier injection from the channel
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/40—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the peripheral circuit region
- H10B41/42—Simultaneous manufacture of periphery and memory cells
- H10B41/43—Simultaneous manufacture of periphery and memory cells comprising only one type of peripheral transistor
- H10B41/44—Simultaneous manufacture of periphery and memory cells comprising only one type of peripheral transistor with a control gate layer also being used as part of the peripheral transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/557,589 US5687118A (en) | 1995-11-14 | 1995-11-14 | PMOS memory cell with hot electron injection programming and tunnelling erasing |
Publications (1)
Publication Number | Publication Date |
---|---|
TW287321B true TW287321B (en) | 1996-10-01 |
Family
ID=24226069
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW084112625A TW287321B (en) | 1995-11-14 | 1995-11-27 | A PMOS flash memory cell with hot electron injection programming and tunnelling erasing |
Country Status (6)
Country | Link |
---|---|
US (1) | US5687118A (zh) |
EP (1) | EP0778623B1 (zh) |
JP (1) | JP3124936B2 (zh) |
AT (1) | ATE203356T1 (zh) |
DE (2) | DE778623T1 (zh) |
TW (1) | TW287321B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1998029907A2 (en) * | 1997-01-02 | 1998-07-09 | Caywood John M | Low voltage single supply cmos electrically erasable read-only memory |
US6201732B1 (en) | 1997-01-02 | 2001-03-13 | John M. Caywood | Low voltage single CMOS electrically erasable read-only memory |
Families Citing this family (88)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6144581A (en) * | 1996-07-24 | 2000-11-07 | California Institute Of Technology | pMOS EEPROM non-volatile data storage |
US5825063A (en) * | 1995-03-07 | 1998-10-20 | California Institute Of Technology | Three-terminal silicon synaptic device |
US5990512A (en) * | 1995-03-07 | 1999-11-23 | California Institute Of Technology | Hole impact ionization mechanism of hot electron injection and four-terminal ρFET semiconductor structure for long-term learning |
US5875126A (en) * | 1995-09-29 | 1999-02-23 | California Institute Of Technology | Autozeroing floating gate amplifier |
US5898613A (en) * | 1996-07-24 | 1999-04-27 | California Institute Of Technology | pMOS analog EEPROM cell |
US6965142B2 (en) * | 1995-03-07 | 2005-11-15 | Impinj, Inc. | Floating-gate semiconductor structures |
JP3878681B2 (ja) * | 1995-06-15 | 2007-02-07 | 株式会社ルネサステクノロジ | 不揮発性半導体記憶装置 |
US5912842A (en) * | 1995-11-14 | 1999-06-15 | Programmable Microelectronics Corp. | Nonvolatile PMOS two transistor memory cell and array |
JPH09293842A (ja) * | 1996-04-26 | 1997-11-11 | Ricoh Co Ltd | 半導体記憶装置の製造方法 |
US5861650A (en) * | 1996-08-09 | 1999-01-19 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device comprising an FPGA |
US5914514A (en) * | 1996-09-27 | 1999-06-22 | Xilinx, Inc. | Two transistor flash EPROM cell |
US5973967A (en) * | 1997-01-03 | 1999-10-26 | Programmable Microelectronics Corporation | Page buffer having negative voltage level shifter |
US5856946A (en) * | 1997-04-09 | 1999-01-05 | Advanced Micro Devices, Inc. | Memory cell programming with controlled current injection |
US6134144A (en) * | 1997-09-19 | 2000-10-17 | Integrated Memory Technologies, Inc. | Flash memory array |
