TW200530429A - Ni-Pt alloy and target comprising the alloy - Google Patents
Ni-Pt alloy and target comprising the alloy Download PDFInfo
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- TW200530429A TW200530429A TW094105007A TW94105007A TW200530429A TW 200530429 A TW200530429 A TW 200530429A TW 094105007 A TW094105007 A TW 094105007A TW 94105007 A TW94105007 A TW 94105007A TW 200530429 A TW200530429 A TW 200530429A
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- 229910001260 Pt alloy Inorganic materials 0.000 title claims abstract description 32
- 229910045601 alloy Inorganic materials 0.000 title claims description 12
- 239000000956 alloy Substances 0.000 title claims description 12
- 238000000034 method Methods 0.000 claims abstract description 24
- 238000004519 manufacturing process Methods 0.000 claims abstract description 23
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims abstract description 14
- 239000002994 raw material Substances 0.000 claims abstract description 14
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 11
- 239000000843 powder Substances 0.000 claims abstract description 11
- 239000012535 impurity Substances 0.000 claims abstract description 9
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 claims abstract description 8
- 238000002386 leaching Methods 0.000 claims abstract description 5
- 229910000008 nickel(II) carbonate Inorganic materials 0.000 claims abstract description 5
- ZULUUIKRFGGGTL-UHFFFAOYSA-L nickel(ii) carbonate Chemical compound [Ni+2].[O-]C([O-])=O ZULUUIKRFGGGTL-UHFFFAOYSA-L 0.000 claims abstract description 5
- 239000002253 acid Substances 0.000 claims abstract description 4
- 239000001569 carbon dioxide Substances 0.000 claims abstract description 4
- 229910002092 carbon dioxide Inorganic materials 0.000 claims abstract description 4
- 238000001914 filtration Methods 0.000 claims abstract description 3
- 238000007664 blowing Methods 0.000 claims abstract 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 7
- 229910052737 gold Inorganic materials 0.000 claims description 6
- 239000010931 gold Substances 0.000 claims description 6
- 238000004070 electrodeposition Methods 0.000 claims description 4
- 238000002844 melting Methods 0.000 claims description 4
- 230000008018 melting Effects 0.000 claims description 4
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 claims description 3
