TW200506105A - Improved tin plating method - Google Patents
Improved tin plating methodInfo
- Publication number
- TW200506105A TW200506105A TW093113045A TW93113045A TW200506105A TW 200506105 A TW200506105 A TW 200506105A TW 093113045 A TW093113045 A TW 093113045A TW 93113045 A TW93113045 A TW 93113045A TW 200506105 A TW200506105 A TW 200506105A
- Authority
- TW
- Taiwan
- Prior art keywords
- plating method
- tin plating
- improved tin
- improved
- whiskers
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/244—Finish plating of conductors, especially of copper conductors, e.g. for pads or lands
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
- C25D5/022—Electroplating of selected surface areas using masking means
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/10—Electroplating with more than one layer of the same or of different metals
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/34—Pretreatment of metallic surfaces to be electroplated
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/615—Microstructure of the layers, e.g. mixed structure
- C25D5/617—Crystalline layers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/623—Porosity of the layers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/627—Electroplating characterised by the visual appearance of the layers, e.g. colour, brightness or mat appearance
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/03—Contact members characterised by the material, e.g. plating, or coating materials
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/03—Metal processing
- H05K2203/0392—Pretreatment of metal, e.g. before finish plating, etching
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/382—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
- H05K3/383—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by microetching
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electroplating Methods And Accessories (AREA)
- Electroplating And Plating Baths Therefor (AREA)
- Chemically Coating (AREA)
- Lead Frames For Integrated Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0310722A GB0310722D0 (en) | 2003-05-12 | 2003-05-12 | Improved tin plating method |
| GB0311074A GB0311074D0 (en) | 2003-05-14 | 2003-05-14 | Improved tin plating method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200506105A true TW200506105A (en) | 2005-02-16 |
Family
ID=33031418
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW093113045A TW200506105A (en) | 2003-05-12 | 2004-05-10 | Improved tin plating method |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7695605B2 (enExample) |
| EP (1) | EP1477587A3 (enExample) |
| JP (1) | JP4603812B2 (enExample) |
| KR (1) | KR20040097895A (enExample) |
| CN (1) | CN1550577A (enExample) |
| TW (1) | TW200506105A (enExample) |
Families Citing this family (51)
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|---|---|---|---|---|
| DE102004003784B4 (de) | 2004-01-23 | 2011-01-13 | Ormecon Gmbh | Dispersion intrinsisch leitfähigen Polyanilins und deren Verwendung |
| DE102004030388A1 (de) | 2004-06-23 | 2006-01-26 | Ormecon Gmbh | Artikel mit einer Beschichtung von elektrisch leitfähigem Polymer und Verfahren zu deren Herstellung |
| DE102004030930A1 (de) * | 2004-06-25 | 2006-02-23 | Ormecon Gmbh | Zinnbeschichtete Leiterplatten mit geringer Neigung zur Whiskerbildung |
| US7736802B1 (en) | 2004-11-12 | 2010-06-15 | Greatbatch Ltd. | Electrochemical cell current collector comprising solid area for coated film measurements |
| DE102005010162B4 (de) | 2005-03-02 | 2007-06-14 | Ormecon Gmbh | Leitfähige Polymere aus Teilchen mit anisotroper Morphologie |
| JP4712439B2 (ja) * | 2005-05-17 | 2011-06-29 | 学校法人早稲田大学 | めっき液、めっき膜及びその作製方法 |