US6026026A (en) * | 1997-12-05 | 2000-02-15 | Hyundai Electronics America, Inc. | Self-convergence of post-erase threshold voltages in a flash memory cell using transient response |
JP3378879B2 (ja) | 1997-12-10 | 2003-02-17 | 松下電器産業株式会社 | 不揮発性半導体記憶装置及びその駆動方法 |
US5903497A (en) * | 1997-12-22 | 1999-05-11 | Programmable Microelectronics Corporation | Integrated program verify page buffer |
EP0936629B1 (de) * | 1998-02-12 | 2006-09-13 | Infineon Technologies AG | EEPROM und Verfahren zur Ansteuerung eines EEPROM |
US6118691A (en) * | 1998-04-01 | 2000-09-12 | National Semiconductor Corporation | Memory cell with a Frohmann-Bentchkowsky EPROM memory transistor that reduces the voltage across an unprogrammed memory transistor during a read |
US6055185A (en) | 1998-04-01 | 2000-04-25 | National Semiconductor Corporation | Single-poly EPROM cell with CMOS compatible programming voltages |
US6081451A (en) * | 1998-04-01 | 2000-06-27 | National Semiconductor Corporation | Memory device that utilizes single-poly EPROM cells with CMOS compatible programming voltages |
US6157574A (en) * | 1998-04-01 | 2000-12-05 | National Semiconductor Corporation | Erasable frohmann-bentchkowsky memory transistor that stores multiple bits of data |
US6141246A (en) * | 1998-04-01 | 2000-10-31 | National Semiconductor Corporation | Memory device with sense amplifier that sets the voltage drop across the cells of the device |
US5862082A (en) * | 1998-04-16 | 1999-01-19 | Xilinx, Inc. | Two transistor flash EEprom cell and method of operating same |
US6160737A (en) * | 1998-08-10 | 2000-12-12 | Aplus Flash Technology, Inc. | Bias conditions for repair, program and erase operations of non-volatile memory |
JP3344331B2 (ja) * | 1998-09-30 | 2002-11-11 | 日本電気株式会社 | 不揮発性半導体記憶装置 |
JP2002539624A (ja) * | 1999-03-18 | 2002-11-19 | キャベンディッシュ・キネティックス・リミテッド | フレキシブル要素を有するフラッシュメモリ素子、フラッシュメモリデバイスおよび情報電荷蓄積方法 |
WO2000075994A1 (en) * | 1999-06-04 | 2000-12-14 | Koninklijke Philips Electronics N.V. | Semiconductor device with a non-volatile memory |
JP2001007227A (ja) | 1999-06-23 | 2001-01-12 | Seiko Epson Corp | 不揮発性半導体記憶装置 |
US6522587B1 (en) | 1999-06-23 | 2003-02-18 | Seiko Epson Corporation | Non-volatile semiconductor memory devices |
JP3743486B2 (ja) | 1999-06-23 | 2006-02-08 | セイコーエプソン株式会社 | 不揮発性メモリトランジスタを含む半導体装置の製造方法 |
JP2001060674A (ja) | 1999-08-20 | 2001-03-06 | Seiko Epson Corp | 不揮発性メモリトランジスタを含む半導体装置 |
DE19941684B4 (de) * | 1999-09-01 | 2004-08-26 | Infineon Technologies Ag | Halbleiterbauelement als Verzögerungselement |
JP3587100B2 (ja) | 1999-09-17 | 2004-11-10 | セイコーエプソン株式会社 | 不揮発性メモリトランジスタを含む半導体装置の製造方法 |
US6307781B1 (en) * | 1999-09-30 | 2001-10-23 | Infineon Technologies Aktiengesellschaft | Two transistor flash memory cell |
KR100379553B1 (ko) * | 2001-01-11 | 2003-04-10 | 주식회사 하이닉스반도체 | 플래쉬 메모리 셀의 어레이 및 이를 이용한 데이터프로그램방법 및 소거방법 |
FR2823363B1 (fr) * | 2001-04-05 | 2003-12-12 | St Microelectronics Sa | Procede d'effacement d'une cellule-memoire de type famos, et cellule-memoire correspondante |
US6664909B1 (en) | 2001-08-13 | 2003-12-16 | Impinj, Inc. | Method and apparatus for trimming high-resolution digital-to-analog converter |
US20040206999A1 (en) * | 2002-05-09 | 2004-10-21 | Impinj, Inc., A Delaware Corporation | Metal dielectric semiconductor floating gate variable capacitor |
US6958646B1 (en) | 2002-05-28 | 2005-10-25 | Impinj, Inc. | Autozeroing floating-gate amplifier |
US7221596B2 (en) * | 2002-07-05 | 2007-05-22 | Impinj, Inc. | pFET nonvolatile memory |
