TW200620575A - Hollow type semiconductor apparatus and its manufacture - Google Patents
Hollow type semiconductor apparatus and its manufactureInfo
- Publication number
- TW200620575A TW200620575A TW094138994A TW94138994A TW200620575A TW 200620575 A TW200620575 A TW 200620575A TW 094138994 A TW094138994 A TW 094138994A TW 94138994 A TW94138994 A TW 94138994A TW 200620575 A TW200620575 A TW 200620575A
- Authority
- TW
- Taiwan
- Prior art keywords
- type semiconductor
- semiconductor apparatus
- surface side
- manufacture
- hollow type
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/0504—Holders; Supports for bulk acoustic wave devices
- H03H9/0514—Holders; Supports for bulk acoustic wave devices consisting of mounting pads or bumps
- H03H9/0523—Holders; Supports for bulk acoustic wave devices consisting of mounting pads or bumps for flip-chip mounting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/0032—Packages or encapsulation
- B81B7/007—Interconnections between the MEMS and external electrical signals
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/10—Mounting in enclosures
- H03H9/1007—Mounting in enclosures for bulk acoustic wave [BAW] devices
- H03H9/105—Mounting in enclosures for bulk acoustic wave [BAW] devices the enclosure being defined by a cover cap mounted on an element forming part of the BAW device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/146—Mixed devices
- H01L2924/1461—MEMS
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004337775 | 2004-11-22 | ||
JP2005149504A JP2006173557A (ja) | 2004-11-22 | 2005-05-23 | 中空型半導体装置とその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200620575A true TW200620575A (en) | 2006-06-16 |
TWI298913B TWI298913B (zh) | 2008-07-11 |
Family
ID=36594640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094138994A TW200620575A (en) | 2004-11-22 | 2005-11-07 | Hollow type semiconductor apparatus and its manufacture |
Country Status (3)
Country | Link |
---|---|
US (1) | US7476567B2 (zh) |
JP (1) | JP2006173557A (zh) |
TW (1) | TW200620575A (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107040231A (zh) * | 2016-02-04 | 2017-08-11 | 三星电机株式会社 | 声波滤波器装置、制造声波滤波器装置的封装件和方法 |
CN111003682A (zh) * | 2018-10-08 | 2020-04-14 | 凤凰先驱股份有限公司 | 电子封装件及其制法 |
TWI723606B (zh) * | 2018-12-14 | 2021-04-01 | 南韓商三星電機股份有限公司 | 聲波諧振器及其製造方法 |
US11431318B2 (en) | 2018-12-14 | 2022-08-30 | Samsung Electro-Mechanics Co., Ltd. | Acoustic resonator and method of manufacturing thereof |
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JP4889974B2 (ja) * | 2005-08-01 | 2012-03-07 | 新光電気工業株式会社 | 電子部品実装構造体及びその製造方法 |
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US7812416B2 (en) * | 2006-05-22 | 2010-10-12 | Cardiomems, Inc. | Methods and apparatus having an integrated circuit attached to fused silica |
US7763488B2 (en) * | 2006-06-05 | 2010-07-27 | Akustica, Inc. | Method of fabricating MEMS device |
JP4957123B2 (ja) * | 2006-08-25 | 2012-06-20 | 大日本印刷株式会社 | センサーユニットおよびその製造方法 |
WO2008023478A1 (fr) * | 2006-08-25 | 2008-02-28 | Murata Manufacturing Co., Ltd. | pièce électronique, et procédé de fabrication de la pièce électronique |
KR100750741B1 (ko) * | 2006-09-15 | 2007-08-22 | 삼성전기주식회사 | 캡 웨이퍼, 이를 구비한 반도체 칩, 및 그 제조방법 |
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US8508036B2 (en) * | 2007-05-11 | 2013-08-13 | Tessera, Inc. | Ultra-thin near-hermetic package based on rainier |