- 238000003723 Smelting Methods 0.000 claims description 3
- 235000011114 ammonium hydroxide Nutrition 0.000 claims description 3
- 238000006386 neutralization reaction Methods 0.000 claims description 3
- 239000000126 substance Substances 0.000 claims description 3
- 238000010309 melting process Methods 0.000 claims description 2
- 238000003490 calendering Methods 0.000 claims 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 abstract description 4
- 229910021529 ammonia Inorganic materials 0.000 abstract description 2
- 238000005868 electrolysis reaction Methods 0.000 abstract description 2
- 238000004090 dissolution Methods 0.000 abstract 1
- 230000003472 neutralizing effect Effects 0.000 abstract 1
- 239000000243 solution Substances 0.000 description 9
- 230000000694 effects Effects 0.000 description 7
- 238000005096 rolling process Methods 0.000 description 5
- 239000013078 crystal Substances 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 239000010985 leather Substances 0.000 description 2
- 229910001029 Hf alloy Inorganic materials 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 235000019687 Lamb Nutrition 0.000 description 1
- 240000000233 Melia azedarach Species 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- 229910018553 Ni—O Inorganic materials 0.000 description 1
- 241000237502 Ostreidae Species 0.000 description 1
- 241001494479 Pecora Species 0.000 description 1
- 238000005054 agglomeration Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- QZPSXPBJTPJTSZ-UHFFFAOYSA-N aqua regia Chemical compound Cl.O[N+]([O-])=O QZPSXPBJTPJTSZ-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- AQLMHYSWFMLWBS-UHFFFAOYSA-N arsenite(1-) Chemical compound O[As](O)[O-] AQLMHYSWFMLWBS-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000002775 capsule Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000009770 conventional sintering Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000005518 electrochemistry Effects 0.000 description 1
- 239000002659 electrodeposit Substances 0.000 description 1
- 239000008151 electrolyte solution Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 210000004907 gland Anatomy 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 235000020636 oyster Nutrition 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000004663 powder metallurgy Methods 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