US6950342B2 (en) * | 2002-07-05 | 2005-09-27 | Impinj, Inc. | Differential floating gate nonvolatile memories |
US7212446B2 (en) * | 2002-09-16 | 2007-05-01 | Impinj, Inc. | Counteracting overtunneling in nonvolatile memory cells using charge extraction control |
US6853583B2 (en) | 2002-09-16 | 2005-02-08 | Impinj, Inc. | Method and apparatus for preventing overtunneling in pFET-based nonvolatile memory cells |
US20050030827A1 (en) * | 2002-09-16 | 2005-02-10 | Impinj, Inc., A Delaware Corporation | PMOS memory cell |
US7149118B2 (en) * | 2002-09-16 | 2006-12-12 | Impinj, Inc. | Method and apparatus for programming single-poly pFET-based nonvolatile memory cells |
KR100532429B1 (ko) * | 2003-04-18 | 2005-11-30 | 삼성전자주식회사 | 바이트 오퍼레이션 비휘발성 반도체 메모리 장치 |
US7419895B2 (en) * | 2003-10-23 | 2008-09-02 | Micron Technology, Inc. | NAND memory arrays |
TWI228800B (en) * | 2003-11-06 | 2005-03-01 | Ememory Technology Inc | Non-volatile memory cell and related method |
US7262457B2 (en) * | 2004-01-05 | 2007-08-28 | Ememory Technology Inc. | Non-volatile memory cell |
US20050145924A1 (en) * | 2004-01-07 | 2005-07-07 | I-Sheng Liu | Source/drain adjust implant |
US7283390B2 (en) | 2004-04-21 | 2007-10-16 | Impinj, Inc. | Hybrid non-volatile memory |
US8111558B2 (en) * | 2004-05-05 | 2012-02-07 | Synopsys, Inc. | pFET nonvolatile memory |
US6965538B1 (en) * | 2004-08-03 | 2005-11-15 | Micron Technology, Inc. | Programming and evaluating through PMOS injection |
JP3962769B2 (ja) | 2004-11-01 | 2007-08-22 | 株式会社Genusion | 不揮発性半導体記憶装置およびその書込方法 |
KR100663974B1 (ko) * | 2005-02-03 | 2007-01-02 | 재단법인서울대학교산학협력재단 | 복수개의 도핑층을 갖는 전하트랩 메모리 셀의 구조 및 그 제조방법과 동작방법 |
JP4522879B2 (ja) * | 2005-02-07 | 2010-08-11 | 株式会社Genusion | 不揮発性半導体記憶装置 |
US7257033B2 (en) * | 2005-03-17 | 2007-08-14 | Impinj, Inc. | Inverter non-volatile memory cell and array system |
JP4783044B2 (ja) * | 2005-03-23 | 2011-09-28 | 株式会社Genusion | 不揮発性半導体記憶装置 |
US7679957B2 (en) * | 2005-03-31 | 2010-03-16 | Virage Logic Corporation | Redundant non-volatile memory cell |
JP4832835B2 (ja) * | 2005-09-13 | 2011-12-07 | 株式会社Genusion | 不揮発性半導体記憶装置の読み書き制御方法 |
TWI311796B (en) * | 2005-11-17 | 2009-07-01 | Ememory Technology Inc | Semiconductor device and manufacturing method thereof |
US20070247915A1 (en) * | 2006-04-21 | 2007-10-25 | Intersil Americas Inc. | Multiple time programmable (MTP) PMOS floating gate-based non-volatile memory device for a general-purpose CMOS technology with thick gate oxide |
US7391652B2 (en) * | 2006-05-05 | 2008-06-24 | Macronix International Co., Ltd. | Method of programming and erasing a p-channel BE-SONOS NAND flash memory |
US8122307B1 (en) | 2006-08-15 | 2012-02-21 | Synopsys, Inc. | One time programmable memory test structures and methods |
US7505325B2 (en) * | 2006-09-28 | 2009-03-17 | Chingis Technology Corporation | Low voltage low capacitance flash memory array |
KR100861749B1 (ko) * | 2006-12-22 | 2008-10-09 | 최웅림 | 2t nor형 비휘발성 메모리 셀 어레이, 2t nor형비휘발성 메모리의 데이터 처리방법 |
US7719896B1 (en) | 2007-04-24 | 2010-05-18 | Virage Logic Corporation | Configurable single bit/dual bits memory |
US7688627B2 (en) * | 2007-04-24 | 2010-03-30 | Intersil Americas Inc. | Flash memory array of floating gate-based non-volatile memory cells |
US7903465B2 (en) * | 2007-04-24 | 2011-03-08 | Intersil Americas Inc. | Memory array of floating gate-based non-volatile memory cells |