JP2009010261A (ja) * | 2007-06-29 | 2009-01-15 | Fujikura Ltd | 半導体パッケージおよびその製造方法 |
KR100878410B1 (ko) * | 2007-07-11 | 2009-01-13 | 삼성전기주식회사 | 수정 진동자 제조방법 |
US20090026619A1 (en) * | 2007-07-24 | 2009-01-29 | Northrop Grumman Space & Mission Systems Corp. | Method for Backside Metallization for Semiconductor Substrate |
DE102007044806A1 (de) * | 2007-09-20 | 2009-04-02 | Robert Bosch Gmbh | Mikromechanisches Bauelement und Verfahren zur Herstellung eines mikromechanischen Bauelements |
US7605466B2 (en) * | 2007-10-15 | 2009-10-20 | General Electric Company | Sealed wafer packaging of microelectromechanical systems |
DE102008005686B9 (de) * | 2008-01-23 | 2019-06-27 | Tdk Corporation | MEMS-Bauelement und Verfahren zur Herstellung eines MEMS-Bauelements |
JP5262136B2 (ja) * | 2008-01-28 | 2013-08-14 | 株式会社村田製作所 | 電子部品の製造方法 |
JP4966897B2 (ja) * | 2008-03-25 | 2012-07-04 | 株式会社フジクラ | 半導体パッケージの製造方法 |
US8410868B2 (en) | 2009-06-04 | 2013-04-02 | Sand 9, Inc. | Methods and apparatus for temperature control of devices and mechanical resonating structures |
US8476809B2 (en) * | 2008-04-29 | 2013-07-02 | Sand 9, Inc. | Microelectromechanical systems (MEMS) resonators and related apparatus and methods |
JP2009272229A (ja) * | 2008-05-09 | 2009-11-19 | Canon Inc | レーザ光を用いた接合方法ならびに気密容器の製造方法 |
US7863699B2 (en) * | 2008-05-21 | 2011-01-04 | Triquint Semiconductor, Inc. | Bonded wafer package module |
US8129888B2 (en) * | 2008-08-05 | 2012-03-06 | Daishinku Corporation | Sealing member of piezoelectric resonator device and manufacturing method therefor |
JP5111307B2 (ja) * | 2008-08-29 | 2013-01-09 | 京セラ株式会社 | 共振器、フィルタおよびデュプレクサ、ならびに共振器の製造方法 |
US9048811B2 (en) | 2009-03-31 | 2015-06-02 | Sand 9, Inc. | Integration of piezoelectric materials with substrates |
CN101533832A (zh) * | 2009-04-14 | 2009-09-16 | 李刚 | 微机电系统器件与集成电路的集成芯片及集成方法 |
EP2481703B1 (en) | 2011-01-27 | 2020-07-01 | Sensirion AG | Sensor protection |
WO2012124282A1 (ja) * | 2011-03-11 | 2012-09-20 | パナソニック株式会社 | センサ |
DE102011016554B4 (de) * | 2011-04-08 | 2018-11-22 | Snaptrack, Inc. | Waferlevel-Package und Verfahren zur Herstellung |
JP5344017B2 (ja) * | 2011-10-05 | 2013-11-20 | 三菱電機株式会社 | 基板間接続構造およびパッケージ |
US8963316B2 (en) | 2012-02-15 | 2015-02-24 | Advanced Semiconductor Engineering, Inc. | Semiconductor device and method for manufacturing the same |
US9225311B2 (en) | 2012-02-21 | 2015-12-29 | International Business Machines Corporation | Method of manufacturing switchable filters |
US8653634B2 (en) | 2012-06-11 | 2014-02-18 | Advanced Semiconductor Engineering, Inc. | EMI-shielded semiconductor devices and methods of making |
JP2014143289A (ja) * | 2013-01-23 | 2014-08-07 | Seiko Instruments Inc | 電子デバイスの製造方法、電子デバイス及び発振器 |
DE102013104407B4 (de) * | 2013-04-30 | 2020-06-18 | Tdk Corporation | Auf Waferlevel herstellbares Bauelement und Verfahren zur Herstellung |
DE102013106353B4 (de) * | 2013-06-18 | 2018-06-28 | Tdk Corporation | Verfahren zum Aufbringen einer strukturierten Beschichtung auf ein Bauelement |
KR20150023086A (ko) * | 2013-08-22 | 2015-03-05 | (주)와이솔 | 압전 소자 기반 진동 모듈 |
JP6516399B2 (ja) * | 2013-10-25 | 2019-05-22 | セイコーインスツル株式会社 | 電子デバイス |
US9876483B2 (en) * | 2014-03-28 | 2018-01-23 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator device including trench for providing stress relief |