- 238000005477 sputtering target Methods 0.000 description 1
- 210000002784 stomach Anatomy 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C19/00—Alloys based on nickel or cobalt
- C22C19/03—Alloys based on nickel or cobalt based on nickel
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F9/00—Making metallic powder or suspensions thereof
- B22F9/16—Making metallic powder or suspensions thereof using chemical processes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F9/00—Making metallic powder or suspensions thereof
- B22F9/16—Making metallic powder or suspensions thereof using chemical processes
- B22F9/18—Making metallic powder or suspensions thereof using chemical processes with reduction of metal compounds
- B22F9/24—Making metallic powder or suspensions thereof using chemical processes with reduction of metal compounds starting from liquid metal compounds, e.g. solutions
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25C—PROCESSES FOR THE ELECTROLYTIC PRODUCTION, RECOVERY OR REFINING OF METALS; APPARATUS THEREFOR
- C25C1/00—Electrolytic production, recovery or refining of metals by electrolysis of solutions
- C25C1/20—Electrolytic production, recovery or refining of metals by electrolysis of solutions of noble metals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/28008—Making conductor-insulator-semiconductor electrodes
- H01L21/28017—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon
- H01L21/28026—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor
- H01L21/28088—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor the final conductor layer next to the insulator being a composite, e.g. TiN
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- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Electrochemistry (AREA)
- Physical Vapour Deposition (AREA)
- Manufacture And Refinement Of Metals (AREA)
- Manufacture Of Metal Powder And Suspensions Thereof (AREA)
Description
200530429 九、發明說明: 【發明所屬之技術領域】 本發明係關於,腺+ J、將加工性優異之m-Pt入今另η 金錠進行壓延而制β1 孟及Ni-Pt合 仃土I而衣成之濺鍍靶及其製造方法。 【先前技術】 半導體裝置用之賤鍍乾雖使用著n :二係以粉末冶金法來製造。亦即,將二= 進仃燒結來製造,或將N彳 一 Pt粉 ^ Pt s金粉進行燒結以製作 而燒結品’由於無法成為100%之高密广乍: 鑄再壓延而製成之革巴相比,其緻密性較差。一口炫 因此氣體成分容胃& A ^ t 引起革巴Φ夕H A a & 卜S 1〜、、也度降低、並 八带放電、誘發顆粒的產, 特性變差之原因。 成為引起成膜 另一方面,Ni-Pt熔鑄品有非堂 若將M· D力 有非吊硬且脆之問題。因此, ^狀^;㈣延則會產生晶界裂痕,而有無法製造 、,:1 均一之乾的問題。此等,即為以往使用上 心4末冶金法製造之原因。 由於以上所述,而有不產峰蠢 出(例如,參照術獻〗)。 ❿料峨 粒之=利文貞卜基於裂痕發生之原因係乾中粗大結晶 用二:呈為了將其微細化’而準傷熱容量大之模具或使 制結晶之粗大化。 …错由急速冷卻來抑 然而,專利文獻】中,為了準備熱容量大之模具或使 5 200530429 用水冷模具, 非相當快則難 而有設備大型化之缺點, 以抑制結晶粗大化之問題 且亦有冷卻速度若 々接觸模具時結晶為 丨迅―网俱具而變大, 故難以形成均一之相鸩 而亡么、,a 革 之、、且、哉而有無法製造組織均一且安定之 專利文獻1 :日本特開昭63-33563 【發明内容】