US7515478B2 (en) * | 2007-08-20 | 2009-04-07 | Nantronics Semiconductor, Inc. | CMOS logic compatible non-volatile memory cell structure, operation, and array configuration |
US8339862B2 (en) * | 2007-12-25 | 2012-12-25 | Genusion, Inc. | Nonvolatile semiconductor memory device |
EP2075798A1 (en) * | 2007-12-25 | 2009-07-01 | TPO Displays Corp. | Storage data unit using hot carrier stressing |
US7894261B1 (en) | 2008-05-22 | 2011-02-22 | Synopsys, Inc. | PFET nonvolatile memory |
CN101770955B (zh) * | 2008-12-31 | 2011-09-14 | 北大方正集团有限公司 | 一种制作p型金属氧化物半导体的方法 |
KR101591531B1 (ko) * | 2009-12-31 | 2016-02-03 | 주식회사 동부하이텍 | 반도체 메모리 소자, 반도체 메모리 소자의 제조 방법 및 반도체 메모리 소자의 셀어레이 |
US8369154B2 (en) * | 2010-03-24 | 2013-02-05 | Ememory Technology Inc. | Channel hot electron injection programming method and related device |
US8467245B2 (en) | 2010-03-24 | 2013-06-18 | Ememory Technology Inc. | Non-volatile memory device with program current clamp and related method |
US8536039B2 (en) * | 2010-03-25 | 2013-09-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | Nano-crystal gate structure for non-volatile memory |
US8917551B2 (en) * | 2011-01-11 | 2014-12-23 | Aplus Flash Technology, Inc. | Flexible 2T-based fuzzy and certain matching arrays |
CN102176468A (zh) * | 2011-01-28 | 2011-09-07 | 上海宏力半导体制造有限公司 | P型mos存储单元 |
JP5238859B2 (ja) * | 2011-07-29 | 2013-07-17 | 株式会社Genusion | 不揮発性半導体記憶装置およびその読み書き制御方法 |
JP5888555B2 (ja) * | 2012-01-25 | 2016-03-22 | エスアイアイ・セミコンダクタ株式会社 | 不揮発性半導体記憶装置 |
US9190148B2 (en) * | 2012-03-21 | 2015-11-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | System and method of UV programming of non-volatile semiconductor memory |
US8953380B1 (en) * | 2013-12-02 | 2015-02-10 | Cypress Semiconductor Corporation | Systems, methods, and apparatus for memory cells with common source lines |
US9754669B2 (en) | 2014-09-30 | 2017-09-05 | Anvo-Systems Dresden Gmbh | Flash memory arrangement with a common read-write circuit shared by partial matrices of a memory column |
JP6266688B2 (ja) * | 2016-04-25 | 2018-01-24 | 株式会社フローディア | 不揮発性半導体記憶装置 |
JP7070032B2 (ja) | 2018-04-25 | 2022-05-18 | ユナイテッド・セミコンダクター・ジャパン株式会社 | 不揮発性半導体記憶装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4435790A (en) * | 1980-12-24 | 1984-03-06 | Fairchild Camera And Instrument Corporation | High speed, nonvolatile, electrically erasable memory cell and system |
US4479203A (en) * | 1981-11-16 | 1984-10-23 | Motorola, Inc. | Electrically erasable programmable read only memory cell |
JPS614240A (ja) * | 1984-06-18 | 1986-01-10 | Toshiba Corp | 半導体装置の製造方法 |
IT1201834B (it) * | 1986-07-10 | 1989-02-02 | Sgs Microelettronica Spa | Dispositivo di memoria non volatile a semiconduttore |
JP2504599B2 (ja) * | 1990-02-23 | 1996-06-05 | 株式会社東芝 | 不揮発性半導体記憶装置 |
KR960012303B1 (ko) * | 1992-08-18 | 1996-09-18 | 삼성전자 주식회사 | 불휘발성 반도체메모리장치 및 그 제조방법 |
JP2825407B2 (ja) * | 1993-04-01 | 1998-11-18 | 株式会社東芝 | 不揮発性半導体記憶装置 |
US5416738A (en) * | 1994-05-27 | 1995-05-16 | Alliance Semiconductor Corporation | Single transistor flash EPROM cell and method of operation |
-
1995
- 1995-11-14 US US08/557,589 patent/US5687118A/en not_active Expired - Lifetime
- 1995-11-27 TW TW084112625A patent/TW287321B/zh not_active IP Right Cessation
-
1996
- 1996-10-09 DE DE0778623T patent/DE778623T1/de active Pending
- 1996-10-09 AT AT96307350T patent/ATE203356T1/de not_active IP Right Cessation
- 1996-10-09 EP EP96307350A patent/EP0778623B1/en not_active Expired - Lifetime