US9374059B1 (en) * | 2015-01-06 | 2016-06-21 | Zhuhai Advanced Chip Carriers & Electronic Substrate Solutions Technologies Co. Ltd. | Film bulk acoustic resonator filter |
US20160329481A1 (en) * | 2015-05-04 | 2016-11-10 | Samsung Electro-Mechanics Co., Ltd. | Bulk acoustic wave resonator and filter including the same |
CN107181470B (zh) | 2016-03-10 | 2020-10-02 | 中芯国际集成电路制造(上海)有限公司 | 薄膜体声波谐振器、半导体器件及其制造方法 |
US11146232B2 (en) | 2018-06-15 | 2021-10-12 | Resonant Inc. | Transversely-excited film bulk acoustic resonator with reduced spurious modes |
US11929731B2 (en) | 2018-02-18 | 2024-03-12 | Murata Manufacturing Co., Ltd. | Transversely-excited film bulk acoustic resonator with optimized electrode mark, and pitch |
US20220116015A1 (en) | 2018-06-15 | 2022-04-14 | Resonant Inc. | Transversely-excited film bulk acoustic resonator with optimized electrode thickness, mark, and pitch |
US10911023B2 (en) | 2018-06-15 | 2021-02-02 | Resonant Inc. | Transversely-excited film bulk acoustic resonator with etch-stop layer |
US11936358B2 (en) | 2020-11-11 | 2024-03-19 | Murata Manufacturing Co., Ltd. | Transversely-excited film bulk acoustic resonator with low thermal impedance |
US11206009B2 (en) | 2019-08-28 | 2021-12-21 | Resonant Inc. | Transversely-excited film bulk acoustic resonator with interdigital transducer with varied mark and pitch |
US11323096B2 (en) | 2018-06-15 | 2022-05-03 | Resonant Inc. | Transversely-excited film bulk acoustic resonator with periodic etched holes |
US11264966B2 (en) | 2018-06-15 | 2022-03-01 | Resonant Inc. | Solidly-mounted transversely-excited film bulk acoustic resonator with diamond layers in Bragg reflector stack |
US11876498B2 (en) | 2018-06-15 | 2024-01-16 | Murata Manufacturing Co., Ltd. | Transversely-excited film bulk acoustic resonator with multiple diaphragm thicknesses and fabrication method |
US10826462B2 (en) | 2018-06-15 | 2020-11-03 | Resonant Inc. | Transversely-excited film bulk acoustic resonators with molybdenum conductors |
US11909381B2 (en) | 2018-06-15 | 2024-02-20 | Murata Manufacturing Co., Ltd. | Transversely-excited film bulk acoustic resonators with two-layer electrodes having a narrower top layer |
US11349452B2 (en) | 2018-06-15 | 2022-05-31 | Resonant Inc. | Transversely-excited film bulk acoustic filters with symmetric layout |
US11949402B2 (en) | 2020-08-31 | 2024-04-02 | Murata Manufacturing Co., Ltd. | Resonators with different membrane thicknesses on the same die |
US10917072B2 (en) | 2019-06-24 | 2021-02-09 | Resonant Inc. | Split ladder acoustic wave filters |
US11967945B2 (en) | 2018-06-15 | 2024-04-23 | Murata Manufacturing Co., Ltd. | Transversly-excited film bulk acoustic resonators and filters |
US11916539B2 (en) | 2020-02-28 | 2024-02-27 | Murata Manufacturing Co., Ltd. | Split-ladder band N77 filter using transversely-excited film bulk acoustic resonators |
US10998882B2 (en) | 2018-06-15 | 2021-05-04 | Resonant Inc. | XBAR resonators with non-rectangular diaphragms |
US11901878B2 (en) | 2018-06-15 | 2024-02-13 | Murata Manufacturing Co., Ltd. | Transversely-excited film bulk acoustic resonators with two-layer electrodes with a wider top layer |
US11870423B2 (en) | 2018-06-15 | 2024-01-09 | Murata Manufacturing Co., Ltd. | Wide bandwidth temperature-compensated transversely-excited film bulk acoustic resonator |
US11888463B2 (en) | 2018-06-15 | 2024-01-30 | Murata Manufacturing Co., Ltd. | Multi-port filter using transversely-excited film bulk acoustic resonators |