本發明係以提供安定且效率佳之製造壓延靶之技術為 目的其可降低Nl_Pt合金錠之硬度而能進行壓延。 為解決上述問題點,發現藉由提 卜以 可顯著降低队PW金錠之硬度。 ^、、、屯度 土於此t現,本發明,係提供:(1) 一種加工性優显之 Pt合金及Nl七合金乾,其特徵在於,係Pt含量為 〇」〜2〇/〇之Nl_Pt合金,且維氏硬度(Vickers hardness)為 40 90’(2)如⑴之Nl-pt合金及Ni pt合金革巴,其具有99 99% 以上之純度。 又本毛明又提供··(3)一種加工性優異Ni-Pt合金之製 造方法,.其特徵在於包含下列製程:溶煉製程,將純度3n 級之原料N!實·施電氣化學熔煉;中和製程,將電解遞渡 合液X氨水中和,雜質除去製程,使用活性碳過濾以去 除雜質;製造高純《%粉製程,將二氧化碳吹入作成碳 酸鎳,再於還原性環境氣氛下製造高純度;瀝濾製 H將舲純度3N級之原料Pt以酸瀝濾;製造高純度電沉 牙貝Pt衣私將瀝濾之溶液以電解製造高純度電沉積pt ; 200530429 以及將由上述製程製得之高純度Nl 4八啟a „命币 N1粉與南純度電沉積Pt
進行熔煉之製程;(4)如η)之Ni-pt人A 、;1 ; Nl Pt合金之製造方法,其具 有99.99%以上之純度;^ (勾之NhPt合金之製造方法, 其h含量為(M韻之Nl_Pt合金、且維氏硬度為4〇〜9〇。 又,本發明提供:⑻一種Νι七合錄之製造方法, 其特徵在於,將由〜(5)中任一 貝表矛壬製得熔煉後之Ni-Pt 合金錠進行壓延。 本發明,藉此,不需用以抑制处 丨市J恕晶之粗大化、或加速 &卻速度之設備,例如,準備埶 ^ + 1有熱谷置大之模具或使用水冷 模具’而能容易地將熔煉後之Ni 攸< W卜Pt合金錠於低溫進行壓 延,同時可減低Nl_Pt合金鍵 _ Μ 3之不純物而達成高純度 精此’可具有能提昇Ni_pt合全成 ^ 口孟成臈品質之優異效果。 再者’藉此防止裂痕或刹綠 立 表m縫之產生’並對抑制習知之 燒結靶中常發生之里堂访φ 之異吊放電所引起之顆粒產生,具有顯著 t效果。 【實施方式】 二本务明,可適用於Pt含量為0·1〜20wt%2 Ni-Pt合金。 該成分組成,係半導體裝、“ T iNl以口金材枓成杈時所需 ’本發明亦為可降低硬度之NPt合金或羊巴之电 :本發明之^合金所得之維氏硬度為40〜90。 ^ Nl中所含Pt量之增加硬度(維氏硬度Hv)亦隨之 八對‘貝置亦有很大的影響。純度為3Ν級時, 隨著Ni中所冬m旦 又叶’ 斤b Pt $之增加硬度隨之速上 2〇wt%Pt附近時 汁於Np <可硬度達Hv130左右。 200530429 • * 如此於硬度上昇狀况下對錠進行壓 見方4别、& h 由晶界產生裂痕。 形’當然會 化之Nl,合金,由 而維氏硬度係於40〜9〇範 。此點係本發明之一大特 相對於此,本發明之高純度 wt°/〇至20wt%硬度係缓緩增加, 圍内之可進行低溫壓延之範圍 徵0 未滿Pt 〇」Wt%時,則無法得到作為Nipt八么 分之特性,若超過Pt 20 wt%,則因過 :金之充 加工,故將Pt含量定為O.bH 難以進行革巴之 藉此,防止裂痕或裂縫之產生, …發生之異常放電所引起之:粒產T:卩 果。 /主土 共令顯著之效 99.99%以上之純 ’而可進行低溫 本發明之Ni-Pt合金及該靶係具有 又藉此’可使維氏硬度於40〜90範圍内 壓延。 以下說明如此加工性優異之Ni_pt合金之製造方法。 關^ Nl原料,首先將純度3N級之原料Nl進行電氣化學 :生1煉’其次’將該電解遞濾、之溶液以氨水中#,再將中 和後之溶液使用活性碳將雜質過濾除去。 ro接著,將二氧化碳吹入該溶液作成碳酸鎳,再將其於 遇原性環境氣氛下製造高純度Nl粉。 、 另一方面,關於Pt原料,將純度3N級之原料Pt以酸 瀝濾’再將該瀝濾之溶液以電解製造高純度電沉積Pt。 接著’將由上述製程製得之高純度Ni粉與高純度電沉 8 200530429 積Pt進行熔煉。該等Ni-pt合金係具有99·99% ( 4N)以 上之純度。 再者,如此製得Pt含量(U〜20wt%之熔鑄Ni_pt合金 錠,其維氏硬度為40〜90。該錠,如上述係加工性優異。 如此製造之熔煉後之Nl-Pt合金錠,可藉由低溫壓延 容易地製造Ni-Pt合金靶。 並且’可防止裂痕或裂縫之產生,並對抑制習知之燒
結革巴中常發生之異常放電所引起之顆粒產i,具有顯著之 效果。 實施例 、,接著,說明本發明之實施例。又,本實施例僅為一例, I不,此例而產生任何限制。亦~,包含於本發明技術思 心、之1(1圍内之全部實施例以外之樣態或變形。 實施例] '使用表1所示之純度3N級之Νι原料啊作為陽極, 以鹽酸溶液進杆雷自2、、莊、全 丁甩解歷慮。到達i 〇〇g/L之時間點,以氨水 將該溶液中和,传·^氩 使PH為8。再加入活性碳10g/]L於該溶液 中進行過濾除去雜質。