| WO2007002424A1 (en) * | 2005-06-24 | 2007-01-04 | Technic, Inc. | Silver barrier layer to minimize whisker growth in tin electrodeposits |
| DE102005039608A1 (de) | 2005-08-19 | 2007-03-01 | Ormecon Gmbh | Zusammensetzung mit intrinsisch leitfähigem Polymer |
| JP2007103586A (ja) * | 2005-10-03 | 2007-04-19 | Nitto Denko Corp | 配線回路基板の製造方法 |
| JP4811880B2 (ja) * | 2006-01-06 | 2011-11-09 | エントン インコーポレイテッド | 艶消し金属層を堆積するための電解液および工程 |
| WO2007082112A2 (en) * | 2006-01-06 | 2007-07-19 | Faraday Technology, Inc. | Tin and tin alloy electroplating method with controlled internal stress and grain size of the resulting deposit |
| US20070287022A1 (en) * | 2006-06-07 | 2007-12-13 | Honeywell International, Inc. | Intumescent paint coatings for inhibiting tin whisker growth and methods of making and using the same |
| US20070284700A1 (en) * | 2006-06-07 | 2007-12-13 | Honeywell International, Inc. | Coatings and methods for inhibiting tin whisker growth |
| US20070287023A1 (en) * | 2006-06-07 | 2007-12-13 | Honeywell International, Inc. | Multi-phase coatings for inhibiting tin whisker growth and methods of making and using the same |
| US20070295530A1 (en) * | 2006-06-07 | 2007-12-27 | Honeywell International, Inc. | Coatings and methods for inhibiting tin whisker growth |
| EP2062467B1 (en) | 2006-09-13 | 2012-02-15 | Enthone, Inc. | Article with a coating of electrically conductive polymer and precious/semiprecious metal and process for production thereof |
| US10231344B2 (en) | 2007-05-18 | 2019-03-12 | Applied Nanotech Holdings, Inc. | Metallic ink |
| US8404160B2 (en) | 2007-05-18 | 2013-03-26 | Applied Nanotech Holdings, Inc. | Metallic ink |
| DE202007018616U1 (de) * | 2007-09-14 | 2008-12-24 | Zollern Bhw Gleitlager Gmbh & Co. Kg | Gleitelement |
| KR100973007B1 (ko) * | 2008-01-29 | 2010-07-30 | 삼성전기주식회사 | 금속제품의 무전해 주석 환원 도금용 도금액 및 이를이용한 금속제품의 무전해 주석 환원 도금방법 |
| US8506849B2 (en) | 2008-03-05 | 2013-08-13 | Applied Nanotech Holdings, Inc. | Additives and modifiers for solvent- and water-based metallic conductive inks |
| KR100933091B1 (ko) | 2008-04-01 | 2009-12-21 | (주) 하정인더스트리 | 버스 플레이트 제조 방법 |
| US9730333B2 (en) | 2008-05-15 | 2017-08-08 | Applied Nanotech Holdings, Inc. | Photo-curing process for metallic inks |
| CN102027569B (zh) * | 2008-06-30 | 2013-03-13 | 艾格瑞系统有限公司 | 防止或减缓在金属膜上生长形成物 |
| ES2615337T3 (es) * | 2008-07-08 | 2017-06-06 | Enthone, Inc. | Electrolito y método para depositar una capa metálica mate |
| KR100940537B1 (ko) * | 2008-07-11 | 2010-02-11 | (주)대동아이텍 | 금속 패턴 형성 방법 |
| TW201012970A (en) * | 2008-08-08 | 2010-04-01 | Uyemura C & Co Ltd | Etchant for copper or copper alloy material, pre-plating treatment method, and method for forming member for electronic component |
| JP5740389B2 (ja) | 2009-03-27 | 2015-06-24 | アプライド・ナノテック・ホールディングス・インコーポレーテッド | 光焼結及び/またはレーザー焼結を強化するためのバッファ層 |
| US8262894B2 (en) * | 2009-04-30 | 2012-09-11 | Moses Lake Industries, Inc. | High speed copper plating bath |
| US8440065B1 (en) * | 2009-06-07 | 2013-05-14 | Technic, Inc. | Electrolyte composition, method, and improved apparatus for high speed tin-silver electroplating |
| WO2011001847A1 (ja) * | 2009-07-01 | 2011-01-06 | Jx日鉱日石金属株式会社 | Ulsi微細銅配線埋め込み用電気銅めっき液 |
| US8422197B2 (en) | 2009-07-15 | 2013-04-16 | Applied Nanotech Holdings, Inc. | Applying optical energy to nanoparticles to produce a specified nanostructure |
| DE102010011269B4 (de) * | 2009-11-10 | 2014-02-13 | Ami Doduco Gmbh | Verfahren zum Abscheiden einer für das Drahtbonden geeigneten Palladiumschicht auf Leiterbahnen einer Schaltungsträgerplatte und Verwendung eines Palladiumbades in dem Verfahren |
| EP2476779B1 (en) * | 2011-01-13 | 2013-03-20 | Atotech Deutschland GmbH | Immersion tin or tin alloy plating bath with improved removal of cupurous ions |