US11251769B2 (en) | 2018-10-18 | 2022-02-15 | Skyworks Solutions, Inc. | Bulk acoustic wave components |
KR102574417B1 (ko) * | 2018-11-02 | 2023-09-04 | 삼성전기주식회사 | 박막형 패키지 |
WO2020138278A1 (ja) * | 2018-12-26 | 2020-07-02 | 京セラ株式会社 | 電子部品の接合方法および接合構造体 |
CN111371424A (zh) * | 2018-12-26 | 2020-07-03 | 中芯集成电路(宁波)有限公司上海分公司 | 控制电路与体声波滤波器的集成方法和集成结构 |
CN113615083A (zh) | 2019-03-14 | 2021-11-05 | 谐振公司 | 带有半λ介电层的横向激励的薄膜体声波谐振器 |
WO2020203044A1 (ja) * | 2019-03-29 | 2020-10-08 | 株式会社村田製作所 | 振動子及び振動子の製造方法 |
CN112039458B (zh) * | 2019-07-19 | 2023-11-24 | 中芯集成电路(宁波)有限公司上海分公司 | 体声波谐振器的封装方法及封装结构 |
US11811391B2 (en) | 2020-05-04 | 2023-11-07 | Murata Manufacturing Co., Ltd. | Transversely-excited film bulk acoustic resonator with etched conductor patterns |
CN113054092B (zh) * | 2021-06-01 | 2021-08-24 | 绍兴中芯集成电路制造股份有限公司 | 一种器件及其封装方法 |
WO2023199375A1 (ja) * | 2022-04-11 | 2023-10-19 | 三菱電機株式会社 | 中空パッケージ |
Family Cites Families (12)
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JPH06283619A (ja) | 1993-03-30 | 1994-10-07 | Nippon Steel Corp | 高周波回路素子およびその製造方法 |
JP3328102B2 (ja) | 1995-05-08 | 2002-09-24 | 松下電器産業株式会社 | 弾性表面波装置及びその製造方法 |
JP3039463B2 (ja) * | 1997-07-29 | 2000-05-08 | 日本電気株式会社 | 半導体装置及びその製造方法 |
US6228675B1 (en) | 1999-07-23 | 2001-05-08 | Agilent Technologies, Inc. | Microcap wafer-level package with vias |
JP2001110946A (ja) | 1999-10-05 | 2001-04-20 | Toshiba Corp | 電子デバイスおよびその製造方法 |
GB0016861D0 (en) * | 2000-07-11 | 2000-08-30 | Univ Cranfield | Improvements in or relating to filters |
KR100396551B1 (ko) * | 2001-02-03 | 2003-09-03 | 삼성전자주식회사 | 웨이퍼 레벨 허메틱 실링 방법 |
JP4241160B2 (ja) * | 2002-04-22 | 2009-03-18 | 富士フイルム株式会社 | 固体撮像装置の製造方法 |
US6713314B2 (en) * | 2002-08-14 | 2004-03-30 | Intel Corporation | Hermetically packaging a microelectromechanical switch and a film bulk acoustic resonator |
US20040166603A1 (en) | 2003-02-25 | 2004-08-26 | Carley L. Richard | Micromachined assembly with a multi-layer cap defining a cavity |
JP2005109221A (ja) | 2003-09-30 | 2005-04-21 | Toshiba Corp | ウェーハレベルパッケージ及びその製造方法 |
US6856014B1 (en) * | 2003-12-29 | 2005-02-15 | Texas Instruments Incorporated | Method for fabricating a lid for a wafer level packaged optical MEMS device |
-
2005
- 2005-05-23 JP JP2005149504A patent/JP2006173557A/ja not_active Abandoned
- 2005-11-07 TW TW094138994A patent/TW200620575A/zh not_active IP Right Cessation
- 2005-11-18 US US11/281,517 patent/US7476567B2/en active Active
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107040231A (zh) * | 2016-02-04 | 2017-08-11 | 三星电机株式会社 | 声波滤波器装置、制造声波滤波器装置的封装件和方法 |
CN107040231B (zh) * | 2016-02-04 | 2020-06-23 | 三星电机株式会社 | 声波滤波器装置、制造声波滤波器装置的封装件和方法 |
CN111003682A (zh) * | 2018-10-08 | 2020-04-14 | 凤凰先驱股份有限公司 | 电子封装件及其制法 |
TWI723606B (zh) * | 2018-12-14 | 2021-04-01 | 南韓商三星電機股份有限公司 | 聲波諧振器及其製造方法 |
US11431318B2 (en) | 2018-12-14 | 2022-08-30 | Samsung Electro-Mechanics Co., Ltd. | Acoustic resonator and method of manufacturing thereof |
Also Published As
Publication number | Publication date |
---|---|
US7476567B2 (en) | 2009-01-13 |
TWI298913B (zh) | 2008-07-11 |
JP2006173557A (ja) | 2006-06-29 |
US20060131731A1 (en) | 2006-06-22 |
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Legal Events
Date | Code | Title | Description |
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MM4A | Annulment or lapse of patent due to non-payment of fees |