TW200615616A - Electro-optical device, electronic apparatus, and mounting structure - Google Patents

Electro-optical device, electronic apparatus, and mounting structure

Info

Publication number
TW200615616A
TW200615616A TW094123578A TW94123578A TW200615616A TW 200615616 A TW200615616 A TW 200615616A TW 094123578 A TW094123578 A TW 094123578A TW 94123578 A TW94123578 A TW 94123578A TW 200615616 A TW200615616 A TW 200615616A
Authority
TW
Taiwan
Prior art keywords
substrate
terminals
terminal pairs
electro
crack diagnostic
Prior art date
Application number
TW094123578A
Other languages
English (en)
Inventor
Kenichi Hasegawa
Atsunari Tsuda
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of TW200615616A publication Critical patent/TW200615616A/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/2092—Details of a display terminals using a flat panel, the details relating to the control arrangement of the display terminal and to the interfaces thereto
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0421—Structural details of the set of electrodes
    • G09G2300/0426—Layout of electrodes and connections
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/367—Control of matrices with row and column drivers with a nonlinear element in series with the liquid crystal cell, e.g. a diode, or M.I.M. element
TW094123578A 2004-07-23 2005-07-12 Electro-optical device, electronic apparatus, and mounting structure TW200615616A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004215330A JP2006038988A (ja) 2004-07-23 2004-07-23 電気光学装置、電子機器、および実装構造体

Publications (1)

Publication Number Publication Date
TW200615616A true TW200615616A (en) 2006-05-16

Family

ID=35904080

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094123578A TW200615616A (en) 2004-07-23 2005-07-12 Electro-optical device, electronic apparatus, and mounting structure

Country Status (5)

Country Link
US (1) US7245143B2 (zh)
JP (1) JP2006038988A (zh)
KR (1) KR100731400B1 (zh)
CN (1) CN100378510C (zh)
TW (1) TW200615616A (zh)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006091239A (ja) * 2004-09-22 2006-04-06 Seiko Epson Corp 電気光学装置用基板及び電気光学装置、並びに検査方法
JP4881030B2 (ja) * 2006-02-18 2012-02-22 セイコーインスツル株式会社 表示装置
JP4872468B2 (ja) * 2006-06-06 2012-02-08 株式会社デンソー 半導体装置
EP1892535A1 (fr) * 2006-08-25 2008-02-27 Stmicroelectronics Sa Procédé de test électrique d' un circuit intégré
JP2008191400A (ja) * 2007-02-05 2008-08-21 Toshiba Matsushita Display Technology Co Ltd 液晶表示装置
CN101652705B (zh) * 2007-04-25 2012-05-30 夏普株式会社 液晶显示面板及其检查方法
JP5286818B2 (ja) * 2008-02-21 2013-09-11 セイコーエプソン株式会社 電気光学装置及び電子機器
TWI400442B (zh) * 2008-09-01 2013-07-01 Innolux Corp A detection method for a detection device and a panel
US8400177B2 (en) * 2008-09-01 2013-03-19 Chimei Innolux Corporation Device and method for testing display panel
WO2011036751A1 (ja) * 2009-09-24 2011-03-31 株式会社 東芝 電子機器および損傷検出方法
JP2013047697A (ja) * 2009-12-21 2013-03-07 Sharp Corp 表示装置用パネルおよびその製造方法
JP5506034B2 (ja) * 2010-01-19 2014-05-28 株式会社ジャパンディスプレイ 液晶表示装置および電子機器
JP5585102B2 (ja) * 2010-02-01 2014-09-10 カシオ計算機株式会社 アクティブマトリクス型表示パネル用基板とこれを用いた液晶表示パネル
JP5513262B2 (ja) 2010-06-02 2014-06-04 株式会社ジャパンディスプレイ 表示装置
JP5100823B2 (ja) * 2010-06-25 2012-12-19 日本航空電子工業株式会社 バックライトアセンブリ、バックライトユニット、及び液晶表示装置
JP5636255B2 (ja) * 2010-10-20 2014-12-03 株式会社ユーシン 電動ステアリングロック装置
US10082689B2 (en) 2014-01-16 2018-09-25 Huawei Device (Dongguan) Co., Ltd. Liquid crystal display, liquid crystal display testing method, and electronic apparatus
CN103792702B (zh) * 2014-01-23 2016-09-07 北京京东方光电科技有限公司 具有检测框的基板及其制造方法、检测装置
JP2014139829A (ja) * 2014-03-27 2014-07-31 Japan Display Inc 表示装置
CN104240625B (zh) * 2014-08-19 2017-11-07 合肥鑫晟光电科技有限公司 一种显示装置及其检测方法
KR102460323B1 (ko) 2018-03-08 2022-10-28 삼성전자주식회사 하나 이상의 지정된 핀을 이용하여 디스플레이의 상태를 결정하기 위한 전자 장치
KR102531042B1 (ko) * 2018-04-05 2023-05-15 삼성전자 주식회사 디스플레이에 형성된 개구에 인접한 영역에서 발생된 크랙을 검출하기 위한 배선을 포함하는 디스플레이 장치 및 그를 포함하는 전자 장치
EP3809193A1 (en) * 2019-10-17 2021-04-21 ALCAN Systems GmbH Panel damage detection arrangement
FR3114882B1 (fr) 2020-10-01 2023-05-12 St Microelectronics Rousset Circuit de test