| EP2594662B1 (en) * | 2011-11-21 | 2014-04-09 | Atotech Deutschland GmbH | Aqueous composition for etching of copper and copper alloys |
| TW201419315A (zh) | 2012-07-09 | 2014-05-16 | Applied Nanotech Holdings Inc | 微米尺寸銅粒子的光燒結法 |
| CN103882484B (zh) * | 2014-04-04 | 2016-06-29 | 哈尔滨工业大学 | 高速电镀锡用镀液 |
| JP6618241B2 (ja) * | 2014-06-11 | 2019-12-11 | 上村工業株式会社 | 錫電気めっき浴および錫めっき皮膜 |
| US9604316B2 (en) | 2014-09-23 | 2017-03-28 | Globalfoundries Inc. | Tin-based solder composition with low void characteristic |
| CN104593835B (zh) * | 2015-02-04 | 2017-10-24 | 广东羚光新材料股份有限公司 | 用于片式元器件端电极电镀的中性镀锡液 |
| CN105401177A (zh) * | 2015-12-14 | 2016-03-16 | 广东美的暖通设备有限公司 | 换热器的防腐处理方法、换热器和空调器 |
| GB2569466B (en) * | 2016-10-24 | 2021-06-30 | Jaguar Land Rover Ltd | Apparatus and method relating to electrochemical migration |
| US10147697B1 (en) | 2017-12-15 | 2018-12-04 | Nxp Usa, Inc. | Bond pad structure for semiconductor device packaging |
| JP7070360B2 (ja) * | 2018-11-16 | 2022-05-18 | トヨタ自動車株式会社 | スズ膜形成用のスズ溶液、及びそれを用いたスズ膜の形成方法 |
| CN111188069A (zh) * | 2019-12-31 | 2020-05-22 | 大连长丰实业总公司 | 一种镀锡铋合金溶液及其制备方法 |
| CN111458328B (zh) * | 2020-04-26 | 2021-03-19 | 电子科技大学 | 一种检测印制电路板残留铜层分布的方法 |
| CN112342584A (zh) * | 2020-09-29 | 2021-02-09 | 扬州市景杨表面工程有限公司 | 一种心脏起搏器电容器件无磁化铜锡电镀工艺 |
| CN112517859B (zh) * | 2020-11-24 | 2022-07-19 | 太仓史密斯理查森精密制造有限公司 | 一种用于芯撑的环保抗变色耐腐蚀镀锡制备工艺 |
| PE20240150A1 (es) * | 2021-05-20 | 2024-02-08 | Basf Se | Bano de galvanizacion de sulfonato, proceso de refinado de metal mediante deposicion electrolitica y proceso para controlar la morfologia de metales en el refinado electroolitico |
| CN114990651A (zh) * | 2022-04-29 | 2022-09-02 | 沈阳飞机工业(集团)有限公司 | 一种镀铜镀镉镀锡的多重电镀工艺方法 |
| CN115948775B (zh) * | 2022-11-22 | 2025-04-01 | 广州三孚新材料科技股份有限公司 | 一种用于高速镀锡的甲磺酸高速镀锡液及其制备方法 |
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| JPS61284593A (ja) * | 1985-06-12 | 1986-12-15 | Mitsubishi Electric Corp | 接触子用銅合金条の製造方法 |
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| JP2797542B2 (ja) * | 1989-11-06 | 1998-09-17 | ソニー株式会社 | リードフレームの製造方法 |
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| AU8670798A (en) * | 1997-07-30 | 1999-02-22 | Whitaker Corporation, The | Two layer solderable tin coating |
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| JP4186029B2 (ja) * | 1998-10-05 | 2008-11-26 | 石原薬品株式会社 | 銅箔基材上のスズ又はスズ合金メッキ皮膜における異常結晶析出防止剤並びに当該防止方法 |
| EP1241281A1 (en) * | 2001-03-16 | 2002-09-18 | Shipley Co. L.L.C. | Tin plating |
| US20030025182A1 (en) * | 2001-06-22 | 2003-02-06 | Abys Joseph A. | Metal article coated with tin or tin alloy under tensile stress to inhibit whisker growth |
| JP2003023123A (ja) * | 2001-07-09 | 2003-01-24 | Shindo Denshi Kogyo Kk | 回路基板および回路基板の製造方法 |
| JP3551168B2 (ja) * | 2001-08-23 | 2004-08-04 | 株式会社日立製作所 | Pbフリーはんだ接続構造体および電子機器 |
| JP4016637B2 (ja) * | 2001-10-24 | 2007-12-05 | 松下電器産業株式会社 | 錫−銀合金めっき皮膜を有する電子部品用リードフレーム及びその製造方法 |
| US6860981B2 (en) * | 2002-04-30 | 2005-03-01 | Technic, Inc. | Minimizing whisker growth in tin electrodeposits |
-
2004
- 2004-03-29 JP JP2004094941A patent/JP4603812B2/ja not_active Expired - Fee Related
- 2004-04-30 EP EP04252548A patent/EP1477587A3/en not_active Withdrawn
- 2004-05-07 KR KR1020040032095A patent/KR20040097895A/ko not_active Withdrawn
- 2004-05-10 TW TW093113045A patent/TW200506105A/zh unknown
- 2004-05-11 CN CNA2004100445177A patent/CN1550577A/zh active Pending
- 2004-05-12 US US10/843,984 patent/US7695605B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US7695605B2 (en) | 2010-04-13 |
| JP4603812B2 (ja) | 2010-12-22 |
| KR20040097895A (ko) | 2004-11-18 |
| CN1550577A (zh) | 2004-12-01 |
| EP1477587A3 (en) | 2007-04-04 |
| US20040256239A1 (en) | 2004-12-23 |
| EP1477587A2 (en) | 2004-11-17 |
| JP2004339605A (ja) | 2004-12-02 |
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