接者’將二f Μ ―山A 羊L G ^人入該溶液作成碳酸鎳。之後,於 溫度1 2 0 0 〇C氫氧广y、四 4 I %境氣氛下進行加熱處理,製得高 純度Ni粉8kg。 另一方面, 煉。調整pH至 電解沉積時之陽 使用純度3N級之Pt 5kg,將其以王水熔 2 ’進行電解沉積製得高純度電沉積pt。 極使用碳。 9 200530429 將如此製得之高純度Ni粉與高純度電沉積pt,於真 空度1 〇托之真空下進彳亍、丨谷煉,製得南純度N i - 2 0 % p t ^ 金。該合金之硬度為Hv80。將其於室溫進行壓延製成靶 該靶不會產生龜裂、裂痕且壓延容易。該結果示 y、於表 表1 (wtppm) 原料Ni 原料Pt 南純度Ni 高純度Pt 實施例1 Fe 110 10 2.1 1.0 1.7 Cr 50 2 0.6 0.5 0.6 — Co 60 5 0.5 0.2 0.4 ’ Cu 30 4 0.1 0.1 0.1 ' A1 10 8 0.1 0.1 0.1 ^ 〇 150 70 20 <10 10 ^ C 80 20 10 <10 10 ^0— '^Πο— N 30 10 <10 Γ <10 卜<10〜 硬度 100 40 70 30 80 ~ 室溫之塑性加工性 △ 〇 〇 ◎ ◎〜 實施例2 該 與貝他例1以相同方法製作高純度Ni-O jo/oPt合6 忒合金之硬度為Hv45。將其於室溫進行壓延製成靶。 靶不會產生龜裂、裂痕且壓延容易。該結果示於表2。 實施例3 與實施例1以相同方法製作高純度Nl_5%pt合金。上 合金之硬度為Hv55。將其於室溫進行壓延製成靶。上^ 。該萃巴 10 200530429 不會產生龜裂、裂痕且壓延容易。該結果示於表2 實施例4 1以相同方法製作高純度NM 〇%pt八々 ^ Hv65。將其於室溫進行壓延製成靶。該= 、裂痕且壓延容易。該結果示於表 與實施例 合金之硬度為 不會產生龜裂 表2 (wtppm)
貫施例2 實施例3 實施例4 Fe ~ 2.0 1.9 1.8 Cr 0.6 0.6 0.6 Co — 0.5 0.5 05 Cu ~ 0.1 0.1 0.1 A1 01 0.1 0.1 〇 20 20 20 — C 10 10 10 N <10 <10 <10 硬度 45 55 65 ' 室溫之塑性加工性 ◎ ◎ ◎ 比較例1 將純度3N級之]sii與同純度之pt以作成Ni-20wt%Pt 之方式進行炫煉。其結果,製得之錠之硬度為Ην π 〇。該 錠非常硬’於室溫難以進行塑性加工。其結果與實施例相 對比而示於表1。 如以上所述,本發明,熔煉後之N!-Pt合金錠可容易 進行低溫壓延,並且同時可減低Ni_pt合金錠所含之不純 物而達成高純度化,藉此,可具有能提昇Ni、pt合金成膜 200530429 * » 品質之優異效果。 再者,藉此防止裂痕或裂缝之產生,並對抑制習知之 燒結靶中常發生之異常放電所引起之顆粒產生,具有顯著 之效果。因此,適於半導體裝置之Ni-Pt合金之成膜。 【圖式簡單說明】 益 4 【主要元件符號說明】 無
12
Claims (1)
- 200530429 十、申請專利範圍: ’其特徵在於,pt含 工性優異之N i - P t合 k 一種加工性優異之Ni-Pt合金 量為〇· 1〜20%,維氏硬度為40〜9〇。 2·如申請專利範圍第1項之加 金’其具有99.99%以上之純度。 3二—種Nl_pt合金靶,其加工性優異,且其特徵在於’ Pt含為〇.1〜2〇%,維氏硬度為4〇〜9〇。4.如申請專利範圍第3項之N〗-Pt合金靶,其具有 99.99%以上之純度。 一 5· —種加工性優異之Nl_Pt合金之製造方法,其特徵 在於包含下列製程:熔煉製程,將純度3N級之原料Nl實 施電氣化學熔煉;中和製程,將電解瀝濾之溶液以氨水中 和;雜質除去製程,使用活性碳過濾以去除雜質;製造高 純度N:i粉製程,將二氧化碳吹入作成碳酸鎳,再於還原 性環境氣氛下製造高純度Nl粉;瀝濾製程,將將純度3n 級之原料Pt以酸瀝濾;製造高純度電沉積pt製程,將瀝 滤之溶液以電解製造高純度電沉積Pt ;以及將由上述製程 衣传之而純度Ni粉與高純度電沉積Pt進行熔煉之製程。 6 ·如申凊專利範圍第6項之加工性優異之n i - p t合金 革巴之製造方法,其中,該NbPt合金靶具有99.99%以上之 純度。 7·如申請專利範圍第5或第6項之加工性優異之Νι- Pt 口金把之製造方法,其中,pt含量為〇1〜2〇%,維氏硬 度為4〇〜90 〇 13 -200530429 8. —種Ni-Pt合金靶之製造方法,其特徵在於,將以 申請專利範圍第5〜第7項中任一項之製造方法所製得之熔 煉後N i - P t合金I定進行壓延。 十一、圖式: 無。 14 200530429 七、指定代表圖: (一) 本案指定代表圖為:第(無)圖。 (二) 本代表圖之元件符號簡單說明: 無 八、本案若有化學式時,請揭示最能顯示發明特徵的化學式:
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EP1721997B1 (en) | 2012-03-28 |
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KR20060114384A (ko) | 2006-11-06 |
JPWO2005083138A1 (ja) | 2007-11-22 |
EP2468906A1 (en) | 2012-06-27 |
US7959782B2 (en) | 2011-06-14 |
JP5113134B2 (ja) | 2013-01-09 |
TWI264480B (en) | 2006-10-21 |
CN1926254A (zh) | 2007-03-07 |
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