Family Cites Families (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4835466A (en) * 1987-02-06 1989-05-30 Fairchild Semiconductor Corporation Apparatus and method for detecting spot defects in integrated circuits
JP2650949B2 (ja) * 1988-03-14 1997-09-10 株式会社日立製作所 液晶表示装置
JPH0595036A (ja) * 1991-10-01 1993-04-16 Seiko Epson Corp 半導体装置
JPH05173164A (ja) * 1991-12-25 1993-07-13 Sanyo Electric Co Ltd 液晶表示パネル
JPH05315418A (ja) 1992-05-11 1993-11-26 Toshiba Corp 障害検出機能付き集積回路
JP2711616B2 (ja) * 1992-06-12 1998-02-10 スタンレー電気株式会社 液晶表示素子
JPH0682802A (ja) * 1992-08-31 1994-03-25 Hitachi Ltd 液晶表示装置
JPH08190087A (ja) * 1995-01-09 1996-07-23 Hitachi Ltd 液晶表示パネル作製用透明絶縁基板およびその各種特性検査方法
JP3444028B2 (ja) * 1995-06-16 2003-09-08 ソニー株式会社 表示用半導体装置及び表示装置
JP3569072B2 (ja) * 1996-05-09 2004-09-22 セイコーエプソン株式会社 セラミック基板のクラック検査方法
TW329002B (en) * 1996-06-05 1998-04-01 Zenshin Test Co Apparatus and method for inspecting a LCD substrate
JP4147594B2 (ja) * 1997-01-29 2008-09-10 セイコーエプソン株式会社 アクティブマトリクス基板、液晶表示装置および電子機器
US6734925B1 (en) * 1998-12-07 2004-05-11 Samsung Electronics Co., Ltd. Multiple testing bars for testing liquid crystal display and method thereof
TW486806B (en) * 1998-10-30 2002-05-11 Hitachi Ltd Semiconductor integrated circuit apparatus and IC card
JP2000216230A (ja) * 1999-01-27 2000-08-04 Hitachi Ltd Ｔｆｔ基板固定用治具及びｔｆｔ基板の断線検出装置
US6437596B1 (en) * 1999-01-28 2002-08-20 International Business Machines Corporation Integrated circuits for testing a display array
JP3792931B2 (ja) * 1999-03-15 2006-07-05 株式会社東芝 半導体装置およびそのテスト方法
JP2000276369A (ja) 1999-03-24 2000-10-06 Seiko Epson Corp バスブリッジ回路、ａｓｉｃ、及び電子機器
JP2001156417A (ja) * 1999-11-30 2001-06-08 Optrex Corp 回路基板間の接続状態検査用パターン
US6505317B1 (en) * 2000-03-24 2003-01-07 Sun Microsystems, Inc. System and method for testing signal interconnections using built-in self test
JP2002005850A (ja) 2000-06-22 2002-01-09 Toshiba Corp 欠陥検査方法及びその装置、マスクの製造方法
JP5053479B2 (ja) * 2000-09-14 2012-10-17 株式会社ジャパンディスプレイセントラル マトリクスアレイ基板及びその製造方法
JP2002098992A (ja) * 2000-09-22 2002-04-05 Toshiba Corp 液晶表示装置
JP3790684B2 (ja) * 2001-07-12 2006-06-28 インターナショナル・ビジネス・マシーンズ・コーポレーション 検査用回路、検査方法および液晶セルの製造方法
JP4069597B2 (ja) 2001-08-09 2008-04-02 セイコーエプソン株式会社 電気光学装置及び電子機器
JP2003215626A (ja) * 2002-01-23 2003-07-30 Seiko Epson Corp 液晶セルユニット、液晶装置および液晶装置の製造方法、並びに電子機器
JP2003215627A (ja) * 2002-01-23 2003-07-30 Seiko Epson Corp 液晶セルユニット、液晶装置、液晶装置の製造方法、並びに電子機器
JP2003241219A (ja) * 2002-02-18 2003-08-27 Matsushita Electric Ind Co Ltd 液晶表示装置
JP2003255853A (ja) * 2002-03-06 2003-09-10 Seiko Epson Corp 電気光学装置、および電子機器
KR100425765B1 (ko) * 2002-04-12 2004-04-01 엘지.필립스 엘시디 주식회사 액정표시장치
JP4292770B2 (ja) * 2002-09-20 2009-07-08 セイコーエプソン株式会社 リーク検査装置及びリーク検査方法
KR100479525B1 (ko) * 2002-12-31 2005-03-31 엘지.필립스 엘시디 주식회사 다수의 어레이셀을 포함하는 액정표시장치용 기판 및 이의 제조방법
KR20050053407A (ko) * 2003-12-02 2005-06-08 엘지.필립스 엘시디 주식회사 액정표시장치용 어레이기판

Also Published As

Publication number Publication date
KR100731400B1 (ko) 2007-06-21
US7245143B2 (en) 2007-07-17
US20060038580A1 (en) 2006-02-23
JP2006038988A (ja) 2006-02-09
CN100378510C (zh) 2008-04-02
CN1725064A (zh) 2006-01-25
KR20060053973A (ko) 2006-05-22

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