- 1996-10-09 DE DE69613947T patent/DE69613947T2/de not_active Expired - Fee Related
- 1996-11-14 JP JP30292496A patent/JP3124936B2/ja not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1998029907A2 (en) * | 1997-01-02 | 1998-07-09 | Caywood John M | Low voltage single supply cmos electrically erasable read-only memory |
WO1998029907A3 (en) * | 1997-01-02 | 1998-09-11 | John M Caywood | Low voltage single supply cmos electrically erasable read-only memory |
US5986931A (en) * | 1997-01-02 | 1999-11-16 | Caywood; John M. | Low voltage single CMOS electrically erasable read-only memory |
US6201732B1 (en) | 1997-01-02 | 2001-03-13 | John M. Caywood | Low voltage single CMOS electrically erasable read-only memory |
US6574140B2 (en) | 1997-01-02 | 2003-06-03 | The John Millard And Pamela Ann Caywood 1989 Revocable Living Trust | Low voltage single supply CMOS electrically erasable read-only memory |
Also Published As
Publication number | Publication date |
---|---|
DE778623T1 (de) | 1998-03-05 |
US5687118A (en) | 1997-11-11 |
DE69613947D1 (de) | 2001-08-23 |
EP0778623A3 (en) | 1997-09-03 |
JPH09260518A (ja) | 1997-10-03 |
EP0778623B1 (en) | 2001-07-18 |
ATE203356T1 (de) | 2001-08-15 |
DE69613947T2 (de) | 2001-11-15 |
JP3124936B2 (ja) | 2001-01-15 |
EP0778623A2 (en) | 1997-06-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW287321B (en) | A PMOS flash memory cell with hot electron injection programming and tunnelling erasing | |
US6137723A (en) | Memory device having erasable Frohmann-Bentchkowsky EPROM cells that use a well-to-floating gate coupled voltage during erasure | |
US6084262A (en) | Etox cell programmed by band-to-band tunneling induced substrate hot electron and read by gate induced drain leakage current | |
US5212541A (en) | Contactless, 5v, high speed eprom/flash eprom array utilizing cells programmed using source side injection | |
TW363229B (en) | PMOS single-poly non-volatile memory structure | |
TW285777B (en) | PMOS flash EEPROM cell with single poly | |
KR970030850A (ko) | Pmos 단일 다결정 비휘발성 메모리 구조체 | |
US5790460A (en) | Method of erasing a flash EEPROM memory | |
US7372734B2 (en) | Methods of operating electrically alterable non-volatile memory cell | |
TW286406B (en) | Non-volatile electrically erasable memory with PMOS transistor NAND gate structure | |
JPH098153A (ja) | 不揮発性半導体記憶装置 | |
ATE203852T1 (de) | Pmos-flash-speicherzelle mit mehrstufiger schwellspannung | |
US6137721A (en) | Memory device having erasable frohmann-bentchkowsky EPROM cells that use a plate-to-floating gate coupled voltage during erasure | |
US6130840A (en) | Memory cell having an erasable Frohmann-Bentchkowsky memory transistor | |
KR920001402B1 (ko) | 불휘발성 반도체 기억소자 | |
US20070210369A1 (en) | Single gate-non-volatile flash memory cell | |
JPH06302828A (ja) | 半導体不揮発性記憶装置 | |
US20110101440A1 (en) | Two pfet soi memory cells | |
GB2349275A (en) | Eeprom cell with tunneling across entire separated channels | |
CN101022133A (zh) | 电可擦可编程非易失性存储装置与阵列及其操作方法 | |
US6850440B2 (en) | Method for improved programming efficiency in flash memory cells | |
US7969790B2 (en) | Method of erasing an NVM cell that utilizes a gated diode | |
US6348710B1 (en) | Non-volatile semiconductor memory device | |
US6061269A (en) | P-channel memory cell and method for forming the same | |
JPH0451072B2 (zh) |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK4A | Expiration of patent term of an invention patent |